JP2000517000A - マイクロ波プラズマ電極のアレイを有するプラズマcvd装置及びプラズマcvd方法 - Google Patents
マイクロ波プラズマ電極のアレイを有するプラズマcvd装置及びプラズマcvd方法Info
- Publication number
- JP2000517000A JP2000517000A JP10511256A JP51125698A JP2000517000A JP 2000517000 A JP2000517000 A JP 2000517000A JP 10511256 A JP10511256 A JP 10511256A JP 51125698 A JP51125698 A JP 51125698A JP 2000517000 A JP2000517000 A JP 2000517000A
- Authority
- JP
- Japan
- Prior art keywords
- plasma
- pulse
- microwave
- electrodes
- plasma cvd
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005268 plasma chemical vapour deposition Methods 0.000 title claims abstract description 34
- 238000000034 method Methods 0.000 claims abstract description 35
- 230000005284 excitation Effects 0.000 claims abstract description 16
- 238000000151 deposition Methods 0.000 claims abstract description 8
- 230000008021 deposition Effects 0.000 claims abstract description 7
- 239000010409 thin film Substances 0.000 claims description 17
- 239000000758 substrate Substances 0.000 claims description 16
- 238000005229 chemical vapour deposition Methods 0.000 claims description 5
- 230000005684 electric field Effects 0.000 claims description 3
- 238000005461 lubrication Methods 0.000 claims 1
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 claims 1
- 239000007789 gas Substances 0.000 description 27
- 238000000576 coating method Methods 0.000 description 11
- 239000011248 coating agent Substances 0.000 description 10
- 239000000203 mixture Substances 0.000 description 5
- 239000010408 film Substances 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- 229910004298 SiO 2 Inorganic materials 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000002452 interceptive effect Effects 0.000 description 2
- 230000001105 regulatory effect Effects 0.000 description 2
- 241000761427 Boraras micros Species 0.000 description 1
- 230000006978 adaptation Effects 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 238000009675 coating thickness measurement Methods 0.000 description 1
- 230000001276 controlling effect Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 238000009501 film coating Methods 0.000 description 1
- 239000005357 flat glass Substances 0.000 description 1
- -1 hexamethylene disiloxane Chemical class 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 230000010363 phase shift Effects 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- 230000002123 temporal effect Effects 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 238000011282 treatment Methods 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32192—Microwave generated discharge
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/40—Oxides
- C23C16/401—Oxides containing silicon
- C23C16/402—Silicon dioxide
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
- C23C16/511—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using microwave discharges
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/54—Apparatus specially adapted for continuous coating
- C23C16/545—Apparatus specially adapted for continuous coating for coating elongated substrates
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Metallurgy (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- General Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Inorganic Chemistry (AREA)
- Analytical Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
Description
Claims (1)
