JP2002301697A5 - - Google Patents

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Publication number
JP2002301697A5
JP2002301697A5 JP2001360361A JP2001360361A JP2002301697A5 JP 2002301697 A5 JP2002301697 A5 JP 2002301697A5 JP 2001360361 A JP2001360361 A JP 2001360361A JP 2001360361 A JP2001360361 A JP 2001360361A JP 2002301697 A5 JP2002301697 A5 JP 2002301697A5
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JP
Japan
Prior art keywords
layer
selected area
polysilicon
silicon layer
monocrystalline silicon
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001360361A
Other languages
English (en)
Japanese (ja)
Other versions
JP2002301697A (ja
Filing date
Publication date
Priority claimed from US09/724,514 external-priority patent/US6479315B1/en
Application filed filed Critical
Publication of JP2002301697A publication Critical patent/JP2002301697A/ja
Publication of JP2002301697A5 publication Critical patent/JP2002301697A5/ja
Pending legal-status Critical Current

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JP2001360361A 2000-11-27 2001-11-27 単結晶シリコンの露光の工程を備える、マイクロメカニカルおよびマイクロオプトメカニカルな構造物を製造するための方法 Pending JP2002301697A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/724,514 2000-11-27
US09/724,514 US6479315B1 (en) 2000-11-27 2000-11-27 Process for manufacturing micromechanical and microoptomechanical structures with single crystal silicon exposure step

Publications (2)

Publication Number Publication Date
JP2002301697A JP2002301697A (ja) 2002-10-15
JP2002301697A5 true JP2002301697A5 (enExample) 2004-11-11

Family

ID=24910720

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001360361A Pending JP2002301697A (ja) 2000-11-27 2001-11-27 単結晶シリコンの露光の工程を備える、マイクロメカニカルおよびマイクロオプトメカニカルな構造物を製造するための方法

Country Status (4)

Country Link
US (2) US6479315B1 (enExample)
EP (1) EP1213259B1 (enExample)
JP (1) JP2002301697A (enExample)
DE (1) DE60128529T2 (enExample)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6614110B1 (en) * 1994-12-22 2003-09-02 Benedict G Pace Module with bumps for connection and support
US6506620B1 (en) * 2000-11-27 2003-01-14 Microscan Systems Incorporated Process for manufacturing micromechanical and microoptomechanical structures with backside metalization
JP2002334927A (ja) * 2001-05-11 2002-11-22 Hitachi Ltd 半導体装置の製造方法
KR100456526B1 (ko) * 2001-05-22 2004-11-09 삼성전자주식회사 식각저지막을 갖는 에스오아이 기판, 그 제조방법, 그위에 제작된 에스오아이 집적회로 및 그것을 사용하여에스오아이 집적회로를 제조하는 방법
US20040240034A1 (en) * 2001-11-30 2004-12-02 Scharf Bruce R. Diffraction compensation using a patterned reflector
US7172911B2 (en) * 2002-02-14 2007-02-06 Silex Microsystems Ab Deflectable microstructure and method of manufacturing the same through bonding of wafers
US6673697B2 (en) * 2002-04-03 2004-01-06 Intel Corporation Packaging microelectromechanical structures
US6858459B2 (en) * 2002-05-23 2005-02-22 Institute Of Microelectronics Method of fabricating micro-mirror switching device
KR100471153B1 (ko) * 2002-11-27 2005-03-10 삼성전기주식회사 Soi웨이퍼를 이용한 mems 디바이스의 제조 및 접지 방법
US6972255B2 (en) * 2003-07-28 2005-12-06 Freescale Semiconductor, Inc. Semiconductor device having an organic anti-reflective coating (ARC) and method therefor
US7056757B2 (en) * 2003-11-25 2006-06-06 Georgia Tech Research Corporation Methods of forming oxide masks with submicron openings and microstructures formed thereby
US7355793B2 (en) * 2004-05-19 2008-04-08 The Regents Of The University Of California Optical system applicable to improving the dynamic range of Shack-Hartmann sensors
US7067355B2 (en) * 2004-05-26 2006-06-27 Hewlett-Packard Development Company, L.P. Package having bond-sealed underbump
US20080119002A1 (en) * 2006-11-17 2008-05-22 Charles Grosjean Substrate contact for a MEMS device
US20080116534A1 (en) * 2006-11-17 2008-05-22 Charles Grosjean Substrate contact for a MEMS device
US20080119001A1 (en) * 2006-11-17 2008-05-22 Charles Grosjean Substrate contact for a mems device
US20080119003A1 (en) * 2006-11-17 2008-05-22 Charles Grosjean Substrate contact for a MEMS device
US7691746B2 (en) * 2007-07-31 2010-04-06 Hewlett-Packard Development Company, L.P. Formation of silicon nitride layer on back side of substrate
US20090088618A1 (en) 2007-10-01 2009-04-02 Arneson Michael R System and Method for Manufacturing a Swallowable Sensor Device
WO2009120900A2 (en) * 2008-03-26 2009-10-01 Endevco Corporation Interconnection system on a plane adjacent to a solid-state device structure
DE102014002824A1 (de) * 2014-02-25 2015-08-27 Northrop Grumman Litef Gmbh Verfahren zur Herstellung eines Bauteils
DE102016200494A1 (de) 2016-01-15 2017-07-20 Robert Bosch Gmbh Verfahren zum Herstellen eines mehrschichtigen MEMS-Bauelements und entsprechendes mehrschichtiges MEMS-Bauelement

