JP2003534122A5 - - Google Patents

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Publication number
JP2003534122A5
JP2003534122A5 JP2001585954A JP2001585954A JP2003534122A5 JP 2003534122 A5 JP2003534122 A5 JP 2003534122A5 JP 2001585954 A JP2001585954 A JP 2001585954A JP 2001585954 A JP2001585954 A JP 2001585954A JP 2003534122 A5 JP2003534122 A5 JP 2003534122A5
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2001585954A
Other versions
JP3668192B2 (ja
JP2003534122A (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/US2000/014235 external-priority patent/WO2001089725A1/en
Publication of JP2003534122A publication Critical patent/JP2003534122A/ja
Application granted granted Critical
Publication of JP3668192B2 publication Critical patent/JP3668192B2/ja
Publication of JP2003534122A5 publication Critical patent/JP2003534122A5/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2001585954A 2000-05-23 2000-05-23 受動部品の視覚的検査器 Expired - Fee Related JP3668192B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
PCT/US2000/014235 WO2001089725A1 (en) 2000-05-23 2000-05-23 Inspection machine for surface mount passive component
US09/578,787 2000-05-23
US09/578,787 US6294747B1 (en) 1999-06-02 2000-05-23 Inspection machine for surface mount passive component

Publications (3)

Publication Number Publication Date
JP2003534122A JP2003534122A (ja) 2003-11-18
JP3668192B2 JP3668192B2 (ja) 2005-07-06
JP2003534122A5 true JP2003534122A5 (ja) 2005-12-22

Family

ID=24314309

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001585954A Expired - Fee Related JP3668192B2 (ja) 2000-05-23 2000-05-23 受動部品の視覚的検査器

Country Status (13)

Country Link
US (1) US6294747B1 (ja)
EP (1) EP1283751B1 (ja)
JP (1) JP3668192B2 (ja)
KR (1) KR100478885B1 (ja)
CN (1) CN1241689C (ja)
AT (1) ATE361792T1 (ja)
AU (1) AU2000251587A1 (ja)
CZ (1) CZ2002662A3 (ja)
DE (1) DE60034820T2 (ja)
HU (1) HUP0203331A2 (ja)
IL (1) IL147702A0 (ja)
TW (1) TW571102B (ja)
WO (1) WO2001089725A1 (ja)

