ITRM910646A0 - Struttura di transistore sos e procedimento per la sua fabbricazione - Google Patents

Struttura di transistore sos e procedimento per la sua fabbricazione

Info

Publication number
ITRM910646A0
ITRM910646A0 IT91RM646A ITRM910646A ITRM910646A0 IT RM910646 A0 ITRM910646 A0 IT RM910646A0 IT 91RM646 A IT91RM646 A IT 91RM646A IT RM910646 A ITRM910646 A IT RM910646A IT RM910646 A0 ITRM910646 A0 IT RM910646A0
Authority
IT
Italy
Prior art keywords
procedure
manufacture
transistor structure
sos
sos transistor
Prior art date
Application number
IT91RM646A
Other languages
English (en)
Inventor
Byeong-Hyeok Rho
Chang-Kyu Hwang
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of ITRM910646A0 publication Critical patent/ITRM910646A0/it
Publication of ITRM910646A1 publication Critical patent/ITRM910646A1/it
Application granted granted Critical
Publication of IT1250089B publication Critical patent/IT1250089B/it

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76Unipolar devices, e.g. field effect transistors
    • H01L29/772Field effect transistors
    • H01L29/78Field effect transistors with field effect produced by an insulated gate
    • H01L29/785Field effect transistors with field effect produced by an insulated gate having a channel with a horizontal current flow in a vertical sidewall of a semiconductor body, e.g. FinFET, MuGFET
    • H01L29/7853Field effect transistors with field effect produced by an insulated gate having a channel with a horizontal current flow in a vertical sidewall of a semiconductor body, e.g. FinFET, MuGFET the body having a non-rectangular crossection
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/66007Multistep manufacturing processes
    • H01L29/66075Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
    • H01L29/66227Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
    • H01L29/66409Unipolar field-effect transistors
    • H01L29/66477Unipolar field-effect transistors with an insulated gate, i.e. MISFET
    • H01L29/66568Lateral single gate silicon transistors
    • H01L29/66613Lateral single gate silicon transistors with a gate recessing step, e.g. using local oxidation
    • H01L29/66628Lateral single gate silicon transistors with a gate recessing step, e.g. using local oxidation recessing the gate by forming single crystalline semiconductor material at the source or drain location
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/66007Multistep manufacturing processes
    • H01L29/66075Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
    • H01L29/66227Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
    • H01L29/66409Unipolar field-effect transistors
    • H01L29/66477Unipolar field-effect transistors with an insulated gate, i.e. MISFET
    • H01L29/66568Lateral single gate silicon transistors
    • H01L29/66651Lateral single gate silicon transistors with a single crystalline channel formed on the silicon substrate after insulating device isolation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/66007Multistep manufacturing processes
    • H01L29/66075Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
    • H01L29/66227Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
    • H01L29/66409Unipolar field-effect transistors
    • H01L29/66477Unipolar field-effect transistors with an insulated gate, i.e. MISFET
    • H01L29/66787Unipolar field-effect transistors with an insulated gate, i.e. MISFET with a gate at the side of the channel
    • H01L29/66795Unipolar field-effect transistors with an insulated gate, i.e. MISFET with a gate at the side of the channel with a horizontal current flow in a vertical sidewall of a semiconductor body, e.g. FinFET, MuGFET

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Manufacturing & Machinery (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Insulated Gate Type Field-Effect Transistor (AREA)
ITRM910646A 1991-05-31 1991-08-29 Struttura di transistore mos e procedimento per la sua fabbricazione. IT1250089B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019910009066A KR920022546A (ko) 1991-05-31 1991-05-31 모오스 트랜지스터의 구조 및 그 제조방법

Publications (3)

Publication Number Publication Date
ITRM910646A0 true ITRM910646A0 (it) 1991-08-29
ITRM910646A1 ITRM910646A1 (it) 1993-03-01
IT1250089B IT1250089B (it) 1995-03-30

Family

ID=19315297

Family Applications (1)

Application Number Title Priority Date Filing Date
ITRM910646A IT1250089B (it) 1991-05-31 1991-08-29 Struttura di transistore mos e procedimento per la sua fabbricazione.

