IT1043400B - Procedimento per fobmare una zona drogata di un tipo di conduzione in un corpo di materiale semicon duttore nonche transistore fabbricato secondo tale procedimento - Google Patents
Procedimento per fobmare una zona drogata di un tipo di conduzione in un corpo di materiale semicon duttore nonche transistore fabbricato secondo tale procedimentoInfo
- Publication number
- IT1043400B IT1043400B IT28325/75A IT2832575A IT1043400B IT 1043400 B IT1043400 B IT 1043400B IT 28325/75 A IT28325/75 A IT 28325/75A IT 2832575 A IT2832575 A IT 2832575A IT 1043400 B IT1043400 B IT 1043400B
- Authority
- IT
- Italy
- Prior art keywords
- procedure
- fobmate
- droged
- conduct
- zone
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/13—Semiconductor regions connected to electrodes carrying current to be rectified, amplified or switched, e.g. source or drain regions
- H10D62/133—Emitter regions of BJTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/60—Impurity distributions or concentrations
-
- H10P32/1414—
-
- H10P32/171—
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/024—Defect control-gettering and annealing
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/122—Polycrystalline
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/124—Polycrystalline emitter
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE2449688A DE2449688C3 (de) | 1974-10-18 | 1974-10-18 | Verfahren zur Herstellung einer dotierten Zone eines Leitfähigkeitstyps in einem Halbleiterkörper |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| IT1043400B true IT1043400B (it) | 1980-02-20 |
Family
ID=5928640
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| IT28325/75A IT1043400B (it) | 1974-10-18 | 1975-10-16 | Procedimento per fobmare una zona drogata di un tipo di conduzione in un corpo di materiale semicon duttore nonche transistore fabbricato secondo tale procedimento |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US4063967A (cg-RX-API-DMAC10.html) |
| JP (1) | JPS5952533B2 (cg-RX-API-DMAC10.html) |
| CA (1) | CA1055620A (cg-RX-API-DMAC10.html) |
| DE (1) | DE2449688C3 (cg-RX-API-DMAC10.html) |
| FR (1) | FR2288391A1 (cg-RX-API-DMAC10.html) |
| GB (1) | GB1464801A (cg-RX-API-DMAC10.html) |
| IT (1) | IT1043400B (cg-RX-API-DMAC10.html) |
Families Citing this family (55)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5290273A (en) * | 1976-01-23 | 1977-07-29 | Hitachi Ltd | Semiconductor device |
| NL7604445A (nl) * | 1976-04-27 | 1977-10-31 | Philips Nv | Werkwijze ter vervaardiging van een halfgelei- derinrichting, en inrichting vervaardigd door toepassing van de werkwijze. |
| DE2627855A1 (de) * | 1976-06-22 | 1977-12-29 | Siemens Ag | Halbleiterbauelement mit wenigstens zwei, einen pn-uebergang bildenden zonen unterschiedlichen leitungstyps sowie verfahren zu dessen herstellung |
| NL7710635A (nl) * | 1977-09-29 | 1979-04-02 | Philips Nv | Werkwijze voor het vervaardigen van een halfgeleiderinrichting. |
| JPS5467778A (en) * | 1977-11-10 | 1979-05-31 | Toshiba Corp | Production of semiconductor device |
| US4190466A (en) * | 1977-12-22 | 1980-02-26 | International Business Machines Corporation | Method for making a bipolar transistor structure utilizing self-passivating diffusion sources |
| US4118250A (en) * | 1977-12-30 | 1978-10-03 | International Business Machines Corporation | Process for producing integrated circuit devices by ion implantation |
| US4155779A (en) * | 1978-08-21 | 1979-05-22 | Bell Telephone Laboratories, Incorporated | Control techniques for annealing semiconductors |
| US4214918A (en) * | 1978-10-12 | 1980-07-29 | Stanford University | Method of forming polycrystalline semiconductor interconnections, resistors and contacts by applying radiation beam |
| US4274892A (en) * | 1978-12-14 | 1981-06-23 | Trw Inc. | Dopant diffusion method of making semiconductor products |
| JPS5586151A (en) * | 1978-12-23 | 1980-06-28 | Chiyou Lsi Gijutsu Kenkyu Kumiai | Manufacture of semiconductor integrated circuit |
