JP2002512691A - テスト装置用ケーブルトレイ組立体 - Google Patents

テスト装置用ケーブルトレイ組立体

Info

Publication number
JP2002512691A
JP2002512691A JP54744998A JP54744998A JP2002512691A JP 2002512691 A JP2002512691 A JP 2002512691A JP 54744998 A JP54744998 A JP 54744998A JP 54744998 A JP54744998 A JP 54744998A JP 2002512691 A JP2002512691 A JP 2002512691A
Authority
JP
Japan
Prior art keywords
cable
tray
manipulator
handling system
housing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
JP54744998A
Other languages
English (en)
Japanese (ja)
Other versions
JP2002512691A5 (https=
Inventor
カーター・ネイビル
ベーカー・デービット・エイ
Original Assignee
クリーダンス システムズ コーポレイション
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by クリーダンス システムズ コーポレイション filed Critical クリーダンス システムズ コーポレイション
Publication of JP2002512691A publication Critical patent/JP2002512691A/ja
Publication of JP2002512691A5 publication Critical patent/JP2002512691A5/ja
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D21/00—Measuring or testing not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Manipulator (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP54744998A 1997-04-30 1998-04-30 テスト装置用ケーブルトレイ組立体 Ceased JP2002512691A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US08/846,350 US5821440A (en) 1997-04-30 1997-04-30 Cable tray assembly for testing device
US08/846,350 1997-04-30
PCT/US1998/008925 WO1998049526A1 (en) 1997-04-30 1998-04-30 Cable tray assembly for testing device

Publications (2)

Publication Number Publication Date
JP2002512691A true JP2002512691A (ja) 2002-04-23
JP2002512691A5 JP2002512691A5 (https=) 2005-11-24

Family

ID=25297653

Family Applications (1)

Application Number Title Priority Date Filing Date
JP54744998A Ceased JP2002512691A (ja) 1997-04-30 1998-04-30 テスト装置用ケーブルトレイ組立体

Country Status (6)

Country Link
US (1) US5821440A (https=)
EP (1) EP0979389B1 (https=)
JP (1) JP2002512691A (https=)
KR (1) KR20010020428A (https=)
DE (1) DE69824957T2 (https=)
WO (1) WO1998049526A1 (https=)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006516733A (ja) * 2003-01-28 2006-07-06 インテスト　アイピー　コーポレイション テストヘッドの位置決め用リストジョイント
JP2015058514A (ja) * 2013-09-19 2015-03-30 蛇の目ミシン工業株式会社 卓上ロボット

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ATE205303T1 (de) * 1995-02-23 2001-09-15 Aesop Inc Manipulator für einen testkopf einer automatischen testanlage
US6006616A (en) * 1997-07-11 1999-12-28 Credence Systems Corporation Semiconductor tester with power assist for vertical test head movement
US5949002A (en) * 1997-11-12 1999-09-07 Teradyne, Inc. Manipulator for automatic test equipment with active compliance
US6837125B1 (en) * 1999-07-14 2005-01-04 Teradyne, Inc. Automatic test manipulator with support internal to test head
US6396257B1 (en) 2000-04-26 2002-05-28 Credence Systems Corporation Test head manipulator for semiconductor tester with manual assist for vertical test head movement
US6646431B1 (en) 2002-01-22 2003-11-11 Elite E/M, Inc. Test head manipulator
DE10325818B3 (de) * 2003-06-06 2004-09-16 Heigl, Helmuth, Dr.-Ing. Handhabungsvorrichtung, insbesondere zum Positionieren eines Testkopfs an einer Prüfeinrichtung
JP2005091041A (ja) * 2003-09-12 2005-04-07 Advantest Corp 半導体試験装置
US7673197B2 (en) 2003-11-20 2010-03-02 Practical Engineering Inc. Polymorphic automatic test systems and methods
KR100956472B1 (ko) 2005-04-27 2010-05-07 에어 테스트 시스템즈 전자 장치들을 테스트하기 위한 장치
DE112005003600T5 (de) * 2005-06-03 2008-04-30 Advantest Corporation Halbleiter-Prüfvorrichtung
US7800382B2 (en) 2007-12-19 2010-09-21 AEHR Test Ststems System for testing an integrated circuit of a device and its method of use
US8030957B2 (en) 2009-03-25 2011-10-04 Aehr Test Systems System for testing an integrated circuit of a device and its method of use
TWI729056B (zh) 2016-01-08 2021-06-01 美商艾爾測試系統 測試器設備及測試微電子裝置的方法
EP4632390A3 (en) 2017-03-03 2026-01-14 AEHR Test Systems Electronics tester
US10635096B2 (en) 2017-05-05 2020-04-28 Honeywell International Inc. Methods for analytics-driven alarm rationalization, assessment of operator response, and incident diagnosis and related systems
US10747207B2 (en) 2018-06-15 2020-08-18 Honeywell International Inc. System and method for accurate automatic determination of “alarm-operator action” linkage for operator assessment and alarm guidance using custom graphics and control charts
CN120254561B (zh) 2020-10-07 2026-03-03 雅赫测试系统公司 电子测试器
US20240019484A1 (en) * 2022-07-05 2024-01-18 Softiron Limited Automatic Selection of Connecting Cables for In-line Test
JP2026501645A (ja) 2022-12-30 2026-01-16 エイアー テスト システムズ 電子試験器

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5241870A (en) * 1991-07-22 1993-09-07 Intest Corporation Test head manipulator
JPH0615584A (ja) * 1992-06-30 1994-01-25 Akazawa Tekkosho:Kk ワーク罫書き装置及びワーク取付装置
US5608334A (en) * 1995-04-20 1997-03-04 Intest Corporation Device testing system with cable pivot and method of installation

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006516733A (ja) * 2003-01-28 2006-07-06 インテスト　アイピー　コーポレイション テストヘッドの位置決め用リストジョイント
JP4791350B2 (ja) * 2003-01-28 2011-10-12 インテスト コーポレイション テストヘッドの位置決め用リストジョイント
JP2015058514A (ja) * 2013-09-19 2015-03-30 蛇の目ミシン工業株式会社 卓上ロボット

Also Published As

Publication number Publication date
US5821440A (en) 1998-10-13
DE69824957T2 (de) 2005-08-25
WO1998049526A1 (en) 1998-11-05
DE69824957D1 (de) 2004-08-12
EP0979389A4 (en) 2000-07-19
EP0979389B1 (en) 2004-07-07
EP0979389A1 (en) 2000-02-16
KR20010020428A (ko) 2001-03-15

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