IL287245B2 - Photodetector sensor arrays - Google Patents

Photodetector sensor arrays

Info

Publication number
IL287245B2
IL287245B2 IL287245A IL28724521A IL287245B2 IL 287245 B2 IL287245 B2 IL 287245B2 IL 287245 A IL287245 A IL 287245A IL 28724521 A IL28724521 A IL 28724521A IL 287245 B2 IL287245 B2 IL 287245B2
Authority
IL
Israel
Prior art keywords
light absorbing
doped
contact layer
pixel
absorbing layer
Prior art date
Application number
IL287245A
Other languages
English (en)
Hebrew (he)
Other versions
IL287245A (en
IL287245B1 (en
Original Assignee
Actlight S A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US16/387,011 external-priority patent/US10964837B2/en
Priority claimed from US16/429,158 external-priority patent/US11114480B2/en
Application filed by Actlight S A filed Critical Actlight S A
Publication of IL287245A publication Critical patent/IL287245A/en
Publication of IL287245B1 publication Critical patent/IL287245B1/en
Publication of IL287245B2 publication Critical patent/IL287245B2/en

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10Integrated devices
    • H10F39/12Image sensors
    • H10F39/18Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/011Manufacture or treatment of image sensors covered by group H10F39/12
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/011Manufacture or treatment of image sensors covered by group H10F39/12
    • H10F39/024Manufacture or treatment of image sensors covered by group H10F39/12 of coatings or optical elements
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/011Manufacture or treatment of image sensors covered by group H10F39/12
    • H10F39/026Wafer-level processing
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10Integrated devices
    • H10F39/12Image sensors
    • H10F39/18Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
    • H10F39/182Colour image sensors
    • H10F39/1825Multicolour image sensors having stacked structure, e.g. NPN, NPNPN or multiple quantum well [MQW] structures
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80Constructional details of image sensors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80Constructional details of image sensors
    • H10F39/803Pixels having integrated switching, control, storage or amplification elements
    • H10F39/8037Pixels having integrated switching, control, storage or amplification elements the integrated elements comprising a transistor
    • H10F39/80377Pixels having integrated switching, control, storage or amplification elements the integrated elements comprising a transistor characterised by the channel of the transistor, e.g. channel having a doping gradient
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80Constructional details of image sensors
    • H10F39/805Coatings
    • H10F39/8057Optical shielding
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80Constructional details of image sensors
    • H10F39/807Pixel isolation structures
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80Constructional details of image sensors
    • H10F39/811Interconnections

Landscapes

  • Solid State Image Pick-Up Elements (AREA)
  • Light Receiving Elements (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
IL287245A 2019-04-17 2020-04-14 Photodetector sensor arrays IL287245B2 (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US16/387,011 US10964837B2 (en) 2013-03-15 2019-04-17 Photo detector systems and methods of operating same
US16/429,158 US11114480B2 (en) 2013-03-15 2019-06-03 Photodetector
US16/776,572 US11251217B2 (en) 2019-04-17 2020-01-30 Photodetector sensor arrays
PCT/EP2020/060388 WO2020212305A1 (en) 2019-04-17 2020-04-14 Photodetector sensor arrays

Publications (3)

Publication Number Publication Date
IL287245A IL287245A (en) 2021-12-01
IL287245B1 IL287245B1 (en) 2025-04-01
IL287245B2 true IL287245B2 (en) 2025-08-01

Family

ID=72837083

Family Applications (1)

Application Number Title Priority Date Filing Date
IL287245A IL287245B2 (en) 2019-04-17 2020-04-14 Photodetector sensor arrays

Country Status (7)

Country Link
US (1) US11251217B2 (https=)
EP (1) EP3956929A1 (https=)
JP (1) JP7400164B2 (https=)
KR (1) KR102613379B1 (https=)
CN (1) CN113875008B (https=)
IL (1) IL287245B2 (https=)
WO (1) WO2020212305A1 (https=)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11837669B2 (en) 2013-03-15 2023-12-05 ActLight SA Photo detector systems and methods of operating same
US11114480B2 (en) 2013-03-15 2021-09-07 ActLight SA Photodetector
US11735677B2 (en) * 2020-07-20 2023-08-22 ActLight SA Photodetectors and photodetector arrays
JP7588028B2 (ja) * 2021-01-26 2024-11-21 日本ルメンタム株式会社 半導体受光素子
KR102567702B1 (ko) * 2021-06-30 2023-08-18 한국원자력연구원 방사선 검출소자 및 이의 제조방법
US12474453B2 (en) 2022-01-20 2025-11-18 ActLight SA Control techniques for photodetector systems
CN115207150B (zh) * 2022-07-21 2023-10-10 北京工业大学 一种全通信波段覆盖的高速光电探测器
US12598374B2 (en) 2023-09-27 2026-04-07 ActLight SA Techniques for minimizing power consumption in photodetector measurements

