JP2000503407A - 微分走査カロリーメータ - Google Patents

微分走査カロリーメータ

Info

Publication number
JP2000503407A
JP2000503407A JP10521855A JP52185598A JP2000503407A JP 2000503407 A JP2000503407 A JP 2000503407A JP 10521855 A JP10521855 A JP 10521855A JP 52185598 A JP52185598 A JP 52185598A JP 2000503407 A JP2000503407 A JP 2000503407A
Authority
JP
Japan
Prior art keywords
sample
temperature
current
thin film
area
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
JP10521855A
Other languages
English (en)
Japanese (ja)
Other versions
JP2000503407A5 (enExample
Inventor
エル． ダンレイ，ロバート
アール．ジュニア リーダー，ジョン
ダブリュ． シェファー，ジョン
Original Assignee
ティーエイ インストゥルメンツ，インコーポレイティド
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=21862838&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=JP2000503407(A) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by ティーエイ インストゥルメンツ，インコーポレイティド filed Critical ティーエイ インストゥルメンツ，インコーポレイティド
Publication of JP2000503407A publication Critical patent/JP2000503407A/ja
Publication of JP2000503407A5 publication Critical patent/JP2000503407A5/ja
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/20—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity
    • G01N25/48—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation
    • G01N25/4806—Details not adapted to a particular type of sample
    • G01N25/4813—Details not adapted to a particular type of sample concerning the measuring means
    • G01N25/482—Details not adapted to a particular type of sample concerning the measuring means concerning the temperature responsive elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K17/00—Measuring quantity of heat
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/20—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity
    • G01N25/48—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation
    • G01N25/4806—Details not adapted to a particular type of sample
    • G01N25/4826—Details not adapted to a particular type of sample concerning the heating or cooling arrangements
    • G01N25/4833—Details not adapted to a particular type of sample concerning the heating or cooling arrangements specially adapted for temperature scanning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/20—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity
    • G01N25/48—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation
    • G01N25/4846—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation for a motionless, e.g. solid sample
    • G01N25/4866—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation for a motionless, e.g. solid sample by using a differential method

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Combustion & Propulsion (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
JP10521855A 1996-11-01 1997-10-31 微分走査カロリーメータ Ceased JP2000503407A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US3205196P 1996-11-01 1996-11-01
US60/032,051 1996-11-01
PCT/US1997/020523 WO1998020314A2 (en) 1996-11-01 1997-10-31 Differential scanning calorimeter

Publications (2)

Publication Number Publication Date
JP2000503407A true JP2000503407A (ja) 2000-03-21
JP2000503407A5 JP2000503407A5 (enExample) 2005-07-14

Family

ID=21862838

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10521855A Ceased JP2000503407A (ja) 1996-11-01 1997-10-31 微分走査カロリーメータ

Country Status (5)

Country Link
US (1) US5842788A (enExample)
EP (1) EP0883801B1 (enExample)
JP (1) JP2000503407A (enExample)
DE (1) DE69730699T2 (enExample)
WO (1) WO1998020314A2 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011523060A (ja) * 2008-06-06 2011-08-04 パーキンエルマー・ヘルス・サイエンシズ・インコーポレーテッド 熱量計およびそれを用いる方法ならびにそのための制御システム

Families Citing this family (36)

