DE69730699T2 - Differentialabtastkalorimeter - Google Patents
Differentialabtastkalorimeter Download PDFInfo
- Publication number
- DE69730699T2 DE69730699T2 DE69730699T DE69730699T DE69730699T2 DE 69730699 T2 DE69730699 T2 DE 69730699T2 DE 69730699 T DE69730699 T DE 69730699T DE 69730699 T DE69730699 T DE 69730699T DE 69730699 T2 DE69730699 T2 DE 69730699T2
- Authority
- DE
- Germany
- Prior art keywords
- sample
- temperature
- current
- output voltage
- area
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000000523 sample Substances 0.000 claims description 165
- 239000000758 substrate Substances 0.000 claims description 44
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 claims description 38
- 230000035945 sensitivity Effects 0.000 claims description 36
- 239000010409 thin film Substances 0.000 claims description 36
- 238000001514 detection method Methods 0.000 claims description 25
- 230000005284 excitation Effects 0.000 claims description 18
- 229910052697 platinum Inorganic materials 0.000 claims description 18
- 239000000919 ceramic Substances 0.000 claims description 16
- 230000004907 flux Effects 0.000 claims description 15
- 230000004044 response Effects 0.000 claims description 14
- 238000000034 method Methods 0.000 claims description 11
- 229910052594 sapphire Inorganic materials 0.000 claims description 10
- 239000010980 sapphire Substances 0.000 claims description 10
- 238000004364 calculation method Methods 0.000 claims description 8
- 239000000463 material Substances 0.000 claims description 7
- 230000001965 increasing effect Effects 0.000 claims description 6
- 239000003989 dielectric material Substances 0.000 claims description 3
- 229910052751 metal Inorganic materials 0.000 claims description 3
- 239000002184 metal Substances 0.000 claims description 3
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 claims description 2
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 claims description 2
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 claims 1
- 229910052790 beryllium Inorganic materials 0.000 claims 1
- ATBAMAFKBVZNFJ-UHFFFAOYSA-N beryllium atom Chemical compound [Be] ATBAMAFKBVZNFJ-UHFFFAOYSA-N 0.000 claims 1
- 230000002708 enhancing effect Effects 0.000 claims 1
- 239000013074 reference sample Substances 0.000 claims 1
- 238000005070 sampling Methods 0.000 claims 1
- 229910052726 zirconium Inorganic materials 0.000 claims 1
- 238000012827 research and development Methods 0.000 description 95
- 239000004020 conductor Substances 0.000 description 16
- 238000010438 heat treatment Methods 0.000 description 10
- 230000009466 transformation Effects 0.000 description 7
- 238000000113 differential scanning calorimetry Methods 0.000 description 5
- 238000005259 measurement Methods 0.000 description 5
- 238000000844 transformation Methods 0.000 description 5
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 description 4
- 230000001419 dependent effect Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 239000011521 glass Substances 0.000 description 4
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 4
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 3
- LTPBRCUWZOMYOC-UHFFFAOYSA-N beryllium oxide Inorganic materials O=[Be] LTPBRCUWZOMYOC-UHFFFAOYSA-N 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 3
- 238000005253 cladding Methods 0.000 description 3
- 238000012937 correction Methods 0.000 description 3
- 238000002474 experimental method Methods 0.000 description 3
- 239000012925 reference material Substances 0.000 description 3
- 239000004606 Fillers/Extenders Substances 0.000 description 2
- 238000009529 body temperature measurement Methods 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- -1 for example Substances 0.000 description 2
- 239000010410 layer Substances 0.000 description 2
- 238000001565 modulated differential scanning calorimetry Methods 0.000 description 2
