IN2014CN03496A - - Google Patents

Info

Publication number
IN2014CN03496A
IN2014CN03496A IN3496CHN2014A IN2014CN03496A IN 2014CN03496 A IN2014CN03496 A IN 2014CN03496A IN 3496CHN2014 A IN3496CHN2014 A IN 3496CHN2014A IN 2014CN03496 A IN2014CN03496 A IN 2014CN03496A
Authority
IN
India
Prior art keywords
field lines
charges
direct conversion
electric field
drifting
Prior art date
Application number
Inventor
Klaus Jürgen Engel
Christoph Herrmann
Original Assignee
Koninkl Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninkl Philips Nv filed Critical Koninkl Philips Nv
Publication of IN2014CN03496A publication Critical patent/IN2014CN03496A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
    • G01T1/2928—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/241—Electrode arrangements, e.g. continuous or parallel strips or the like
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14609—Pixel-elements with integrated switching, control, storage or amplification elements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14665—Imagers using a photoconductor layer

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Electromagnetism (AREA)
  • Measurement Of Radiation (AREA)
  • Light Receiving Elements (AREA)
  • Solid State Image Pick-Up Elements (AREA)

Abstract

In radiation sensitive detector devices such as direct conversion detectors charges are drifting within an externally applied electric field towards collecting electrodes (4) which are segmented (e.g. representing a pixel array). At the gaps between segments electrical field lines can leave the detector and charges drifting along those field lines can be trapped within the gap. This can be avoided by external electrodes (8) which push electric field lines back into the direct conversion material.
IN3496CHN2014 2011-11-09 2012-11-07 IN2014CN03496A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201161557480P 2011-11-09 2011-11-09
PCT/IB2012/056231 WO2013068944A1 (en) 2011-11-09 2012-11-07 Radiation-sensitive detector device with charge-rejecting segment gaps

Publications (1)

Publication Number Publication Date
IN2014CN03496A true IN2014CN03496A (en) 2015-10-16

Family

ID=47297342

Family Applications (1)

Application Number Title Priority Date Filing Date
IN3496CHN2014 IN2014CN03496A (en) 2011-11-09 2012-11-07

Country Status (8)

Country Link
US (1) US9069088B2 (en)
EP (1) EP2748638B1 (en)
JP (1) JP6251683B2 (en)
CN (1) CN103917897B (en)
BR (1) BR112014010873A8 (en)
IN (1) IN2014CN03496A (en)
RU (1) RU2605523C2 (en)
WO (1) WO2013068944A1 (en)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102013202630B4 (en) * 2013-02-19 2017-07-06 Siemens Healthcare Gmbh Radiation detector and medical diagnostic system
US10497737B2 (en) * 2013-05-30 2019-12-03 Caeleste Cvba Enhanced dynamic range imaging
DE102014204042A1 (en) * 2014-03-05 2015-09-10 Siemens Aktiengesellschaft Method for controlling an X-ray detector and associated control unit
JP6126758B1 (en) * 2014-10-31 2017-05-10 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． Sensor device and imaging system for detecting radiation signals
EP3161522B1 (en) * 2014-12-05 2018-02-28 Koninklijke Philips N.V. X-ray detector device for inclined angle x-ray radiation
WO2016096622A1 (en) * 2014-12-17 2016-06-23 Koninklijke Philips N.V. Detector and method for detecting ionizing radiation
WO2017091989A1 (en) * 2015-12-02 2017-06-08 Shenzhen Xpectvision Technology Co., Ltd. Packaging methods of semiconductor x-ray detectors
DE102016221481B4 (en) 2016-11-02 2021-09-16 Siemens Healthcare Gmbh Radiation detector with an intermediate layer
US10156645B2 (en) * 2016-12-23 2018-12-18 General Electric Company Systems and methods for sub-pixel location determination at sidewalls and corners of detectors
EP3404447B1 (en) * 2017-05-17 2019-08-14 Siemens Healthcare GmbH X-ray detector comprising a light source on the holder element
WO2020235124A1 (en) * 2019-05-17 2020-11-26 Ｊｘ金属株式会社 Semiconductor wafer, radiation detection element, radiation detector, and production method for compound semiconductor monocrystalline substrate
US11967659B2 (en) 2019-05-17 2024-04-23 Jx Metals Corporation Semiconductor wafer, radiation detection element, radiation detector, and production method for compound semiconductor monocrystalline substrate
JP7423423B2 (en) * 2020-05-28 2024-01-29 株式会社日立製作所 Semiconductor detector and its manufacturing method
US11835666B1 (en) * 2020-07-31 2023-12-05 Redlen Technologies, Inc. Photon counting computed tomography detector with improved count rate stability and method of operating same

