JP2000258500A5 - - Google Patents

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Publication number
JP2000258500A5
JP2000258500A5 JP1999061157A JP6115799A JP2000258500A5 JP 2000258500 A5 JP2000258500 A5 JP 2000258500A5 JP 1999061157 A JP1999061157 A JP 1999061157A JP 6115799 A JP6115799 A JP 6115799A JP 2000258500 A5 JP2000258500 A5 JP 2000258500A5
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JP
Japan
Prior art keywords
scan chains
input terminals
scan
changing
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1999061157A
Other languages
English (en)
Japanese (ja)
Other versions
JP2000258500A (ja
JP4283369B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP06115799A priority Critical patent/JP4283369B2/ja
Priority claimed from JP06115799A external-priority patent/JP4283369B2/ja
Publication of JP2000258500A publication Critical patent/JP2000258500A/ja
Priority to US10/452,195 priority patent/US7036060B2/en
Publication of JP2000258500A5 publication Critical patent/JP2000258500A5/ja
Application granted granted Critical
Publication of JP4283369B2 publication Critical patent/JP4283369B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

JP06115799A 1998-09-22 1999-03-09 半導体集積回路 Expired - Fee Related JP4283369B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP06115799A JP4283369B2 (ja) 1999-03-09 1999-03-09 半導体集積回路
US10/452,195 US7036060B2 (en) 1998-09-22 2003-06-03 Semiconductor integrated circuit and its analyzing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP06115799A JP4283369B2 (ja) 1999-03-09 1999-03-09 半導体集積回路

Publications (3)

Publication Number Publication Date
JP2000258500A JP2000258500A (ja) 2000-09-22
JP2000258500A5 true JP2000258500A5 (enrdf_load_stackoverflow) 2006-03-30
JP4283369B2 JP4283369B2 (ja) 2009-06-24

Family

ID=13163034

Family Applications (1)

Application Number Title Priority Date Filing Date
JP06115799A Expired - Fee Related JP4283369B2 (ja) 1998-09-22 1999-03-09 半導体集積回路

Country Status (1)

Country Link
JP (1) JP4283369B2 (enrdf_load_stackoverflow)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004093462A (ja) 2002-09-02 2004-03-25 Oki Electric Ind Co Ltd 半導体集積回路とその試験方法
JP4520103B2 (ja) * 2003-04-02 2010-08-04 ルネサスエレクトロニクス株式会社 スキャンテストパタン入力方法および半導体集積回路
KR20050078704A (ko) * 2004-01-31 2005-08-08 삼성전자주식회사 스캔 베이스 ａｔｐｇ 테스트회로, 테스트방법 및 스캔체인 재배열방법
JP4815326B2 (ja) * 2006-10-31 2011-11-16 富士通株式会社 集積回路のタイミング不良改善装置、並びに、集積回路のタイミング不良診断装置および方法、並びに、集積回路
JP2009042017A (ja) * 2007-08-08 2009-02-26 Nec Electronics Corp スキャンパス回路及び半導体集積回路
JP2009150726A (ja) * 2007-12-19 2009-07-09 Panasonic Corp 半導体装置
JP5421409B2 (ja) * 2012-03-02 2014-02-19 Ｗｉｔ株式会社 外観検査装置及び外観検査方法
JP6221433B2 (ja) * 2013-07-09 2017-11-01 株式会社ソシオネクスト 半導体集積回路

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