IE52758B1 - Gate enhanced rectifier - Google Patents
Gate enhanced rectifierInfo
- Publication number
- IE52758B1 IE52758B1 IE2693/81A IE269381A IE52758B1 IE 52758 B1 IE52758 B1 IE 52758B1 IE 2693/81 A IE2693/81 A IE 2693/81A IE 269381 A IE269381 A IE 269381A IE 52758 B1 IE52758 B1 IE 52758B1
- Authority
- IE
- Ireland
- Prior art keywords
- island
- gate
- electrode
- base region
- gate electrode
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 claims abstract description 18
- 238000009825 accumulation Methods 0.000 claims abstract description 11
- 238000002347 injection Methods 0.000 claims description 26
- 239000007924 injection Substances 0.000 claims description 26
- 239000000463 material Substances 0.000 claims description 14
- 239000000969 carrier Substances 0.000 claims description 12
- 230000000903 blocking effect Effects 0.000 abstract description 17
- 230000002441 reversible effect Effects 0.000 abstract description 12
- 230000005669 field effect Effects 0.000 abstract description 7
- 230000001172 regenerating effect Effects 0.000 description 12
- 238000005215 recombination Methods 0.000 description 5
- 230000006798 recombination Effects 0.000 description 5
- 230000008901 benefit Effects 0.000 description 4
- 238000009792 diffusion process Methods 0.000 description 4
- 230000007246 mechanism Effects 0.000 description 4
- 230000003071 parasitic effect Effects 0.000 description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 3
- 239000004020 conductor Substances 0.000 description 3
- 230000008030 elimination Effects 0.000 description 3
- 238000003379 elimination reaction Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- 230000009471 action Effects 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 230000001629 suppression Effects 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000002800 charge carrier Substances 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 239000003989 dielectric material Substances 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 230000000977 initiatory effect Effects 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 230000003252 repetitive effect Effects 0.000 description 1
- 230000007480 spreading Effects 0.000 description 1
- 230000002459 sustained effect Effects 0.000 description 1
- 230000001052 transient effect Effects 0.000 description 1
- 230000001960 triggered effect Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/70—Bipolar devices
- H01L29/72—Transistor-type devices, i.e. able to continuously respond to applied control signals
- H01L29/739—Transistor-type devices, i.e. able to continuously respond to applied control signals controlled by field-effect, e.g. bipolar static induction transistors [BSIT]
- H01L29/7393—Insulated gate bipolar mode transistors, i.e. IGBT; IGT; COMFET
- H01L29/7395—Vertical transistors, e.g. vertical IGBT
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
- H01L29/08—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
- H01L29/083—Anode or cathode regions of thyristors or gated bipolar-mode devices
- H01L29/0834—Anode regions of thyristors or gated bipolar-mode devices, e.g. supplementary regions surrounding anode regions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
- H01L29/08—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
- H01L29/0843—Source or drain regions of field-effect devices
- H01L29/0847—Source or drain regions of field-effect devices of field-effect transistors with insulated gate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
- H01L29/08—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
