JP2004163430A - 薄層の厚さの非破壊測定装置 - Google Patents

薄層の厚さの非破壊測定装置 Download PDF

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Publication number
JP2004163430A
JP2004163430A JP2003379634A JP2003379634A JP2004163430A JP 2004163430 A JP2004163430 A JP 2004163430A JP 2003379634 A JP2003379634 A JP 2003379634A JP 2003379634 A JP2003379634 A JP 2003379634A JP 2004163430 A JP2004163430 A JP 2004163430A
Authority
JP
Japan
Prior art keywords
display device
display
housing
measurement
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2003379634A
Other languages
English (en)
Japanese (ja)
Other versions
JP2004163430A5 (enExample
Inventor
Helmut Fischer
ヘルムート・フィッシャー
Scherzinger Bernhard
ベルンハルト・シェルツィンガー
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Immobilien Ges Helmut Fischer & Co KG GmbH
Original Assignee
Immobilien Ges Helmut Fischer & Co KG GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Immobilien Ges Helmut Fischer & Co KG GmbH filed Critical Immobilien Ges Helmut Fischer & Co KG GmbH
Publication of JP2004163430A publication Critical patent/JP2004163430A/ja
Publication of JP2004163430A5 publication Critical patent/JP2004163430A5/ja
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/08—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices Characterised By Use Of Acoustic Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Indicating Measured Values (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
JP2003379634A 2002-11-08 2003-11-10 薄層の厚さの非破壊測定装置 Pending JP2004163430A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE10252541.2A DE10252541B4 (de) 2002-11-08 2002-11-08 Vorrichtung zur zerstörungsfreien Messung der Dicke dünner Schichten

Publications (2)

Publication Number Publication Date
JP2004163430A true JP2004163430A (ja) 2004-06-10
JP2004163430A5 JP2004163430A5 (enExample) 2009-08-27

Family

ID=29723942

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003379634A Pending JP2004163430A (ja) 2002-11-08 2003-11-10 薄層の厚さの非破壊測定装置

Country Status (6)

Country Link
US (1) US7180286B2 (enExample)
JP (1) JP2004163430A (enExample)
CN (1) CN100429473C (enExample)
DE (1) DE10252541B4 (enExample)
FR (1) FR2847036B1 (enExample)
GB (1) GB2396700B (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ES2383810B1 (es) * 2009-12-22 2013-05-08 Asociación De Investigación Metalúrgica Del Noroeste Aimen Equipo móvil de inspección del espesor de recubrimientos de película seca, sistema de inspección del espesor de recubrimientos de película seca y procedimiento de inspección del espesor de recubrimientos de película seca.
DE202010006061U1 (de) * 2010-04-23 2010-07-22 Helmut Fischer GmbH Institut für Elektronik und Messtechnik Messsonde zur zerstörungsfreien Messung der Dicke dünner Schichten
CN103988243B (zh) 2011-12-14 2017-09-12 英特尔公司 微型数字看板硬件集成

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2311623A1 (de) * 1973-03-09 1974-09-12 Fischer Gmbh & Co Helmut Vorrichtung zum messen der dicke von schichten mit einem die schicht bestrahlenden radionuklid
JPS49146970U (enExample) * 1973-04-16 1974-12-18
JPS5181684U (enExample) * 1974-12-23 1976-06-30
US4730247A (en) * 1983-09-05 1988-03-08 Mitutoyo Mfg. Co., Ltd. Digital indication type measuring apparatus and measured data storage apparatus therefor
JPS6138503A (ja) * 1984-07-31 1986-02-24 Ketsuto Kagaku Kenkyusho:Kk 膜厚計
US4745809A (en) * 1986-08-12 1988-05-24 Grumman Aerospace Corporation Composite analyzer tester
US5241280A (en) * 1990-06-05 1993-08-31 Defelsko Corporation Coating thickness measurement gauge
EP0576714B1 (de) * 1992-07-03 1995-03-15 Norbert Dr. Nix Vorrichtung zur Messung einer Schichtdicke
US5583830A (en) * 1993-06-30 1996-12-10 Casio Computer Co., Ltd. Electronic appliance equipped with sensor capable of visually displaying sensed data
FI115160B (fi) * 1994-06-22 2005-03-15 Suunto Oy Optisesti luettava suuntimakompassi
DE19511397C1 (de) * 1995-03-28 1996-09-12 Norbert Nix Gerät zur Feststellung eines Lackschadens
GB9520414D0 (en) * 1995-10-06 1995-12-06 Car Light & Sound Sys Ltd Thickness measurement
US5959451A (en) * 1997-08-18 1999-09-28 Torfino Enterprises, Inc. Metal detector with vibrating tactile indicator mounted within a compact housing
GB2347220B (en) * 1999-02-23 2003-12-31 Rynhart Res Ltd A moisture meter
DE19918064C2 (de) * 1999-04-21 2003-09-18 Norbert Nix Schichtdickenmeßgerät mit automatisierter Nulleinstellung und/oder Kalibrierung
GB2356050B (en) * 1999-11-05 2001-10-24 Elcometer Instr Ltd Apparatus and method for measuring thickness
DE20206657U1 (de) * 2002-04-26 2002-09-19 Gimex Dr. Gao Import u. Export GmbH, 67655 Kaiserslautern Multianzeige für Digital-Meßmittel

Also Published As

Publication number Publication date
CN1501048A (zh) 2004-06-02
DE10252541B4 (de) 2016-08-11
US20040165198A1 (en) 2004-08-26
DE10252541A1 (de) 2004-05-27
GB0325704D0 (en) 2003-12-10
FR2847036B1 (fr) 2005-11-11
GB2396700B (en) 2005-11-16
CN100429473C (zh) 2008-10-29
FR2847036A1 (fr) 2004-05-14
GB2396700A (en) 2004-06-30
US7180286B2 (en) 2007-02-20

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