JP2003505684A - 電圧計機能の強化 - Google Patents

電圧計機能の強化

Info

Publication number
JP2003505684A
JP2003505684A JP2001512254A JP2001512254A JP2003505684A JP 2003505684 A JP2003505684 A JP 2003505684A JP 2001512254 A JP2001512254 A JP 2001512254A JP 2001512254 A JP2001512254 A JP 2001512254A JP 2003505684 A JP2003505684 A JP 2003505684A
Authority
JP
Japan
Prior art keywords
circuit
test
load
voltmeter
switch
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001512254A
Other languages
English (en)
Japanese (ja)
Other versions
JP2003505684A5 (enExample
Inventor
バーバー サリバン，ダニエル
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=27000740&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=JP2003505684(A) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Individual filed Critical Individual
Publication of JP2003505684A publication Critical patent/JP2003505684A/ja
Publication of JP2003505684A5 publication Critical patent/JP2003505684A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/12—Circuits for multi-testers, i.e. multimeters, e.g. for measuring voltage, current, or impedance at will
    • G01R15/125—Circuits for multi-testers, i.e. multimeters, e.g. for measuring voltage, current, or impedance at will for digital multimeters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/36—Overload-protection arrangements or circuits for electric measuring instruments
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/005—Testing of electric installations on transport means
    • G01R31/006—Testing of electric installations on transport means on road vehicles, e.g. automobiles or trucks

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
  • Polysaccharides And Polysaccharide Derivatives (AREA)
  • Acyclic And Carbocyclic Compounds In Medicinal Compositions (AREA)
  • Photoreceptors In Electrophotography (AREA)
  • Glass Compositions (AREA)
  • Tires In General (AREA)
JP2001512254A 1999-07-23 2000-07-21 電圧計機能の強化 Pending JP2003505684A (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US36006699A 1999-07-23 1999-07-23
US09/360,066 1999-07-23
US09/472,425 1999-12-27
US09/472,425 US6356853B1 (en) 1999-07-23 1999-12-27 Enhancing voltmeter functionality
PCT/US2000/019759 WO2001007871A1 (en) 1999-07-23 2000-07-21 Enhancing voltmeter functionality

Publications (2)

Publication Number Publication Date
JP2003505684A true JP2003505684A (ja) 2003-02-12
JP2003505684A5 JP2003505684A5 (enExample) 2007-05-17

Family

ID=27000740

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001512254A Pending JP2003505684A (ja) 1999-07-23 2000-07-21 電圧計機能の強化

Country Status (8)

Country Link
US (1) US6356853B1 (enExample)
EP (1) EP1203202B1 (enExample)
JP (1) JP2003505684A (enExample)
AT (1) ATE322021T1 (enExample)
AU (1) AU6225500A (enExample)
CA (1) CA2380267A1 (enExample)
DE (1) DE60027010T2 (enExample)
WO (1) WO2001007871A1 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006126037A (ja) * 2004-10-29 2006-05-18 Chugoku Electric Power Co Inc:The 電圧計付ヒューズクリップ
KR101462108B1 (ko) * 2011-07-13 2014-11-17 티센크루프 마린 시스템즈 게엠베하 전압결정을 위한 측정장치 검사방법 및 충전가능한 전압원 충전방법

