WO2010108089A2 - Display device for measurement tool - Google Patents

Display device for measurement tool Download PDF

Info

Publication number
WO2010108089A2
WO2010108089A2 PCT/US2010/027962 US2010027962W WO2010108089A2 WO 2010108089 A2 WO2010108089 A2 WO 2010108089A2 US 2010027962 W US2010027962 W US 2010027962W WO 2010108089 A2 WO2010108089 A2 WO 2010108089A2
Authority
WO
WIPO (PCT)
Prior art keywords
camera
measurement
probe
measuring probe
display
Prior art date
Application number
PCT/US2010/027962
Other languages
French (fr)
Other versions
WO2010108089A3 (en
Inventor
Al Boehnlein
Original Assignee
Perceptron, Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to US16143409P priority Critical
Priority to US61/161,434 priority
Application filed by Perceptron, Inc. filed Critical Perceptron, Inc.
Publication of WO2010108089A2 publication Critical patent/WO2010108089A2/en
Publication of WO2010108089A3 publication Critical patent/WO2010108089A3/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06788Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/025General constructional details concerning dedicated user interfaces, e.g. GUI, or dedicated keyboards
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00 and G01R33/00 - G01R35/00
    • G01R15/12Circuits for multi-testers, i.e. multimeters, e.g. for measuring voltage, current, or impedance at will

Abstract

A measurement device is herein disclosed. The measurement device comprises a measurement module and a measuring probe operably coupled to said measurement module, said measuring probe having at least one sensor at a distal end of said measuring probe, wherein said sensor communicates sensor signals to said measurement module. Further, the device includes a camera having a lens coupled to the measuring probe, wherein said lens focuses on an area proximate to said distal end of said probe; and a display unit displaying images generated by said camera.

Description

DISPLAY DEVICE FOR MEASUREMENT TOOL

CROSS-REFERENCE TO RELATED APPLICATIONS [0001] This application claims the benefit of U.S. Provisional Application No. 61/161 ,434 filed on March 19, 2009. The entire disclosure of the above application is incorporated herein by reference.

FIELD

[0002] The present disclosure relates to a display device used in connection with a measurement tool.

BACKGROUND

[0003] Modern electronic circuit boards include various electrical circuits that use various electrical components. Often, the components may be electrically conductive and/or may carry an electrical charge. The components may be arranged in close proximity to one another.

[0004] When a circuit board requires assembly, servicing, testing, or repair, various tools may be used to perform measurements corresponding to the components. For example, the tool may be a multi-meter that measures voltage or current between components on the circuit board. The tool may be an oscilloscope or other measurement tool to measure time based signals between components. The measurement tool may measure various data including voltage, current, resistance, continuity, pressure, temperature, and time based signals.

[0005] The measurement tool may include probes to contact the components and create the connections used for the measurements. A user of the measurement tool may use one or more probes to connect the components and perform the measurement in an area being inspected. The user may cause electrical damage to the circuit board by creating an unintended electrical connection between components and/or other connections with the probes. For example, the probes may create a short circuit between two components on the circuit board. The user may physically damage the circuit board by applying too much pressure to the component while performing the measurement. As circuit boards decrease in size and increase in complexity, the potential for damage increases. [0006] Furthermore, the user may shift visual focus from the area being inspected to the measurement tool in order to see a current measurement reading. When the user shifts focus from the circuit board to the measurement tool, the probes of the tool may also shift and damage the circuit board. The components and electrical connections are often small, making inspection and work on the circuit board difficult to see without magnification. Relative size and depth of the components may be difficult to determine due to the close proximity of the components to one another. Ambient light may cast shadows on the circuit board further diminishing visibility of the area being inspected.

[0007] This section provides background information related to the present disclosure which is not necessarily prior art.

SUMMARY

[0008] A measurement device is herein disclosed. The measurement device comprises a measurement module and a measuring probe operably coupled to said measurement module, said measuring probe having at least one sensor at a distal end of said measuring probe, wherein said sensor communicates sensor signals to said measurement module. Further, the device includes a camera having a lens coupled to the measuring probe, wherein said lens focuses on an area proximate to said distal end of said probe; and a display unit displaying images generated by said camera.

[0009] This section provides a general summary of the disclosure, and is not a comprehensive disclosure of its full scope or all of its features.

[0010] Further areas of applicability will become apparent from the description provided herein. The description and specific examples in this summary are intended for purposes of illustration only and are not intended to limit the scope of the present disclosure.