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0679162U (en) * 1993-04-22 1994-11-04 ジーイー横河メディカルシステム株式会社 Semiconductor X-ray detector
US5677539A (en) 1995-10-13 1997-10-14 Digirad Semiconductor radiation detector with enhanced charge collection
US6175120B1 (en) 1998-05-08 2001-01-16 The Regents Of The University Of Michigan High-resolution ionization detector and array of such detectors
US6034373A (en) * 1997-12-11 2000-03-07 Imrad Imaging Systems Ltd. Semiconductor radiation detector with reduced surface effects
JP4091334B2 (en) * 2001-05-11 2008-05-28 富士フイルム株式会社 Image recording method and apparatus, and image recording medium
JP3900992B2 (en) 2002-04-02 2007-04-04 株式会社日立製作所 Radiation detector and radiation inspection apparatus
CN1230693C (en) * 2002-11-26 2005-12-07 张亚美 Small area pixel electrode direct plane plate X-ray detector
WO2005008286A2 (en) * 2003-07-12 2005-01-27 Radiation Watch Limited Ionising radiation detector
EP1759402B1 (en) * 2004-05-21 2015-07-08 Craig M. Whitehouse Rf surfaces and rf ion guides
EP1779141A2 (en) * 2004-08-13 2007-05-02 Koninklijke Philips Electronics N.V. Solid state radiation detector packaging technique
US7453068B2 (en) 2005-07-06 2008-11-18 Ge Medical Systems Israel, Ltd. Method and apparatus of detecting ionizing radiation
WO2008054862A2 (en) * 2006-04-21 2008-05-08 Ii-Vi Incorporated Radiation detector with co-planar grid structure
CN101542315B (en) * 2006-11-17 2013-03-20 皇家飞利浦电子股份有限公司 Radiation detector with multiple electrodes on a sensitive layer
EP2097771A2 (en) * 2006-12-22 2009-09-09 Koninklijke Philips Electronics N.V. Energy-resolving detection system and imaging system
US7955992B2 (en) 2008-08-08 2011-06-07 Redlen Technologies, Inc. Method of passivating and encapsulating CdTe and CZT segmented detectors
WO2010073189A1 (en) * 2008-12-22 2010-07-01 Koninklijke Philips Electronics N.V. Radiation detector with improved charge collection and minimized leakage currents
JP2012114166A (en) * 2010-11-22 2012-06-14 Canon Inc Detection device and radiation detection system

Also Published As

Publication number Publication date
US20140284489A1 (en) 2014-09-25
RU2014123326A (en) 2015-12-20
WO2013068944A1 (en) 2013-05-16
JP6251683B2 (en) 2017-12-20
CN103917897A (en) 2014-07-09
JP2015504513A (en) 2015-02-12
CN103917897B (en) 2016-08-17
BR112014010873A2 (en) 2017-06-13
EP2748638A1 (en) 2014-07-02
BR112014010873A8 (en) 2017-06-20
US9069088B2 (en) 2015-06-30
EP2748638B1 (en) 2019-09-18
RU2605523C2 (en) 2016-12-20

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