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US6149190A (en) 1993-05-26 2000-11-21 Kionix, Inc. Micromechanical accelerometer for automotive applications
DE4318466B4 (de) 1993-06-03 2004-12-09 Robert Bosch Gmbh Verfahren zur Herstellung eines mikromechanischen Sensors
US5476819A (en) 1993-07-26 1995-12-19 Litton Systems, Inc. Substrate anchor for undercut silicon on insulator microstructures
DE4331798B4 (de) * 1993-09-18 2004-08-26 Robert Bosch Gmbh Verfahren zur Herstellung von mikromechanischen Bauelementen
US5589083A (en) 1993-12-11 1996-12-31 Electronics And Telecommunications Research Institute Method of manufacturing microstructure by the anisotropic etching and bonding of substrates
US5824186A (en) * 1993-12-17 1998-10-20 The Regents Of The University Of California Method and apparatus for fabricating self-assembling microstructures
US5645684A (en) 1994-03-07 1997-07-08 The Regents Of The University Of California Multilayer high vertical aspect ratio thin film structures
US5660680A (en) 1994-03-07 1997-08-26 The Regents Of The University Of California Method for fabrication of high vertical aspect ratio thin film structures
US5484073A (en) 1994-03-28 1996-01-16 I/O Sensors, Inc. Method for fabricating suspension members for micromachined sensors
US5569355A (en) 1995-01-11 1996-10-29 Center For Advanced Fiberoptic Applications Method for fabrication of microchannel electron multipliers
US6084257A (en) 1995-05-24 2000-07-04 Lucas Novasensor Single crystal silicon sensor with high aspect ratio and curvilinear structures
SE9502258D0 (sv) 1995-06-21 1995-06-21 Pharmacia Biotech Ab Method for the manufacture of a membrane-containing microstructure
DE19603829A1 (de) 1996-02-02 1997-08-07 Daimler Benz Ag Verfahren zur Herstellung von mikromechanischen Strukturen aus Silizium
US6074890A (en) 1998-01-08 2000-06-13 Rockwell Science Center, Llc Method of fabricating suspended single crystal silicon micro electro mechanical system (MEMS) devices
US5853960A (en) 1998-03-18 1998-12-29 Trw Inc. Method for producing a micro optical semiconductor lens
US6117344A (en) 1998-03-20 2000-09-12 Borealis Technical Limited Method for manufacturing low work function surfaces
US6014240A (en) 1998-12-01 2000-01-11 Xerox Corporation Method and apparatus for an integrated laser beam scanner using a carrier substrate
US6002507A (en) 1998-12-01 1999-12-14 Xerox Corpoation Method and apparatus for an integrated laser beam scanner
US6238581B1 (en) 1998-12-18 2001-05-29 Eastman Kodak Company Process for manufacturing an electro-mechanical grating device
US6362512B1 (en) 1998-12-23 2002-03-26 Xerox Corporation Microelectromechanical structures defined from silicon on insulator wafers
US6379989B1 (en) 1998-12-23 2002-04-30 Xerox Corporation Process for manufacture of microoptomechanical structures

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