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US5549387A (en) * 1994-06-01 1996-08-27 The Perkin-Elmer Corporation Apparatus and method for differential analysis using real and imaginary signal components
TW473518B (en) 1995-07-28 2002-01-21 Ciba Sc Holding Ag Soluble chromophores containing solubilising groups which can be easily removed
US5965606A (en) * 1995-12-29 1999-10-12 Allergan Sales, Inc. Methods of treatment with compounds having RAR.sub.α receptor specific or selective activity
US5823677A (en) * 1996-03-18 1998-10-20 The Board Of Trustees Of Western Michigan Method of identifying a substance by infrared imaging
USD412991S (en) 1997-01-16 1999-08-17 The Perkin-Elmer Corp. Enclosure for analytical instrumentation
HU224150B1 (hu) * 1997-04-24 2005-06-28 Paulik Edit Bessenyeyné Hőmérsékletszabályozó eljárás és berendezés termikus fázisátalakulás vizsgálatára
US6079873A (en) * 1997-10-20 2000-06-27 The United States Of America As Represented By The Secretary Of Commerce Micron-scale differential scanning calorimeter on a chip
JP3434694B2 (ja) * 1997-12-01 2003-08-11 セイコーインスツルメンツ株式会社 示差走査熱量計
DE19757258C2 (de) * 1997-12-23 2001-02-08 Heraeus Electro Nite Int Sensor mit temperaturabhängigem Meßwiderstand und dessen Verwendung zur Temperaturmessung
JP3137605B2 (ja) * 1998-07-14 2001-02-26 セイコーインスツルメンツ株式会社 熱流束型示差走査熱量計
US6488406B2 (en) 2000-03-23 2002-12-03 Ta Instruments-Waters, Llc Differential scanning calorimeter
US6561692B2 (en) * 2000-03-23 2003-05-13 Ta Instruments-Waters Llc Differential scanning calorimeter
US6428203B1 (en) * 2000-03-23 2002-08-06 Ta Instruments, Inc. Power compensation differential scanning calorimeter
US6431747B1 (en) * 2000-03-23 2002-08-13 Ta Instruments, Inc. Heat flux differential scanning calorimeter sensor
DE60133380T2 (de) * 2000-05-08 2009-04-02 Ttp Labtech Ltd., Royston Mikrophysiomessgerät
US6497509B2 (en) 2000-06-08 2002-12-24 Perkinelmer Instruments Llc Method for measuring absolute value of thermal conductivity
US6843595B2 (en) * 2001-01-26 2005-01-18 Waters Investment Limited Differential scanning calorimeter accounting for heat leakage
US6641300B1 (en) 2001-01-29 2003-11-04 Waters Investment, Ltd. Differential scanning calorimeter
DE60142083D1 (de) * 2001-06-08 2010-06-17 Perkinelmer Health Sci Inc Verfahren zur messung des absolutwerts der wärmeleitfähigkeit
US6491426B1 (en) 2001-06-25 2002-12-10 Sbs Technologies Inc. Thermal bond verification
US6648504B2 (en) 2002-03-01 2003-11-18 Waters Investment Limited System and method for calibrating contact thermal resistances in differential scanning calorimeters
DE10227182B4 (de) * 2002-06-18 2013-01-31 Mettler-Toledo Ag Probenhalter für die Differenz-Thermoanalyse
NL1021400C2 (nl) * 2002-09-05 2004-03-08 Tno Werkwijze en inrichting voor het bepalen van een faseovergang van een stof.
US20040148051A1 (en) * 2003-01-28 2004-07-29 Omnova Solutions, Inc. Modeling method and program for in-mold coating an injection molded thermoplastic article
IL162091A (en) * 2004-05-20 2008-11-03 Ecoclim Ltd System for measuring heat flow
DE602005000853D1 (de) * 2004-07-02 2007-05-24 Vivactis Nv Messung der Wärme erzeugt durch einen chemischen oder biologischen Prozess.
GB0605683D0 (en) 2006-03-21 2006-05-03 Servomex Group Ltd Thermal conductivity sensor
US7470057B2 (en) * 2006-08-24 2008-12-30 Waters Investments Limited Differential scanning calorimeter sensor and method
JP2008089474A (ja) * 2006-10-03 2008-04-17 Rigaku Corp 熱分析装置のセンサユニットおよびその製造方法
US9464947B2 (en) * 2012-10-19 2016-10-11 Okazaki Manufacturing Company Cryogenic temperature measuring resistor element
EP2921833B1 (de) * 2014-03-18 2016-12-28 Mettler-Toledo GmbH Thermoanalytischer Sensor und Verfahren zu dessen Herstellung
JP6682485B2 (ja) * 2017-09-12 2020-04-15 エスペック株式会社 熱容量測定装置及び熱容量測定方法
US11359979B2 (en) * 2018-06-01 2022-06-14 Analog Devices International Unlimited Company Hybrid temperature sensor
US11474054B2 (en) * 2018-10-22 2022-10-18 Equistar Chemicals, Lp Temperature control apparatuses and methods
WO2020088151A1 (zh) * 2018-10-29 2020-05-07 中国科学院上海硅酸盐研究所 一种用于热分析仪器的炉体及具备该炉体的热分析仪器
CN110530924A (zh) * 2019-08-08 2019-12-03 西安交通大学 一种可施加电场的dsc电极系统