- 210000004985 myeloid-derived suppressor cell Anatomy 0.000 description 2
- 239000000615 nonconductor Substances 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- FRWYFWZENXDZMU-UHFFFAOYSA-N 2-iodoquinoline Chemical compound C1=CC=CC2=NC(I)=CC=C21 FRWYFWZENXDZMU-UHFFFAOYSA-N 0.000 description 1
- 101100232929 Caenorhabditis elegans pat-4 gene Proteins 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- WYTGDNHDOZPMIW-RCBQFDQVSA-N alstonine Natural products C1=CC2=C3C=CC=CC3=NC2=C2N1C[C@H]1[C@H](C)OC=C(C(=O)OC)[C@H]1C2 WYTGDNHDOZPMIW-RCBQFDQVSA-N 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000004455 differential thermal analysis Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000005566 electron beam evaporation Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000011224 oxide ceramic Substances 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 238000005240 physical vapour deposition Methods 0.000 description 1
- 239000011241 protective layer Substances 0.000 description 1
- 238000001552 radio frequency sputter deposition Methods 0.000 description 1
- 230000002441 reversible effect Effects 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 239000000725 suspension Substances 0.000 description 1
- 239000002470 thermal conductor Substances 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/20—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity
- G01N25/48—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation
- G01N25/4806—Details not adapted to a particular type of sample
- G01N25/4813—Details not adapted to a particular type of sample concerning the measuring means
- G01N25/482—Details not adapted to a particular type of sample concerning the measuring means concerning the temperature responsive elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K17/00—Measuring quantity of heat
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/20—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity
- G01N25/48—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation
- G01N25/4806—Details not adapted to a particular type of sample
- G01N25/4826—Details not adapted to a particular type of sample concerning the heating or cooling arrangements
- G01N25/4833—Details not adapted to a particular type of sample concerning the heating or cooling arrangements specially adapted for temperature scanning
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/20—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity
- G01N25/48—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation
- G01N25/4846—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation for a motionless, e.g. solid sample
- G01N25/4866—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation for a motionless, e.g. solid sample by using a differential method
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Combustion & Propulsion (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US3205196P | 1996-11-01 | 1996-11-01 | |
| US32051P | 1996-11-01 | ||
| PCT/US1997/020523 WO1998020314A2 (en) | 1996-11-01 | 1997-10-31 | Differential scanning calorimeter |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE69730699D1 DE69730699D1 (de) | 2004-10-21 |
| DE69730699T2 true DE69730699T2 (de) | 2005-08-18 |
Family
ID=21862838
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE69730699T Expired - Fee Related DE69730699T2 (de) | 1996-11-01 | 1997-10-31 | Differentialabtastkalorimeter |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US5842788A (enExample) |
| EP (1) | EP0883801B1 (enExample) |
| JP (1) | JP2000503407A (enExample) |
| DE (1) | DE69730699T2 (enExample) |
| WO (1) | WO1998020314A2 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP2921833A1 (de) * | 2014-03-18 | 2015-09-23 | Mettler-Toledo AG | Thermoanalytischer Sensor und Verfahren zu dessen Herstellung |