DRAWINGS [0011] The drawings described herein are for illustrative purposes only of selected embodiments and not all possible implementations, and are not intended to limit the scope of the present disclosure.

[0012] Figure 1 is a drawing of an exemplary measurement device; [0013] Figure 2 is a drawing of an exemplary measurement device integrating the measurement module and the display device in a single housing;

[0014] Figure 3 is a drawing of an exemplary measurement device integrating the measurement module and the display device in separate housings;

[0015] Figure 4 is a drawing of an exemplary measurement device having the measurement module and the display device in separate housings, wherein the measurement is communicated to the display device;

[0016] Figure 5 is a drawing of an exemplary measurement device having two cameras;

[0017] Figure 6 is a drawing of an exemplary measuring probe and a camera including a light source that illuminates a measuring area; [0018] Figure 7 is a drawing of an exemplary measuring probe and a camera including a light source that illuminates a measuring area;

[0019] Figure 8 is a drawing of an exemplary measuring probe and a camera including a light source using structured lighting;

[0020] Figure 9 is a drawing of an exemplary measuring probe having a camera disposed therein; and

[0021] Figure 10 is a drawing of an exemplary measuring probe having a camera disposed therein.

[0022] Corresponding reference numerals indicate corresponding parts throughout the several views of the drawings. DETAILED DESCRIPTION

[0023] Example embodiments will now be described more fully with reference to the accompanying drawings.

[0024] Referring now to FIG. 1 , a device 100 enables the user of a measurement tool 200 to view an area 102 of a circuit board 104 being inspected on a display 106. The area 102 may include various components 108 and connections 1 10. The device 100 includes a camera 1 12 mounted to a probe 1 14 that is directed towards the area 102 being inspected. The camera 1 12 transmits an image 1 16 of the area 102 to the display 106. The camera 1 12 may be detachable from the probe 1 14. The camera 1 12 and the probe 114 may be integrated into a single unit.

[0025] Referring now to FIGS. 1 and 2, in one embodiment, the device 100 may be integrated in the measurement tool 200. The measurement tool 200 may include the display 106 and the probe 1 14 may include the camera 1 12. The camera 1 12 transmits the image 1 16 of the area 102 to the display 106 on the measurement tool 200. The probe 1 14 transmits a measurement reading 1 18 to the display 106. The user may view the image 1 16 of the area 102 and the current measurement reading 1 18 on the same display 106.

[0026] Referring now to FIG. 3, in another embodiment 100', the display 106 may be separate from the measurement tool 200. The display 106 may display the image 1 16 of the area 102 while the measurement tool 200 displays the measurement reading 1 18. [0027] Referring now to FIG. 4, in another embodiment 100", the display

106 and the measurement tool 200 may be coupled such that the camera 1 12 transmits the image 1 16 to the display 106. The probe 1 14 transmits the measurement reading 1 18 to the measurement tool 200. The measurement tool 200 transmits the measurement reading 118 to the display 106. [0028] Referring to FIG. 5, in another embodiment 100'", a second camera 120 transmits an image 122 of the measurement reading 1 18 on the measurement tool 200 to the display 106.

[0029] The device 100 may include magnification to improve visibility of the components 108 and connections 1 10 of the circuit board 104 on the display

106. For example, the image 116 may be magnified to improve viewing of the area

102. The magnification may be optical magnification by the camera 1 12 or digital magnification.

[0030] Referring now to FIGS. 6 and 7, the probe 114 may include a light source 124 to improve visibility of the components 108 and connections 1 10 of the circuit board 104. For example, the camera 1 12 may include the light source 124 to improve the image 116 of the area 102 being inspected. The probe 1 14 may include a depth cue generator to provide improved depth perception. For example, the light source 124 may be mounted off-axis with respect to the camera 1 12. The light source 124 may cast a shadow 126 from the probe 1 14 onto the circuit board 104. The user may use the shadow 126 to determine an approximate distance (D) between the probe 1 14 and the component 108 based on a distance (D') between the shadow 126 and the component 108.

