JP2000258500A5 - - Google Patents
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- JP2000258500A5 JP2000258500A5 JP1999061157A JP6115799A JP2000258500A5 JP 2000258500 A5 JP2000258500 A5 JP 2000258500A5 JP 1999061157 A JP1999061157 A JP 1999061157A JP 6115799 A JP6115799 A JP 6115799A JP 2000258500 A5 JP2000258500 A5 JP 2000258500A5
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- Prior art keywords
- scan chains
- input terminals
- scan
- changing
- circuit
- Prior art date
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- 239000004065 semiconductor Substances 0.000 description 4
Description
【特許請求の範囲】
【請求項１】
シフトスキャン方式で設計された半導体集積回路であって、
少なくとも２つのテストデータ入力端子と、
前記テストデータ入力端子よりも数の多い複数のスキャンチェーンと、
選択された１つの前記スキャンチェーンにデータを供給するために、前記少なくとも２つのテストデータ入力端子を選択的に結線し、第１のテストモードと第２のテストモードの両方において、前記少なくとも２つのテストデータ入力端子の各々を、選択された１つの前記スキャンチェーンに結線する結線変更回路と、を有し、
前記第１のテストモードにおいて前記少なくとも２つのテストデータ入力端子の各々が結線されるスキャンチェーンの組は、前記第２のテストモードにおいて少なくとも２つの入力端子の各々が結線されるスキャンチェーンの組と異なる半導体集積回路。
【請求項２】
請求項１の半導体集積回路であって、
前記スキャンチェーンの各々は、シフトレジスタとして動作する複数のフリップフロップ回路を有し、
前記結線変更回路は、少なくとも２つの前記スキャンチェーンを１つの入力端子にて相互に結線し、
全ての前記スキャンチェーンは、シフトレジスタとして同時に動作する機能を有し、
前記結線変更回路は、少なくとも２つの前記スキャンチェーンの組を変更する機能を有し、前記変更する動作は、前記結線変更回路に入力されるフェーズ信号の値に応じて実行される半導体集積回路。
【請求項３】
請求項１の半導体集積回路であって、
前記スキャンチェーンの各々は、シフトレジスタとして動作する複数のフリップフロップ回路を有し、
前記結線変更回路は、少なくとも２つの前記スキャンチェーンを１つの入力端子にて相互に結線し、
前記スキャンチェーンからデータを読み出すための出力端子の数は、前記スキャンチェーンの数よりも少なく、
全ての前記スキャンチェーンは、シフトレジスタとして同時に動作する機能を有し、
前記結線変更回路は、少なくとも２つの前記スキャンチェーンの組を変更する機能を有し、前記変更する動作は、前記結線変更回路に入力されるフェーズ信号の値に応じて実行される半導体集積回路。
[Claims]
[Claim 1]
A semiconductor integrated circuit designed by the shift scan method.
At least two test data input terminals and
With multiple scan chains, which are larger than the test data input terminals
The at least two test data input terminals are selectively connected in order to supply data to the one selected scan chain, and the at least two test data input terminals are connected in both the first test mode and the second test mode. It has a connection change circuit that connects each of the test data input terminals to one selected scan chain.
The set of scan chains in which each of the at least two test data input terminals is connected in the first test mode is the set of scan chains in which each of the at least two input terminals is connected in the second test mode. Different semiconductor integrated circuits.
2.
The semiconductor integrated circuit of claim 1.
Each of the scan chains has a plurality of flip-flop circuits that act as shift registers.
The connection change circuit connects at least two of the scan chains to each other at one input terminal.
All the scan chains have a function of operating as shift registers at the same time.
The connection changing circuit has a function of changing at least two sets of the scan chains, and the changing operation is executed according to the value of a phase signal input to the connection changing circuit.
3.
The semiconductor integrated circuit of claim 1.
Each of the scan chains has a plurality of flip-flop circuits that act as shift registers.
The connection change circuit connects at least two of the scan chains to each other at one input terminal.
The number of output terminals for reading data from the scan chain is less than the number of scan chains.
All the scan chains have a function of operating as shift registers at the same time.
The connection changing circuit has a function of changing at least two sets of the scan chains, and the changing operation is executed according to the value of a phase signal input to the connection changing circuit.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP06115799A JP4283369B2 (en) | 1999-03-09 | 1999-03-09 | Semiconductor integrated circuit |
| US10/452,195 US7036060B2 (en) | 1998-09-22 | 2003-06-03 | Semiconductor integrated circuit and its analyzing method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP06115799A JP4283369B2 (en) | 1999-03-09 | 1999-03-09 | Semiconductor integrated circuit |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2000258500A JP2000258500A (en) | 2000-09-22 |
| JP2000258500A5 true JP2000258500A5 (en) | 2006-03-30 |
| JP4283369B2 JP4283369B2 (en) | 2009-06-24 |
Family
ID=13163034
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP06115799A Expired - Fee Related JP4283369B2 (en) | 1998-09-22 | 1999-03-09 | Semiconductor integrated circuit |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP4283369B2 (en) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004093462A (en) | 2002-09-02 | 2004-03-25 | Oki Electric Ind Co Ltd | Semiconductor integrated circuit and its testing method |
| JP4520103B2 (en) * | 2003-04-02 | 2010-08-04 | ルネサスエレクトロニクス株式会社 | Scan test pattern input method and semiconductor integrated circuit |
| KR20050078704A (en) * | 2004-01-31 | 2005-08-08 | 삼성전자주식회사 | The scan based automatic test pattern generation test circuit and test method thereby and scan chain reordering method |
| JP4815326B2 (en) * | 2006-10-31 | 2011-11-16 | 富士通株式会社 | Integrated circuit timing failure improvement apparatus, integrated circuit timing failure diagnosis apparatus and method, and integrated circuit |
| JP2009042017A (en) * | 2007-08-08 | 2009-02-26 | Nec Electronics Corp | Scan path circuit and semiconductor integrated circuit |
| JP2009150726A (en) * | 2007-12-19 | 2009-07-09 | Panasonic Corp | Semiconductor device |
| JP5421409B2 (en) * | 2012-03-02 | 2014-02-19 | Ｗｉｔ株式会社 | Appearance inspection apparatus and appearance inspection method |
| JP6221433B2 (en) * | 2013-07-09 | 2017-11-01 | 株式会社ソシオネクスト | Semiconductor integrated circuit |
-
1999
- 1999-03-09 JP JP06115799A patent/JP4283369B2/en not_active Expired - Fee Related
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