- H01L29/0843—Source or drain regions of field-effect devices
- H01L29/0847—Source or drain regions of field-effect devices of field-effect transistors with insulated gate
- H01L29/0852—Source or drain regions of field-effect devices of field-effect transistors with insulated gate of DMOS transistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/41—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions
- H01L29/423—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions not carrying the current to be rectified, amplified or switched
- H01L29/42312—Gate electrodes for field effect devices
- H01L29/42316—Gate electrodes for field effect devices for field-effect transistors
- H01L29/4232—Gate electrodes for field effect devices for field-effect transistors with insulated gate
- H01L29/42372—Gate electrodes for field effect devices for field-effect transistors with insulated gate characterised by the conducting layer, e.g. the length, the sectional shape or the lay-out
- H01L29/42376—Gate electrodes for field effect devices for field-effect transistors with insulated gate characterised by the conducting layer, e.g. the length, the sectional shape or the lay-out characterised by the length or the sectional shape
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Thyristors (AREA)
- Electrodes Of Semiconductors (AREA)
- Junction Field-Effect Transistors (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US21218180A | 1980-12-02 | 1980-12-02 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| IE812693L IE812693L (en) | 1982-06-02 |
| IE52758B1 true IE52758B1 (en) | 1988-02-17 |
Family
ID=22789906
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| IE2693/81A IE52758B1 (en) | 1980-12-02 | 1981-11-17 | Gate enhanced rectifier |
Country Status (8)
| Country | Link |
|---|---|
| JP (1) | JPS57120369A (ja) |
| CH (1) | CH657230A5 (ja) |
| DE (1) | DE3147075A1 (ja) |
| FR (1) | FR2495382B1 (ja) |
| GB (1) | GB2088631B (ja) |
| IE (1) | IE52758B1 (ja) |
| MX (1) | MX151412A (ja) |
| SE (1) | SE8107136L (ja) |
Families Citing this family (37)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58212173A (ja) * | 1982-04-01 | 1983-12-09 | 株式会社東芝 | 制御装置を備えたバイポ−ラ・トランジスタ装置 |
| DE3380136D1 (en) * | 1982-04-12 | 1989-08-03 | Gen Electric | Semiconductor device having a diffused region of reduced length and method of fabricating the same |
| JPS594077A (ja) * | 1982-06-30 | 1984-01-10 | Toshiba Corp | 電界効果トランジスタ |
| JPS5927569A (ja) * | 1982-08-06 | 1984-02-14 | Hitachi Ltd | 半導体スイツチ素子 |
| EP0273030A3 (en) * | 1982-12-13 | 1988-09-21 | General Electric Company | Lateral insulated-gate rectifier structures |
| CA1200322A (en) * | 1982-12-13 | 1986-02-04 | General Electric Company | Bidirectional insulated-gate rectifier structures and method of operation |
| EP0118007B1 (en) * | 1983-02-04 | 1990-05-23 | General Electric Company | Electrical circuit comprising a hybrid power switching semiconductor device including an scr structure |
| JPS59211271A (ja) * | 1983-05-17 | 1984-11-30 | Toshiba Corp | 半導体装置 |
| JPS605568A (ja) * | 1983-06-23 | 1985-01-12 | Sanken Electric Co Ltd | 縦型絶縁ゲ−ト電界効果トランジスタ |
| EP0144654A3 (en) * | 1983-11-03 | 1987-10-07 | General Electric Company | Semiconductor device structure including a dielectrically-isolated insulated-gate transistor |
| US4618872A (en) * | 1983-12-05 | 1986-10-21 | General Electric Company | Integrated power switching semiconductor devices including IGT and MOSFET structures |
| JPS60174258U (ja) * | 1983-12-22 | 1985-11-19 | 株式会社明電舎 | 電界制御型半導体素子 |
| JPH0810763B2 (ja) * | 1983-12-28 | 1996-01-31 | 株式会社日立製作所 | 半導体装置 |
| JPH0618255B2 (ja) * | 1984-04-04 | 1994-03-09 | 株式会社東芝 | 半導体装置 |