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3675465A (en) * 1969-10-07 1972-07-11 Gunter Sommer Apparatus and method for differential thermal analysis
US3747396A (en) * 1971-07-09 1973-07-24 Perkin Elmer Corp Linearizing circuit for a ramp generator in a differential scanning calorimeter
US4102199A (en) * 1976-08-26 1978-07-25 Megasystems, Inc. RTD measurement system
US4255961A (en) * 1978-10-17 1981-03-17 University Of Va. Alumni Patents Foundation Differential calorimeter based on the heat leak principle
US4350446A (en) * 1980-11-03 1982-09-21 E. I. Du Pont De Nemours And Company Method and apparatus for calorimetric differential thermal analysis
US4590669A (en) * 1984-11-13 1986-05-27 Netsushin Co., Ltd. Method of preparing resistance thermometer
HU194405B (en) * 1985-05-10 1988-01-28 Magyar Optikai Muevek Temperature control system for testing thermic phase transformations
DE3517693A1 (de) * 1985-05-14 1986-11-20 Bodenseewerk Perkin-Elmer & Co GmbH, 7770 Überlingen Verfahren und vorrichtung zur dynamischen-leistungs-differenz-kalorimetrie
DE3529489A1 (de) * 1985-08-16 1987-02-26 Max Planck Gesellschaft Verfahren und einrichtung zum bestimmen der waermekapazitaet einer probe
US4971452A (en) * 1988-02-05 1990-11-20 Finney Philip F RTD assembly
JPH07122619B2 (ja) * 1988-10-13 1995-12-25 セイコー電子工業株式会社 分析装置
US5098196A (en) * 1991-01-04 1992-03-24 The Perkin-Elmer Corporation Circuit for heating and sensing with a single element
US5224775C2 (en) * 1992-03-02 2002-04-23 Ta Instr Inc Method and apparatus for modulated differential analysis
US5211477A (en) * 1992-05-29 1993-05-18 Ford Motor Company Method and apparatus for simultaneous differential scanning calorimetry and microdielectrometry
US5288147A (en) * 1992-11-09 1994-02-22 Ta Instruments, Inc. Thermopile differential thermal analysis sensor
JP2909950B2 (ja) * 1993-09-24 1999-06-23 セイコーインスツルメンツ株式会社 熱分析装置
US5672289A (en) * 1996-01-11 1997-09-30 The Perkin-Elmer Corporation Heater control circuit

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011523060A (ja) * 2008-06-06 2011-08-04 パーキンエルマー・ヘルス・サイエンシズ・インコーポレーテッド 熱量計およびそれを用いる方法ならびにそのための制御システム

Also Published As

Publication number Publication date
EP0883801B1 (en) 2004-09-15
EP0883801A2 (en) 1998-12-16
US5842788A (en) 1998-12-01
WO1998020314A2 (en) 1998-05-14
WO1998020314A3 (en) 1998-07-02
DE69730699T2 (de) 2005-08-18
DE69730699D1 (de) 2004-10-21
EP0883801A4 (en) 1999-04-28

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