| JPS55138877A (en) * | 1979-04-17 | 1980-10-30 | Seiko Instr & Electronics Ltd | Method of fabricating semiconductor device |
| JPS5826829B2 (ja) * | 1979-08-30 | 1983-06-06 | 富士通株式会社 | ダイナミックメモリセルの製造方法 |
| JPS5638815A (en) * | 1979-09-07 | 1981-04-14 | Chiyou Lsi Gijutsu Kenkyu Kumiai | Manufacture of semiconductor device |
| US4452645A (en) * | 1979-11-13 | 1984-06-05 | International Business Machines Corporation | Method of making emitter regions by implantation through a non-monocrystalline layer |
| DE3064143D1 (en) * | 1979-12-03 | 1983-08-18 | Ibm | Process for producing a vertical pnp transistor and transistor so produced |
| US4534806A (en) * | 1979-12-03 | 1985-08-13 | International Business Machines Corporation | Method for manufacturing vertical PNP transistor with shallow emitter |
| US4389255A (en) * | 1980-01-14 | 1983-06-21 | Burroughs Corporation | Method of forming buried collector for bipolar transistor in a semiconductor by selective implantation of poly-si followed by oxidation and etch-off |
| US4485552A (en) * | 1980-01-18 | 1984-12-04 | International Business Machines Corporation | Complementary transistor structure and method for manufacture |
| US4301588A (en) * | 1980-02-01 | 1981-11-24 | International Business Machines Corporation | Consumable amorphous or polysilicon emitter process |
| US4803528A (en) * | 1980-07-28 | 1989-02-07 | General Electric Company | Insulating film having electrically conducting portions |
| US4339285A (en) * | 1980-07-28 | 1982-07-13 | Rca Corporation | Method for fabricating adjacent conducting and insulating regions in a film by laser irradiation |
| US4411708A (en) * | 1980-08-25 | 1983-10-25 | Trw Inc. | Method of making precision doped polysilicon vertical ballast resistors by multiple implantations |
| JPS5766674A (en) * | 1980-10-09 | 1982-04-22 | Toshiba Corp | Semiconductor device |
| JPS5931556Y2 (ja) * | 1980-11-28 | 1984-09-06 | 功 田中 | 農作物の収納用網袋 |
| JPS5793525A (en) * | 1980-12-03 | 1982-06-10 | Nec Corp | Manufacture of semiconductor device |
| JPS5795625A (en) | 1980-12-04 | 1982-06-14 | Toshiba Corp | Manufacture of semiconductor device |
| US4391651A (en) * | 1981-10-15 | 1983-07-05 | The United States Of America As Represented By The Secretary Of The Navy | Method of forming a hyperabrupt interface in a GaAs substrate |
| JPS58122724A (ja) * | 1982-01-18 | 1983-07-21 | Toshiba Corp | 半導体素子の製造方法 |
| EP0101737A4 (en) * | 1982-02-26 | 1984-08-20 | Western Electric Co | DIFFUSION OF SHALLOW DEEP REGIONS. |
| US4472212A (en) * | 1982-02-26 | 1984-09-18 | At&T Bell Laboratories | Method for fabricating a semiconductor device |
| JPS58188157A (ja) * | 1982-04-28 | 1983-11-02 | Toshiba Corp | 半導体装置およびその製造方法 |
| US4437897A (en) | 1982-05-18 | 1984-03-20 | International Business Machines Corporation | Fabrication process for a shallow emitter/base transistor using same polycrystalline layer |
| US4471524A (en) * | 1982-06-01 | 1984-09-18 | At&T Bell Laboratories | Method for manufacturing an insulated gate field effect transistor device |
| CA1198226A (en) * | 1982-06-01 | 1985-12-17 | Eliezer Kinsbron | Method for manufacturing a semiconductor device |
| US4888297A (en) * | 1982-09-20 | 1989-12-19 | International Business Machines Corporation | Process for making a contact structure including polysilicon and metal alloys |
| GB2130793B (en) * | 1982-11-22 | 1986-09-03 | Gen Electric Co Plc | Forming a doped region in a semiconductor body |
| JPS59113619A (ja) * | 1982-12-20 | 1984-06-30 | Matsushita Electronics Corp | 半導体装置の製造方法 |
| JPS59186367A (ja) * | 1983-04-06 | 1984-10-23 | Matsushita Electric Ind Co Ltd | 半導体装置の製造方法 |
| JPS6068611A (ja) * | 1983-09-26 | 1985-04-19 | Matsushita Electric Ind Co Ltd | 半導体装置の製造方法 |
| US4569701A (en) * | 1984-04-05 | 1986-02-11 | At&T Bell Laboratories | Technique for doping from a polysilicon transfer layer |