[0031] Referring to FIG. 8, the probe 1 14 may include a light source 124' using structured lighting. The structured lighting may include a light pattern 128 emitted from the light source 124'. The camera 1 12 may acquire dimensional data based on the light pattern 128 as light reflects back to the camera 1 12 from the component 108. The camera 1 12 may transmit the dimensional data to the device 100 to be displayed. [0032] Referring now to FIGS. 9 and 10, the camera 1 12 may be disposed within the probe 1 14. A mirror 130 may reflect the area 102 being inspected back to the camera 1 12. The light source 124 may include an LED light to illuminate the area 102. The camera 1 12 may transmit the image 1 16 of the area 102 to the display 106 by a printed circuit board 132. As shown in FIG. 9, the display 106 may be integrated with the probe 114. In other embodiments, the display 106 may be attached to a separate tool such as an electrical testing probe, a soldering tool, and/or a precision glue tool. The image 116 may be transmitted to the display 106 by a radio frequency, a personal area network protocol, or other wireless connection. [0033] In any of the embodiments, the camera 1 12 may be disposed outside the probe 114 or within the probe 1 14 using the mirror 130. The device 100 may include a camera fixture to attach the camera 112 to existing designs or products. For example, the camera 1 12 may be attached to an existing test probe or soldering iron using the camera fixture. The camera 1 12 may be removable from the test probe or soldering iron.

[0034] While the above description has been provided with reference to electrical measurement device, it is envisioned that the concepts set forth above also extend to a soldering tool, a precision glue tool and other similar tools.

[0035] Example embodiments are provided so that this disclosure will be thorough, and will fully convey the scope to those who are skilled in the art. Numerous specific details are set forth such as examples of specific components, devices, and methods, to provide a thorough understanding of embodiments of the present disclosure. It will be apparent to those skilled in the art that specific details need not be employed, that example embodiments may be embodied in many different forms and that neither should be construed to limit the scope of the disclosure. In some example embodiments, well-known processes, well-known device structures, and well-known technologies are not described in detail. The foregoing description of the embodiments has been provided for purposes of illustration and description. It is not intended to be exhaustive or to limit the invention. Individual elements or features of a particular embodiment are generally not limited to that particular embodiment, but, where applicable, are interchangeable and can be used in a selected embodiment, even if not specifically shown or described. The same may also be varied in many ways. Such variations are not to be regarded as a departure from the invention, and all such modifications are intended to be included within the scope of the invention.

Claims

CLAIMS What is claimed is:
1. A measurement device comprising: a measurement module; a measuring probe operably coupled to said measurement module, said measuring probe having at least one sensor at a distal end of said measuring probe, wherein said sensor communicates sensor signals to said measurement module; a camera having a lens coupled to the measuring probe, wherein said lens focuses on an area proximate to said distal end of said probe; and a display unit displaying images generated by said camera.
PCT/US2010/027962 2009-03-19 2010-03-19 Display device for measurement tool WO2010108089A2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
US16143409P true 2009-03-19 2009-03-19
US61/161,434 2009-03-19

Publications (2)

Publication Number Publication Date
WO2010108089A2 true WO2010108089A2 (en) 2010-09-23
WO2010108089A3 WO2010108089A3 (en) 2011-01-13

Family

ID=42740255

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2010/027962 WO2010108089A2 (en) 2009-03-19 2010-03-19 Display device for measurement tool

Country Status (1)

Country Link
WO (1) WO2010108089A2 (en)

