IN145547B - - Google Patents

Info

Publication number
IN145547B
IN145547B IN2053/CAL/76A IN2053CA1976A IN145547B IN 145547 B IN145547 B IN 145547B IN 2053CA1976 A IN2053CA1976 A IN 2053CA1976A IN 145547 B IN145547 B IN 145547B
Authority
IN
India
Application number
IN2053/CAL/76A
Other languages
English (en)
Inventor
J Fabula
S Cohen
Original Assignee
Rca Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rca Corp filed Critical Rca Corp
Publication of IN145547B publication Critical patent/IN145547B/en

Links

Classifications

    • H10P14/6309
    • H10P14/6322
IN2053/CAL/76A 1976-01-12 1976-11-16 IN145547B (member.php)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US64845576A 1976-01-12 1976-01-12

Publications (1)

Publication Number Publication Date
IN145547B true IN145547B (member.php) 1978-11-04

Family

ID=24600841

Family Applications (1)

Application Number Title Priority Date Filing Date
IN2053/CAL/76A IN145547B (member.php) 1976-01-12 1976-11-16

Country Status (9)

Country Link
JP (1) JPS5286070A (member.php)
AU (1) AU502350B2 (member.php)
DE (1) DE2700094A1 (member.php)
FR (1) FR2337941A1 (member.php)
GB (1) GB1513640A (member.php)
IN (1) IN145547B (member.php)
IT (1) IT1064328B (member.php)
SE (1) SE7614145L (member.php)
YU (1) YU301876A (member.php)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58188162A (ja) * 1982-04-28 1983-11-02 Agency Of Ind Science & Technol ゲ−ト絶縁膜の形成方法
DE3425531A1 (de) * 1984-07-11 1986-01-16 Siemens AG, 1000 Berlin und 8000 München Verfahren zum verfliessenlassen von dotierten sio(pfeil abwaerts)2(pfeil abwaerts)-schichten bei der herstellung von integrierten mos-halbleiterschaltungen
JPS61193456A (ja) * 1985-02-21 1986-08-27 Toshiba Corp 半導体素子の製造方法
NL8603111A (nl) * 1986-12-08 1988-07-01 Philips Nv Werkwijze voor het vervaardigen van een halfgeleiderinrichting waarbij een siliciumplak aan zijn oppervlak wordt voorzien van veldoxidegebieden.
JP3310386B2 (ja) * 1993-05-25 2002-08-05 忠弘 大見 絶縁酸化膜の形成方法及び半導体装置
EP1014432A1 (en) * 1998-12-23 2000-06-28 Infineon Technologies North America Corp. Method for forming the gate oxide of metal-oxide-semiconductor devices

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2014382B1 (member.php) * 1968-06-28 1974-03-15 Motorola Inc
JPS4913909B1 (member.php) * 1970-05-04 1974-04-03

Also Published As

Publication number Publication date
AU502350B2 (en) 1979-07-19
SE7614145L (sv) 1977-07-13
YU301876A (en) 1982-06-30
JPS5286070A (en) 1977-07-16
FR2337941B1 (member.php) 1982-05-28
GB1513640A (en) 1978-06-07
AU2108877A (en) 1978-07-13
DE2700094A1 (de) 1977-07-21
IT1064328B (it) 1985-02-18
JPS5615573B2 (member.php) 1981-04-10
FR2337941A1 (fr) 1977-08-05

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