KR20010020428A - 소자 테스트용 케이블 트레이 어셈블리 - Google Patents

소자 테스트용 케이블 트레이 어셈블리 Download PDF

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Publication number
KR20010020428A
KR20010020428A KR1019997010053A KR19997010053A KR20010020428A KR 20010020428 A KR20010020428 A KR 20010020428A KR 1019997010053 A KR1019997010053 A KR 1019997010053A KR 19997010053 A KR19997010053 A KR 19997010053A KR 20010020428 A KR20010020428 A KR 20010020428A
Authority
KR
South Korea
Prior art keywords
cable
tray
cable tray
manipulator
housing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
KR1019997010053A
Other languages
English (en)
Korean (ko)
Inventor
카터나빌
베이커데이빗에이.
Original Assignee
오쿠모토 리차드
크레던스 시스템스 코포레이션
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 오쿠모토 리차드, 크레던스 시스템스 코포레이션 filed Critical 오쿠모토 리차드
Publication of KR20010020428A publication Critical patent/KR20010020428A/ko
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D21/00—Measuring or testing not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Manipulator (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
KR1019997010053A 1997-04-30 1998-04-30 소자 테스트용 케이블 트레이 어셈블리 Abandoned KR20010020428A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/846,350 US5821440A (en) 1997-04-30 1997-04-30 Cable tray assembly for testing device
US8/846,350 1997-04-30

Publications (1)

Publication Number Publication Date
KR20010020428A true KR20010020428A (ko) 2001-03-15

Family

ID=25297653

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019997010053A Abandoned KR20010020428A (ko) 1997-04-30 1998-04-30 소자 테스트용 케이블 트레이 어셈블리

Country Status (6)

Country Link
US (1) US5821440A (https=)
EP (1) EP0979389B1 (https=)
JP (1) JP2002512691A (https=)
KR (1) KR20010020428A (https=)
DE (1) DE69824957T2 (https=)
WO (1) WO1998049526A1 (https=)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ATE205303T1 (de) * 1995-02-23 2001-09-15 Aesop Inc Manipulator für einen testkopf einer automatischen testanlage
US6006616A (en) * 1997-07-11 1999-12-28 Credence Systems Corporation Semiconductor tester with power assist for vertical test head movement
US5949002A (en) * 1997-11-12 1999-09-07 Teradyne, Inc. Manipulator for automatic test equipment with active compliance
US6837125B1 (en) * 1999-07-14 2005-01-04 Teradyne, Inc. Automatic test manipulator with support internal to test head
US6396257B1 (en) 2000-04-26 2002-05-28 Credence Systems Corporation Test head manipulator for semiconductor tester with manual assist for vertical test head movement
US6646431B1 (en) 2002-01-22 2003-11-11 Elite E/M, Inc. Test head manipulator
DE04705321T1 (de) * 2003-01-28 2006-08-31 Intest Ip Corp. Handgelenk zum Positionieren eines Testkopfes
DE10325818B3 (de) * 2003-06-06 2004-09-16 Heigl, Helmuth, Dr.-Ing. Handhabungsvorrichtung, insbesondere zum Positionieren eines Testkopfs an einer Prüfeinrichtung
JP2005091041A (ja) * 2003-09-12 2005-04-07 Advantest Corp 半導体試験装置
US7673197B2 (en) 2003-11-20 2010-03-02 Practical Engineering Inc. Polymorphic automatic test systems and methods
KR100956472B1 (ko) 2005-04-27 2010-05-07 에어 테스트 시스템즈 전자 장치들을 테스트하기 위한 장치
DE112005003600T5 (de) * 2005-06-03 2008-04-30 Advantest Corporation Halbleiter-Prüfvorrichtung
US7800382B2 (en) 2007-12-19 2010-09-21 AEHR Test Ststems System for testing an integrated circuit of a device and its method of use
US8030957B2 (en) 2009-03-25 2011-10-04 Aehr Test Systems System for testing an integrated circuit of a device and its method of use
JP6291197B2 (ja) * 2013-09-19 2018-03-14 蛇の目ミシン工業株式会社 卓上ロボット
TWI729056B (zh) 2016-01-08 2021-06-01 美商艾爾測試系統 測試器設備及測試微電子裝置的方法
EP4632390A3 (en) 2017-03-03 2026-01-14 AEHR Test Systems Electronics tester
US10635096B2 (en) 2017-05-05 2020-04-28 Honeywell International Inc. Methods for analytics-driven alarm rationalization, assessment of operator response, and incident diagnosis and related systems
US10747207B2 (en) 2018-06-15 2020-08-18 Honeywell International Inc. System and method for accurate automatic determination of “alarm-operator action” linkage for operator assessment and alarm guidance using custom graphics and control charts
CN120254561B (zh) 2020-10-07 2026-03-03 雅赫测试系统公司 电子测试器
US20240019484A1 (en) * 2022-07-05 2024-01-18 Softiron Limited Automatic Selection of Connecting Cables for In-line Test
JP2026501645A (ja) 2022-12-30 2026-01-16 エイアー テスト システムズ 電子試験器

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5241870A (en) * 1991-07-22 1993-09-07 Intest Corporation Test head manipulator
JPH0615584A (ja) * 1992-06-30 1994-01-25 Akazawa Tekkosho:Kk ワーク罫書き装置及びワーク取付装置
US5608334A (en) * 1995-04-20 1997-03-04 Intest Corporation Device testing system with cable pivot and method of installation

Also Published As

Publication number Publication date
US5821440A (en) 1998-10-13
DE69824957T2 (de) 2005-08-25
WO1998049526A1 (en) 1998-11-05
JP2002512691A (ja) 2002-04-23
DE69824957D1 (de) 2004-08-12
EP0979389A4 (en) 2000-07-19
EP0979389B1 (en) 2004-07-07
EP0979389A1 (en) 2000-02-16

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Legal Events

Date Code Title Description
PA0105 International application

Patent event date: 19991029

Patent event code: PA01051R01D

Comment text: International Patent Application

PG1501 Laying open of application
A201 Request for examination
PA0201 Request for examination

Patent event code: PA02012R01D

Patent event date: 20030417

Comment text: Request for Examination of Application

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

Patent event code: PE07011S01D

Comment text: Decision to Grant Registration

Patent event date: 20050325

NORF Unpaid initial registration fee
PC1904 Unpaid initial registration fee