JP2004139632A - 強誘電体メモリ - Google Patents
強誘電体メモリ Download PDFInfo
- Publication number
- JP2004139632A JP2004139632A JP2002300522A JP2002300522A JP2004139632A JP 2004139632 A JP2004139632 A JP 2004139632A JP 2002300522 A JP2002300522 A JP 2002300522A JP 2002300522 A JP2002300522 A JP 2002300522A JP 2004139632 A JP2004139632 A JP 2004139632A
- Authority
- JP
- Japan
- Prior art keywords
- potential
- reference potential
- capacitor
- ferroelectric
- bit line
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/22—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/14—Dummy cell management; Sense reference voltage generators
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Dram (AREA)
- Semiconductor Memories (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2002300522A JP2004139632A (ja) | 2002-10-15 | 2002-10-15 | 強誘電体メモリ |
| US10/684,497 US6853600B2 (en) | 2002-10-15 | 2003-10-15 | Ferro-electric random access memory using paraelectric and ferroelectric capacitor for generating a reference potential |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2002300522A JP2004139632A (ja) | 2002-10-15 | 2002-10-15 | 強誘電体メモリ |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2004139632A true JP2004139632A (ja) | 2004-05-13 |
| JP2004139632A5 JP2004139632A5 (https=) | 2005-01-27 |
Family
ID=32449193
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2002300522A Pending JP2004139632A (ja) | 2002-10-15 | 2002-10-15 | 強誘電体メモリ |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US6853600B2 (https=) |
| JP (1) | JP2004139632A (https=) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007058958A (ja) * | 2005-08-23 | 2007-03-08 | Toshiba Corp | 強誘電体半導体記憶装置 |
| JP2018514891A (ja) * | 2015-02-17 | 2018-06-07 | 日本テキサス・インスツルメンツ株式会社 | 強誘電体メモリにおけるデータ感知のための基準電圧の設定 |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010033642A (ja) * | 2008-07-28 | 2010-02-12 | Toshiba Corp | 半導体記憶装置 |
| CN116136835B (zh) * | 2023-04-19 | 2023-07-18 | 中国人民解放军国防科技大学 | 一种三进二出数值获取方法、装置及介质 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09134594A (ja) | 1995-11-08 | 1997-05-20 | Hitachi Ltd | 半導体不揮発メモリ |
| JP2939973B2 (ja) * | 1996-06-06 | 1999-08-25 | 日本電気株式会社 | 不揮発性半導体メモリ装置の駆動方法 |
| JPH1116377A (ja) | 1997-06-25 | 1999-01-22 | Nec Corp | 強誘電体メモリ装置 |
| EP0928004A3 (en) * | 1997-12-31 | 1999-12-15 | Texas Instruments Inc. | Ferroelectric memory |
| KR100432879B1 (ko) * | 2001-03-05 | 2004-05-22 | 삼성전자주식회사 | 강유전체 랜덤 액세스 메모리 장치의 데이터 감지 방법 |
-
2002
- 2002-10-15 JP JP2002300522A patent/JP2004139632A/ja active Pending
-
2003
- 2003-10-15 US US10/684,497 patent/US6853600B2/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007058958A (ja) * | 2005-08-23 | 2007-03-08 | Toshiba Corp | 強誘電体半導体記憶装置 |
| JP2018514891A (ja) * | 2015-02-17 | 2018-06-07 | 日本テキサス・インスツルメンツ株式会社 | 強誘電体メモリにおけるデータ感知のための基準電圧の設定 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20040130928A1 (en) | 2004-07-08 |
| US6853600B2 (en) | 2005-02-08 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Written amendment |
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| A621 | Written request for application examination |
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