CN100429473C - 用于无毁损地测量薄层厚度的装置 - Google Patents

用于无毁损地测量薄层厚度的装置 Download PDF

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Publication number
CN100429473C
CN100429473C CNB2003101148991A CN200310114899A CN100429473C CN 100429473 C CN100429473 C CN 100429473C CN B2003101148991 A CNB2003101148991 A CN B2003101148991A CN 200310114899 A CN200310114899 A CN 200310114899A CN 100429473 C CN100429473 C CN 100429473C
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CN
China
Prior art keywords
display device
housing
experimental probe
measurement
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CNB2003101148991A
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English (en)
Chinese (zh)
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CN1501048A (zh
Inventor
(发明人要求不公开姓名)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Immobiliengesellschaft Helmut Fischer GmbH and Co KG
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Immobiliengesellschaft Helmut Fischer GmbH and Co KG
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Application filed by Immobiliengesellschaft Helmut Fischer GmbH and Co KG filed Critical Immobiliengesellschaft Helmut Fischer GmbH and Co KG
Publication of CN1501048A publication Critical patent/CN1501048A/zh
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Publication of CN100429473C publication Critical patent/CN100429473C/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/08—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Indicating Measured Values (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Length Measuring Devices Characterised By Use Of Acoustic Means (AREA)
CNB2003101148991A 2002-11-08 2003-11-07 用于无毁损地测量薄层厚度的装置 Expired - Fee Related CN100429473C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10252541.2A DE10252541B4 (de) 2002-11-08 2002-11-08 Vorrichtung zur zerstörungsfreien Messung der Dicke dünner Schichten
DE10252541.2 2002-11-08

Publications (2)

Publication Number Publication Date
CN1501048A CN1501048A (zh) 2004-06-02
CN100429473C true CN100429473C (zh) 2008-10-29

Family

ID=29723942

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB2003101148991A Expired - Fee Related CN100429473C (zh) 2002-11-08 2003-11-07 用于无毁损地测量薄层厚度的装置

Country Status (6)

Country Link
US (1) US7180286B2 (enExample)
JP (1) JP2004163430A (enExample)
CN (1) CN100429473C (enExample)
DE (1) DE10252541B4 (enExample)
FR (1) FR2847036B1 (enExample)
GB (1) GB2396700B (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ES2383810B1 (es) * 2009-12-22 2013-05-08 Asociación De Investigación Metalúrgica Del Noroeste Aimen Equipo móvil de inspección del espesor de recubrimientos de película seca, sistema de inspección del espesor de recubrimientos de película seca y procedimiento de inspección del espesor de recubrimientos de película seca.
DE202010006061U1 (de) * 2010-04-23 2010-07-22 Helmut Fischer GmbH Institut für Elektronik und Messtechnik Messsonde zur zerstörungsfreien Messung der Dicke dünner Schichten
CN103988243B (zh) 2011-12-14 2017-09-12 英特尔公司 微型数字看板硬件集成

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4745809A (en) * 1986-08-12 1988-05-24 Grumman Aerospace Corporation Composite analyzer tester
CN1103174A (zh) * 1993-06-30 1995-05-31 卡西欧计算机公司 具有传感器并能显示感测数据的电子装置
US5467014A (en) * 1992-07-03 1995-11-14 Nix; Norbert Device for measuring the thickness of a layer or coating on a ferrous and/or non-ferrous substrate

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2311623A1 (de) * 1973-03-09 1974-09-12 Fischer Gmbh & Co Helmut Vorrichtung zum messen der dicke von schichten mit einem die schicht bestrahlenden radionuklid
JPS49146970U (enExample) * 1973-04-16 1974-12-18
JPS5181684U (enExample) * 1974-12-23 1976-06-30
US4730247A (en) * 1983-09-05 1988-03-08 Mitutoyo Mfg. Co., Ltd. Digital indication type measuring apparatus and measured data storage apparatus therefor
JPS6138503A (ja) * 1984-07-31 1986-02-24 Ketsuto Kagaku Kenkyusho:Kk 膜厚計
US5241280A (en) * 1990-06-05 1993-08-31 Defelsko Corporation Coating thickness measurement gauge
FI115160B (fi) * 1994-06-22 2005-03-15 Suunto Oy Optisesti luettava suuntimakompassi
DE19511397C1 (de) * 1995-03-28 1996-09-12 Norbert Nix Gerät zur Feststellung eines Lackschadens
GB9520414D0 (en) * 1995-10-06 1995-12-06 Car Light & Sound Sys Ltd Thickness measurement
US5959451A (en) * 1997-08-18 1999-09-28 Torfino Enterprises, Inc. Metal detector with vibrating tactile indicator mounted within a compact housing
GB2347220B (en) * 1999-02-23 2003-12-31 Rynhart Res Ltd A moisture meter
DE19918064C2 (de) * 1999-04-21 2003-09-18 Norbert Nix Schichtdickenmeßgerät mit automatisierter Nulleinstellung und/oder Kalibrierung
GB2356050B (en) * 1999-11-05 2001-10-24 Elcometer Instr Ltd Apparatus and method for measuring thickness
DE20206657U1 (de) * 2002-04-26 2002-09-19 Gimex Dr. Gao Import u. Export GmbH, 67655 Kaiserslautern Multianzeige für Digital-Meßmittel

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4745809A (en) * 1986-08-12 1988-05-24 Grumman Aerospace Corporation Composite analyzer tester
US5467014A (en) * 1992-07-03 1995-11-14 Nix; Norbert Device for measuring the thickness of a layer or coating on a ferrous and/or non-ferrous substrate
CN1103174A (zh) * 1993-06-30 1995-05-31 卡西欧计算机公司 具有传感器并能显示感测数据的电子装置

Also Published As

Publication number Publication date
FR2847036B1 (fr) 2005-11-11
GB2396700A (en) 2004-06-30
GB2396700B (en) 2005-11-16
JP2004163430A (ja) 2004-06-10
US7180286B2 (en) 2007-02-20
FR2847036A1 (fr) 2004-05-14
US20040165198A1 (en) 2004-08-26
GB0325704D0 (en) 2003-12-10
CN1501048A (zh) 2004-06-02
DE10252541A1 (de) 2004-05-27
DE10252541B4 (de) 2016-08-11

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Granted publication date: 20081029

Termination date: 20201107