IL152577A0 - Electrically-eraseable programmable read-only memory having reduced-page-size program and erase - Google Patents
Electrically-eraseable programmable read-only memory having reduced-page-size program and eraseInfo
- Publication number
- IL152577A0 IL152577A0 IL15257701A IL15257701A IL152577A0 IL 152577 A0 IL152577 A0 IL 152577A0 IL 15257701 A IL15257701 A IL 15257701A IL 15257701 A IL15257701 A IL 15257701A IL 152577 A0 IL152577 A0 IL 152577A0
- Authority
- IL
- Israel
- Prior art keywords
- erase
- page
- electrically
- memory
- reduced
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0408—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors
- G11C16/0425—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors comprising cells containing a merged floating gate and select transistor
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0408—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/08—Address circuits; Decoders; Word-line control circuits
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Read Only Memory (AREA)
- Semiconductor Memories (AREA)
- Non-Volatile Memory (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/564,324 US6400603B1 (en) | 2000-05-03 | 2000-05-03 | Electronically-eraseable programmable read-only memory having reduced-page-size program and erase |
PCT/US2001/013581 WO2001084556A1 (en) | 2000-05-03 | 2001-04-26 | Electrically-eraseable programmable read-only memory having reduced-page-size program and erase |
Publications (1)
Publication Number | Publication Date |
---|---|
IL152577A0 true IL152577A0 (en) | 2003-05-29 |
Family
ID=24254017
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IL15257701A IL152577A0 (en) | 2000-05-03 | 2001-04-26 | Electrically-eraseable programmable read-only memory having reduced-page-size program and erase |
Country Status (10)
Country | Link |
---|---|
US (2) | US6400603B1 (ko) |
EP (1) | EP1305805A1 (ko) |
JP (1) | JP4966472B2 (ko) |
KR (1) | KR100698340B1 (ko) |
AU (1) | AU2001255732A1 (ko) |
BR (1) | BR0110585A (ko) |
CA (1) | CA2407888A1 (ko) |
IL (1) | IL152577A0 (ko) |
NZ (1) | NZ522383A (ko) |
WO (1) | WO2001084556A1 (ko) |
Families Citing this family (44)
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US6950336B2 (en) * | 2000-05-03 | 2005-09-27 | Emosyn America, Inc. | Method and apparatus for emulating an electrically erasable programmable read only memory (EEPROM) using non-volatile floating gate memory cells |
US6798719B1 (en) * | 2000-08-18 | 2004-09-28 | Hewlett-Packard Development Company, L.P. | Electronic device including warranty start date |
KR100422445B1 (ko) * | 2001-06-01 | 2004-03-12 | 삼성전자주식회사 | 선택적 배속동작 모드를 갖는 불휘발성 반도체 메모리 장치 |
US6591330B2 (en) * | 2001-06-18 | 2003-07-08 | M-Systems Flash Disk Pioneers Ltd. | System and method for flexible flash file |
EP1327992B1 (en) * | 2002-01-11 | 2005-03-30 | STMicroelectronics S.r.l. | Architecture for a flash-EEPROM simultaneously readable in other sectors while erasing and/or programming one or more different sectors |
US6862223B1 (en) * | 2002-07-05 | 2005-03-01 | Aplus Flash Technology, Inc. | Monolithic, combo nonvolatile memory allowing byte, page and block write with no disturb and divided-well in the cell array using a unified cell structure and technology with a new scheme of decoder and layout |
WO2004023385A1 (ja) | 2002-08-29 | 2004-03-18 | Renesas Technology Corp. | 半導体処理装置及びicカード |
TW569221B (en) * | 2002-09-11 | 2004-01-01 | Elan Microelectronics Corp | Chip having on-system programmable nonvolatile memory and off-system programmable nonvolatile memory, and forming method and programming method of the same |
US6717850B1 (en) * | 2002-12-05 | 2004-04-06 | Advanced Micro Devices, Inc. | Efficient method to detect process induced defects in the gate stack of flash memory devices |
US6882567B1 (en) * | 2002-12-06 | 2005-04-19 | Multi Level Memory Technology | Parallel programming of multiple-bit-per-cell memory cells on a continuous word line |