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110272561A1 (en) * 2010-03-23 2011-11-10 Stmicroelectronics S.R.L. Method of detecting impinging position of photons on a geiger-mode avalanche photodiode, related geiger-mode avalanche photodiode and fabrication process

Family Cites Families (39)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4484210A (en) 1980-09-05 1984-11-20 Nippon Electric Co., Ltd. Solid-state imaging device having a reduced image lag
WO1995015583A1 (en) * 1993-12-03 1995-06-08 Interuniversitair Micro-Elektronica Centrum Vzw Fast electrical complete turn-off optical device
US6906793B2 (en) 2000-12-11 2005-06-14 Canesta, Inc. Methods and devices for charge management for three-dimensional sensing
US7386207B2 (en) 2001-12-27 2008-06-10 Kotura, Inc. In-line light sensor
WO2005078801A1 (en) 2004-02-17 2005-08-25 Nanyang Technological University Method and device for wavelength-sensitive photo-sensing
JP4280822B2 (ja) 2004-02-18 2009-06-17 国立大学法人静岡大学 光飛行時間型距離センサ
JP4345693B2 (ja) 2004-03-17 2009-10-14 パナソニック電工株式会社 光検出素子および光検出素子の制御方法
JP2005347599A (ja) 2004-06-04 2005-12-15 Fuji Photo Film Co Ltd カラー受光素子、及び撮像素子
JP2006108379A (ja) * 2004-10-05 2006-04-20 Sony Corp 固体撮像素子及びその駆動方法
US9117726B2 (en) * 2006-03-19 2015-08-25 Shimon Maimon Application of reduced dark current photodetector
US7560784B2 (en) 2007-02-01 2009-07-14 International Business Machines Corporation Fin PIN diode
US7651883B2 (en) * 2007-05-09 2010-01-26 Sharp Laboratories Of America, Inc. High energy implant photodiode stack
KR100879013B1 (ko) 2007-05-22 2009-01-19 (주)실리콘화일 매립형 컬렉터를 구비하는 포토트랜지스터
US8410568B2 (en) * 2008-08-29 2013-04-02 Tau-Metrix, Inc. Integrated photodiode for semiconductor substrates
US8519379B2 (en) 2009-12-08 2013-08-27 Zena Technologies, Inc. Nanowire structured photodiode with a surrounding epitaxially grown P or N layer
US8274096B2 (en) * 2009-02-13 2012-09-25 University Of Rochester Semiconductor device and method
US8953149B2 (en) 2009-02-17 2015-02-10 Microsoft Corporation CMOS three-dimensional image sensor detectors having reduced inter-gate capacitance, and enhanced modulation contrast
IT1393781B1 (it) 2009-04-23 2012-05-08 St Microelectronics Rousset Fotodiodo operante in modalita' geiger con resistore di soppressione integrato e controllabile ad effetto jfet, schiera di fotodiodi e relativo procedimento di fabbricazione
WO2010134993A1 (en) * 2009-05-18 2010-11-25 Sarnoff Corporation Slab scintillator with integrated double-sided photoreceiver
JP2011007622A (ja) 2009-06-25 2011-01-13 Sharp Corp センサ装置、携帯電話およびデジタルカメラ
US8319262B2 (en) 2009-07-31 2012-11-27 Sri International Substrate bias for CMOS imagers
US8487357B2 (en) 2010-03-12 2013-07-16 Unisantis Electronics Singapore Pte Ltd. Solid state imaging device having high sensitivity and high pixel density
US9431566B2 (en) 2011-06-10 2016-08-30 ActLight S.A. Photo detector and methods of manufacturing and operating same
US9236520B2 (en) 2011-06-10 2016-01-12 ActLight S.A. Proximity sensor systems and methods of operating same
US9012960B2 (en) 2011-06-10 2015-04-21 Actlight, S.A. Photo detector and methods of manufacturing and operating same
US9735304B1 (en) 2013-03-15 2017-08-15 Actlight, S.A. Photo detector systems and methods of operating same
US8866064B2 (en) 2011-07-26 2014-10-21 Avago Technologies General Ip (Singapore) Pte. Ltd. Multi-directional proximity sensor
US8569806B2 (en) 2011-09-02 2013-10-29 Hoon Kim Unit pixel of image sensor and photo detector thereof
CN103384916A (zh) 2012-02-20 2013-11-06 新加坡优尼山帝斯电子私人有限公司 固体摄像器件
US9142692B2 (en) 2012-07-23 2015-09-22 Bae Systems Information And Electronic Systems Integration Inc. Thyristor-based, dual-polarity blocking photo-conductive semiconductor switch (PCSS) for short pulse switching and methods
US10269855B2 (en) 2013-03-15 2019-04-23 ActLight SA Photo detector systems and methods of operating same
US10964837B2 (en) 2013-03-15 2021-03-30 ActLight SA Photo detector systems and methods of operating same
JP6625995B2 (ja) * 2013-11-04 2019-12-25 オーロラ アルット 改善した半導体放射線検出器
US10418407B2 (en) 2015-11-06 2019-09-17 Artilux, Inc. High-speed light sensing apparatus III
US10872987B2 (en) * 2015-12-10 2020-12-22 California Institute Of Technology Enhanced quantum efficiency barrier infrared detectors
ITUA20164571A1 (it) 2016-06-21 2017-12-21 St Microelectronics Srl Dispositivo optoelettronico multibanda per applicazioni colorimetriche e relativo metodo di fabbricazione
TWI745553B (zh) * 2017-02-28 2021-11-11 美商光程研創股份有限公司 高速光偵測裝置
US10504952B2 (en) 2017-08-30 2019-12-10 Taiwan Semiconductor Manufacturing Co., Ltd. Increased optical path for long wavelength light by grating structure
FR3089684A1 (fr) * 2018-12-07 2020-06-12 Commissariat A L'energie Atomique Et Aux Energies Alternatives Photodiode de type SPAD