| US4694561A (en) * | 1984-11-30 | 1987-09-22 | American Telephone And Telegraph Company, At&T Bell Laboratories | Method of making high-performance trench capacitors for DRAM cells |
| US4898838A (en) * | 1985-10-16 | 1990-02-06 | Texas Instruments Incorporated | Method for fabricating a poly emitter logic array |
| JPS6293929A (ja) * | 1985-10-21 | 1987-04-30 | Toshiba Corp | 半導体装置の製造方法 |
| JPS62208638A (ja) * | 1986-03-07 | 1987-09-12 | Toshiba Corp | 半導体装置の製造方法 |
| JP2695185B2 (ja) * | 1988-05-02 | 1997-12-24 | 株式会社日立製作所 | 半導体集積回路装置及びその製造方法 |
| JP2508818B2 (ja) * | 1988-10-03 | 1996-06-19 | 三菱電機株式会社 | 半導体装置の製造方法 |
| JPH0744275B2 (ja) * | 1988-10-06 | 1995-05-15 | 日本電気株式会社 | 高耐圧mos型半導体装置の製造方法 |
| US5028973A (en) * | 1989-06-19 | 1991-07-02 | Harris Corporation | Bipolar transistor with high efficient emitter |
| US5188978A (en) * | 1990-03-02 | 1993-02-23 | International Business Machines Corporation | Controlled silicon doping of III-V compounds by thermal oxidation of silicon capping layer |
| US5296388A (en) * | 1990-07-13 | 1994-03-22 | Matsushita Electric Industrial Co., Ltd. | Fabrication method for semiconductor devices |
| JPH04199507A (ja) * | 1990-11-28 | 1992-07-20 | Mitsubishi Electric Corp | 3―V族化合物半導体へのn型不純物固相拡散方法 |
| DE59409300D1 (de) * | 1993-06-23 | 2000-05-31 | Siemens Ag | Verfahren zur Herstellung von einem Isolationsgraben in einem Substrat für Smart-Power-Technologien |
| JPH07142419A (ja) * | 1993-11-15 | 1995-06-02 | Toshiba Corp | 半導体装置の製造方法 |
| US6451644B1 (en) * | 1998-11-06 | 2002-09-17 | Advanced Micro Devices, Inc. | Method of providing a gate conductor with high dopant activation |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3460007A (en) * | 1967-07-03 | 1969-08-05 | Rca Corp | Semiconductor junction device |
| US3558374A (en) * | 1968-01-15 | 1971-01-26 | Ibm | Polycrystalline film having controlled grain size and method of making same |
| JPS4826179B1 (cg-RX-API-DMAC10.html) * | 1968-09-30 | 1973-08-07 | ||
| US3548233A (en) * | 1968-11-29 | 1970-12-15 | Rca Corp | Charge storage device with pn junction diode array target having semiconductor contact pads |
| US3717507A (en) * | 1969-06-19 | 1973-02-20 | Shibaura Electric Co Ltd | Method of manufacturing semiconductor devices utilizing ion-implantation and arsenic diffusion |
| US3664896A (en) * | 1969-07-28 | 1972-05-23 | David M Duncan | Deposited silicon diffusion sources |
| US3764413A (en) * | 1970-11-25 | 1973-10-09 | Nippon Electric Co | Method of producing insulated gate field effect transistors |
| US3775191A (en) * | 1971-06-28 | 1973-11-27 | Bell Canada Northern Electric | Modification of channel regions in insulated gate field effect transistors |
| JPS5217747B2 (cg-RX-API-DMAC10.html) * | 1971-08-09 | 1977-05-17 | ||
| JPS4855663A (cg-RX-API-DMAC10.html) * | 1971-11-10 | 1973-08-04 | ||
| JPS499186A (cg-RX-API-DMAC10.html) * | 1972-05-11 | 1974-01-26 | ||
| US3928095A (en) * | 1972-11-08 | 1975-12-23 | Suwa Seikosha Kk | Semiconductor device and process for manufacturing same |
-
1974
- 1974-10-18 DE DE2449688A patent/DE2449688C3/de not_active Expired
-
1975
- 1975-08-22 GB GB3486775A patent/GB1464801A/en not_active Expired
- 1975-09-30 CA CA236,668A patent/CA1055620A/en not_active Expired
- 1975-10-09 US US05/621,071 patent/US4063967A/en not_active Expired - Lifetime
- 1975-10-14 FR FR7531393A patent/FR2288391A1/fr active Granted
- 1975-10-16 IT IT28325/75A patent/IT1043400B/it active
- 1975-10-17 JP JP50125207A patent/JPS5952533B2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| US4063967A (en) | 1977-12-20 |
| DE2449688B2 (de) | 1979-10-04 |
| GB1464801A (en) | 1977-02-16 |
| FR2288391A1 (fr) | 1976-05-14 |
| JPS5165561A (cg-RX-API-DMAC10.html) | 1976-06-07 |
| DE2449688C3 (de) | 1980-07-10 |
| DE2449688A1 (de) | 1976-04-22 |
| FR2288391B1 (cg-RX-API-DMAC10.html) | 1982-10-01 |
| JPS5952533B2 (ja) | 1984-12-20 |
| CA1055620A (en) | 1979-05-29 |
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