IN2014CN03496A - - Google Patents

Info

Publication number
IN2014CN03496A
IN2014CN03496A IN3496CHN2014A IN2014CN03496A IN 2014CN03496 A IN2014CN03496 A IN 2014CN03496A IN 3496CHN2014 A IN3496CHN2014 A IN 3496CHN2014A IN 2014CN03496 A IN2014CN03496 A IN 2014CN03496A
Authority
IN
India
Prior art keywords
field lines
charges
direct conversion
electric field
drifting
Prior art date
Application number
Other languages
English (en)
Inventor
Klaus Jürgen Engel
Christoph Herrmann
Original Assignee
Koninkl Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninkl Philips Nv filed Critical Koninkl Philips Nv
Publication of IN2014CN03496A publication Critical patent/IN2014CN03496A/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914Measurement of spatial distribution of radiation
    • G01T1/2921Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
    • G01T1/2928Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/24Measuring radiation intensity with semiconductor detectors
    • G01T1/241Electrode arrangements, e.g. continuous or parallel strips or the like
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144Devices controlled by radiation
    • H01L27/146Imager structures
    • H01L27/14601Structural or functional details thereof
    • H01L27/14609Pixel-elements with integrated switching, control, storage or amplification elements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144Devices controlled by radiation
    • H01L27/146Imager structures
    • H01L27/14665Imagers using a photoconductor layer

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Electromagnetism (AREA)
  • Measurement Of Radiation (AREA)
  • Light Receiving Elements (AREA)
  • Solid State Image Pick-Up Elements (AREA)
IN3496CHN2014 2011-11-09 2012-11-07 IN2014CN03496A (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201161557480P 2011-11-09 2011-11-09
PCT/IB2012/056231 WO2013068944A1 (fr) 2011-11-09 2012-11-07 Dispositif de détecteur sensible à rayonnement ayant des intervalles de segment de rejet de charges

Publications (1)

Publication Number Publication Date
IN2014CN03496A true IN2014CN03496A (fr) 2015-10-16

Family

ID=47297342

Family Applications (1)

Application Number Title Priority Date Filing Date
IN3496CHN2014 IN2014CN03496A (fr) 2011-11-09 2012-11-07

Country Status (8)

Country Link
US (1) US9069088B2 (fr)
EP (1) EP2748638B1 (fr)
JP (1) JP6251683B2 (fr)
CN (1) CN103917897B (fr)
BR (1) BR112014010873A8 (fr)
IN (1) IN2014CN03496A (fr)
RU (1) RU2605523C2 (fr)
WO (1) WO2013068944A1 (fr)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102013202630B4 (de) * 2013-02-19 2017-07-06 Siemens Healthcare Gmbh Strahlungsdetektor und medizinisches Diagnosesystem
US10497737B2 (en) * 2013-05-30 2019-12-03 Caeleste Cvba Enhanced dynamic range imaging
DE102014204042A1 (de) * 2014-03-05 2015-09-10 Siemens Aktiengesellschaft Verfahren zur Ansteuerung eines Röntgendetektors und zugehörige Steuereinheit
CN106662661B (zh) * 2014-10-31 2019-06-25 皇家飞利浦有限公司 用于探测辐射信号的传感器设备和成像系统
RU2017106201A (ru) * 2014-12-05 2018-08-27 Конинклейке Филипс Н.В. Устройство детектора рентгеновского излучения для рентгеновского излучения под наклонным углом
US10054692B2 (en) * 2014-12-17 2018-08-21 Koninklijke Philips N.V. Detector and method for detecting ionizing radiation
CN108369285B (zh) 2015-12-02 2022-04-26 深圳帧观德芯科技有限公司 半导体x射线检测器的封装方法
DE102016221481B4 (de) 2016-11-02 2021-09-16 Siemens Healthcare Gmbh Strahlungsdetektor mit einer Zwischenschicht
US10156645B2 (en) * 2016-12-23 2018-12-18 General Electric Company Systems and methods for sub-pixel location determination at sidewalls and corners of detectors
EP3404447B1 (fr) * 2017-05-17 2019-08-14 Siemens Healthcare GmbH Détecteur à rayons x présentant une source lumineuse sur un élément support
WO2020235123A1 (fr) * 2019-05-17 2020-11-26 Jx金属株式会社 Tranche de semi-conducteur, élément de détection de rayonnement, détecteur de rayonnement et procédé de production pour substrat monocristallin semi-conducteur composé
JP7265004B2 (ja) * 2019-05-17 2023-04-25 Jx金属株式会社 半導体ウエハ、放射線検出素子、放射線検出器、及び化合物半導体単結晶基板の製造方法
JP7423423B2 (ja) 2020-05-28 2024-01-29 株式会社日立製作所 半導体検出器およびその製造方法
US11835666B1 (en) * 2020-07-31 2023-12-05 Redlen Technologies, Inc. Photon counting computed tomography detector with improved count rate stability and method of operating same