Cited By (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8001697B2 (en) 2010-01-20 2011-08-23 Faro Technologies, Inc. Counter balance for coordinate measurement device
US8284407B2 (en) 2010-01-20 2012-10-09 Faro Technologies, Inc. Coordinate measuring machine having an illuminated probe end and method of operation
CN103091527A (en) * 2011-11-04 2013-05-08 上海科沁机电有限公司 Video universal meter
US8533967B2 (en) 2010-01-20 2013-09-17 Faro Technologies, Inc. Coordinate measurement machines with removable accessories
US20130262497A1 (en) * 2012-04-02 2013-10-03 Caterpillar Inc. Inspection Tool
US8615893B2 (en) 2010-01-20 2013-12-31 Faro Technologies, Inc. Portable articulated arm coordinate measuring machine having integrated software controls
US8630314B2 (en) 2010-01-11 2014-01-14 Faro Technologies, Inc. Method and apparatus for synchronizing measurements taken by multiple metrology devices
JP2014010124A (en) * 2012-07-02 2014-01-20 Hioki Ee Corp Measurement device
US8638446B2 (en) 2010-01-20 2014-01-28 Faro Technologies, Inc. Laser scanner or laser tracker having a projector
US8677643B2 (en) 2010-01-20 2014-03-25 Faro Technologies, Inc. Coordinate measurement machines with removable accessories
US8832954B2 (en) 2010-01-20 2014-09-16 Faro Technologies, Inc. Coordinate measurement machines with removable accessories
CN104048687A (en) * 2013-03-15 2014-09-17 弗兰克公司 Measurement system with image capture capabilities
US8875409B2 (en) 2010-01-20 2014-11-04 Faro Technologies, Inc. Coordinate measurement machines with removable accessories
US8898919B2 (en) 2010-01-20 2014-12-02 Faro Technologies, Inc. Coordinate measurement machine with distance meter used to establish frame of reference
US8997362B2 (en) 2012-07-17 2015-04-07 Faro Technologies, Inc. Portable articulated arm coordinate measuring machine with optical communications bus
US9074883B2 (en) 2009-03-25 2015-07-07 Faro Technologies, Inc. Device for optically scanning and measuring an environment
US9113023B2 (en) 2009-11-20 2015-08-18 Faro Technologies, Inc. Three-dimensional scanner with spectroscopic energy detector
US9163922B2 (en) 2010-01-20 2015-10-20 Faro Technologies, Inc. Coordinate measurement machine with distance meter and camera to determine dimensions within camera images
US9168654B2 (en) 2010-11-16 2015-10-27 Faro Technologies, Inc. Coordinate measuring machines with dual layer arm
USRE45854E1 (en) 2006-07-03 2016-01-19 Faro Technologies, Inc. Method and an apparatus for capturing three-dimensional data of an area of space
US9329271B2 (en) 2010-05-10 2016-05-03 Faro Technologies, Inc. Method for optically scanning and measuring an environment
US9372265B2 (en) 2012-10-05 2016-06-21 Faro Technologies, Inc. Intermediate two-dimensional scanning with a three-dimensional scanner to speed registration
US9417056B2 (en) 2012-01-25 2016-08-16 Faro Technologies, Inc. Device for optically scanning and measuring an environment
US9417316B2 (en) 2009-11-20 2016-08-16 Faro Technologies, Inc. Device for optically scanning and measuring an environment
US9513107B2 (en) 2012-10-05 2016-12-06 Faro Technologies, Inc. Registration calculation between three-dimensional (3D) scans based on two-dimensional (2D) scan data from a 3D scanner
US9529083B2 (en) 2009-11-20 2016-12-27 Faro Technologies, Inc. Three-dimensional scanner with enhanced spectroscopic energy detector
US9551575B2 (en) 2009-03-25 2017-01-24 Faro Technologies, Inc. Laser scanner having a multi-color light source and real-time color receiver
US9607239B2 (en) 2010-01-20 2017-03-28 Faro Technologies, Inc. Articulated arm coordinate measurement machine having a 2D camera and method of obtaining 3D representations
US9628775B2 (en) 2010-01-20 2017-04-18 Faro Technologies, Inc. Articulated arm coordinate measurement machine having a 2D camera and method of obtaining 3D representations
US10067231B2 (en) 2012-10-05 2018-09-04 Faro Technologies, Inc. Registration calculation of three-dimensional scanner data performed between scans based on measurements by two-dimensional scanner
US10175037B2 (en) 2015-12-27 2019-01-08 Faro Technologies, Inc. 3-D measuring device with battery pack
US10281259B2 (en) 2010-01-20 2019-05-07 Faro Technologies, Inc. Articulated arm coordinate measurement machine that uses a 2D camera to determine 3D coordinates of smoothly continuous edge features

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001259056A (en) * 2000-03-21 2001-09-25 Ya Man Ltd Laser beam irradiation prove
JP2002303640A (en) * 2000-11-03 2002-10-18 Tektronix Inc Tester
US20040252877A1 (en) * 2003-06-16 2004-12-16 The Boeing Company Pin protrusion measurement probe

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0926435A (en) * 1995-07-12 1997-01-28 Hitachi Denshi Ltd probe

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001259056A (en) * 2000-03-21 2001-09-25 Ya Man Ltd Laser beam irradiation prove
JP2002303640A (en) * 2000-11-03 2002-10-18 Tektronix Inc Tester
US20040252877A1 (en) * 2003-06-16 2004-12-16 The Boeing Company Pin protrusion measurement probe

