JP2000292441A5 - - Google Patents
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- Publication number
- JP2000292441A5 JP2000292441A5 JP1999100411A JP10041199A JP2000292441A5 JP 2000292441 A5 JP2000292441 A5 JP 2000292441A5 JP 1999100411 A JP1999100411 A JP 1999100411A JP 10041199 A JP10041199 A JP 10041199A JP 2000292441 A5 JP2000292441 A5 JP 2000292441A5
- Authority
- JP
- Japan
- Prior art keywords
- probe
- probes
- slot
- insulating plate
- intersection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 description 174
- 230000000149 penetrating effect Effects 0.000 description 13
- 239000004065 semiconductor Substances 0.000 description 8
- 238000007689 inspection Methods 0.000 description 6
- 239000000853 adhesive Substances 0.000 description 4
- 230000001070 adhesive effect Effects 0.000 description 4
- 239000011159 matrix material Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000002950 deficient Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000004080 punching Methods 0.000 description 1
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10041199A JP4060984B2 (ja) | 1999-04-07 | 1999-04-07 | プローブカード |
US09/361,719 US6271674B1 (en) | 1999-04-07 | 1999-07-27 | Probe card |
TW088112662A TW434407B (en) | 1999-04-07 | 1999-07-27 | Probe card |
KR1019990031492A KR100329293B1 (ko) | 1999-04-07 | 1999-07-31 | 프로브 카드 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10041199A JP4060984B2 (ja) | 1999-04-07 | 1999-04-07 | プローブカード |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2000292441A JP2000292441A (ja) | 2000-10-20 |
JP2000292441A5 true JP2000292441A5 (enrdf_load_html_response) | 2005-08-11 |
JP4060984B2 JP4060984B2 (ja) | 2008-03-12 |
Family
ID=14273250
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10041199A Expired - Lifetime JP4060984B2 (ja) | 1999-04-07 | 1999-04-07 | プローブカード |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP4060984B2 (enrdf_load_html_response) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2003087852A1 (en) * | 2002-04-16 | 2003-10-23 | Nhk Spring Co., Ltd. | Holder for conductive contact |
JP4698374B2 (ja) * | 2005-10-05 | 2011-06-08 | 日本電子材料株式会社 | プローブの製造方法 |
JP2008003049A (ja) * | 2006-06-26 | 2008-01-10 | Micronics Japan Co Ltd | プローブ組立体 |
JP2008008730A (ja) * | 2006-06-29 | 2008-01-17 | Micronics Japan Co Ltd | プローブ組立体 |
JP4924881B2 (ja) * | 2006-11-14 | 2012-04-25 | 軍生 木本 | 電気信号接続用座標変換装置 |
TW201504631A (zh) * | 2013-07-23 | 2015-02-01 | Mpi Corp | 光電元件檢測用之高頻探針卡 |
JP7224575B2 (ja) * | 2017-05-30 | 2023-02-20 | 株式会社オリティ | プローブカード |
-
1999
- 1999-04-07 JP JP10041199A patent/JP4060984B2/ja not_active Expired - Lifetime
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