| US4672407A (en) * | 1984-05-30 | 1987-06-09 | Kabushiki Kaisha Toshiba | Conductivity modulated MOSFET |
| JPS61185971A (ja) * | 1985-02-14 | 1986-08-19 | Toshiba Corp | 伝導度変調型半導体装置 |
| JPS61191071A (ja) * | 1985-02-20 | 1986-08-25 | Toshiba Corp | 伝導度変調型半導体装置及びその製造方法 |
| DE3677627D1 (de) * | 1985-04-24 | 1991-04-04 | Gen Electric | Halbleiteranordnung mit isoliertem gate. |
| DE3628857A1 (de) * | 1985-08-27 | 1987-03-12 | Mitsubishi Electric Corp | Halbleitereinrichtung |
| JPS6248073A (ja) * | 1985-08-27 | 1987-03-02 | Mitsubishi Electric Corp | 半導体装置 |
| JPH0715998B2 (ja) * | 1985-08-27 | 1995-02-22 | 三菱電機株式会社 | 半導体装置 |
| US4809045A (en) * | 1985-09-30 | 1989-02-28 | General Electric Company | Insulated gate device |
| JPS62126668A (ja) * | 1985-11-27 | 1987-06-08 | Mitsubishi Electric Corp | 半導体装置 |
| JPH0821713B2 (ja) * | 1987-02-26 | 1996-03-04 | 株式会社東芝 | 導電変調型ｍｏｓｆｅｔ |
| JPH0624244B2 (ja) * | 1987-06-12 | 1994-03-30 | 株式会社日立製作所 | 複合半導体装置 |
| JP2576173B2 (ja) * | 1988-02-02 | 1997-01-29 | 日本電装株式会社 | 絶縁ゲート型半導体装置 |
| DE58909474D1 (de) * | 1988-02-24 | 1995-11-30 | Siemens Ag | Verfahren zur Herstellung eines durch Feldeffekt steuerbaren Bipolartransistors. |
| JPH07120799B2 (ja) * | 1988-04-01 | 1995-12-20 | 株式会社日立製作所 | 半導体装置 |
| JPH0247874A (ja) * | 1988-08-10 | 1990-02-16 | Fuji Electric Co Ltd | Ｍｏｓ型半導体装置の製造方法 |
| EP0409010A1 (de) * | 1989-07-19 | 1991-01-23 | Asea Brown Boveri Ag | Abschaltbares Leistungshalbleiterbauelement |
| JP2752184B2 (ja) * | 1989-09-11 | 1998-05-18 | 株式会社東芝 | 電力用半導体装置 |
| GB8921596D0 (en) * | 1989-09-25 | 1989-11-08 | Lucas Ind Plc | Mos gated bipolar devices |
| DE3942490C2 (de) * | 1989-12-22 | 1994-03-24 | Daimler Benz Ag | Feldeffekt-gesteuertes Halbleiterbauelement |
| JP2808882B2 (ja) * | 1990-05-07 | 1998-10-08 | 富士電機株式会社 | 絶縁ゲート型バイポーラトランジスタ |
| AU650064B2 (en) * | 1990-10-31 | 1994-06-09 | Monodor S.A. | Method for preparing a liquid product and device for implementing same |
| JPH0548111A (ja) * | 1991-08-12 | 1993-02-26 | Toshiba Corp | 半導体装置およびその製造方法 |
| JP2984478B2 (ja) * | 1992-08-15 | 1999-11-29 | 株式会社東芝 | 伝導度変調型半導体装置及びその製造方法 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2040657C3 (de) * | 1970-08-17 | 1975-10-02 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Elektronischer Schalter für Halbleiterkoppelpunkte in Fernmelde-, insbesondere Fernsprechvermittlungsanlagen |
| US3831187A (en) * | 1973-04-11 | 1974-08-20 | Rca Corp | Thyristor having capacitively coupled control electrode |
| US4364073A (en) * | 1980-03-25 | 1982-12-14 | Rca Corporation | Power MOSFET with an anode region |
-
1981
- 1981-04-01 SE SE8107136A patent/SE8107136L/ not_active Application Discontinuation
- 1981-11-17 IE IE2693/81A patent/IE52758B1/en unknown
- 1981-11-24 GB GB8135419A patent/GB2088631B/en not_active Expired
- 1981-11-27 CH CH7616/81A patent/CH657230A5/de not_active IP Right Cessation
- 1981-11-27 DE DE19813147075 patent/DE3147075A1/de not_active Withdrawn
- 1981-11-30 JP JP56190983A patent/JPS57120369A/ja active Pending
- 1981-12-01 FR FR8122488A patent/FR2495382B1/fr not_active Expired
- 1981-12-02 MX MX190377A patent/MX151412A/es unknown
Also Published As
| Publication number | Publication date |
|---|---|
| MX151412A (es) | 1984-11-14 |
| IE812693L (en) | 1982-06-02 |
| DE3147075A1 (de) | 1982-07-01 |
| FR2495382A1 (fr) | 1982-06-04 |
| GB2088631B (en) | 1984-11-28 |
| JPS57120369A (en) | 1982-07-27 |
| GB2088631A (en) | 1982-06-09 |
| CH657230A5 (de) | 1986-08-15 |
| SE8107136L (sv) | 1982-06-03 |
| FR2495382B1 (fr) | 1988-04-29 |
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