JP2021536580A - マルチピース単層放射線検出器 - Google Patents
マルチピース単層放射線検出器 Download PDFInfo
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- 238000009828 non-uniform distribution Methods 0.000 claims description 6
- FVAUCKIRQBBSSJ-UHFFFAOYSA-M sodium iodide Chemical compound [Na+].[I-] FVAUCKIRQBBSSJ-UHFFFAOYSA-M 0.000 claims description 6
- 229910052733 gallium Inorganic materials 0.000 claims description 4
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 claims description 3
- 239000002223 garnet Substances 0.000 claims description 3
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- 239000011669 selenium Substances 0.000 claims description 3
- 229910052725 zinc Inorganic materials 0.000 claims description 3
- 239000011701 zinc Substances 0.000 claims description 3
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 claims description 2
- OYPRJOBELJOOCE-UHFFFAOYSA-N Calcium Chemical compound [Ca] OYPRJOBELJOOCE-UHFFFAOYSA-N 0.000 claims description 2
- 229910052684 Cerium Inorganic materials 0.000 claims description 2
- 229910001218 Gallium arsenide Inorganic materials 0.000 claims description 2
- 229910052777 Praseodymium Inorganic materials 0.000 claims description 2
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 claims description 2
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- 239000005083 Zinc sulfide Substances 0.000 claims description 2
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- 229910000464 lead oxide Inorganic materials 0.000 claims description 2
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- 239000011159 matrix material Substances 0.000 claims description 2
- QKEOZZYXWAIQFO-UHFFFAOYSA-M mercury(1+);iodide Chemical compound [Hg]I QKEOZZYXWAIQFO-UHFFFAOYSA-M 0.000 claims description 2
- 239000002105 nanoparticle Substances 0.000 claims description 2
- PVADDRMAFCOOPC-UHFFFAOYSA-N oxogermanium Chemical compound [Ge]=O PVADDRMAFCOOPC-UHFFFAOYSA-N 0.000 claims description 2
- YEXPOXQUZXUXJW-UHFFFAOYSA-N oxolead Chemical compound [Pb]=O YEXPOXQUZXUXJW-UHFFFAOYSA-N 0.000 claims description 2
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- PUDIUYLPXJFUGB-UHFFFAOYSA-N praseodymium atom Chemical compound [Pr] PUDIUYLPXJFUGB-UHFFFAOYSA-N 0.000 claims description 2
- 229910052711 selenium Inorganic materials 0.000 claims description 2
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- PGAPATLGJSQQBU-UHFFFAOYSA-M thallium(i) bromide Chemical compound [Tl]Br PGAPATLGJSQQBU-UHFFFAOYSA-M 0.000 claims description 2
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- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 claims 3
- 229910052765 Lutetium Inorganic materials 0.000 claims 2
- XMBWDFGMSWQBCA-UHFFFAOYSA-N hydrogen iodide Chemical compound I XMBWDFGMSWQBCA-UHFFFAOYSA-N 0.000 claims 2
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- MCVAAHQLXUXWLC-UHFFFAOYSA-N [O-2].[O-2].[S-2].[Gd+3].[Gd+3] Chemical compound [O-2].[O-2].[S-2].[Gd+3].[Gd+3] MCVAAHQLXUXWLC-UHFFFAOYSA-N 0.000 claims 1
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- 229910052793 cadmium Inorganic materials 0.000 description 1
- BDOSMKKIYDKNTQ-UHFFFAOYSA-N cadmium atom Chemical compound [Cd] BDOSMKKIYDKNTQ-UHFFFAOYSA-N 0.000 description 1
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- 230000005251 gamma ray Effects 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
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- 229910052727 yttrium Inorganic materials 0.000 description 1
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- 239000011787 zinc oxide Substances 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20181—Stacked detectors, e.g. for measuring energy and positional information
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20184—Detector read-out circuitry, e.g. for clearing of traps, compensating for traps or compensating for direct hits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/242—Stacked detectors, e.g. for depth information
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
- G01T1/2914—Measurement of spatial distribution of radiation
- G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
- G01T1/2928—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
- G01T1/2914—Measurement of spatial distribution of radiation
