JP2005214932A - 信号処理装置、この信号処理装置を用いた電圧測定装置及び電流測定装置 - Google Patents

信号処理装置、この信号処理装置を用いた電圧測定装置及び電流測定装置 Download PDF

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Publication number
JP2005214932A
JP2005214932A JP2004025653A JP2004025653A JP2005214932A JP 2005214932 A JP2005214932 A JP 2005214932A JP 2004025653 A JP2004025653 A JP 2004025653A JP 2004025653 A JP2004025653 A JP 2004025653A JP 2005214932 A JP2005214932 A JP 2005214932A
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Japan
Prior art keywords
signal
square
digital
value
signal processing
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JP2004025653A
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Japanese (ja)
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JP2005214932A5 (enExample
Inventor
Ryohei Tanaka
良平 田中
Toyokazu Kitano
豊和 北野
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Daihen Corp
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Daihen Corp
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Priority to JP2004025653A priority Critical patent/JP2005214932A/ja
Priority to US11/048,434 priority patent/US20050171992A1/en
Publication of JP2005214932A publication Critical patent/JP2005214932A/ja
Publication of JP2005214932A5 publication Critical patent/JP2005214932A5/ja
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/02Measuring effective values, i.e. root-mean-square values
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0046Arrangements for measuring currents or voltages or for indicating presence or sign thereof characterised by a specific application or detail not covered by any other subgroup of G01R19/00
    • G01R19/0061Measuring currents of particle-beams, currents from electron multipliers, photocurrents, ion currents; Measuring in plasmas

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Current Or Voltage (AREA)
JP2004025653A 2004-02-02 2004-02-02 信号処理装置、この信号処理装置を用いた電圧測定装置及び電流測定装置 Pending JP2005214932A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2004025653A JP2005214932A (ja) 2004-02-02 2004-02-02 信号処理装置、この信号処理装置を用いた電圧測定装置及び電流測定装置
US11/048,434 US20050171992A1 (en) 2004-02-02 2005-01-31 Signal processing apparatus, and voltage or current measurer utilizing the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004025653A JP2005214932A (ja) 2004-02-02 2004-02-02 信号処理装置、この信号処理装置を用いた電圧測定装置及び電流測定装置

Publications (2)

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JP2005214932A true JP2005214932A (ja) 2005-08-11
JP2005214932A5 JP2005214932A5 (enExample) 2007-03-08

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JP2004025653A Pending JP2005214932A (ja) 2004-02-02 2004-02-02 信号処理装置、この信号処理装置を用いた電圧測定装置及び電流測定装置

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US (1) US20050171992A1 (enExample)
JP (1) JP2005214932A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105353197A (zh) * 2015-07-17 2016-02-24 深圳市科润宝实业有限公司 一种交流真有效值的测量方法和装置

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7477711B2 (en) * 2005-05-19 2009-01-13 Mks Instruments, Inc. Synchronous undersampling for high-frequency voltage and current measurements
TWI492671B (zh) * 2007-12-13 2015-07-11 Lam Res Corp 電漿未限制感測器及其方法
JP5468401B2 (ja) * 2010-01-28 2014-04-09 グローリー株式会社 硬貨センサ、実効値算出方法および硬貨識別装置
JP5841917B2 (ja) * 2012-08-24 2016-01-13 株式会社日立ハイテクノロジーズ プラズマ処理装置及びプラズマ処理方法
CN112505391B (zh) * 2020-11-27 2024-03-19 陕西航空电气有限责任公司 一种频率自适应的交流信号有效值获取方法

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63163282A (ja) * 1986-12-26 1988-07-06 Hitachi Ltd 多値多重化関数演算方式
JPH0395469A (ja) * 1989-09-08 1991-04-19 Yokogawa Electric Corp 実効値測定装置
JPH03151709A (ja) * 1989-11-09 1991-06-27 Casio Comput Co Ltd サウンド用デジタルフィルタ装置
JPH10232250A (ja) * 1997-02-18 1998-09-02 Fluke Corp rmsコンバータ、rms値測定装置、およびrms値計算方法
JPH10319056A (ja) * 1997-04-09 1998-12-04 Fluke Corp 測定装置のための測定フロントエンドおよび信号電圧から複数個の測定パラメータを得るための方法
JP2003179465A (ja) * 2001-12-13 2003-06-27 Korg Inc フィルタ装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4959608A (en) * 1989-10-16 1990-09-25 Hewlett-Packard Company Apparatus and method for extracting the RMS value from a signal
US6064193A (en) * 1997-07-17 2000-05-16 Tektronix, Inc. Method and apparatus for measuring the mean square value of an electrical signal

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63163282A (ja) * 1986-12-26 1988-07-06 Hitachi Ltd 多値多重化関数演算方式
JPH0395469A (ja) * 1989-09-08 1991-04-19 Yokogawa Electric Corp 実効値測定装置
JPH03151709A (ja) * 1989-11-09 1991-06-27 Casio Comput Co Ltd サウンド用デジタルフィルタ装置
JPH10232250A (ja) * 1997-02-18 1998-09-02 Fluke Corp rmsコンバータ、rms値測定装置、およびrms値計算方法
JPH10319056A (ja) * 1997-04-09 1998-12-04 Fluke Corp 測定装置のための測定フロントエンドおよび信号電圧から複数個の測定パラメータを得るための方法
JP2003179465A (ja) * 2001-12-13 2003-06-27 Korg Inc フィルタ装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105353197A (zh) * 2015-07-17 2016-02-24 深圳市科润宝实业有限公司 一种交流真有效值的测量方法和装置

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US20050171992A1 (en) 2005-08-04

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