US6966044B2 (en) * | 2002-12-09 | 2005-11-15 | Lsi Logic Corporation | Method for composing memory on programmable platform devices to meet varied memory requirements with a fixed set of resources |
US6898680B2 (en) * | 2003-01-03 | 2005-05-24 | Micrel, Incorporated | Minimization of overhead of non-volatile memory operation |
JP4188744B2 (ja) * | 2003-04-08 | 2008-11-26 | 株式会社ルネサステクノロジ | メモリカード |
KR100532429B1 (ko) * | 2003-04-18 | 2005-11-30 | 삼성전자주식회사 | 바이트 오퍼레이션 비휘발성 반도체 메모리 장치 |
FR2856185A1 (fr) * | 2003-06-12 | 2004-12-17 | St Microelectronics Sa | Memoire flash programmable par mot |
US7057228B2 (en) * | 2003-07-21 | 2006-06-06 | Taiwan Semiconductor Manufacturing Company | Memory array with byte-alterable capability |
DE60318837T2 (de) * | 2003-07-23 | 2009-01-22 | Em Microelectronic-Marin S.A., Marin | Nicht flüchtiges Speichermatrix mit Speicherzellen mit geteiltem Gate sowie Programmierverfahren zur Vermeidung von Störungen |
US6868009B1 (en) | 2003-10-20 | 2005-03-15 | Macronix International Co., Ltd. | Flash memory device with byte erase |
US7072215B2 (en) * | 2004-02-24 | 2006-07-04 | Taiwan Semiconductor Manufacturing Company | Array structure of two-transistor cells with merged floating gates for byte erase and re-write if disturbed algorithm |
US7030444B2 (en) * | 2004-02-25 | 2006-04-18 | Taiwan Semiconductor Manufacturing Co., Ltd. | Space process to prevent the reverse tunneling in split gate flash |
KR100746198B1 (ko) * | 2005-07-08 | 2007-08-06 | 삼성전자주식회사 | 데이터 저장장치, 데이터 저장방법, 및 그 기록매체 |
KR101260632B1 (ko) * | 2005-09-30 | 2013-05-03 | 모사이드 테크놀로지스 인코퍼레이티드 | 출력 제어 메모리 |
US7236402B2 (en) * | 2005-11-30 | 2007-06-26 | Freescale Semiconductor, Inc. | Method and apparatus for programming/erasing a non-volatile memory |
US7345914B2 (en) * | 2005-12-22 | 2008-03-18 | Intel Corporation | Use of flash memory blocks outside of the main flash memory array |
US7436708B2 (en) * | 2006-03-01 | 2008-10-14 | Micron Technology, Inc. | NAND memory device column charging |
KR100739256B1 (ko) * | 2006-05-12 | 2007-07-12 | 주식회사 하이닉스반도체 | 소거 동작시 메모리 셀 블록의 크기를 선택적으로 변경하는기능을 가지는 플래시 메모리 장치 및 그 소거 동작 방법 |
WO2008001363A2 (en) * | 2006-06-27 | 2008-01-03 | Kdr Flashware Ltd. | Monolithic flash memory having integrated code and data memory portions |
JP4997882B2 (ja) * | 2006-09-05 | 2012-08-08 | ソニー株式会社 | 不揮発性半導体記憶装置およびその書き込み方法 |
KR100851546B1 (ko) * | 2006-09-22 | 2008-08-11 | 삼성전자주식회사 | 비휘발성 기억 장치 및 그 동작 방법 |
KR100909362B1 (ko) | 2006-11-21 | 2009-07-24 | 삼성전자주식회사 | 향상된 프로그램 성능을 갖는 플래시 메모리 장치 및그것을 포함한 스마트 카드 |
US8320191B2 (en) | 2007-08-30 | 2012-11-27 | Infineon Technologies Ag | Memory cell arrangement, method for controlling a memory cell, memory array and electronic device |
KR100909627B1 (ko) * | 2007-10-10 | 2009-07-27 | 주식회사 하이닉스반도체 | 플래시 메모리소자 |
WO2009059329A1 (en) * | 2007-11-01 | 2009-05-07 | Jonker, Llc | Integrated circuit embedded with non-volatile one-time-programmable and multiple-time programmable memory |
US8580622B2 (en) | 2007-11-14 | 2013-11-12 | Invensas Corporation | Method of making integrated circuit embedded with non-volatile programmable memory having variable coupling |
US7787295B2 (en) * | 2007-11-14 | 2010-08-31 | Jonker Llc | Integrated circuit embedded with non-volatile multiple-time programmable memory having variable coupling |
US7876615B2 (en) | 2007-11-14 | 2011-01-25 | Jonker Llc | Method of operating integrated circuit embedded with non-volatile programmable memory having variable coupling related application data |
WO2009097681A1 (en) * | 2008-02-04 | 2009-08-13 | Mosaid Technologies Incorporated | Flexible memory operations in nand flash devices |
US8068365B2 (en) | 2008-02-04 | 2011-11-29 | Mosaid Technologies Incorporated | Non-volatile memory device having configurable page size |
US20090251972A1 (en) * | 2008-04-03 | 2009-10-08 | Yue-Song He | Nonvolatile memory arrays with charge trapping dielectric and with non-dielectric nanodots |
US8305805B2 (en) * | 2008-11-03 | 2012-11-06 | Invensas Corporation | Common drain non-volatile multiple-time programmable memory |
