IN2014CN03832A - - Google Patents

Info

Publication number
IN2014CN03832A
IN2014CN03832A IN3832CHN2014A IN2014CN03832A IN 2014CN03832 A IN2014CN03832 A IN 2014CN03832A IN 3832CHN2014 A IN3832CHN2014 A IN 3832CHN2014A IN 2014CN03832 A IN2014CN03832 A IN 2014CN03832A
Authority
IN
India
Prior art keywords
scintillator
encapsulation
ray
electronic circuit
pack
Prior art date
Application number
Other languages
English (en)
Inventor
Simha Levene
Nicolaas Johannes Anthonius Van Veen
Lev Gregorian
Laat Antonius Wilhelmus Maria De
Gerardus Franciscus Cornelis Maria Lijten
Rafael Goshen
Original Assignee
Koninkl Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninkl Philips Nv filed Critical Koninkl Philips Nv
Publication of IN2014CN03832A publication Critical patent/IN2014CN03832A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/208—Circuits specially adapted for scintillation detectors, e.g. for the photo-multiplier section
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2008—Measuring radiation intensity with scintillation detectors using a combination of different types of scintillation detectors, e.g. phoswich
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20183—Arrangements for preventing or correcting crosstalk, e.g. optical or electrical arrangements for correcting crosstalk
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20187—Position of the scintillator with respect to the photodiode, e.g. photodiode surrounding the crystal, the crystal surrounding the photodiode, shape or size of the scintillator
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20188—Auxiliary details, e.g. casings or cooling
    • G01T1/2019—Shielding against direct hits

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Radiology & Medical Imaging (AREA)
  • Immunology (AREA)
  • Theoretical Computer Science (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pulmonology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Measurement Of Radiation (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Conversion Of X-Rays Into Visible Images (AREA)
IN3832CHN2014 2011-11-29 2012-11-23 IN2014CN03832A (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201161564407P 2011-11-29 2011-11-29
PCT/IB2012/056665 WO2013080105A2 (fr) 2011-11-29 2012-11-23 Bloc de scintillateur comprenant une encapsulation d'absorption de rayons x et réseau de détecteurs de rayons x comprenant un tel bloc de scintillateur

Publications (1)

Publication Number Publication Date
IN2014CN03832A true IN2014CN03832A (fr) 2015-07-03

Family

ID=47603861

Family Applications (1)

Application Number Title Priority Date Filing Date
IN3832CHN2014 IN2014CN03832A (fr) 2011-11-29 2012-11-23

Country Status (8)

Country Link
US (1) US9599728B2 (fr)
EP (1) EP2751595B1 (fr)
JP (1) JP6114300B2 (fr)
CN (1) CN103959098B (fr)
BR (1) BR112014012699A8 (fr)
IN (1) IN2014CN03832A (fr)
RU (1) RU2605520C2 (fr)
WO (1) WO2013080105A2 (fr)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3042395B1 (fr) * 2013-09-05 2017-03-08 Koninklijke Philips N.V. Élément détecteur de rayonnement
CN106663685A (zh) 2014-06-06 2017-05-10 夏普株式会社 半导体装置及其制造方法
JP6739423B2 (ja) * 2014-09-25 2020-08-12 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 光を発生させるセラミック材料
JP6671839B2 (ja) * 2014-10-07 2020-03-25 キヤノン株式会社 放射線撮像装置及び撮像システム
WO2017052443A1 (fr) * 2015-09-24 2017-03-30 Prismatic Sensors Ab Détecteur modulaire de rayons x
WO2018053778A1 (fr) 2016-09-23 2018-03-29 Shenzhen Xpectvision Technology Co.,Ltd. Mise en boîtier de détecteurs de rayons x à semi-conducteurs
EP3399344B1 (fr) * 2017-05-03 2021-06-30 ams International AG Dispositif à semi-conducteur permettant la détection indirecte de rayonnement électromagnétique et procédé de production
CN109709594B (zh) * 2018-12-18 2020-12-11 北京纳米维景科技有限公司 闪烁屏封装结构制造方法、闪烁屏封装结构及影像探测器
CN111697109A (zh) * 2020-07-09 2020-09-22 上海大学 一种柔性x射线探测器的制备方法及系统

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WO2000025151A1 (fr) * 1998-10-28 2000-05-04 Koninklijke Philips Electronics N.V. Procede de fabrication d'un detecteur a scintillation a couche
JP2001099941A (ja) 1999-09-30 2001-04-13 Hitachi Metals Ltd 放射線遮蔽板、放射線検出器及び放射線遮蔽板の製造方法
US6298113B1 (en) * 2000-02-07 2001-10-02 General Electric Company Self aligning inter-scintillator reflector x-ray damage shield and method of manufacture
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US6519313B2 (en) * 2001-05-30 2003-02-11 General Electric Company High-Z cast reflector compositions and method of manufacture
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JP2004219318A (ja) * 2003-01-16 2004-08-05 Hamamatsu Photonics Kk 放射線検出器
CN101115344A (zh) 2003-02-20 2008-01-30 因普有限公司 产生x射线的系统
JP4500010B2 (ja) * 2003-06-16 2010-07-14 株式会社日立メディコ Ｘ線検出器及びこれを用いたｘ線ｃｔ装置
RU2251124C1 (ru) * 2003-10-14 2005-04-27 ГОУ ВПО Уральский государственный технический университет-УПИ СЦИНТИЛЛЯЦИОННЫЙ ДАТЧИК ЭЛЕКТРОННОГО И β-ИЗЛУЧЕНИЯ
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EP1877832B1 (fr) * 2005-04-26 2018-02-21 Koninklijke Philips N.V. Reseau de detecteurs pour tomographie spectrale par ordinateur
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KR20080106453A (ko) * 2006-03-30 2008-12-05 코닌클리케 필립스 일렉트로닉스 엔.브이. 방사선 디텍터 어레이
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JP5587788B2 (ja) * 2007-12-21 2014-09-10 コーニンクレッカ フィリップス エヌ ヴェ 複合樹脂におけるシンチレータを備えた放射線感受性検出器
JP2010096616A (ja) 2008-10-16 2010-04-30 Fujifilm Corp 放射線画像検出器
US8373132B2 (en) * 2009-02-06 2013-02-12 Koninklijke Philips Electronics N. V. Radiation detector with a stack of scintillator elements and photodiode arrays
EP2526443A4 (fr) 2010-01-22 2017-08-30 Denct Ltd Procédés et appareil pour détecteur de rayons x à écran plat à caméras multiples

Also Published As

Publication number Publication date
EP2751595A2 (fr) 2014-07-09
BR112014012699A2 (pt) 2017-06-13
EP2751595B1 (fr) 2017-07-05
CN103959098A (zh) 2014-07-30
WO2013080105A2 (fr) 2013-06-06
BR112014012699A8 (pt) 2017-06-20
RU2014126371A (ru) 2016-01-27
US20140321609A1 (en) 2014-10-30
WO2013080105A3 (fr) 2013-12-27
JP6114300B2 (ja) 2017-04-12
JP2015503096A (ja) 2015-01-29
US9599728B2 (en) 2017-03-21
CN103959098B (zh) 2017-04-26
RU2605520C2 (ru) 2016-12-20

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