- G01T1/2985—In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/36—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0256—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by the material
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- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- Measurement Of Radiation (AREA)
- Sustainable Development (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Abstract
Description
本発明のさらなる実施形態は、説明の目的のために説明において提供される。
である。
Claims (15)
- 放射線検出器であって、
i)基板と、
ii)前記基板に結合されるセンサであって、前記センサは、
センサ画素の第1のアレイ、
信号読み出し要素の第2のアレイ、及び
前記信号読み出し要素から受信される信号に基づいて画像データを提供するように構成される電子回路
を有する、センサと、
iii)前記基板及び前記センサに結合されるトランスデューサであって、前記トランスデューサは、
サブ画素の第3のアレイであって、少なくとも2つのサブ画素が1つのセンサ画素に割り当てられ、前記信号読み出し要素の第2のアレイ及び前記サブ画素の第3のアレイは互いに対応し、前記サブ画素の各々は放射線変換材料を有する、サブ画素の第3のアレイ
を有する、トランスデューサと
を有する、放射線検出器。 - 前記信号読み出し要素の少なくとも1つはフォトダイオードであり、前記サブ画素の各々の前記放射線変換材料はシンチレータであり、前記放射線変換材料の組成及び/又は前記放射線変換材料の厚さは、1つのセンサ画素に割り当てられる少なくとも2つのサブ画素間で変化する、請求項1に記載の放射線検出器。
- 1つのセンサ画素に割り当てられる少なくとも2つのサブ画素の間で変化する放射線変換材料の組成は、i)前記放射線変換材料のドーピングレベル、ii)ドーピング材料、及び/又はiii)ドーピング材料の組合せの少なくとも1つである、請求項2に記載の放射線検出器。
- 前記放射線変換材料は、タリウムで随意にドープされるヨウ化セリウム、セリウムで随意にドープされるヨウ化ルテチウム、テルビウムで随意にドープされるか、又はプラセオジム、タングステン酸カルシウム、ルテチウムイットリウムオキシオルトシリケート、ヨウ化ナトリウム、硫化亜鉛、ルテチウムガドリウムガリウムガーネット、イットリウムアルミニウムガーネット、又は酸化ビスマスゲルマニウムで随意にドープされる、オキシ硫化ガドリニウムである、請求項2又は3に記載の放射線検出器。
- 前記信号読み出し要素の少なくとも1つは、導電性電極であり、前記サブ画素の各々の前記放射線変換材料は光導電体であり、前記光導電体の組成及び/又は前記光導電体の厚さは、1つのセンサ画素に割り当てられる少なくとも2つのサブ画素間で変化する、請求項1乃至4の何れか一項に記載の放射線検出器。
- 1つのセンサ画素に割り当てられる少なくとも2つのサブ画素の間で変化する光導電体の組成が、i)前記光導電体のドーピングレベル、ii)ドーピング材料、及び/又はiii)ドーピング材料の組み合わせの少なくとも1つである、請求項5に記載の放射線検出器。
- 前記光導電体は、i)非晶質セレン、ii)テルル化カドミウム亜鉛、iii)テルル化カドミウム、iv)ペロブスカイト、v)ヒ化ガリウム、vi)ヨウ化水銀(II)、vii)酸化鉛(II)、viii)臭化タリウム(I)、及びix)有機マトリックスに埋め込まれる無機光導電体ナノ粒子の少なくとも1つである、請求項5又は6に記載の放射線検出器。
- 1つのセンサ画素に割り当てられる前記少なくとも2つのサブ画素は、異なる次元及び/又は異なるサイズ及び/又は異なる距離空隙及び/又は異なる放射線変換材料及び/又は前記サブ画素の間の異なる材料組成を有するサブ画素である、請求項1乃至7の何れか一項に記載の放射線検出器。
- 前記第3のアレイは、前記サブ画素の前記異なる次元及び/又は前記サブ画素の前記異なるサイズ及び/又は前記サブ画素の異なる距離空隙及び/又は前記サブ画素の前記異なる放射線変換材料及び/又は前記サブ画素の間の前記異なる材料組成の不均一な分布を有する、請求項1乃至8の何れか一項に記載の放射線検出器。
- センサ画素の前記第1のアレイ及び/又は信号読み出し要素の前記第2のアレイ及び/又はサブ画素の前記第3のアレイは、2次元アレイである、請求項1乃至9の何れか一項に記載の放射線検出器。
- センサ画素の前記第1のアレイ及び/又は信号読み出し要素の前記第2のアレイ及び/又はサブ画素の前記第3のアレイは、1次元アレイである、請求項1乃至10の何れか一項に記載の放射線検出器。
- 信号読み出し要素の前記第2のアレイ及び/又はサブ画素の前記第3のアレイは、センサ画素の前記第1のアレイのサブアレイスキームを定義する、請求項1乃至11の何れか一項に記載の放射線検出器。
- 信号読み出し要素の前記第2のアレイ及び/又はサブ画素の前記第3のアレイは、空間解像度、スペクトルエネルギ分解能、又はダイナミックレンジ又はスペクトルエネルギレンジを提供するように構成される、請求項1乃至12の何れか一項に記載の放射線検出器。
- 前記基板は、平坦又はほぼ平坦又は湾曲形状を有する、請求項の1乃至13の何れか一項に記載の放射線検出器。
- 前記基板は、シリコン、ガラス又はポリマフォイルを有する、請求項1乃至14の何れか一項に記載の放射線検出器。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP18193337.5 | 2018-09-10 | ||
EP18193337.5A EP3620826A1 (en) | 2018-09-10 | 2018-09-10 | Multi-piece mono-layer radiation detector |
PCT/EP2019/074036 WO2020053174A1 (en) | 2018-09-10 | 2019-09-10 | Multi-piece mono-layer radiation detector |
Publications (3)
Publication Number | Publication Date |
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JP2021536580A true JP2021536580A (ja) | 2021-12-27 |
JPWO2020053174A5 JPWO2020053174A5 (ja) | 2023-12-08 |
JP7453215B2 JP7453215B2 (ja) | 2024-03-19 |
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JP2021512677A Active JP7453215B2 (ja) | 2018-09-10 | 2019-09-10 | マルチピース単層放射線検出器 |
Country Status (5)
Country | Link |
---|---|
US (1) | US11506802B2 (ja) |
EP (2) | EP3620826A1 (ja) |
JP (1) | JP7453215B2 (ja) |
CN (1) | CN112673285A (ja) |
WO (1) | WO2020053174A1 (ja) |
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EP3660542A1 (en) * | 2018-11-29 | 2020-06-03 | Koninklijke Philips N.V. | Hybrid x-ray and optical detector |
FR3119708B1 (fr) * | 2021-02-11 | 2023-08-25 | Trixell | Détecteur numérique à étages de conversion superposés |
WO2023229530A1 (en) * | 2022-05-27 | 2023-11-30 | National University Of Singapore | 3d light field detector, sensor and methods of fabrication thereof |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20100135463A1 (en) * | 2008-12-02 | 2010-06-03 | Samsung Electronics Co., Ltd. | X-ray image obtaining/imaging apparatus and method |
JP2012118060A (ja) * | 2010-11-30 | 2012-06-21 | General Electric Co <Ge> | タイリング可能なセンサアレイ |
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US11506802B2 (en) | 2022-11-22 |
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CN112673285A (zh) | 2021-04-16 |
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