JP2005315876A - インターフェースをテスト機器に着脱可能に接続するための機構 - Google Patents

インターフェースをテスト機器に着脱可能に接続するための機構 Download PDF

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Publication number
JP2005315876A
JP2005315876A JP2005101903A JP2005101903A JP2005315876A JP 2005315876 A JP2005315876 A JP 2005315876A JP 2005101903 A JP2005101903 A JP 2005101903A JP 2005101903 A JP2005101903 A JP 2005101903A JP 2005315876 A JP2005315876 A JP 2005315876A
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JP
Japan
Prior art keywords
interface
bearing
fixture
load board
lever
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2005101903A
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English (en)
Japanese (ja)
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JP2005315876A5 (enExample
Inventor
Peter Hirschmann
ヒルシュマン ペーター
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of JP2005315876A publication Critical patent/JP2005315876A/ja
Publication of JP2005315876A5 publication Critical patent/JP2005315876A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
JP2005101903A 2004-04-05 2005-03-31 インターフェースをテスト機器に着脱可能に接続するための機構 Pending JP2005315876A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP04101408A EP1584934B1 (en) 2004-04-05 2004-04-05 Device for releasable connecting an interface to a test equipment

Publications (2)

Publication Number Publication Date
JP2005315876A true JP2005315876A (ja) 2005-11-10
JP2005315876A5 JP2005315876A5 (enExample) 2007-04-05

Family

ID=34896115

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005101903A Pending JP2005315876A (ja) 2004-04-05 2005-03-31 インターフェースをテスト機器に着脱可能に接続するための機構

Country Status (4)

Country Link
US (1) US7164278B2 (enExample)
EP (1) EP1584934B1 (enExample)
JP (1) JP2005315876A (enExample)
DE (1) DE602004021469D1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105388329A (zh) * 2015-11-17 2016-03-09 国网北京市电力公司 接线钳

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3875254B2 (ja) * 2005-05-30 2007-01-31 株式会社アドバンテスト 半導体試験装置及びインターフェースプレート
US7504822B2 (en) 2005-10-28 2009-03-17 Teradyne, Inc. Automatic testing equipment instrument card and probe cabling system and apparatus
US7541819B2 (en) 2005-10-28 2009-06-02 Teradyne, Inc. Modularized device interface with grounding insert between two strips
US7764079B1 (en) * 2007-01-31 2010-07-27 SemiProbe LLC Modular probe system
DE102015109022B4 (de) * 2015-06-08 2018-08-23 Infineon Technologies Ag Modulares Messgerät zum Testen von Prüflingen mittels Schnittstellenelementen

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01295183A (ja) * 1988-05-23 1989-11-28 Yokogawa Hewlett Packard Ltd 治具接続装置と接続手段
JPH04162740A (ja) * 1990-10-26 1992-06-08 Yokogawa Hewlett Packard Ltd 蓋状体の開閉機構
JPH04282472A (ja) * 1991-03-11 1992-10-07 Yokogawa Hewlett Packard Ltd テストヘッドにおけるｄｕｔボードの着脱機構
JPH0633090U (ja) * 1991-04-26 1994-04-28 横河電機株式会社 Ｌｓｉテスタ
JPH06148270A (ja) * 1992-11-04 1994-05-27 Hitachi Ltd テストボード着脱装置
JP2003130919A (ja) * 2001-10-25 2003-05-08 Agilent Technologies Japan Ltd コネクションボックス及びｄｕｔボード評価システム及びその評価方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5068601A (en) * 1991-02-11 1991-11-26 Credence Systems Corporation Dual function cam-ring system for DUT board parallel electrical inter-connection and prober/handler docking
EP0541839B1 (en) * 1991-11-11 1993-07-28 Hewlett-Packard GmbH Apparatus for generating test signals
DE4305442C2 (de) * 1993-02-23 1999-08-05 Hewlett Packard Gmbh Verfahren und Vorrichtung zum Erzeugen eines Testvektors
US5923180A (en) * 1997-02-04 1999-07-13 Hewlett-Packard Company Compliant wafer prober docking adapter
US6166553A (en) * 1998-06-29 2000-12-26 Xandex, Inc. Prober-tester electrical interface for semiconductor test
EP0999450B1 (en) * 1999-08-23 2002-04-10 Agilent Technologies, Inc. (a Delaware corporation) Modular interface between test and application equipment
US6747447B2 (en) * 2002-09-25 2004-06-08 Advantest Corporation Locking apparatus and loadboard assembly

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01295183A (ja) * 1988-05-23 1989-11-28 Yokogawa Hewlett Packard Ltd 治具接続装置と接続手段
JPH04162740A (ja) * 1990-10-26 1992-06-08 Yokogawa Hewlett Packard Ltd 蓋状体の開閉機構
JPH04282472A (ja) * 1991-03-11 1992-10-07 Yokogawa Hewlett Packard Ltd テストヘッドにおけるｄｕｔボードの着脱機構
JPH0633090U (ja) * 1991-04-26 1994-04-28 横河電機株式会社 Ｌｓｉテスタ
JPH06148270A (ja) * 1992-11-04 1994-05-27 Hitachi Ltd テストボード着脱装置
JP2003130919A (ja) * 2001-10-25 2003-05-08 Agilent Technologies Japan Ltd コネクションボックス及びｄｕｔボード評価システム及びその評価方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105388329A (zh) * 2015-11-17 2016-03-09 国网北京市电力公司 接线钳

Also Published As

Publication number Publication date
EP1584934A1 (en) 2005-10-12
DE602004021469D1 (de) 2009-07-23
EP1584934B1 (en) 2009-06-10
US20050264278A1 (en) 2005-12-01
US7164278B2 (en) 2007-01-16

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