Families Citing this family (36)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5549387A (en) * | 1994-06-01 | 1996-08-27 | The Perkin-Elmer Corporation | Apparatus and method for differential analysis using real and imaginary signal components |
| TW473518B (en) | 1995-07-28 | 2002-01-21 | Ciba Sc Holding Ag | Soluble chromophores containing solubilising groups which can be easily removed |
| US5965606A (en) * | 1995-12-29 | 1999-10-12 | Allergan Sales, Inc. | Methods of treatment with compounds having RAR.sub.α receptor specific or selective activity |
| US5823677A (en) * | 1996-03-18 | 1998-10-20 | The Board Of Trustees Of Western Michigan | Method of identifying a substance by infrared imaging |
| USD412991S (en) | 1997-01-16 | 1999-08-17 | The Perkin-Elmer Corp. | Enclosure for analytical instrumentation |
| HU224150B1 (hu) * | 1997-04-24 | 2005-06-28 | Paulik Edit Bessenyeyné | Hőmérsékletszabályozó eljárás és berendezés termikus fázisátalakulás vizsgálatára |
| US6079873A (en) * | 1997-10-20 | 2000-06-27 | The United States Of America As Represented By The Secretary Of Commerce | Micron-scale differential scanning calorimeter on a chip |
| JP3434694B2 (ja) * | 1997-12-01 | 2003-08-11 | セイコーインスツルメンツ株式会社 | 示差走査熱量計 |
| DE19757258C2 (de) * | 1997-12-23 | 2001-02-08 | Heraeus Electro Nite Int | Sensor mit temperaturabhängigem Meßwiderstand und dessen Verwendung zur Temperaturmessung |
| JP3137605B2 (ja) * | 1998-07-14 | 2001-02-26 | セイコーインスツルメンツ株式会社 | 熱流束型示差走査熱量計 |
| US6488406B2 (en) | 2000-03-23 | 2002-12-03 | Ta Instruments-Waters, Llc | Differential scanning calorimeter |
| US6561692B2 (en) * | 2000-03-23 | 2003-05-13 | Ta Instruments-Waters Llc | Differential scanning calorimeter |
| US6428203B1 (en) * | 2000-03-23 | 2002-08-06 | Ta Instruments, Inc. | Power compensation differential scanning calorimeter |
| US6431747B1 (en) * | 2000-03-23 | 2002-08-13 | Ta Instruments, Inc. | Heat flux differential scanning calorimeter sensor |
| DE60133380T2 (de) * | 2000-05-08 | 2009-04-02 | Ttp Labtech Ltd., Royston | Mikrophysiomessgerät |
| US6497509B2 (en) | 2000-06-08 | 2002-12-24 | Perkinelmer Instruments Llc | Method for measuring absolute value of thermal conductivity |
| US6843595B2 (en) * | 2001-01-26 | 2005-01-18 | Waters Investment Limited | Differential scanning calorimeter accounting for heat leakage |
| US6641300B1 (en) | 2001-01-29 | 2003-11-04 | Waters Investment, Ltd. | Differential scanning calorimeter |
| DE60142083D1 (de) * | 2001-06-08 | 2010-06-17 | Perkinelmer Health Sci Inc | Verfahren zur messung des absolutwerts der wärmeleitfähigkeit |
| US6491426B1 (en) | 2001-06-25 | 2002-12-10 | Sbs Technologies Inc. | Thermal bond verification |
| US6648504B2 (en) | 2002-03-01 | 2003-11-18 | Waters Investment Limited | System and method for calibrating contact thermal resistances in differential scanning calorimeters |
| DE10227182B4 (de) * | 2002-06-18 | 2013-01-31 | Mettler-Toledo Ag | Probenhalter für die Differenz-Thermoanalyse |
| NL1021400C2 (nl) * | 2002-09-05 | 2004-03-08 | Tno | Werkwijze en inrichting voor het bepalen van een faseovergang van een stof. |
| US20040148051A1 (en) * | 2003-01-28 | 2004-07-29 | Omnova Solutions, Inc. | Modeling method and program for in-mold coating an injection molded thermoplastic article |
| IL162091A (en) * | 2004-05-20 | 2008-11-03 | Ecoclim Ltd | System for measuring heat flow |
| DE602005000853D1 (de) * | 2004-07-02 | 2007-05-24 | Vivactis Nv | Messung der Wärme erzeugt durch einen chemischen oder biologischen Prozess. |
| GB0605683D0 (en) | 2006-03-21 | 2006-05-03 | Servomex Group Ltd | Thermal conductivity sensor |
| US7470057B2 (en) * | 2006-08-24 | 2008-12-30 | Waters Investments Limited | Differential scanning calorimeter sensor and method |
| JP2008089474A (ja) * | 2006-10-03 | 2008-04-17 | Rigaku Corp | 熱分析装置のセンサユニットおよびその製造方法 |
| WO2009149333A1 (en) * | 2008-06-06 | 2009-12-10 | Perkinelmer Health Sciences, Inc. | Calorimeter and methods of using it and control systems therefor |