Country Status (5)

Country Link
JP (1) JPH04368180A (it)
KR (1) KR920022546A (it)
DE (1) DE4127795A1 (it)
GB (1) GB2256315A (it)
IT (1) IT1250089B (it)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6762448B1 (en) * 2003-04-03 2004-07-13 Advanced Micro Devices, Inc. FinFET device with multiple fin structures
US7385247B2 (en) * 2004-01-17 2008-06-10 Samsung Electronics Co., Ltd. At least penta-sided-channel type of FinFET transistor
JPWO2006006438A1 (ja) * 2004-07-12 2008-04-24 日本電気株式会社 半導体装置及びその製造方法
US20060071270A1 (en) * 2004-09-29 2006-04-06 Shibib Muhammed A Metal-oxide-semiconductor device having trenched diffusion region and method of forming same
TWI263328B (en) * 2005-01-04 2006-10-01 Samsung Electronics Co Ltd Semiconductor devices having faceted channels and methods of fabricating such devices
JP4849504B2 (ja) * 2005-03-29 2012-01-11 ラピスセミコンダクタ株式会社 半導体装置、その製造方法、出力回路および電子機器
JP2007005568A (ja) 2005-06-23 2007-01-11 Toshiba Corp 半導体装置
JP5270817B2 (ja) * 2006-03-29 2013-08-21 株式会社東芝 3次元形状を有する半導体部材を加工する方法
CN104078356B (zh) * 2013-03-28 2016-10-05 中芯国际集成电路制造(上海)有限公司 分段沟道晶体管及其形成方法
CN104952785A (zh) * 2014-03-31 2015-09-30 中芯国际集成电路制造(上海)有限公司 半导体器件及其制作方法
CN107342327A (zh) * 2017-08-10 2017-11-10 睿力集成电路有限公司 一种半导体存储器的晶体管结构及制作方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5132075A (en) * 1974-09-11 1976-03-18 Tetsutaro Mori Senkohodenkan no tentokairo
JPS5676575A (en) * 1979-11-26 1981-06-24 Nippon Telegr & Teleph Corp <Ntt> Manufacture of junction type field effect semiconductor device
NL188776C (nl) * 1979-04-21 1992-09-16 Nippon Telegraph & Telephone Veldeffecttransistorinrichting en werkwijze voor het vervaardigen daarvan.
JPS5676576A (en) * 1979-11-26 1981-06-24 Nippon Telegr & Teleph Corp <Ntt> Semiconductor device and manufacture thereof
US4393391A (en) * 1980-06-16 1983-07-12 Supertex, Inc. Power MOS transistor with a plurality of longitudinal grooves to increase channel conducting area
FR2501913A1 (fr) * 1981-03-10 1982-09-17 Thomson Csf Transistor a effet de champ de type planar comportant des electrodes a puits metallises et procede de fabrication de ce transistor
US4583107A (en) * 1983-08-15 1986-04-15 Westinghouse Electric Corp. Castellated gate field effect transistor
FR2554639B1 (fr) * 1983-11-08 1986-02-21 Thomson Csf Transistor a effet de champ a tension de seuil reglable, et circuit integre comportant ce type de transistors
EP0167810A1 (en) * 1984-06-08 1986-01-15 Eaton Corporation Power JFET with plural lateral pinching

Also Published As

Publication number Publication date
GB9118511D0 (en) 1991-10-16
DE4127795A1 (de) 1992-12-03
JPH04368180A (ja) 1992-12-21
ITRM910646A1 (it) 1993-03-01
GB2256315A (en) 1992-12-02
KR920022546A (ko) 1992-12-19
IT1250089B (it) 1995-03-30

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Legal Events

Date Code Title Description
0001 Granted