- 【特許請求の範囲】 1. マイクロ波プラズマ電極(2a,b,c,d)のアレイと制御回路(7) とを有するプラズマCVD装置において、 隣り合った2つのプラズマ電極(2a,2b;2b,2c;2c,2d)には 、制御回路(7)によって種々の時間にマイクロ波パルス(A,B)が印加され 、前記個別マイクロ波パルス(A,B)の期間は、公知のプラズマパルスCVD 方法のパルスの期間に比して短いことを特徴とするプラズマCVD装置。 2. 個別マイクロ波パルスの期間は、高々50μ秒である請求項1記載のプラ ズマCVD装置。 3. 全てのプラズマ電極(2a−2d)の幾つかの、101〜102のオーダ ーのマイクロ波パルス(A,B)は、一緒にプラズマCVD方法の1つパルスを 形成する請求項1記載のプラズマCVD装置。 4. 付加的に1つの無線周波励起系(6,61,62a−c)が設けられてい る請求項1,2又は3記載のプラズマCVD装置。 5. リニアアレイが設けられている請求項1〜4までのいずれか1記載のプラ ズマCVD装置。 6. 各2つのプラズマ電極(2a,2c;2b,2d)には、リニアアレイ内 で制御回路(7)によっ て同じ時間でマイクロ波パルス(A,B)が印加される請求項5記載のプラズマ CVD装置。 7. マイクロ波プラズマ電極のアレイは、関連のプラズマをパルス状のマイク ロ波励起によって形成するプラズマCVD薄膜形成方法において、 各2つの隣り合ったプラズマ電極に種々の時間にマイクロ波パルスを印加し、 個別マイクロ波パルス(A,B)の期間を、公知プラズマパルスCVD方法のパ ルスの期間に比して短くすることを特徴とするプラズマCVD薄膜形成方法。 8. 個別マイクロ波パルスの期間を高々50μ秒にする請求項7記載のプラズ マCVD方法。 9. 全てのプラズマ電極(2a−2d)の幾つかの、101〜102のオーダ ーのマイクロ波パルス(A,B)により、一緒にプラズマパルスCVD方法の1 つのパルスを形成する請求項7記載のプラズマCVD方法。 10. 付加的に無線周波励起により、電界を形成する請求項7〜9までのいず れか1記載のプラズマCVD方法。 11. リニアアレイが設けられており、大面積基板(301)をストライプ状 に薄膜形成する請求項7〜10までのいずれか1記載のプラズマCVD方法。 12. 2つの異なった時間(A,B)だけを設け、 該時間にマイクロ波パルスを送出し、リニアアレイ内でプラズマ電極(2a−2 d)に交互に配属する請求項11記載のプラズマCVD方法。 13. 磁場又はガス出口(5)を薄膜析出の均一化のために付加的に利用する 請求項7〜12までのいずれか1記載の方法プラズマCVD方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19634795.5 | 1996-08-29 | ||
DE19634795A DE19634795C2 (de) | 1996-08-29 | 1996-08-29 | Plasma-CVD-Anlage mit einem Array von Mikrowellen-Plasmaelektroden und Plasma-CVD-Verfahren |
PCT/EP1997/004605 WO1998008998A1 (de) | 1996-08-29 | 1997-08-23 | Plasma-cvd-anlage mit einem array von mikrowellen-plasmaelektroden und plasma-cvd-verfahren |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2000517000A true JP2000517000A (ja) | 2000-12-19 |
Family
ID=7803941
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10511256A Pending JP2000517000A (ja) | 1996-08-29 | 1997-08-23 | マイクロ波プラズマ電極のアレイを有するプラズマcvd装置及びプラズマcvd方法 |
Country Status (6)
Country | Link |
---|---|
US (1) | US6177148B1 (ja) |
EP (1) | EP0922122B1 (ja) |
JP (1) | JP2000517000A (ja) |
CA (1) | CA2264017A1 (ja) |
DE (2) | DE19634795C2 (ja) |
WO (1) | WO1998008998A1 (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007018819A (ja) * | 2005-07-06 | 2007-01-25 | Advanced Lcd Technologies Development Center Co Ltd | 処理装置および処理方法 |
JP2021064509A (ja) * | 2019-10-11 | 2021-04-22 | 東京エレクトロン株式会社 | 処理方法及びプラズマ処理装置 |
Families Citing this family (40)
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DE19643865C2 (de) * | 1996-10-30 | 1999-04-08 | Schott Glas | Plasmaunterstütztes chemisches Abscheidungsverfahren (CVD) mit entfernter Anregung eines Anregungsgases (Remote-Plasma-CVD-Verfahren) zur Beschichtung oder zur Behandlung großflächiger Substrate und Vorrichtung zur Durchführung desselben |
DE19740792A1 (de) * | 1997-09-17 | 1999-04-01 | Bosch Gmbh Robert | Verfahren zur Erzeugung eines Plasmas durch Einstrahlung von Mikrowellen |
DE19740806C2 (de) * | 1997-09-17 | 1999-10-07 | Schott Glas | Mikrotiterplatte aus Kunststoff |
DE19801320B4 (de) | 1998-01-16 | 2004-08-26 | Schott Glas | Befüllter und verschlossener Kunststoffbehälter und Verfahren zu seiner Herstellung |
FR2812665B1 (fr) * | 2000-08-01 | 2003-08-08 | Sidel Sa | Procede de depot de revetement par plasma, dispositif de mise en oeuvre du procede et revetement obtenu par un tel procede |
EP1417042B1 (de) * | 2001-03-29 | 2013-01-23 | Schott AG | Verfahren zur herstellung eines beschichteten kunststoffkörpers |
EP1253216B1 (en) * | 2001-04-27 | 2003-11-12 | European Community | Method and apparatus for sequential plasma treatment |
US20040146667A1 (en) * | 2001-06-26 | 2004-07-29 | Kenichi Hama | Manufacturing device for dlc film coated plastic container, dlc film coated plastic container, and method of manufacturing the dlc film coated plastic container |
DE10139305A1 (de) | 2001-08-07 | 2003-03-06 | Schott Glas | Verbundmaterial aus einem Substratmaterial und einem Barriereschichtmaterial |
