JP2005340825A5 - - Google Patents

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Publication number
JP2005340825A5
JP2005340825A5 JP2005150621A JP2005150621A JP2005340825A5 JP 2005340825 A5 JP2005340825 A5 JP 2005340825A5 JP 2005150621 A JP2005150621 A JP 2005150621A JP 2005150621 A JP2005150621 A JP 2005150621A JP 2005340825 A5 JP2005340825 A5 JP 2005340825A5
Authority
JP
Japan
Prior art keywords
gas
gas outlet
laminator
flushing device
lithographic apparatus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2005150621A
Other languages
English (en)
Japanese (ja)
Other versions
JP4318667B2 (ja
JP2005340825A (ja
Filing date
Publication date
Priority claimed from US10/852,686 external-priority patent/US7136142B2/en
Application filed filed Critical
Publication of JP2005340825A publication Critical patent/JP2005340825A/ja
Publication of JP2005340825A5 publication Critical patent/JP2005340825A5/ja
Application granted granted Critical
Publication of JP4318667B2 publication Critical patent/JP4318667B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

JP2005150621A 2004-05-25 2005-05-24 ガス・フラッシング・デバイスを有するリソグラフィ装置 Expired - Fee Related JP4318667B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/852,686 US7136142B2 (en) 2004-05-25 2004-05-25 Lithographic apparatus having a gas flushing device

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2008265455A Division JP4637223B2 (ja) 2004-05-25 2008-10-14 ガス・フラッシング・デバイスを有するリソグラフィ装置

Publications (3)

Publication Number Publication Date
JP2005340825A JP2005340825A (ja) 2005-12-08
JP2005340825A5 true JP2005340825A5 (enExample) 2007-06-28
JP4318667B2 JP4318667B2 (ja) 2009-08-26

Family

ID=34938293

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2005150621A Expired - Fee Related JP4318667B2 (ja) 2004-05-25 2005-05-24 ガス・フラッシング・デバイスを有するリソグラフィ装置
JP2008265455A Expired - Lifetime JP4637223B2 (ja) 2004-05-25 2008-10-14 ガス・フラッシング・デバイスを有するリソグラフィ装置

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2008265455A Expired - Lifetime JP4637223B2 (ja) 2004-05-25 2008-10-14 ガス・フラッシング・デバイスを有するリソグラフィ装置

Country Status (8)

Country Link
US (1) US7136142B2 (enExample)
EP (1) EP1600819B1 (enExample)
JP (2) JP4318667B2 (enExample)
KR (1) KR100768946B1 (enExample)
CN (1) CN100541334C (enExample)
DE (1) DE602005013145D1 (enExample)
SG (1) SG117593A1 (enExample)
TW (1) TWI266965B (enExample)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060119811A1 (en) * 2004-12-07 2006-06-08 Asml Netherlands B.V. Radiation exposure apparatus comprising a gas flushing system
KR101252312B1 (ko) * 2004-12-23 2013-04-08 칼 짜이스 에스엠테 게엠베하 적어도 하나의 교체 가능한 광학 요소를 포함하는 대물렌즈모듈
NL1036181A1 (nl) * 2007-11-30 2009-06-04 Asml Netherlands Bv A lithographic apparatus, a projection system and a device manufacturing method.
KR101399303B1 (ko) * 2008-12-05 2014-05-26 엘지디스플레이 주식회사 평판표시장치용 노광장비
NL2008184A (en) 2011-02-28 2012-08-29 Asml Netherlands Bv Gas manifold, module for a lithographic apparatus, lithographic apparatus and device manufacturing method.
US9453801B2 (en) 2012-05-25 2016-09-27 Kla-Tencor Corporation Photoemission monitoring of EUV mirror and mask surface contamination in actinic EUV systems
US9662688B2 (en) 2012-07-09 2017-05-30 Kla-Tencor Corporation Apparatus and method for cross-flow purge for optical components in a chamber
NL2012291A (en) * 2013-02-20 2014-08-21 Asml Netherlands Bv Gas flow optimization in reticle stage environment.
CN109283797B (zh) * 2017-07-21 2021-04-30 上海微电子装备(集团)股份有限公司 物镜保护装置、物镜系统以及光刻设备
CN108398858B (zh) * 2018-03-20 2019-05-10 李笛 一种气体隔离装置及隔离方法
WO2020182540A1 (en) 2019-03-14 2020-09-17 Asml Netherlands B.V. Providing substantially laminar fluid flow in a lithographic apparatus
JP7427461B2 (ja) * 2020-02-06 2024-02-05 キヤノン株式会社 露光装置、及び物品の製造方法
DE102022128598A1 (de) * 2022-10-28 2024-05-08 Trumpf Laser- Und Systemtechnik Gmbh Vorrichtung und Verfahren zur Inertisierung einer Prozesskammer für die additive Fertigung eines Werkstücks

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4692934A (en) 1984-11-08 1987-09-08 Hampshire Instruments X-ray lithography system
JPH03252507A (ja) 1990-03-02 1991-11-11 Hitachi Ltd レーザ干渉測長装置およびそれを用いた位置決め方法
JP3448670B2 (ja) 1993-09-02 2003-09-22 株式会社ニコン 露光装置及び素子製造方法
JP3637639B2 (ja) 1995-07-10 2005-04-13 株式会社ニコン 露光装置
JP2828090B2 (ja) * 1997-03-24 1998-11-25 株式会社ニコン 露光装置
DE19830438A1 (de) 1998-07-08 2000-01-13 Zeiss Carl Fa Verfahren zur Dekontamination von Mikrolithographie-Projektionsbelichtungsanlagen
TW480372B (en) 1999-11-05 2002-03-21 Asm Lithography Bv Lithographic projection apparatus, method of manufacturing a device using the apparatus, and device manufactured according to the method
TW563002B (en) * 1999-11-05 2003-11-21 Asml Netherlands Bv Lithographic projection apparatus, method of manufacturing a device using a lithographic projection apparatus, and device manufactured by the method
JP2002373852A (ja) * 2001-06-15 2002-12-26 Canon Inc 露光装置

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