JP2002512691A5 - - Google Patents

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Publication number
JP2002512691A5
JP2002512691A5 JP1998547449A JP54744998A JP2002512691A5 JP 2002512691 A5 JP2002512691 A5 JP 2002512691A5 JP 1998547449 A JP1998547449 A JP 1998547449A JP 54744998 A JP54744998 A JP 54744998A JP 2002512691 A5 JP2002512691 A5 JP 2002512691A5
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
JP1998547449A
Other languages
English (en)
Japanese (ja)
Other versions
JP2002512691A (ja
Filing date
Publication date
Priority claimed from US08/846,350 external-priority patent/US5821440A/en
Application filed filed Critical
Publication of JP2002512691A publication Critical patent/JP2002512691A/ja
Publication of JP2002512691A5 publication Critical patent/JP2002512691A5/ja
Ceased legal-status Critical Current

Links

JP54744998A 1997-04-30 1998-04-30 テスト装置用ケーブルトレイ組立体 Ceased JP2002512691A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US08/846,350 US5821440A (en) 1997-04-30 1997-04-30 Cable tray assembly for testing device
US08/846,350 1997-04-30
PCT/US1998/008925 WO1998049526A1 (en) 1997-04-30 1998-04-30 Cable tray assembly for testing device

Publications (2)

Publication Number Publication Date
JP2002512691A JP2002512691A (ja) 2002-04-23
JP2002512691A5 true JP2002512691A5 (https=) 2005-11-24

Family

ID=25297653

Family Applications (1)

Application Number Title Priority Date Filing Date
JP54744998A Ceased JP2002512691A (ja) 1997-04-30 1998-04-30 テスト装置用ケーブルトレイ組立体

Country Status (6)

Country Link
US (1) US5821440A (https=)
EP (1) EP0979389B1 (https=)
JP (1) JP2002512691A (https=)
KR (1) KR20010020428A (https=)
DE (1) DE69824957T2 (https=)
WO (1) WO1998049526A1 (https=)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3869465B2 (ja) * 1995-02-23 2007-01-17 テラダイン・インコーポレーテッド 自動テスト装置のテストヘッド用マニピュレータ
US6006616A (en) * 1997-07-11 1999-12-28 Credence Systems Corporation Semiconductor tester with power assist for vertical test head movement
US5949002A (en) * 1997-11-12 1999-09-07 Teradyne, Inc. Manipulator for automatic test equipment with active compliance
US6837125B1 (en) * 1999-07-14 2005-01-04 Teradyne, Inc. Automatic test manipulator with support internal to test head
US6396257B1 (en) 2000-04-26 2002-05-28 Credence Systems Corporation Test head manipulator for semiconductor tester with manual assist for vertical test head movement
US6646431B1 (en) 2002-01-22 2003-11-11 Elite E/M, Inc. Test head manipulator
WO2004070400A1 (en) * 2003-01-28 2004-08-19 Intest Ip Corporation Wrist joint for positioning a test head
DE10325818B3 (de) * 2003-06-06 2004-09-16 Heigl, Helmuth, Dr.-Ing. Handhabungsvorrichtung, insbesondere zum Positionieren eines Testkopfs an einer Prüfeinrichtung
JP2005091041A (ja) * 2003-09-12 2005-04-07 Advantest Corp 半導体試験装置
US7673197B2 (en) 2003-11-20 2010-03-02 Practical Engineering Inc. Polymorphic automatic test systems and methods
JP5085534B2 (ja) 2005-04-27 2012-11-28 エイアー テスト システムズ 電子デバイスを試験するための装置
KR100927679B1 (ko) * 2005-06-03 2009-11-20 가부시키가이샤 어드밴티스트 반도체 시험장치
US7800382B2 (en) 2007-12-19 2010-09-21 AEHR Test Ststems System for testing an integrated circuit of a device and its method of use
US8030957B2 (en) 2009-03-25 2011-10-04 Aehr Test Systems System for testing an integrated circuit of a device and its method of use
JP6291197B2 (ja) * 2013-09-19 2018-03-14 蛇の目ミシン工業株式会社 卓上ロボット
TWI782508B (zh) 2016-01-08 2022-11-01 美商艾爾測試系統 電子測試器中裝置之熱控制的方法與系統
EP3589965B1 (en) 2017-03-03 2023-12-06 AEHR Test Systems Electronics tester
US10635096B2 (en) 2017-05-05 2020-04-28 Honeywell International Inc. Methods for analytics-driven alarm rationalization, assessment of operator response, and incident diagnosis and related systems
US10747207B2 (en) 2018-06-15 2020-08-18 Honeywell International Inc. System and method for accurate automatic determination of “alarm-operator action” linkage for operator assessment and alarm guidance using custom graphics and control charts
KR102949167B1 (ko) 2020-10-07 2026-04-06 에어 테스트 시스템즈 일렉트로닉스 테스터
US20240019484A1 (en) * 2022-07-05 2024-01-18 Softiron Limited Automatic Selection of Connecting Cables for In-line Test
CN121114724A (zh) 2022-12-30 2025-12-12 雅赫测试系统公司 电子测试器

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5241870A (en) * 1991-07-22 1993-09-07 Intest Corporation Test head manipulator
JPH0615584A (ja) * 1992-06-30 1994-01-25 Akazawa Tekkosho:Kk ワーク罫書き装置及びワーク取付装置
US5608334A (en) * 1995-04-20 1997-03-04 Intest Corporation Device testing system with cable pivot and method of installation

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