JP2005315876A5 - - Google Patents
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- Publication number
- JP2005315876A5 JP2005315876A5 JP2005101903A JP2005101903A JP2005315876A5 JP 2005315876 A5 JP2005315876 A5 JP 2005315876A5 JP 2005101903 A JP2005101903 A JP 2005101903A JP 2005101903 A JP2005101903 A JP 2005101903A JP 2005315876 A5 JP2005315876 A5 JP 2005315876A5
- Authority
- JP
- Japan
- Prior art keywords
- bearing
- annular fixture
- mechanism according
- load board
- lever
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP04101408A EP1584934B1 (en) | 2004-04-05 | 2004-04-05 | Device for releasable connecting an interface to a test equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2005315876A JP2005315876A (ja) | 2005-11-10 |
| JP2005315876A5 true JP2005315876A5 (enExample) | 2007-04-05 |
Family
ID=34896115
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2005101903A Pending JP2005315876A (ja) | 2004-04-05 | 2005-03-31 | インターフェースをテスト機器に着脱可能に接続するための機構 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US7164278B2 (enExample) |
| EP (1) | EP1584934B1 (enExample) |
| JP (1) | JP2005315876A (enExample) |
| DE (1) | DE602004021469D1 (enExample) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3875254B2 (ja) * | 2005-05-30 | 2007-01-31 | 株式会社アドバンテスト | 半導体試験装置及びインターフェースプレート |
| US7504822B2 (en) | 2005-10-28 | 2009-03-17 | Teradyne, Inc. | Automatic testing equipment instrument card and probe cabling system and apparatus |
| US7541819B2 (en) | 2005-10-28 | 2009-06-02 | Teradyne, Inc. | Modularized device interface with grounding insert between two strips |
| US7764079B1 (en) * | 2007-01-31 | 2010-07-27 | SemiProbe LLC | Modular probe system |
| DE102015109022B4 (de) * | 2015-06-08 | 2018-08-23 | Infineon Technologies Ag | Modulares Messgerät zum Testen von Prüflingen mittels Schnittstellenelementen |
| CN105388329A (zh) * | 2015-11-17 | 2016-03-09 | 国网北京市电力公司 | 接线钳 |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2674781B2 (ja) * | 1988-05-23 | 1997-11-12 | 日本ヒューレット・パッカード株式会社 | 治具接続装置と接続手段 |
| JPH04162740A (ja) * | 1990-10-26 | 1992-06-08 | Yokogawa Hewlett Packard Ltd | 蓋状体の開閉機構 |
| US5068601A (en) * | 1991-02-11 | 1991-11-26 | Credence Systems Corporation | Dual function cam-ring system for DUT board parallel electrical inter-connection and prober/handler docking |
| JP3062268B2 (ja) * | 1991-03-11 | 2000-07-10 | アジレント・テクノロジー株式会社 | テストヘッドにおけるdutボードの着脱機構 |
| JP2550265Y2 (ja) * | 1991-04-26 | 1997-10-08 | 横河電機株式会社 | Lsiテスタ |
| EP0541839B1 (en) * | 1991-11-11 | 1993-07-28 | Hewlett-Packard GmbH | Apparatus for generating test signals |
| JPH06148270A (ja) * | 1992-11-04 | 1994-05-27 | Hitachi Ltd | テストボード着脱装置 |
| DE4305442C2 (de) * | 1993-02-23 | 1999-08-05 | Hewlett Packard Gmbh | Verfahren und Vorrichtung zum Erzeugen eines Testvektors |
| US5923180A (en) * | 1997-02-04 | 1999-07-13 | Hewlett-Packard Company | Compliant wafer prober docking adapter |
| US6166553A (en) * | 1998-06-29 | 2000-12-26 | Xandex, Inc. | Prober-tester electrical interface for semiconductor test |
| EP0999450B1 (en) * | 1999-08-23 | 2002-04-10 | Agilent Technologies, Inc. (a Delaware corporation) | Modular interface between test and application equipment |
| JP2003130919A (ja) * | 2001-10-25 | 2003-05-08 | Agilent Technologies Japan Ltd | コネクションボックス及びdutボード評価システム及びその評価方法 |
| US6747447B2 (en) * | 2002-09-25 | 2004-06-08 | Advantest Corporation | Locking apparatus and loadboard assembly |
-
2004
- 2004-04-05 EP EP04101408A patent/EP1584934B1/en not_active Expired - Lifetime
- 2004-04-05 DE DE602004021469T patent/DE602004021469D1/de not_active Expired - Lifetime
-
2005
- 2005-03-31 JP JP2005101903A patent/JP2005315876A/ja active Pending
- 2005-04-01 US US11/096,377 patent/US7164278B2/en not_active Expired - Lifetime
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