Cited By (48)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USRE45854E1 (en) 2006-07-03 2016-01-19 Faro Technologies, Inc. Method and an apparatus for capturing three-dimensional data of an area of space
US9551575B2 (en) 2009-03-25 2017-01-24 Faro Technologies, Inc. Laser scanner having a multi-color light source and real-time color receiver
US9074883B2 (en) 2009-03-25 2015-07-07 Faro Technologies, Inc. Device for optically scanning and measuring an environment
US9529083B2 (en) 2009-11-20 2016-12-27 Faro Technologies, Inc. Three-dimensional scanner with enhanced spectroscopic energy detector
US9113023B2 (en) 2009-11-20 2015-08-18 Faro Technologies, Inc. Three-dimensional scanner with spectroscopic energy detector
US9417316B2 (en) 2009-11-20 2016-08-16 Faro Technologies, Inc. Device for optically scanning and measuring an environment
US8630314B2 (en) 2010-01-11 2014-01-14 Faro Technologies, Inc. Method and apparatus for synchronizing measurements taken by multiple metrology devices
US8537374B2 (en) 2010-01-20 2013-09-17 Faro Technologies, Inc. Coordinate measuring machine having an illuminated probe end and method of operation
US10060722B2 (en) 2010-01-20 2018-08-28 Faro Technologies, Inc. Articulated arm coordinate measurement machine having a 2D camera and method of obtaining 3D representations
US8601702B2 (en) 2010-01-20 2013-12-10 Faro Technologies, Inc. Display for coordinate measuring machine
US8615893B2 (en) 2010-01-20 2013-12-31 Faro Technologies, Inc. Portable articulated arm coordinate measuring machine having integrated software controls
US8533967B2 (en) 2010-01-20 2013-09-17 Faro Technologies, Inc. Coordinate measurement machines with removable accessories
US9628775B2 (en) 2010-01-20 2017-04-18 Faro Technologies, Inc. Articulated arm coordinate measurement machine having a 2D camera and method of obtaining 3D representations
US8638446B2 (en) 2010-01-20 2014-01-28 Faro Technologies, Inc. Laser scanner or laser tracker having a projector
US8284407B2 (en) 2010-01-20 2012-10-09 Faro Technologies, Inc. Coordinate measuring machine having an illuminated probe end and method of operation
US8683709B2 (en) 2010-01-20 2014-04-01 Faro Technologies, Inc. Portable articulated arm coordinate measuring machine with multi-bus arm technology
US8763266B2 (en) 2010-01-20 2014-07-01 Faro Technologies, Inc. Coordinate measurement device
US8832954B2 (en) 2010-01-20 2014-09-16 Faro Technologies, Inc. Coordinate measurement machines with removable accessories
US8276286B2 (en) 2010-01-20 2012-10-02 Faro Technologies, Inc. Display for coordinate measuring machine
US8875409B2 (en) 2010-01-20 2014-11-04 Faro Technologies, Inc. Coordinate measurement machines with removable accessories
US8898919B2 (en) 2010-01-20 2014-12-02 Faro Technologies, Inc. Coordinate measurement machine with distance meter used to establish frame of reference
US8942940B2 (en) 2010-01-20 2015-01-27 Faro Technologies, Inc. Portable articulated arm coordinate measuring machine and integrated electronic data processing system
US9607239B2 (en) 2010-01-20 2017-03-28 Faro Technologies, Inc. Articulated arm coordinate measurement machine having a 2D camera and method of obtaining 3D representations
US9009000B2 (en) 2010-01-20 2015-04-14 Faro Technologies, Inc. Method for evaluating mounting stability of articulated arm coordinate measurement machine using inclinometers
US8001697B2 (en) 2010-01-20 2011-08-23 Faro Technologies, Inc. Counter balance for coordinate measurement device
US8171650B2 (en) 2010-01-20 2012-05-08 Faro Technologies, Inc. Intelligent repeatable arm mounting system
US9163922B2 (en) 2010-01-20 2015-10-20 Faro Technologies, Inc. Coordinate measurement machine with distance meter and camera to determine dimensions within camera images
US8028432B2 (en) 2010-01-20 2011-10-04 Faro Technologies, Inc. Mounting device for a coordinate measuring machine
US8677643B2 (en) 2010-01-20 2014-03-25 Faro Technologies, Inc. Coordinate measurement machines with removable accessories
US10281259B2 (en) 2010-01-20 2019-05-07 Faro Technologies, Inc. Articulated arm coordinate measurement machine that uses a 2D camera to determine 3D coordinates of smoothly continuous edge features
US9684078B2 (en) 2010-05-10 2017-06-20 Faro Technologies, Inc. Method for optically scanning and measuring an environment
US9329271B2 (en) 2010-05-10 2016-05-03 Faro Technologies, Inc. Method for optically scanning and measuring an environment
US9168654B2 (en) 2010-11-16 2015-10-27 Faro Technologies, Inc. Coordinate measuring machines with dual layer arm
CN103091527A (en) * 2011-11-04 2013-05-08 上海科沁机电有限公司 Video universal meter
US9417056B2 (en) 2012-01-25 2016-08-16 Faro Technologies, Inc. Device for optically scanning and measuring an environment
US20130262497A1 (en) * 2012-04-02 2013-10-03 Caterpillar Inc. Inspection Tool
JP2014010124A (en) * 2012-07-02 2014-01-20 Hioki Ee Corp Measurement device
US8997362B2 (en) 2012-07-17 2015-04-07 Faro Technologies, Inc. Portable articulated arm coordinate measuring machine with optical communications bus
US9372265B2 (en) 2012-10-05 2016-06-21 Faro Technologies, Inc. Intermediate two-dimensional scanning with a three-dimensional scanner to speed registration
US9618620B2 (en) 2012-10-05 2017-04-11 Faro Technologies, Inc. Using depth-camera images to speed registration of three-dimensional scans
US9739886B2 (en) 2012-10-05 2017-08-22 Faro Technologies, Inc. Using a two-dimensional scanner to speed registration of three-dimensional scan data
US9746559B2 (en) 2012-10-05 2017-08-29 Faro Technologies, Inc. Using two-dimensional camera images to speed registration of three-dimensional scans
US10203413B2 (en) 2012-10-05 2019-02-12 Faro Technologies, Inc. Using a two-dimensional scanner to speed registration of three-dimensional scan data
US9513107B2 (en) 2012-10-05 2016-12-06 Faro Technologies, Inc. Registration calculation between three-dimensional (3D) scans based on two-dimensional (2D) scan data from a 3D scanner
US10067231B2 (en) 2012-10-05 2018-09-04 Faro Technologies, Inc. Registration calculation of three-dimensional scanner data performed between scans based on measurements by two-dimensional scanner
EP2778628A3 (en) * 2013-03-15 2017-12-06 Fluke Corporation Measurement system with image capture capabilities
CN104048687A (en) * 2013-03-15 2014-09-17 弗兰克公司 Measurement system with image capture capabilities
US10175037B2 (en) 2015-12-27 2019-01-08 Faro Technologies, Inc. 3-D measuring device with battery pack