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6646562B1 (en) * 2002-05-28 2003-11-11 Appa Technology Corp. Hooking-type fully automatic electric meter
BRPI0205470B1 (pt) * 2002-12-05 2017-01-24 Multibrás S A Eletrodomésticos sistema de diagnósticos para aparelhos eletrodomésticos
US8540493B2 (en) 2003-12-08 2013-09-24 Sta-Rite Industries, Llc Pump control system and method
US8043070B2 (en) 2004-08-26 2011-10-25 Pentair Water Pool And Spa, Inc. Speed control
US7686589B2 (en) 2004-08-26 2010-03-30 Pentair Water Pool And Spa, Inc. Pumping system with power optimization
US7845913B2 (en) 2004-08-26 2010-12-07 Pentair Water Pool And Spa, Inc. Flow control
US8469675B2 (en) 2004-08-26 2013-06-25 Pentair Water Pool And Spa, Inc. Priming protection
US8602745B2 (en) 2004-08-26 2013-12-10 Pentair Water Pool And Spa, Inc. Anti-entrapment and anti-dead head function
US7874808B2 (en) 2004-08-26 2011-01-25 Pentair Water Pool And Spa, Inc. Variable speed pumping system and method
US8019479B2 (en) 2004-08-26 2011-09-13 Pentair Water Pool And Spa, Inc. Control algorithm of variable speed pumping system
US8480373B2 (en) 2004-08-26 2013-07-09 Pentair Water Pool And Spa, Inc. Filter loading
FR2875603A1 (fr) * 2004-09-20 2006-03-24 Pierre Henri Churlet Voltmetre a charge adaptee
US7504830B2 (en) * 2005-06-06 2009-03-17 Associated Equipment Corp. Dual load tester
US7696760B2 (en) * 2007-11-30 2010-04-13 Caterpillar Inc. High voltage harness testing system
DE102007061729A1 (de) * 2007-12-20 2009-06-25 Robert Bosch Gmbh Verfahren zur Erkennung eines elektrischen Fehlers in einem elektrischen Netzwerk eines Kraftfahrzeugs
US7777508B2 (en) * 2008-01-07 2010-08-17 Armstrong Eric A Electrical test lead with a replaceable inline fuse
US7948227B2 (en) * 2008-09-08 2011-05-24 Beckmann Robert U Electrical circuit diagnostic tool
MX2011003708A (es) 2008-10-06 2011-06-16 Pentair Water Pool & Spa Inc Metodo para operar un sistema de seguridad para alivio de vacio.
US9556874B2 (en) 2009-06-09 2017-01-31 Pentair Flow Technologies, Llc Method of controlling a pump and motor
US8564233B2 (en) 2009-06-09 2013-10-22 Sta-Rite Industries, Llc Safety system and method for pump and motor
MX344350B (es) 2010-12-08 2016-12-13 Pentair Water Pool & Spa Inc Válvula de descarga con vacío para sistema de liberación de vacío de seguridad.
TW201248383A (en) * 2011-05-25 2012-12-01 Hon Hai Prec Ind Co Ltd Power supplying circuit
CN102435879B (zh) * 2011-09-22 2013-10-09 重庆大学 一种合闸前对线路进行检测的方法
CN102818964B (zh) * 2012-09-12 2016-01-13 成都光码智能科技有限公司 一种基于逆卡诺原理设备工况的监测装置及方法
US9885360B2 (en) 2012-10-25 2018-02-06 Pentair Flow Technologies, Llc Battery backup sump pump systems and methods
CN103176099B (zh) * 2013-03-01 2015-05-13 常熟理工学院 低压断路器合闸前主接线短路检测传感装置
US9590537B2 (en) * 2013-03-15 2017-03-07 Pentair Flow Technologies, Llc Method of controlling a pump and motor
US11249117B2 (en) 2018-08-02 2022-02-15 Jetperch Llc Autoranging ammeter with fast dynamic response
US12498398B2 (en) * 2023-02-23 2025-12-16 Snap-On Incorporated Electrical testing device with probe having an adjustable angle

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2432013A (en) * 1942-04-16 1947-12-02 Du Pont Measurement of leakage resistance in electrolytic cell systems
JPH1123635A (ja) * 1997-07-08 1999-01-29 Ricoh Keiki Kk 電源用負荷制御方法及びその装置

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2785378A (en) * 1953-01-30 1957-03-12 Western Electric Co Electrical measuring system
US4001686A (en) * 1975-05-28 1977-01-04 Storage Technology Corporation Electronic circuit testing apparatus
US4409732A (en) * 1981-01-05 1983-10-18 John Grant Circuit isolator
US4808915A (en) * 1981-10-30 1989-02-28 Honeywell Bull, Inc. Assembly of electronic components testable by a reciprocal quiescent testing technique
JPS6144371A (ja) 1984-08-06 1986-03-04 Mitsubishi Electric Corp 半導体試験装置
US4709366A (en) * 1985-07-29 1987-11-24 John Fluke Mfg. Co., Inc. Computer assisted fault isolation in circuit board testing
US4777430A (en) * 1987-03-16 1988-10-11 American Technical Ceramics Corp. Circuit for determining the effective series resistance and Q-factor of capacitors
US4884034A (en) * 1989-01-03 1989-11-28 Hermilo Guzman Ground fault detector and locator
JPH03277983A (ja) 1990-03-28 1991-12-09 Ando Electric Co Ltd Ｄｂ型ａｓによるｄｕｔ負荷切換回路
US5699402A (en) * 1994-09-26 1997-12-16 Teradyne, Inc. Method and apparatus for fault segmentation in a telephone network
US5952821A (en) 1997-08-29 1999-09-14 Credence Systems Corporation Load circuit for integrated circuit tester

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2432013A (en) * 1942-04-16 1947-12-02 Du Pont Measurement of leakage resistance in electrolytic cell systems
JPH1123635A (ja) * 1997-07-08 1999-01-29 Ricoh Keiki Kk 電源用負荷制御方法及びその装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006126037A (ja) * 2004-10-29 2006-05-18 Chugoku Electric Power Co Inc:The 電圧計付ヒューズクリップ
KR101462108B1 (ko) * 2011-07-13 2014-11-17 티센크루프 마린 시스템즈 게엠베하 전압결정을 위한 측정장치 검사방법 및 충전가능한 전압원 충전방법

Also Published As

Publication number Publication date
AU6225500A (en) 2001-02-13
ATE322021T1 (de) 2006-04-15
DE60027010T2 (de) 2007-06-14
EP1203202B1 (en) 2006-03-29
WO2001007871A1 (en) 2001-02-01
DE60027010D1 (de) 2006-05-18
US6356853B1 (en) 2002-03-12
CA2380267A1 (en) 2001-02-01
EP1203202A4 (en) 2005-01-12
EP1203202A1 (en) 2002-05-08
WO2001007871A9 (en) 2002-09-06

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