HK1225790A1 - X射線檢查系統以及用於借助於這種x射線檢查系統轉動檢查對象的方法 - Google Patents

X射線檢查系統以及用於借助於這種x射線檢查系統轉動檢查對象的方法

Info

Publication number
HK1225790A1
HK1225790A1 HK16113880A HK16113880A HK1225790A1 HK 1225790 A1 HK1225790 A1 HK 1225790A1 HK 16113880 A HK16113880 A HK 16113880A HK 16113880 A HK16113880 A HK 16113880A HK 1225790 A1 HK1225790 A1 HK 1225790A1
Authority
HK
Hong Kong
Prior art keywords
inspection system
ray inspection
rotating
test object
ray
Prior art date
Application number
HK16113880A
Other languages
English (en)
Inventor
Andreas Mecke
Jan Spalding
Axel Klein
Original Assignee
Yxlon Int Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yxlon Int Gmbh filed Critical Yxlon Int Gmbh
Publication of HK1225790A1 publication Critical patent/HK1225790A1/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/041—Phase-contrast imaging, e.g. using grating interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/309—Accessories, mechanical or electrical features support of sample holder
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3303—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts object fixed; source and detector move
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3306—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts object rotates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3308—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts object translates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/044—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using laminography or tomosynthesis

Landscapes

  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Pulmonology (AREA)
  • Theoretical Computer Science (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
HK16113880A 2013-10-21 2016-12-06 X射線檢查系統以及用於借助於這種x射線檢查系統轉動檢查對象的方法 HK1225790A1 (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102013017462 2013-10-21

Publications (1)

Publication Number Publication Date
HK1225790A1 true HK1225790A1 (zh) 2017-09-15

Family

ID=51799070

Family Applications (1)

Application Number Title Priority Date Filing Date
HK16113880A HK1225790A1 (zh) 2013-10-21 2016-12-06 X射線檢查系統以及用於借助於這種x射線檢查系統轉動檢查對象的方法

Country Status (9)

Country Link
US (1) US10209204B2 (zh)
EP (1) EP3060903B1 (zh)
JP (1) JP6471151B2 (zh)
KR (1) KR102252257B1 (zh)
CN (1) CN105765375A (zh)
DE (1) DE112014004817A5 (zh)
GB (1) GB2534509B (zh)
HK (1) HK1225790A1 (zh)
WO (1) WO2015058855A1 (zh)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016205899A (ja) * 2015-04-17 2016-12-08 株式会社ミツトヨ 回転テーブルの制御方法及び装置
JP6915374B2 (ja) * 2017-05-19 2021-08-04 富士通株式会社 Ｘ線分析方法及びｘ線分析装置
JP6858372B2 (ja) * 2017-06-22 2021-04-14 リョーエイ株式会社 製品のｘ線ｃｔ検査方法
DE102018105460A1 (de) 2018-03-09 2019-09-12 Yxlon International Gmbh Computertomographiesystem sowie computertomographisches Verfahren
US11009449B2 (en) * 2018-04-20 2021-05-18 Fei Company Scanning trajectories for region-of-interest tomograph
JP7143567B2 (ja) * 2018-09-14 2022-09-29 株式会社島津テクノリサーチ 材料試験機および放射線ｃｔ装置
JP7217943B2 (ja) * 2019-04-11 2023-02-06 株式会社リガク 投影像の撮影方法、制御装置、制御プログラム、処理装置および処理プログラム
KR102288818B1 (ko) 2020-08-25 2021-08-12 주식회사 쎄크 엑스레이 검사 장치 및 엑스레이 검사 시스템
CN112881436A (zh) * 2021-01-08 2021-06-01 中广核工程有限公司 核电站异形小径管无损检测装置和检测方法
US20230010730A1 (en) * 2021-07-08 2023-01-12 Illinois Tool Works Inc. Customizable axes of rotation for industrial radiography systems

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AT363262B (de) * 1979-07-06 1981-07-27 Gurker Norbert Dr Ortsaufloesendes spektrometersystem
US4809308A (en) * 1986-02-20 1989-02-28 Irt Corporation Method and apparatus for performing automated circuit board solder quality inspections
GB9302452D0 (en) * 1993-02-06 1993-03-24 Atomic Energy Authority Uk Computed tomography
JP2003156455A (ja) * 2002-09-27 2003-05-30 Toshiba It & Control Systems Corp コンピュータ断層撮影装置
JP3891285B2 (ja) 2002-11-01 2007-03-14 株式会社島津製作所 Ｘ線透視装置
US7636165B2 (en) * 2006-03-21 2009-12-22 Asml Netherlands B.V. Displacement measurement systems lithographic apparatus and device manufacturing method
WO2009078415A1 (ja) 2007-12-17 2009-06-25 Uni-Hite System Corporation Ｘ線検査装置および方法
JP5365010B2 (ja) * 2008-01-24 2013-12-11 株式会社島津製作所 Ｘ線透視による３次元観測方法およびｘ線透視装置
KR100943002B1 (ko) * 2009-07-22 2010-02-18 (주)자비스 엑스레이검사장치
JP5451461B2 (ja) 2010-03-05 2014-03-26 三菱電機株式会社 駆動式患者台、駆動式患者台の制御装置、駆動式患者台制御用プログラム及びこれらを用いた粒子線治療装置
CN102283661B (zh) 2011-07-15 2014-05-14 杭州美诺瓦医疗科技有限公司 具有3个运动自由度的c臂乳腺机
JP5881006B2 (ja) * 2011-12-27 2016-03-09 東芝Ｉｔコントロールシステム株式会社 断層撮影装置

Also Published As

Publication number Publication date
WO2015058855A1 (de) 2015-04-30
EP3060903A1 (de) 2016-08-31
KR20160100295A (ko) 2016-08-23
US20160238541A1 (en) 2016-08-18
GB2534509B (en) 2020-04-08
DE112014004817A5 (de) 2016-07-07
US10209204B2 (en) 2019-02-19
CN105765375A (zh) 2016-07-13
GB2534509A (en) 2016-07-27
EP3060903B1 (de) 2024-05-15
JP2016533481A (ja) 2016-10-27
KR102252257B1 (ko) 2021-05-17
JP6471151B2 (ja) 2019-02-13

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