US6845734B2 (en) * | 2002-04-11 | 2005-01-25 | Micron Technology, Inc. | Deposition apparatuses configured for utilizing phased microwave radiation |
US7399500B2 (en) | 2002-08-07 | 2008-07-15 | Schott Ag | Rapid process for the production of multilayer barrier layers |
EP1388593B1 (de) * | 2002-08-07 | 2015-12-30 | Schott AG | Schnelles Verfahren zur Herstellung von Mehrfachlagen-Barriereschichten |
EP1388594B1 (de) * | 2002-08-07 | 2010-01-06 | Schott Ag | Verfahren zum Herstellen von glatten Barriereschichten und Verbundmaterial mit glatter Barriereschicht |
DE10258678B4 (de) * | 2002-12-13 | 2004-12-30 | Schott Ag | Schnelles Verfahren zur Herstellung von Multilayer-Barriereschichten |
WO2005047549A1 (de) * | 2003-11-15 | 2005-05-26 | Basf Aktiengesellschaft | Mit einer zurichtung versehener träger |
US20050224343A1 (en) * | 2004-04-08 | 2005-10-13 | Richard Newcomb | Power coupling for high-power sputtering |
US20060065524A1 (en) * | 2004-09-30 | 2006-03-30 | Richard Newcomb | Non-bonded rotatable targets for sputtering |
US20060096855A1 (en) * | 2004-11-05 | 2006-05-11 | Richard Newcomb | Cathode arrangement for atomizing a rotatable target pipe |
JP2006323721A (ja) * | 2005-05-20 | 2006-11-30 | Fuji Xerox Co Ltd | データ管理システム及びデータサーバ及びデータ管理方法 |
US20060278524A1 (en) * | 2005-06-14 | 2006-12-14 | Stowell Michael W | System and method for modulating power signals to control sputtering |
DE102005040266A1 (de) | 2005-08-24 | 2007-03-01 | Schott Ag | Verfahren und Vorrichtung zur innenseitigen Plasmabehandlung von Hohlkörpern |
US20070095281A1 (en) * | 2005-11-01 | 2007-05-03 | Stowell Michael W | System and method for power function ramping of microwave liner discharge sources |
US7842355B2 (en) * | 2005-11-01 | 2010-11-30 | Applied Materials, Inc. | System and method for modulation of power and power related functions of PECVD discharge sources to achieve new film properties |
EP1918967B1 (en) * | 2006-11-02 | 2013-12-25 | Dow Corning Corporation | Method of forming a film by deposition from a plasma |
DE102007016360A1 (de) | 2007-04-03 | 2008-10-09 | Leibniz-Institut Für Neue Materialien Gemeinnützige Gmbh | Verfahren zum Erzeugen von kratzfesten Schichten auf einem Substrat |
BRPI0916880B1 (pt) | 2008-08-04 | 2019-12-10 | Agc Flat Glass Na Inc | fonte de plasma e método de formar revestimento que utiliza deposição química a vapor melhorada de plasma e revestimento |
DE102008062619B8 (de) * | 2008-12-10 | 2012-03-29 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Mikrowellenplasmaquelle und Verfahren zur Bildung eines linear langgestreckten Plasmas beiAtmosphärendruckbedingungen |
DE102010000001A1 (de) * | 2010-01-04 | 2011-07-07 | Roth & Rau AG, 09337 | Inline-Beschichtungsanlage |
DE102010035593B4 (de) * | 2010-08-27 | 2014-07-10 | Hq-Dielectrics Gmbh | Verfahren und Vorrichtung zum Behandeln eines Substrats mittels eines Plasmas |
TWI465158B (zh) * | 2011-01-12 | 2014-12-11 | Ind Tech Res Inst | 微波電漿激發裝置 |
WO2014146008A2 (en) * | 2013-03-15 | 2014-09-18 | Starfire Industries Llc | Scalable multi-role surface-wave plasma generator |
ES2900321T3 (es) | 2014-12-05 | 2022-03-16 | Agc Flat Glass Na Inc | Fuente de plasma que utiliza un recubrimiento de reducción de macropartículas y procedimiento para usar una fuente de plasma que utiliza un recubrimiento de reducción de macropartículas para la deposición de recubrimientos de película delgada y modificación de superficies |
CN107852805B (zh) | 2014-12-05 | 2020-10-16 | Agc玻璃欧洲公司 | 空心阴极等离子体源 |
US9721765B2 (en) | 2015-11-16 | 2017-08-01 | Agc Flat Glass North America, Inc. | Plasma device driven by multiple-phase alternating or pulsed electrical current |
