WO2003078920A3 - Verfahren und vorrichtung zur bestimmung der absolut-koordinaten eines objekts - Google Patents

Verfahren und vorrichtung zur bestimmung der absolut-koordinaten eines objekts Download PDF

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Publication number
WO2003078920A3
WO2003078920A3 PCT/EP2003/002877 EP0302877W WO03078920A3 WO 2003078920 A3 WO2003078920 A3 WO 2003078920A3 EP 0302877 W EP0302877 W EP 0302877W WO 03078920 A3 WO03078920 A3 WO 03078920A3
Authority
WO
WIPO (PCT)
Prior art keywords
grid
sensor
determining
absolute coordinates
projection
Prior art date
Application number
PCT/EP2003/002877
Other languages
English (en)
French (fr)
Other versions
WO2003078920A2 (de
Inventor
Anton Kraus
Original Assignee
Steinbichler Optotechnik Gmbh
Anton Kraus
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Steinbichler Optotechnik Gmbh, Anton Kraus filed Critical Steinbichler Optotechnik Gmbh
Priority to JP2003576887A priority Critical patent/JP2005520142A/ja
Priority to EP03712057A priority patent/EP1485670A2/de
Priority to US10/478,121 priority patent/US6876458B2/en
Publication of WO2003078920A2 publication Critical patent/WO2003078920A2/de
Publication of WO2003078920A3 publication Critical patent/WO2003078920A3/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2536—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object using several gratings with variable grating pitch, projected on the object with the same angle of incidence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

Bei einem Verfahren zur Bestimmung der Absolut-Koordinaten eines Objekts (1) wird das Objekt (1) durch ein Projektionsgitter (2) mit Licht (3) bestrahlt. Das von dem Objekt (1) reflektierte Licht (4) wird von einem Sensor (5) aufgenommen. Die Aufnahme des Sensors wird ausgewertet. Um ein derartiges Verfahren zu verbessern, umfasst das Projektionsgitter (2) ein erstes Gitter mit einem ersten Gittervektor (G1) und ein zweites Gitter mit einem davon veschiedenen zweiten Gittervektor (G2). Der Sensor (5) ist derart im Abstand (b) vom Projektionsgitter (2) angeordnet, dass die Projektionen (bx, by) des vom ersten und vom zweiten Gitter zum Sensor (5) führenden Basisvektors (b) auf die zugehörigen Gittervektoren (G1, G2) verschieden gross sind.
PCT/EP2003/002877 2002-03-20 2003-03-19 Verfahren und vorrichtung zur bestimmung der absolut-koordinaten eines objekts WO2003078920A2 (de)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2003576887A JP2005520142A (ja) 2002-03-20 2003-03-19 物体の絶対座標測定方法および装置
EP03712057A EP1485670A2 (de) 2002-03-20 2003-03-19 Verfahren und vorrichtung zur bestimmung der absolut-koordinaten eines objekts
US10/478,121 US6876458B2 (en) 2002-03-20 2003-03-19 Method and device for determining the absolute coordinates of an object

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10212364.0 2002-03-20
DE10212364A DE10212364A1 (de) 2002-03-20 2002-03-20 Verfahren und Vorrichtung zur Bestimmung der Absolut-Koordinaten eines Objekts

Publications (2)

Publication Number Publication Date
WO2003078920A2 WO2003078920A2 (de) 2003-09-25
WO2003078920A3 true WO2003078920A3 (de) 2004-02-05

Family

ID=27815803

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2003/002877 WO2003078920A2 (de) 2002-03-20 2003-03-19 Verfahren und vorrichtung zur bestimmung der absolut-koordinaten eines objekts

Country Status (5)

Country Link
US (1) US6876458B2 (de)
EP (1) EP1485670A2 (de)
JP (1) JP2005520142A (de)
DE (1) DE10212364A1 (de)
WO (1) WO2003078920A2 (de)

