IL124556A - A method for testing output / input switching using JTAG - Google Patents
A method for testing output / input switching using JTAGInfo
- Publication number
- IL124556A IL124556A IL12455696A IL12455696A IL124556A IL 124556 A IL124556 A IL 124556A IL 12455696 A IL12455696 A IL 12455696A IL 12455696 A IL12455696 A IL 12455696A IL 124556 A IL124556 A IL 124556A
- Authority
- IL
- Israel
- Prior art keywords
- boundary scan
- shift register
- test
- test pattern
- scan shift
- Prior art date
Links
- 238000010998 test method Methods 0.000 title description 2
- 238000012360 testing method Methods 0.000 claims abstract description 116
- 238000000034 method Methods 0.000 claims abstract description 18
- 239000013598 vector Substances 0.000 claims description 14
- 230000000295 complement effect Effects 0.000 claims description 10
- 230000004044 response Effects 0.000 claims description 4
- 230000000630 rising effect Effects 0.000 description 27
- 230000000694 effects Effects 0.000 description 13
- 230000007704 transition Effects 0.000 description 13
- 239000000872 buffer Substances 0.000 description 7
- 238000010586 diagram Methods 0.000 description 6
- 230000006870 function Effects 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 2
- 230000002457 bidirectional effect Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 230000002950 deficient Effects 0.000 description 2
- 230000007257 malfunction Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 235000021251 pulses Nutrition 0.000 description 2
- XAAILNNJDMIMON-UHFFFAOYSA-N 2'-anilino-6'-(dibutylamino)-3'-methylspiro[2-benzofuran-3,9'-xanthene]-1-one Chemical compound C=1C(N(CCCC)CCCC)=CC=C(C2(C3=CC=CC=C3C(=O)O2)C2=C3)C=1OC2=CC(C)=C3NC1=CC=CC=C1 XAAILNNJDMIMON-UHFFFAOYSA-N 0.000 description 1
- 241000269420 Bufonidae Species 0.000 description 1
- 101100366890 Dictyostelium discoideum dstB gene Proteins 0.000 description 1
- 235000010627 Phaseolus vulgaris Nutrition 0.000 description 1
- 244000046052 Phaseolus vulgaris Species 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000007429 general method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000002674 ointment Substances 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 238000010561 standard procedure Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318544—Scanning methods, algorithms and patterns
- G01R31/318547—Data generators or compressors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US08/596,043 US5648973A (en) | 1996-02-06 | 1996-02-06 | I/O toggle test method using JTAG |
| PCT/US1996/015151 WO1997029382A1 (en) | 1996-02-06 | 1996-09-26 | I/o toggle test method using jtag |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| IL124556A0 IL124556A0 (en) | 1998-12-06 |
| IL124556A true IL124556A (en) | 2001-06-14 |
Family
ID=24385765
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| IL12455696A IL124556A (en) | 1996-02-06 | 1996-09-26 | A method for testing output / input switching using JTAG |
Country Status (11)
| Country | Link |
|---|---|
| US (1) | US5648973A (de) |
| EP (1) | EP0880708B1 (de) |
| JP (1) | JP3612336B2 (de) |
| KR (1) | KR100265138B1 (de) |
| CN (1) | CN1091880C (de) |
| AU (1) | AU7367196A (de) |
| DE (1) | DE69623334T2 (de) |
| IL (1) | IL124556A (de) |
| RU (1) | RU2163023C2 (de) |
| TW (1) | TW305027B (de) |
| WO (1) | WO1997029382A1 (de) |
