JP2002048649A5 - - Google Patents

Download PDF

Info

Publication number
JP2002048649A5
JP2002048649A5 JP2000238744A JP2000238744A JP2002048649A5 JP 2002048649 A5 JP2002048649 A5 JP 2002048649A5 JP 2000238744 A JP2000238744 A JP 2000238744A JP 2000238744 A JP2000238744 A JP 2000238744A JP 2002048649 A5 JP2002048649 A5 JP 2002048649A5
Authority
JP
Japan
Prior art keywords
temperature
thermoelectric
infrared
measurement value
banks
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2000238744A
Other languages
English (en)
Japanese (ja)
Other versions
JP2002048649A (ja
JP3733847B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2000238744A priority Critical patent/JP3733847B2/ja
Priority claimed from JP2000238744A external-priority patent/JP3733847B2/ja
Publication of JP2002048649A publication Critical patent/JP2002048649A/ja
Publication of JP2002048649A5 publication Critical patent/JP2002048649A5/ja
Application granted granted Critical
Publication of JP3733847B2 publication Critical patent/JP3733847B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

JP2000238744A 2000-08-07 2000-08-07 測温計 Expired - Fee Related JP3733847B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000238744A JP3733847B2 (ja) 2000-08-07 2000-08-07 測温計

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000238744A JP3733847B2 (ja) 2000-08-07 2000-08-07 測温計

Publications (3)

Publication Number Publication Date
JP2002048649A JP2002048649A (ja) 2002-02-15
JP2002048649A5 true JP2002048649A5 (enrdf_load_stackoverflow) 2005-03-03
JP3733847B2 JP3733847B2 (ja) 2006-01-11

Family

ID=18730397

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000238744A Expired - Fee Related JP3733847B2 (ja) 2000-08-07 2000-08-07 測温計

Country Status (1)

Country Link
JP (1) JP3733847B2 (enrdf_load_stackoverflow)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4226985B2 (ja) 2003-10-06 2009-02-18 日本航空電子工業株式会社 光学センサの製造方法
JP4042707B2 (ja) * 2004-02-13 2008-02-06 株式会社デンソー 赤外線検出器
TW200936996A (en) * 2008-02-18 2009-09-01 Fortune Semiconductor Corp Temperature sensing module
JP5890261B2 (ja) 2012-06-21 2016-03-22 アズビル株式会社 温度検出範囲特定装置および方法
JP6773089B2 (ja) * 2013-02-21 2020-10-21 株式会社リコー デバイス
JP6166150B2 (ja) * 2013-10-29 2017-07-19 アルプス電気株式会社 受光装置
DE102013114202A1 (de) * 2013-12-17 2015-06-18 Endress + Hauser Wetzer Gmbh + Co. Kg PYROMETER und Verfahren zur Temperaturmessung
CN111854959B (zh) * 2019-04-26 2023-10-24 肖殿清 一种耳机式远红外连续耳温及生理参数测量装置
CN114858289B (zh) * 2022-07-07 2022-10-04 深圳市兆兴博拓科技股份有限公司 一种红外传感测试装置

Similar Documents

Publication Publication Date Title
JP2001349787A5 (enrdf_load_stackoverflow)
US6300554B1 (en) Method of fabricating thermoelectric sensor and thermoelectric sensor device
US20010013831A1 (en) Non-contacting temperature sensing device
US4081678A (en) Through-the-lens thermometer apparatus
KR19980073511A (ko) 적외선 센서 및 그의 온도 보상방법
JP2002048649A5 (enrdf_load_stackoverflow)
JP2009002739A (ja) 放射温度計
CN110268239A (zh) 具有滤波器和透镜阵列的成像传感器
US20110049368A1 (en) Radiation detector with microstructured silicon
JP2008145133A (ja) 放射温度計
US20120199743A1 (en) Terahertz dispersive spectrometer system
JPH0666639A (ja) 赤外線温度計
US20250012635A1 (en) Correction for non-radiation heat-flows in infrared temperature sensor
JPH0337530A (ja) 放射温度計
JP3733847B2 (ja) 測温計
JPH07301679A (ja) 人体検出装置
JP3101190B2 (ja) 赤外線検出装置
CN105051507B (zh) 具有改进的光学系统的医用温度计
JPH0235322A (ja) 放射体温計
JP2771277B2 (ja) 赤外線センサ
JP2011179828A (ja) 多波長赤外線アレイセンサ
JPS63286729A (ja) サ−モパイル検出装置
JP2007248201A (ja) 放射温度計
JP2001349785A5 (enrdf_load_stackoverflow)
RU2622239C1 (ru) Устройство для бесконтактного измерения температуры объекта