JP2005101455A5 - - Google Patents
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- Publication number
- JP2005101455A5 JP2005101455A5 JP2003335641A JP2003335641A JP2005101455A5 JP 2005101455 A5 JP2005101455 A5 JP 2005101455A5 JP 2003335641 A JP2003335641 A JP 2003335641A JP 2003335641 A JP2003335641 A JP 2003335641A JP 2005101455 A5 JP2005101455 A5 JP 2005101455A5
- Authority
- JP
- Japan
- Prior art keywords
- positioning
- substrate
- positioning reference
- unit
- center
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000758 substrate Substances 0.000 claims 55
- 238000000034 method Methods 0.000 claims 1
- 230000007723 transport mechanism Effects 0.000 claims 1
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003335641A JP4289961B2 (ja) | 2003-09-26 | 2003-09-26 | 位置決め装置 |
| US10/947,284 US7311738B2 (en) | 2003-09-26 | 2004-09-23 | Positioning apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003335641A JP4289961B2 (ja) | 2003-09-26 | 2003-09-26 | 位置決め装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2005101455A JP2005101455A (ja) | 2005-04-14 |
| JP2005101455A5 true JP2005101455A5 (enExample) | 2007-03-22 |
| JP4289961B2 JP4289961B2 (ja) | 2009-07-01 |
Family
ID=34462974
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2003335641A Expired - Fee Related JP4289961B2 (ja) | 2003-09-26 | 2003-09-26 | 位置決め装置 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US7311738B2 (enExample) |
| JP (1) | JP4289961B2 (enExample) |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4216263B2 (ja) * | 2005-03-09 | 2009-01-28 | シャープ株式会社 | 製造検査解析システム、および製造検査解析方法 |
| US7342642B2 (en) * | 2005-06-20 | 2008-03-11 | Asml Netherlands B.V. | Pre-aligning a substrate in a lithographic apparatus, device manufacturing method, and device manufactured by the manufacturing method |
| JP4892225B2 (ja) * | 2005-10-28 | 2012-03-07 | 株式会社日立ハイテクノロジーズ | 真空処理方法、真空搬送装置および半導体処理装置 |
| NL1036025A1 (nl) * | 2007-10-10 | 2009-04-15 | Asml Netherlands Bv | Method of transferring a substrate, transfer system and lithographic projection apparatus. |
| EP2196857A3 (en) * | 2008-12-09 | 2010-07-21 | ASML Netherlands BV | Lithographic apparatus and device manufacturing method |
| JP5316172B2 (ja) * | 2009-04-02 | 2013-10-16 | 株式会社安川電機 | ウェハ吸引パッド及びそれを備えたプリアライナ |
| JP5614326B2 (ja) * | 2010-08-20 | 2014-10-29 | 東京エレクトロン株式会社 | 基板搬送装置、基板搬送方法及びその基板搬送方法を実行させるためのプログラムを記録した記録媒体 |
| JP5582152B2 (ja) | 2012-02-03 | 2014-09-03 | 東京エレクトロン株式会社 | 基板搬送装置、基板搬送方法及び記憶媒体 |
| JP2013247235A (ja) * | 2012-05-25 | 2013-12-09 | Ulvac Japan Ltd | 基板位置算出装置、基板位置算出方法、及び、基板位置算出プログラム |
| JP6465565B2 (ja) * | 2014-05-19 | 2019-02-06 | キヤノン株式会社 | 露光装置、位置合わせ方法およびデバイス製造方法 |
| JP5858103B2 (ja) * | 2014-07-16 | 2016-02-10 | 東京エレクトロン株式会社 | 基板搬送装置、基板搬送方法及び記憶媒体 |
| KR101757815B1 (ko) * | 2015-09-25 | 2017-07-14 | 세메스 주식회사 | 기판 중심 검출 방법, 기판 반송 방법, 반송 유닛 및 이를 포함하는 기판 처리 장치. |
| US10386515B2 (en) * | 2015-12-04 | 2019-08-20 | Cgg Services Sas | Method and apparatus for analyzing fractures using AVOAz inversion |
| CN108214965B (zh) * | 2018-02-08 | 2024-03-12 | 常熟市创新陶瓷有限公司 | 大功率水泵轴叶轮定位平台的加工夹具及加工方法 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6225012B1 (en) * | 1994-02-22 | 2001-05-01 | Nikon Corporation | Method for positioning substrate |
| CN1244018C (zh) * | 1996-11-28 | 2006-03-01 | 株式会社尼康 | 曝光方法和曝光装置 |
| US6188467B1 (en) * | 1997-06-13 | 2001-02-13 | Canon Kabushiki Kaisha | Method and apparatus for fabricating semiconductor devices |
| JPH1116806A (ja) | 1997-06-20 | 1999-01-22 | Toshiba Corp | プリアライメントサーチを含む位置合わせ方法 |
| EP0973069A3 (en) * | 1998-07-14 | 2006-10-04 | Nova Measuring Instruments Limited | Monitoring apparatus and method particularly useful in photolithographically processing substrates |
| TW527526B (en) * | 2000-08-24 | 2003-04-11 | Asml Netherlands Bv | Lithographic apparatus, device manufacturing method, and device manufactured thereby |
| EP1258834B1 (en) * | 2001-05-14 | 2004-12-29 | Infineon Technologies AG | Method for performing an alignment measurement of two patterns in different layers on a semiconductor wafer |
-
2003
- 2003-09-26 JP JP2003335641A patent/JP4289961B2/ja not_active Expired - Fee Related
-
2004
- 2004-09-23 US US10/947,284 patent/US7311738B2/en not_active Expired - Lifetime
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