Families Citing this family (33)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE768538T1 (de) * | 1995-10-13 | 1998-03-12 | Jtag Technologies Bv | Verfahren, Prüfer und Schaltung zur Triggerimpulsbeauftragung einer Einrichtung |
| JP3607760B2 (ja) * | 1995-10-13 | 2005-01-05 | 富士通株式会社 | 半導体集積回路装置 |
| US6804725B1 (en) * | 1996-08-30 | 2004-10-12 | Texas Instruments Incorporated | IC with state machine controlled linking module |
| KR100247012B1 (ko) * | 1997-05-15 | 2000-03-15 | 윤종용 | 통신시스템의 상태정보 수집 및 제어장치 |
| US6049901A (en) * | 1997-09-16 | 2000-04-11 | Stock; Mary C. | Test system for integrated circuits using a single memory for both the parallel and scan modes of testing |
| US6100743A (en) * | 1998-08-25 | 2000-08-08 | Lucent Technologies Inc. | Circuit arrangement for adding functionality to a circuit with reduced propagation delays |
| US6532557B1 (en) * | 1999-09-23 | 2003-03-11 | Silicon Motion, Inc. | Method and apparatus for improving fault test coverage for an integrated circuit |
| US6272657B1 (en) | 1999-10-19 | 2001-08-07 | Atmel Corporation | Apparatus and method for progammable parametric toggle testing of digital CMOS pads |
| US6594802B1 (en) * | 2000-03-23 | 2003-07-15 | Intellitech Corporation | Method and apparatus for providing optimized access to circuits for debug, programming, and test |
| US6586921B1 (en) * | 2000-05-12 | 2003-07-01 | Logicvision, Inc. | Method and circuit for testing DC parameters of circuit input and output nodes |
| US6498999B1 (en) * | 2000-07-24 | 2002-12-24 | Lsi Logic Corporation | Method and apparatus for design verification of an integrated circuit using a simulation test bench environment |
| EP1324061A3 (de) * | 2001-12-28 | 2003-08-20 | Koninklijke Philips Electronics N.V. | Simulationstestverfahren für eine integrierte Schaltung |
| CN100370264C (zh) * | 2003-07-28 | 2008-02-20 | 华为技术有限公司 | 一种自动识别电路板类型的方法 |
| US7109734B2 (en) * | 2003-12-18 | 2006-09-19 | Xilinx, Inc. | Characterizing circuit performance by separating device and interconnect impact on signal delay |
| US20060156098A1 (en) * | 2004-11-30 | 2006-07-13 | Bawany Mahuammad A | Method and apparatus for testing an electronic device |
| US20070081396A1 (en) * | 2005-10-06 | 2007-04-12 | Gordon Tarl S | System and method for multi-use eFuse macro |
| CN1877995A (zh) * | 2006-01-24 | 2006-12-13 | 华为技术有限公司 | 一种芯片接口数据传送的方法和装置 |
| JP2007287770A (ja) * | 2006-04-13 | 2007-11-01 | Matsushita Electric Ind Co Ltd | 半導体集積回路 |
| CN100449320C (zh) * | 2006-06-23 | 2009-01-07 | 河海大学 | 板级时序电路测试矢量生成方法 |
| US20080005634A1 (en) * | 2006-06-29 | 2008-01-03 | Grise Gary D | Scan chain circuitry that enables scan testing at functional clock speed |
| KR100869848B1 (ko) | 2007-05-21 | 2008-11-21 | 주식회사 하이닉스반도체 | 번인 테스트 장치 및 이를 이용한 반도체 장치 |
| CN101470170B (zh) * | 2007-12-27 | 2011-04-13 | 华为技术有限公司 | Jtag链路测试方法及其装置 |
| US8621125B2 (en) * | 2009-10-13 | 2013-12-31 | Intellitech Corporation | System and method of sending and receiving data and commands using the TCK and TMS of IEEE 1149.1 |
| JP2012026950A (ja) * | 2010-07-27 | 2012-02-09 | Sony Corp | 集積半導体装置 |
| CN105891695B (zh) * | 2014-05-07 | 2019-01-11 | 紫光同芯微电子有限公司 | 一种基于单io的ic卡并行测试方法 |
| CN106918724A (zh) * | 2015-12-24 | 2017-07-04 | 英业达科技有限公司 | 适用于快捷外设互联标准插槽的测试电路板 |
| CN106918771A (zh) * | 2015-12-24 | 2017-07-04 | 英业达科技有限公司 | 适用于通用串行总线连接器的测试电路板 |