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US7187437B2 (en) 2003-09-10 2007-03-06 Shearographics, Llc Plurality of light sources for inspection apparatus and method
US7436504B2 (en) * 2003-09-10 2008-10-14 Shear Graphics, Llc Non-destructive testing and imaging
US20070023716A1 (en) * 2005-07-26 2007-02-01 Icos Vision Systems N.V. Apparatus for three dimensional measuring on an electronic component
US7525114B2 (en) 2006-02-14 2009-04-28 Lmi Technologies Ltd. Multiple axis multipoint non-contact measurement system
CA2536411C (en) * 2006-02-14 2014-01-14 Lmi Technologies Inc. Multiple axis multipoint non-contact measurement system
SG176440A1 (en) 2006-11-21 2011-12-29 Mantisvision Ltd 3d geometric modeling and 3d video content creation
US8090194B2 (en) 2006-11-21 2012-01-03 Mantis Vision Ltd. 3D geometric modeling and motion capture using both single and dual imaging
DE102007060263A1 (de) 2007-08-16 2009-02-26 Steinbichler Optotechnik Gmbh Vorrichtung zur Ermittlung der 3D-Koordinaten eines Objekts, insbesondere eines Zahns
EP2026034B1 (de) 2007-08-16 2020-04-29 Carl Zeiss Optotechnik GmbH Vorrichtung zur Ermittlung der 3D-Koordinaten eines Objekts, insbesondere eines Zahns
DE502008001698D1 (de) * 2007-10-18 2010-12-16 Nectar Imaging S R L Vorrichtung zur tomografischen Erfassung von Objekten
US8294082B2 (en) 2007-11-14 2012-10-23 Boulder Innovation Group, Inc. Probe with a virtual marker
DE102007054907A1 (de) * 2007-11-15 2009-05-28 Sirona Dental Systems Gmbh Verfahren zur optischen Vermessung von Objekten unter Verwendung eines Triangulationsverfahrens
DE102008047816B4 (de) 2008-09-18 2011-08-25 Steinbichler Optotechnik GmbH, 83115 Vorrichtung zur Ermittlung der 3D-Koordinaten eines Objekts, insbesondere eines Zahns
JP5545932B2 (ja) * 2009-06-08 2014-07-09 株式会社マクシス・シントー 三次元形状計測装置
US8649025B2 (en) 2010-03-27 2014-02-11 Micrometric Vision Technologies Methods and apparatus for real-time digitization of three-dimensional scenes
US8638450B2 (en) 2010-08-04 2014-01-28 Boulder Innovation Group Inc. Methods and systems for realizing reduced complexity in three-dimensional digitizer systems
US8687172B2 (en) 2011-04-13 2014-04-01 Ivan Faul Optical digitizer with improved distance measurement capability
US10447040B2 (en) 2014-10-15 2019-10-15 Cummins Power Generation Ip, Inc. Programmable inverter for controllable grid response
DE102016208049A1 (de) * 2015-07-09 2017-01-12 Inb Vision Ag Vorrichtung und Verfahren zur Bilderfassung einer vorzugsweise strukturierten Oberfläche eines Objekts
CN109323691B (zh) * 2017-07-31 2022-08-09 华为技术有限公司 一种定位系统以及定位方法

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US4802759A (en) * 1986-08-11 1989-02-07 Goro Matsumoto Three-dimensional shape measuring apparatus
WO1993003579A1 (en) * 1991-07-26 1993-02-18 Isis Innovation Limited Three-dimensional vision system
EP0534284A2 (de) * 1991-09-26 1993-03-31 Hans Dr. Steinbichler Verfahren und Vorrichtung zur Bestimmung der Absolut-Koordinaten eines Objektes

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WO1993003579A1 (en) * 1991-07-26 1993-02-18 Isis Innovation Limited Three-dimensional vision system
EP0534284A2 (de) * 1991-09-26 1993-03-31 Hans Dr. Steinbichler Verfahren und Vorrichtung zur Bestimmung der Absolut-Koordinaten eines Objektes

Also Published As

Publication number Publication date
US6876458B2 (en) 2005-04-05
JP2005520142A (ja) 2005-07-07
DE10212364A1 (de) 2003-10-16
EP1485670A2 (de) 2004-12-15
US20040150836A1 (en) 2004-08-05
WO2003078920A2 (de) 2003-09-25

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