US9721764B2 (en) | 2015-11-16 | 2017-08-01 | Agc Flat Glass North America, Inc. | Method of producing plasma by multiple-phase alternating or pulsed electrical current |
US10242846B2 (en) | 2015-12-18 | 2019-03-26 | Agc Flat Glass North America, Inc. | Hollow cathode ion source |
US10573499B2 (en) | 2015-12-18 | 2020-02-25 | Agc Flat Glass North America, Inc. | Method of extracting and accelerating ions |
JP6694736B2 (ja) * | 2016-03-14 | 2020-05-20 | 東京エレクトロン株式会社 | プラズマ処理装置及びプラズマ処理方法 |
DE102018132700A1 (de) | 2018-12-18 | 2020-06-18 | Krones Ag | Vorrichtung und Verfahren zum Beschichten und insbesondere Plasmabeschichten von Behältnissen |
US12000049B2 (en) | 2021-12-22 | 2024-06-04 | Rtx Corporation | Alternating and continuous microwave fiber tow coating thermo-chemical reactor furnace |
Family Cites Families (11)
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DE3010314C2 (de) * | 1980-03-18 | 1982-01-07 | Beerwald, Hans, Dr.Rer.Nat., 5370 Kall | Verfahren zur innenbeschichtung von elektrisch nicht leitfähigen Rohren mittels Gasentladungen |
DE3830249A1 (de) * | 1988-09-06 | 1990-03-15 | Schott Glaswerke | Plasmaverfahren zum beschichten ebener substrate |
DE3830622A1 (de) * | 1988-09-09 | 1990-03-15 | Schott Glaswerke | Verfahren zur herstellung einer preform nach dem picvd-verfahren |
JPH03111577A (ja) * | 1989-09-26 | 1991-05-13 | Idemitsu Petrochem Co Ltd | マイクロ波プラズマ発生装置およびそれを利用するダイヤモンド膜の製造方法 |
DE4008405C1 (ja) * | 1990-03-16 | 1991-07-11 | Schott Glaswerke, 6500 Mainz, De | |
JP2581255B2 (ja) * | 1990-04-02 | 1997-02-12 | 富士電機株式会社 | プラズマ処理方法 |
DE4034211C1 (en) * | 1990-10-27 | 1991-11-14 | Schott Glaswerke, 6500 Mainz, De | Coating interior of pipe-glass tube - comprises coupling HF energy to tube using resonator to deliver pulsed microwave discharges |
DE4228853C2 (de) * | 1991-09-18 | 1993-10-21 | Schott Glaswerke | Optischer Wellenleiter mit einem planaren oder nur geringfügig gewölbten Substrat und Verfahren zu dessen Herstellung sowie Verwendung eines solchen |
DE4137606C1 (ja) * | 1991-11-15 | 1992-07-30 | Schott Glaswerke, 6500 Mainz, De | |
DE4334572C2 (de) * | 1992-10-26 | 1995-12-07 | Schott Glaswerke | Verfahren und Vorrichtung zur Beschichtung der Innenfläche stark gewölbter im wesentlichen kalottenförmiger Substrate mittels CVD |
US5975014A (en) * | 1996-07-08 | 1999-11-02 | Asm Japan K.K. | Coaxial resonant multi-port microwave applicator for an ECR plasma source |
-
1996
- 1996-08-29 DE DE19634795A patent/DE19634795C2/de not_active Expired - Fee Related
-
1997
- 1997-08-23 JP JP10511256A patent/JP2000517000A/ja active Pending
- 1997-08-23 US US09/254,061 patent/US6177148B1/en not_active Expired - Lifetime
- 1997-08-23 DE DE59709516T patent/DE59709516D1/de not_active Expired - Lifetime
- 1997-08-23 EP EP97940121A patent/EP0922122B1/de not_active Expired - Lifetime
- 1997-08-23 CA CA002264017A patent/CA2264017A1/en not_active Abandoned
- 1997-08-23 WO PCT/EP1997/004605 patent/WO1998008998A1/de active IP Right Grant
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007018819A (ja) * | 2005-07-06 | 2007-01-25 | Advanced Lcd Technologies Development Center Co Ltd | 処理装置および処理方法 |
JP2021064509A (ja) * | 2019-10-11 | 2021-04-22 | 東京エレクトロン株式会社 | 処理方法及びプラズマ処理装置 |
JP7292173B2 (ja) | 2019-10-11 | 2023-06-16 | 東京エレクトロン株式会社 | 処理方法及びプラズマ処理装置 |
Also Published As
Publication number | Publication date |
---|---|
DE19634795C2 (de) | 1999-11-04 |
DE19634795A1 (de) | 1998-03-05 |
US6177148B1 (en) | 2001-01-23 |
WO1998008998A1 (de) | 1998-03-05 |
EP0922122A1 (de) | 1999-06-16 |
EP0922122B1 (de) | 2003-03-12 |
CA2264017A1 (en) | 1998-03-05 |
DE59709516D1 (de) | 2003-04-17 |
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