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KR100350855B1 (ko) * 2000-12-29 2002-09-05 주식회사옌트 표면 실장용 칩 검사 장치에서의 칩 선별기
TW577163B (en) * 2001-11-27 2004-02-21 Electro Scient Ind Inc A shadow-creating apparatus
US6756798B2 (en) 2002-03-14 2004-06-29 Ceramic Component Technologies, Inc. Contactor assembly for testing ceramic surface mount devices and other electronic components
US6710611B2 (en) 2002-04-19 2004-03-23 Ceramic Component Technologies, Inc. Test plate for ceramic surface mount devices and other electronic components
JP4243960B2 (ja) * 2003-02-25 2009-03-25 ヤマハファインテック株式会社 ワークの選別装置および選別方法
US7221727B2 (en) * 2003-04-01 2007-05-22 Kingston Technology Corp. All-digital phase modulator/demodulator using multi-phase clocks and digital PLL
US20050139450A1 (en) * 2003-12-30 2005-06-30 International Product Technology, Inc. Electrical part processing unit
US7364043B2 (en) * 2003-12-30 2008-04-29 Zen Voce Manufacturing Pte Ltd Fastener inspection system
US7161346B2 (en) * 2005-05-23 2007-01-09 Electro Scientific Industries, Inc. Method of holding an electronic component in a controlled orientation during parametric testing
KR100713801B1 (ko) * 2006-04-07 2007-05-04 (주)알티에스 듀얼 전자부품 검사 방법
KR100713799B1 (ko) * 2006-04-07 2007-05-04 (주)알티에스 듀얼 전자부품 검사장치
KR100783595B1 (ko) * 2006-04-14 2007-12-10 (주)알티에스 듀얼 전자부품 검사장치에서의 전자부품 분류방법
US7704033B2 (en) * 2006-04-21 2010-04-27 Electro Scientific Industries, Inc. Long axis component loader
JP2009216698A (ja) * 2008-02-07 2009-09-24 Camtek Ltd 対象物の複数の側面を画像化するための装置および方法
WO2010059130A1 (en) * 2008-11-19 2010-05-27 Ust Technology Pte. Ltd. An apparatus and method for inspecting an object
CN101750417B (zh) * 2008-12-12 2012-03-14 鸿富锦精密工业（深圳）有限公司 检测装置
KR101056105B1 (ko) * 2009-01-20 2011-08-10 (주)알티에스 전자부품 검사기의 분류장치
KR101056107B1 (ko) * 2009-01-21 2011-08-10 (주)알티에스 전자부품 검사장치의 분류장치
KR101112193B1 (ko) * 2010-11-09 2012-02-27 박양수 회전형 엘이디 검사 장치
TWI418811B (zh) * 2011-02-14 2013-12-11 Youngtek Electronics Corp 封裝晶片檢測與分類裝置
KR101284528B1 (ko) * 2011-11-08 2013-07-16 대원강업주식회사 기어림 표면 흠 검사장치 및 검사방법
DE102012216163B4 (de) * 2012-01-11 2017-03-09 Robert Bosch Gmbh Vorrichtung zum Zuführen von Kappen mit Überwachungssystem
KR102015572B1 (ko) 2013-10-02 2019-10-22 삼성전자주식회사 실장 장치
CN104375022B (zh) * 2014-10-10 2017-05-03 苏州杰锐思自动化设备有限公司 一种六面测试机台
KR20160090553A (ko) 2015-01-22 2016-08-01 (주)프로옵틱스 다면 검사장치
TWI643800B (zh) * 2018-06-01 2018-12-11 鴻勁精密股份有限公司 Electronic component image capturing device and job classification device thereof
JP2022508708A (ja) * 2018-10-15 2022-01-19 エレクトロ サイエンティフィック インダストリーズ インコーポレーテッド 部品を取り扱う際に使用されるシステム及び方法

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US2583447A (en) * 1946-08-03 1952-01-22 American Wheelabrator & Equipm Classifier
US3750878A (en) * 1971-11-15 1973-08-07 Dixon K Corp Electrical component testing apparatus
US4105122A (en) * 1976-11-26 1978-08-08 Borden, Inc. Inspecting cans for openings with light
DE2910494A1 (de) * 1978-03-17 1979-10-11 Fuji Electric Co Ltd Vorrichtung zur pruefung des aussehens bzw. zustands von festen medikamenten
SU1219172A1 (ru) * 1984-08-20 1986-03-23 Производственно-Экспериментальный Завод "Санитас" Научно-Исследовательского Института По Биологическим Испытаниям Химических Соединений Устройство дл размерной сортировки деталей
FR2590811B1 (fr) * 1985-12-03 1989-08-25 Pont A Mousson Machine automatique de controle et de tri de pieces, en particulier cylindriques
JPH0654226B2 (ja) * 1988-03-31 1994-07-20 ティーディーケイ株式会社 チップ状部品の自動外観検査機
JPH02193813A (ja) * 1989-01-20 1990-07-31 Murata Mfg Co Ltd 電子部品の整列・反転方法
FR2654549A1 (fr) * 1989-11-10 1991-05-17 Europ Composants Electron Dispositif de controle et de tri de condensateurs chips.
US6025567A (en) * 1997-11-10 2000-02-15 Brooks; David M. Binning wheel for testing and sorting capacitor chips
JP4039505B2 (ja) * 1999-03-16 2008-01-30 オカノ電機株式会社 外観検査装置

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