| US10060979B2 (en) | 2016-08-02 | 2018-08-28 | Texas Instruments Incorporated | Generating multiple pseudo static control signals using on-chip JTAG state machine |
| CN107843828A (zh) * | 2017-10-26 | 2018-03-27 | 电子科技大学 | 一种基于fpga的数字电路边界扫描控制系统 |
| WO2020043014A1 (en) | 2018-08-28 | 2020-03-05 | Changxin Memory Technologies, Inc. | Boundary test circuit, memory and boundary test method |
| CN109298322A (zh) * | 2018-09-27 | 2019-02-01 | 西安微电子技术研究所 | 一种动态变链长扫描结构及其方法和边界扫描单元 |
| US11567121B2 (en) * | 2020-03-31 | 2023-01-31 | Texas Instruments Incorporated | Integrated circuit with embedded testing circuitry |
| CN112214368B (zh) * | 2020-10-23 | 2022-06-14 | 英业达科技有限公司 | 动态负载控制系统及其方法 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE68928837T2 (de) * | 1988-09-07 | 1999-05-12 | Texas Instruments Inc | Prüf-Puffer/Register |
| DE68928613T2 (de) * | 1988-09-07 | 1998-09-24 | Texas Instruments Inc | Bidirektionale-Boundary-Scan-Testzelle |
| US5056094A (en) * | 1989-06-09 | 1991-10-08 | Texas Instruments Incorporated | Delay fault testing method and apparatus |
| US5150366A (en) * | 1990-08-01 | 1992-09-22 | International Business Machines Corp. | Reduced delay circuits for shift register latch scan strings |
| US5253255A (en) * | 1990-11-02 | 1993-10-12 | Intel Corporation | Scan mechanism for monitoring the state of internal signals of a VLSI microprocessor chip |
| US5416784A (en) * | 1991-10-28 | 1995-05-16 | Sequoia Semiconductor | Built-in self-test flip-flop with asynchronous input |
| US5450415A (en) * | 1992-11-25 | 1995-09-12 | Matsushita Electric Industrial Co., Ltd. | Boundary scan cell circuit and boundary scan test circuit |
-
1996
- 1996-02-06 US US08/596,043 patent/US5648973A/en not_active Expired - Lifetime
- 1996-09-26 AU AU73671/96A patent/AU7367196A/en not_active Abandoned
- 1996-09-26 JP JP52797397A patent/JP3612336B2/ja not_active Expired - Fee Related
- 1996-09-26 EP EP96935890A patent/EP0880708B1/de not_active Expired - Lifetime
- 1996-09-26 IL IL12455696A patent/IL124556A/en not_active IP Right Cessation
- 1996-09-26 RU RU98116488/09A patent/RU2163023C2/ru not_active IP Right Cessation
- 1996-09-26 KR KR1019980704325A patent/KR100265138B1/ko not_active IP Right Cessation
- 1996-09-26 DE DE69623334T patent/DE69623334T2/de not_active Expired - Lifetime
- 1996-09-26 WO PCT/US1996/015151 patent/WO1997029382A1/en active IP Right Grant
- 1996-09-26 CN CN96199899A patent/CN1091880C/zh not_active Expired - Fee Related
- 1996-10-07 TW TW085112242A patent/TW305027B/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| WO1997029382A1 (en) | 1997-08-14 |
| DE69623334D1 (de) | 2002-10-02 |
| RU2163023C2 (ru) | 2001-02-10 |
| JP3612336B2 (ja) | 2005-01-19 |
| DE69623334T2 (de) | 2003-04-24 |
| KR19990072031A (ko) | 1999-09-27 |
| JP2001513874A (ja) | 2001-09-04 |
| KR100265138B1 (ko) | 2000-09-01 |
| CN1091880C (zh) | 2002-10-02 |
| EP0880708A1 (de) | 1998-12-02 |
| US5648973A (en) | 1997-07-15 |
| AU7367196A (en) | 1997-08-28 |
| IL124556A0 (en) | 1998-12-06 |
| EP0880708B1 (de) | 2002-08-28 |
| TW305027B (en) | 1997-05-11 |
| EP0880708A4 (de) | 1999-10-13 |
| CN1211323A (zh) | 1999-03-17 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| FF | Patent granted | ||
| KB | Patent renewed | ||
| KB | Patent renewed | ||
| KB | Patent renewed | ||
| MM9K | Patent not in force due to non-payment of renewal fees |