HK1170011A1 - Method for forming metal oxide film, metal oxide film and apparatus for forming metal oxide film - Google Patents

Method for forming metal oxide film, metal oxide film and apparatus for forming metal oxide film

Info

Publication number
HK1170011A1
HK1170011A1 HK12110711.3A HK12110711A HK1170011A1 HK 1170011 A1 HK1170011 A1 HK 1170011A1 HK 12110711 A HK12110711 A HK 12110711A HK 1170011 A1 HK1170011 A1 HK 1170011A1
Authority
HK
Hong Kong
Prior art keywords
oxide film
metal oxide
forming metal
forming
film
Prior art date
Application number
HK12110711.3A
Other languages
English (en)
Chinese (zh)
Inventor
織田容征
白幡孝洋
吉田章男
藤田靜雄
龜山直季
川原村敏幸
Original Assignee
東芝三菱電機產業系統株式會社
國立大學法人京都大學
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 東芝三菱電機產業系統株式會社, 國立大學法人京都大學 filed Critical 東芝三菱電機產業系統株式會社
Publication of HK1170011A1 publication Critical patent/HK1170011A1/xx

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C18/00Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
    • C23C18/02Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
    • C23C18/12Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material
    • C23C18/1204Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material inorganic material, e.g. non-oxide and non-metallic such as sulfides, nitrides based compounds
    • C23C18/1208Oxides, e.g. ceramics
    • C23C18/1216Metal oxides
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C18/00Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
    • C23C18/02Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
    • C23C18/12Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B05SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05DPROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05D3/00Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials
    • B05D3/02Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials by baking
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C18/00Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
    • C23C18/02Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
    • C23C18/12Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material
    • C23C18/125Process of deposition of the inorganic material
    • C23C18/1258Spray pyrolysis
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C18/00Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
    • C23C18/02Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
    • C23C18/12Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material
    • C23C18/125Process of deposition of the inorganic material
    • C23C18/1291Process of deposition of the inorganic material by heating of the substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/28Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
    • H01L21/283Deposition of conductive or insulating materials for electrodes conducting electric current
    • H01L21/288Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • H01L31/1884Manufacture of transparent electrodes, e.g. TCO, ITO
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01GCAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
    • H01G9/00Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
    • H01G9/20Light-sensitive devices
    • H01G9/2027Light-sensitive devices comprising an oxide semiconductor electrode
    • H01G9/2031Light-sensitive devices comprising an oxide semiconductor electrode comprising titanium oxide, e.g. TiO2
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76Unipolar devices, e.g. field effect transistors
    • H01L29/772Field effect transistors
    • H01L29/78Field effect transistors with field effect produced by an insulated gate
    • H01L29/786Thin film transistors, i.e. transistors with a channel being at least partly a thin film
    • H01L29/7869Thin film transistors, i.e. transistors with a channel being at least partly a thin film having a semiconductor body comprising an oxide semiconductor material, e.g. zinc oxide, copper aluminium oxide, cadmium stannate
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Organic Chemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Thermal Sciences (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Inorganic Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Ceramic Engineering (AREA)
  • Electromagnetism (AREA)
  • Chemically Coating (AREA)
  • Inorganic Compounds Of Heavy Metals (AREA)
  • Oxygen, Ozone, And Oxides In General (AREA)
  • Chemical Vapour Deposition (AREA)
HK12110711.3A 2009-09-02 2012-10-25 Method for forming metal oxide film, metal oxide film and apparatus for forming metal oxide film HK1170011A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2009/065314 WO2011027425A1 (fr) 2009-09-02 2009-09-02 Procédé de formation d'un film d'oxyde métallique, film d'oxyde métallique et appareil pour former un film d'oxyde métallique

Publications (1)

Publication Number Publication Date
HK1170011A1 true HK1170011A1 (en) 2013-02-15

Family

ID=43648986

Family Applications (1)

Application Number Title Priority Date Filing Date
HK12110711.3A HK1170011A1 (en) 2009-09-02 2012-10-25 Method for forming metal oxide film, metal oxide film and apparatus for forming metal oxide film

Country Status (7)

Country Link
US (1) US9574271B2 (fr)
JP (1) JP5652768B2 (fr)
KR (1) KR101348532B1 (fr)
CN (1) CN102482777B (fr)
DE (1) DE112009005204T5 (fr)
HK (1) HK1170011A1 (fr)
WO (1) WO2011027425A1 (fr)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013038484A1 (fr) 2011-09-13 2013-03-21 東芝三菱電機産業システム株式会社 Procédé de dépôt d'un film d'oxyde et dispositif afférent
JP6103633B2 (ja) * 2013-02-08 2017-03-29 高知県公立大学法人 オゾン支援による高品質均質金属酸化物薄膜作製技術、及び、該薄膜作製技術による酸化物薄膜トランジスタの製造方法
JP6505838B2 (ja) * 2015-06-18 2019-04-24 東芝三菱電機産業システム株式会社 金属酸化膜の成膜方法
US10167545B2 (en) * 2016-04-21 2019-01-01 Nanoco Technologies Ltd. Indium tin oxide thin films with both near-infrared transparency and excellent resistivity
KR102282119B1 (ko) * 2016-07-11 2021-07-27 도시바 미쓰비시덴키 산교시스템 가부시키가이샤 미스트 도포 성막 장치 및 미스트 도포 성막 방법
JP6924458B2 (ja) * 2016-11-10 2021-08-25 株式会社Flosfia 積層体の製造方法および積層体