Also Published As

Publication number Publication date
WO2010108089A3 (en) 2011-01-13

Similar Documents

Publication Publication Date Title
US20060025651A1 (en) Endoscope electronics assembly
JP5497847B2 (en) Electrical measuring instrument with detachable current clamp
JP2012220496A (en) Method and device for displaying indication of quality of three-dimensional data for surface of viewed object
US7762950B2 (en) Endoscope
ES2285906B1 (en) Probe for instrument of tests and voltage detector, combined.
TWI235238B (en) Connection unit, carry board for a device to be tested, probe card and interface part
US8681207B2 (en) Image pickup device and endoscope provided with image pickup device
US20050014996A1 (en) Optical adaptor and endoscope device
EP1512980A3 (en) Loaded-board, guided-probe test fixture
JPH06213955A (en) Test probe
WO2002089661A1 (en) Optical imaging device and optical imaging detecting method
US8217646B2 (en) Inspection apparatus for performing inspections
EP2463666A3 (en) Electronic device test set and contact used therein
TW556298B (en) Probing method and device
TW200515357A (en) Inspection method and inspection device for display device and active matrix substrate used for display device
TW200538741A (en) Probing a device
KR20110082560A (en) Probe connector
EP1261022A4 (en) Apparatus for detecting defect in device and method of detecting defect
JP2006098376A (en) Inspection unit
EP0862061B1 (en) Circuit board inspection apparatus and method
TW200532204A (en) Electric signal connecting device, and probe assembly and prober device using it
US20060290362A1 (en) Probe for use in determining an attribute of a coating on a substrate
US20030137310A1 (en) Remote viewing screen for test instrument
EP1380848A3 (en) Device for measuring and analyzing electrical signals of an integrated circuit component
US6353327B2 (en) Circuit board misalignment detection apparatus and method

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 10754166

Country of ref document: EP

Kind code of ref document: A2

NENP Non-entry into the national phase in:

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 10754166

Country of ref document: EP

Kind code of ref document: A2