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110272561A1 (en) * 2010-03-23 2011-11-10 Stmicroelectronics S.R.L. Method of detecting impinging position of photons on a geiger-mode avalanche photodiode, related geiger-mode avalanche photodiode and fabrication process

Also Published As

Publication number Publication date
IL287245A (en) 2021-12-01
US11251217B2 (en) 2022-02-15
IL287245B1 (en) 2025-04-01
EP3956929A1 (en) 2022-02-23
CN113875008A (zh) 2021-12-31
KR20220016822A (ko) 2022-02-10
US20200373346A1 (en) 2020-11-26
CN113875008B (zh) 2025-08-05
WO2020212305A1 (en) 2020-10-22
JP7400164B2 (ja) 2023-12-19
KR102613379B1 (ko) 2023-12-12
JP2022529637A (ja) 2022-06-23

Similar Documents

Publication Publication Date Title
US11251217B2 (en) Photodetector sensor arrays
JP2022529637A5 (https=)
US11587960B2 (en) Photodetector
KR101721795B1 (ko) 3d 이미지 센서 구조를 제조하는 시스템 및 방법
US9728565B2 (en) Low full-well capacity image sensor with high sensitivity
TWI879993B (zh) 光偵測器和光偵測器陣列及其操作方法
US8730362B2 (en) Image sensor with controllable vertically integrated photodetectors
TW201133812A (en) Image sensor with contact dummy pixels
CN114078895B (zh) 具有穿硅鳍片转移门的图像传感器
EP3528288B1 (en) Gate-controlled charge modulated device for cmos image sensors
JP2022529184A (ja) Utbb光検出器ピクセルユニット、アレイ及び方法
CN114078896B (zh) 具有穿硅鳍片转移门的图像传感器
US20250015102A1 (en) Multiple wavelength band light sensor device
US12062670B2 (en) Pixel layout with photodiode region partially surrounding circuitry
WO2015171572A1 (en) Dark current mitigation with diffusion control
Jansz et al. Extrinsic evolution of the stacked gradient poly-homojunction photodiode genre
D’Souza et al. Monte carlo modeling of VLWIR HgCdTe interdigitated pixel response