Family Cites Families (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE785764A (fr) 1971-07-08 1973-01-03 Glaverbel
US3850665A (en) * 1971-07-08 1974-11-26 Glaverbel Process for forming a metal oxide coating on a substrate and resulting products
DE2826790C2 (de) 1978-06-19 1985-02-21 Akzo Gmbh, 5600 Wuppertal Spinnkopf zur Herstellung von Mehrkomponentenfäden
US4497667A (en) * 1983-07-11 1985-02-05 Amchem Products, Inc. Pretreatment compositions for metals
JP2671384B2 (ja) * 1988-05-26 1997-10-29 ソニー株式会社 金属化合物の形成装置
US5094882A (en) * 1990-12-12 1992-03-10 Ford Motor Company Zinc oxide film growth rate accelerator
JPH0959089A (ja) 1995-08-22 1997-03-04 Sony Corp 化学的気相成長方法
JPH09195050A (ja) 1996-01-12 1997-07-29 Kokusai Chodendo Sangyo Gijutsu Kenkyu Center 酸化物又は金属の製造方法
JPH10195086A (ja) 1997-01-07 1998-07-28 Mitsubishi Materials Corp 有機鉛化合物及び有機金属化学蒸着用原料溶液
JPH11209876A (ja) * 1998-01-26 1999-08-03 Nippon Asm Kk 薄膜形成装置及び方法
JP3069584B1 (ja) * 1999-02-17 2000-07-24 工業技術院長 薄膜作製装置
JP2002146536A (ja) * 2000-11-08 2002-05-22 Japan Science & Technology Corp 酸化スズ薄膜の低温形成方法
US7008669B2 (en) 2001-06-13 2006-03-07 Seiko Epson Corporation Ceramic and method of manufacturing the same, dielectric capacitor, semiconductor device, and element
ES2197785B1 (es) 2001-12-18 2005-03-01 Centro De Investigaciones Energeticas, Medioambientales Y Tecnologicas (C.I.E.M.A.T.) Procedimiento para depositar recubrimientos de metales y oxidos metalicos.
KR100528330B1 (ko) 2003-02-19 2005-11-16 삼성전자주식회사 무기 분말의 코팅방법 및 이에 의하여 제조된 코팅된무기입자
JP4025681B2 (ja) * 2003-05-02 2007-12-26 富士通株式会社 酸化物薄膜の製造方法、酸化物薄膜製造装置及び半導体装置の製造方法
JP4402991B2 (ja) * 2004-03-18 2010-01-20 日本パーカライジング株式会社 金属表面処理用組成物、金属表面処理用処理液、金属表面処理方法および金属材料
JP5055747B2 (ja) 2004-11-10 2012-10-24 大日本印刷株式会社 金属酸化物膜の製造方法
US7655566B2 (en) * 2005-07-27 2010-02-02 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing semiconductor device
JP2007144297A (ja) 2005-11-28 2007-06-14 Masaharu Kaneko 薄膜形成方法
JP2007242340A (ja) 2006-03-07 2007-09-20 Fujikura Ltd 透明導電性基板及びその製造方法並びにその製造装置
CN100427403C (zh) 2006-04-24 2008-10-22 陕西科技大学 一种氧化锌薄膜的制备方法
JP2008078113A (ja) 2006-08-25 2008-04-03 Fujikura Ltd 透明導電性基板の製造装置
JP5323849B2 (ja) 2008-09-24 2013-10-23 東芝三菱電機産業システム株式会社 酸化亜鉛膜(ZnO)または酸化マグネシウム亜鉛膜(ZnMgO)の成膜方法
KR101333437B1 (ko) 2008-09-24 2013-11-26 도시바 미쓰비시덴키 산교시스템 가부시키가이샤 금속 산화막의 성막 방법 및 금속 산화막의 성막 장치
JP2010084179A (ja) 2008-09-30 2010-04-15 Dainippon Printing Co Ltd ニッケル酸化物膜を有する積層体
CN102405305B (zh) 2009-04-20 2016-03-16 东芝三菱电机产业系统株式会社 金属氧化膜的成膜方法、金属氧化膜及金属氧化膜的成膜装置

Also Published As

Publication number Publication date
WO2011027425A1 (fr) 2011-03-10
JP5652768B2 (ja) 2015-01-14
US20120112187A1 (en) 2012-05-10
KR101348532B1 (ko) 2014-01-07
JPWO2011027425A1 (ja) 2013-01-31
US9574271B2 (en) 2017-02-21
CN102482777B (zh) 2014-08-06
CN102482777A (zh) 2012-05-30
DE112009005204T5 (de) 2012-06-28
KR20120032026A (ko) 2012-04-04

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