US8203861B2 (en) * | 2008-12-30 | 2012-06-19 | Invensas Corporation | Non-volatile one-time—programmable and multiple-time programmable memory configuration circuit |
US10074438B2 (en) * | 2016-06-10 | 2018-09-11 | Cypress Semiconductor Corporation | Methods and devices for reducing program disturb in non-volatile memory cell arrays |
US9997253B1 (en) | 2016-12-08 | 2018-06-12 | Cypress Semiconductor Corporation | Non-volatile memory array with memory gate line and source line scrambling |
US10720214B2 (en) | 2017-11-30 | 2020-07-21 | Taiwan Semiconductor Manufacturing Co., Ltd. | Non-volatile memory device and method for controlling the non-volatile memory device |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100274099B1 (ko) * | 1991-08-02 | 2001-01-15 | 비센트 비.인그라시아 | 점진적으로 프로그램가능한 비휘발성 메모리 및 이를 구비한 집적 회로와 비휘발성 메모리 프로그래밍 방법 |
US5339279A (en) | 1993-05-07 | 1994-08-16 | Motorola, Inc. | Block erasable flash EEPROM apparatus and method thereof |
US5365484A (en) | 1993-08-23 | 1994-11-15 | Advanced Micro Devices, Inc. | Independent array grounds for flash EEPROM array with paged erase architechture |
US5606532A (en) | 1995-03-17 | 1997-02-25 | Atmel Corporation | EEPROM array with flash-like core |
US5621690A (en) * | 1995-04-28 | 1997-04-15 | Intel Corporation | Nonvolatile memory blocking architecture and redundancy |
US5687121A (en) | 1996-03-29 | 1997-11-11 | Aplus Integrated Circuits, Inc. | Flash EEPROM worldline decoder |
US5682350A (en) | 1996-03-29 | 1997-10-28 | Aplus Integrated Circuits, Inc. | Flash memory with divided bitline |
US5646890A (en) | 1996-03-29 | 1997-07-08 | Aplus Integrated Circuits, Inc. | Flexible byte-erase flash memory and decoder |
US5712815A (en) * | 1996-04-22 | 1998-01-27 | Advanced Micro Devices, Inc. | Multiple bits per-cell flash EEPROM capable of concurrently programming and verifying memory cells and reference cells |
US5890192A (en) | 1996-11-05 | 1999-03-30 | Sandisk Corporation | Concurrent write of multiple chunks of data into multiple subarrays of flash EEPROM |
JPH10177797A (ja) * | 1996-12-17 | 1998-06-30 | Toshiba Corp | 半導体記憶装置 |
JPH1145587A (ja) | 1997-07-25 | 1999-02-16 | Mitsubishi Electric Corp | 半導体集積回路装置およびプログラム方法 |
US5852577A (en) | 1998-05-05 | 1998-12-22 | Silicon Storage Technology, Inc. | Electrically erasable and programmable read-only memory having a small unit for program and erase |
JP3629144B2 (ja) * | 1998-06-01 | 2005-03-16 | 株式会社東芝 | 不揮発性半導体記憶装置 |
US5995417A (en) * | 1998-10-20 | 1999-11-30 | Advanced Micro Devices, Inc. | Scheme for page erase and erase verify in a non-volatile memory array |
-
2000
- 2000-05-03 US US09/564,324 patent/US6400603B1/en not_active Expired - Lifetime
-
2001
- 2001-04-26 WO PCT/US2001/013581 patent/WO2001084556A1/en not_active Application Discontinuation
- 2001-04-26 IL IL15257701A patent/IL152577A0/xx unknown
- 2001-04-26 KR KR1020027014751A patent/KR100698340B1/ko not_active IP Right Cessation
- 2001-04-26 AU AU2001255732A patent/AU2001255732A1/en not_active Abandoned
- 2001-04-26 JP JP2001581285A patent/JP4966472B2/ja not_active Expired - Lifetime
- 2001-04-26 CA CA002407888A patent/CA2407888A1/en not_active Abandoned
- 2001-04-26 BR BR0110585-0A patent/BR0110585A/pt not_active IP Right Cessation
- 2001-04-26 NZ NZ522383A patent/NZ522383A/en unknown
- 2001-04-26 EP EP01928930A patent/EP1305805A1/en not_active Withdrawn
- 2001-12-18 US US10/022,314 patent/US6510081B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
NZ522383A (en) | 2004-03-26 |
US6510081B2 (en) | 2003-01-21 |
US20020114185A1 (en) | 2002-08-22 |
KR20030014212A (ko) | 2003-02-15 |
JP2003532968A (ja) | 2003-11-05 |
BR0110585A (pt) | 2004-04-06 |
CA2407888A1 (en) | 2001-11-08 |
AU2001255732A1 (en) | 2001-11-12 |
WO2001084556A1 (en) | 2001-11-08 |
KR100698340B1 (ko) | 2007-03-23 |
US6400603B1 (en) | 2002-06-04 |
EP1305805A1 (en) | 2003-05-02 |
JP4966472B2 (ja) | 2012-07-04 |
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