IN2014CN02499A - - Google Patents

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Publication number
IN2014CN02499A
IN2014CN02499A IN2499CHN2014A IN2014CN02499A IN 2014CN02499 A IN2014CN02499 A IN 2014CN02499A IN 2499CHN2014 A IN2499CHN2014 A IN 2499CHN2014A IN 2014CN02499 A IN2014CN02499 A IN 2014CN02499A
Authority
IN
India
Prior art keywords
test
test instrument
programmed
processing system
configurable interface
Prior art date
Application number
Other languages
English (en)
Inventor
Stephen J Bourassa
Michael Francis Mcgoldrick
David Kaushansky
Michael Thomas Fluet
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Publication of IN2014CN02499A publication Critical patent/IN2014CN02499A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2889—Interfaces, e.g. between probe and tester
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31704—Design for test; Design verification
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
IN2499CHN2014 2011-10-28 2012-09-20 IN2014CN02499A (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13/284,378 US9470759B2 (en) 2011-10-28 2011-10-28 Test instrument having a configurable interface
PCT/US2012/056247 WO2013062692A1 (fr) 2011-10-28 2012-09-20 Appareil d'essai doté d'une interface configurable

Publications (1)

Publication Number Publication Date
IN2014CN02499A true IN2014CN02499A (fr) 2015-06-26

Family

ID=48168296

Family Applications (1)

Application Number Title Priority Date Filing Date
IN2499CHN2014 IN2014CN02499A (fr) 2011-10-28 2012-09-20

Country Status (6)

Country Link
US (1) US9470759B2 (fr)
EP (1) EP2771704A4 (fr)
JP (1) JP2014532862A (fr)
KR (1) KR101970290B1 (fr)
IN (1) IN2014CN02499A (fr)
WO (1) WO2013062692A1 (fr)

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JP7316818B2 (ja) * 2019-03-28 2023-07-28 株式会社アドバンテスト 波形データ取得モジュールおよび試験装置
US11408927B2 (en) 2019-06-18 2022-08-09 Teradyne, Inc. Functional testing with inline parametric testing
US11461222B2 (en) 2020-04-16 2022-10-04 Teradyne, Inc. Determining the complexity of a test program
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CN113868038B (zh) * 2021-08-30 2024-06-04 中科可控信息产业有限公司 信号测试方法、装置、计算机设备和存储介质
CN114020554A (zh) * 2021-10-30 2022-02-08 江苏信而泰智能装备有限公司 一种测试仪的端口隔离方法和具有端口隔离功能的测试仪

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Also Published As

Publication number Publication date
KR101970290B1 (ko) 2019-04-18
US20130110446A1 (en) 2013-05-02
WO2013062692A1 (fr) 2013-05-02
US9470759B2 (en) 2016-10-18
EP2771704A1 (fr) 2014-09-03
KR20140091719A (ko) 2014-07-22
EP2771704A4 (fr) 2015-03-25
JP2014532862A (ja) 2014-12-08

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