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0679162U (ja) * 1993-04-22 1994-11-04 ジーイー横河メディカルシステム株式会社 半導体x線検出器
US5677539A (en) * 1995-10-13 1997-10-14 Digirad Semiconductor radiation detector with enhanced charge collection
US6175120B1 (en) 1998-05-08 2001-01-16 The Regents Of The University Of Michigan High-resolution ionization detector and array of such detectors
US6034373A (en) * 1997-12-11 2000-03-07 Imrad Imaging Systems Ltd. Semiconductor radiation detector with reduced surface effects
JP4091334B2 (ja) * 2001-05-11 2008-05-28 富士フイルム株式会社 画像記録方法および装置並びに画像記録媒体
JP3900992B2 (ja) 2002-04-02 2007-04-04 株式会社日立製作所 放射線検出器及び放射線検査装置
CN1230693C (zh) * 2002-11-26 2005-12-07 张亚美 小面积像素电极直接平板x-线探测器
EP1644756A2 (fr) * 2003-07-12 2006-04-12 Radiation Watch Ltd Detecteur de rayonnement ionisant
CA2567466C (fr) * 2004-05-21 2012-05-01 Craig M. Whitehouse Surfaces rf et guides d'ions rf
US7649178B2 (en) * 2004-08-13 2010-01-19 Koninklijke Philips Electronics N.V. Solid state detector packaging technique
US7453068B2 (en) 2005-07-06 2008-11-18 Ge Medical Systems Israel, Ltd. Method and apparatus of detecting ionizing radiation
WO2008054862A2 (fr) * 2006-04-21 2008-05-08 Ii-Vi Incorporated Détecteur de radiation avec structure à grille coplane
CN101542315B (zh) * 2006-11-17 2013-03-20 皇家飞利浦电子股份有限公司 在敏感层上具有多个电极的辐射探测器
RU2009128230A (ru) * 2006-12-22 2011-01-27 Конинклейке Филипс Электроникс Н.В. (Nl) Регистрирующая система с разрешением по энергии и система формирования изображения
US7955992B2 (en) 2008-08-08 2011-06-07 Redlen Technologies, Inc. Method of passivating and encapsulating CdTe and CZT segmented detectors
WO2010073189A1 (fr) * 2008-12-22 2010-07-01 Koninklijke Philips Electronics N.V. Détecteur de rayonnement avec recueil de charge amélioré et courants de fuite minimisés
JP2012114166A (ja) * 2010-11-22 2012-06-14 Canon Inc 検出装置及び放射線検出システム

Also Published As

Publication number Publication date
EP2748638A1 (fr) 2014-07-02
CN103917897B (zh) 2016-08-17
RU2014123326A (ru) 2015-12-20
US20140284489A1 (en) 2014-09-25
BR112014010873A8 (pt) 2017-06-20
CN103917897A (zh) 2014-07-09
BR112014010873A2 (pt) 2017-06-13
JP2015504513A (ja) 2015-02-12
WO2013068944A1 (fr) 2013-05-16
RU2605523C2 (ru) 2016-12-20
US9069088B2 (en) 2015-06-30
JP6251683B2 (ja) 2017-12-20
EP2748638B1 (fr) 2019-09-18

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