| US9464947B2 (en) * | 2012-10-19 | 2016-10-11 | Okazaki Manufacturing Company | Cryogenic temperature measuring resistor element |
| JP6682485B2 (ja) * | 2017-09-12 | 2020-04-15 | エスペック株式会社 | 熱容量測定装置及び熱容量測定方法 |
| US11359979B2 (en) * | 2018-06-01 | 2022-06-14 | Analog Devices International Unlimited Company | Hybrid temperature sensor |
| US11474054B2 (en) * | 2018-10-22 | 2022-10-18 | Equistar Chemicals, Lp | Temperature control apparatuses and methods |
| WO2020088151A1 (zh) * | 2018-10-29 | 2020-05-07 | 中国科学院上海硅酸盐研究所 | 一种用于热分析仪器的炉体及具备该炉体的热分析仪器 |
| CN110530924A (zh) * | 2019-08-08 | 2019-12-03 | 西安交通大学 | 一种可施加电场的dsc电极系统 |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3675465A (en) * | 1969-10-07 | 1972-07-11 | Gunter Sommer | Apparatus and method for differential thermal analysis |
| US3747396A (en) * | 1971-07-09 | 1973-07-24 | Perkin Elmer Corp | Linearizing circuit for a ramp generator in a differential scanning calorimeter |
| US4102199A (en) * | 1976-08-26 | 1978-07-25 | Megasystems, Inc. | RTD measurement system |
| US4255961A (en) * | 1978-10-17 | 1981-03-17 | University Of Va. Alumni Patents Foundation | Differential calorimeter based on the heat leak principle |
| US4350446A (en) * | 1980-11-03 | 1982-09-21 | E. I. Du Pont De Nemours And Company | Method and apparatus for calorimetric differential thermal analysis |
| US4590669A (en) * | 1984-11-13 | 1986-05-27 | Netsushin Co., Ltd. | Method of preparing resistance thermometer |
| HU194405B (en) * | 1985-05-10 | 1988-01-28 | Magyar Optikai Muevek | Temperature control system for testing thermic phase transformations |
| DE3517693A1 (de) * | 1985-05-14 | 1986-11-20 | Bodenseewerk Perkin-Elmer & Co GmbH, 7770 Überlingen | Verfahren und vorrichtung zur dynamischen-leistungs-differenz-kalorimetrie |
| DE3529489A1 (de) * | 1985-08-16 | 1987-02-26 | Max Planck Gesellschaft | Verfahren und einrichtung zum bestimmen der waermekapazitaet einer probe |
| US4971452A (en) * | 1988-02-05 | 1990-11-20 | Finney Philip F | RTD assembly |
| JPH07122619B2 (ja) * | 1988-10-13 | 1995-12-25 | セイコー電子工業株式会社 | 分析装置 |
| US5098196A (en) * | 1991-01-04 | 1992-03-24 | The Perkin-Elmer Corporation | Circuit for heating and sensing with a single element |
| US5224775C2 (en) * | 1992-03-02 | 2002-04-23 | Ta Instr Inc | Method and apparatus for modulated differential analysis |
| US5211477A (en) * | 1992-05-29 | 1993-05-18 | Ford Motor Company | Method and apparatus for simultaneous differential scanning calorimetry and microdielectrometry |
| US5288147A (en) * | 1992-11-09 | 1994-02-22 | Ta Instruments, Inc. | Thermopile differential thermal analysis sensor |
| JP2909950B2 (ja) * | 1993-09-24 | 1999-06-23 | セイコーインスツルメンツ株式会社 | 熱分析装置 |
| US5672289A (en) * | 1996-01-11 | 1997-09-30 | The Perkin-Elmer Corporation | Heater control circuit |
-
1997
- 1997-10-31 WO PCT/US1997/020523 patent/WO1998020314A2/en not_active Ceased
- 1997-10-31 EP EP97945645A patent/EP0883801B1/en not_active Revoked
- 1997-10-31 US US08/962,378 patent/US5842788A/en not_active Expired - Fee Related
- 1997-10-31 JP JP10521855A patent/JP2000503407A/ja not_active Ceased
- 1997-10-31 DE DE69730699T patent/DE69730699T2/de not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP2921833A1 (de) * | 2014-03-18 | 2015-09-23 | Mettler-Toledo AG | Thermoanalytischer Sensor und Verfahren zu dessen Herstellung |
Also Published As
| Publication number | Publication date |
|---|---|
| EP0883801B1 (en) | 2004-09-15 |
| EP0883801A2 (en) | 1998-12-16 |
| US5842788A (en) | 1998-12-01 |
| JP2000503407A (ja) | 2000-03-21 |
| WO1998020314A2 (en) | 1998-05-14 |
| WO1998020314A3 (en) | 1998-07-02 |
| DE69730699D1 (de) | 2004-10-21 |
| EP0883801A4 (en) | 1999-04-28 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8363 | Opposition against the patent | ||
| 8339 | Ceased/non-payment of the annual fee |