HK1170011A1 - Method for forming metal oxide film, metal oxide film and apparatus for forming metal oxide film - Google Patents
Method for forming metal oxide film, metal oxide film and apparatus for forming metal oxide filmInfo
- Publication number
- HK1170011A1 HK1170011A1 HK12110711.3A HK12110711A HK1170011A1 HK 1170011 A1 HK1170011 A1 HK 1170011A1 HK 12110711 A HK12110711 A HK 12110711A HK 1170011 A1 HK1170011 A1 HK 1170011A1
- Authority
- HK
- Hong Kong
- Prior art keywords
- oxide film
- metal oxide
- forming metal
- forming
- film
- Prior art date
Links
- 229910044991 metal oxide Inorganic materials 0.000 title 3
- 150000004706 metal oxides Chemical class 0.000 title 3
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/02—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
- C23C18/12—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material
- C23C18/1204—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material inorganic material, e.g. non-oxide and non-metallic such as sulfides, nitrides based compounds
- C23C18/1208—Oxides, e.g. ceramics
- C23C18/1216—Metal oxides
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/02—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
- C23C18/12—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D3/00—Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials
- B05D3/02—Pretreatment of surfaces to which liquids or other fluent materials are to be applied; After-treatment of applied coatings, e.g. intermediate treating of an applied coating preparatory to subsequent applications of liquids or other fluent materials by baking
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/02—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
- C23C18/12—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material
- C23C18/125—Process of deposition of the inorganic material
- C23C18/1258—Spray pyrolysis
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/02—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
- C23C18/12—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material
- C23C18/125—Process of deposition of the inorganic material
- C23C18/1291—Process of deposition of the inorganic material by heating of the substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/288—Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/1884—Manufacture of transparent electrodes, e.g. TCO, ITO
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
- H01G9/20—Light-sensitive devices
- H01G9/2027—Light-sensitive devices comprising an oxide semiconductor electrode
- H01G9/2031—Light-sensitive devices comprising an oxide semiconductor electrode comprising titanium oxide, e.g. TiO2
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/7869—Thin film transistors, i.e. transistors with a channel being at least partly a thin film having a semiconductor body comprising an oxide semiconductor material, e.g. zinc oxide, copper aluminium oxide, cadmium stannate
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Organic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Thermal Sciences (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Inorganic Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Ceramic Engineering (AREA)
- Electromagnetism (AREA)
- Chemically Coating (AREA)
- Inorganic Compounds Of Heavy Metals (AREA)
- Oxygen, Ozone, And Oxides In General (AREA)
- Chemical Vapour Deposition (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2009/065314 WO2011027425A1 (fr) | 2009-09-02 | 2009-09-02 | Procédé de formation d'un film d'oxyde métallique, film d'oxyde métallique et appareil pour former un film d'oxyde métallique |
Publications (1)
Publication Number | Publication Date |
---|---|
HK1170011A1 true HK1170011A1 (en) | 2013-02-15 |
Family
ID=43648986
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HK12110711.3A HK1170011A1 (en) | 2009-09-02 | 2012-10-25 | Method for forming metal oxide film, metal oxide film and apparatus for forming metal oxide film |
Country Status (7)
Country | Link |
---|---|
US (1) | US9574271B2 (fr) |
JP (1) | JP5652768B2 (fr) |
KR (1) | KR101348532B1 (fr) |
CN (1) | CN102482777B (fr) |
DE (1) | DE112009005204T5 (fr) |
HK (1) | HK1170011A1 (fr) |
WO (1) | WO2011027425A1 (fr) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2013038484A1 (fr) | 2011-09-13 | 2013-03-21 | 東芝三菱電機産業システム株式会社 | Procédé de dépôt d'un film d'oxyde et dispositif afférent |
JP6103633B2 (ja) * | 2013-02-08 | 2017-03-29 | 高知県公立大学法人 | オゾン支援による高品質均質金属酸化物薄膜作製技術、及び、該薄膜作製技術による酸化物薄膜トランジスタの製造方法 |
JP6505838B2 (ja) * | 2015-06-18 | 2019-04-24 | 東芝三菱電機産業システム株式会社 | 金属酸化膜の成膜方法 |
US10167545B2 (en) * | 2016-04-21 | 2019-01-01 | Nanoco Technologies Ltd. | Indium tin oxide thin films with both near-infrared transparency and excellent resistivity |
KR102282119B1 (ko) * | 2016-07-11 | 2021-07-27 | 도시바 미쓰비시덴키 산교시스템 가부시키가이샤 | 미스트 도포 성막 장치 및 미스트 도포 성막 방법 |
JP6924458B2 (ja) * | 2016-11-10 | 2021-08-25 | 株式会社Flosfia | 積層体の製造方法および積層体 |
Family Cites Families (27)
Publication number | Priority date | Publication date | Assignee | Title |
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BE785764A (fr) | 1971-07-08 | 1973-01-03 | Glaverbel | |
US3850665A (en) * | 1971-07-08 | 1974-11-26 | Glaverbel | Process for forming a metal oxide coating on a substrate and resulting products |
DE2826790C2 (de) | 1978-06-19 | 1985-02-21 | Akzo Gmbh, 5600 Wuppertal | Spinnkopf zur Herstellung von Mehrkomponentenfäden |
US4497667A (en) * | 1983-07-11 | 1985-02-05 | Amchem Products, Inc. | Pretreatment compositions for metals |
JP2671384B2 (ja) * | 1988-05-26 | 1997-10-29 | ソニー株式会社 | 金属化合物の形成装置 |
US5094882A (en) * | 1990-12-12 | 1992-03-10 | Ford Motor Company | Zinc oxide film growth rate accelerator |
JPH0959089A (ja) | 1995-08-22 | 1997-03-04 | Sony Corp | 化学的気相成長方法 |
JPH09195050A (ja) | 1996-01-12 | 1997-07-29 | Kokusai Chodendo Sangyo Gijutsu Kenkyu Center | 酸化物又は金属の製造方法 |
JPH10195086A (ja) | 1997-01-07 | 1998-07-28 | Mitsubishi Materials Corp | 有機鉛化合物及び有機金属化学蒸着用原料溶液 |
JPH11209876A (ja) * | 1998-01-26 | 1999-08-03 | Nippon Asm Kk | 薄膜形成装置及び方法 |
JP3069584B1 (ja) * | 1999-02-17 | 2000-07-24 | 工業技術院長 | 薄膜作製装置 |
JP2002146536A (ja) * | 2000-11-08 | 2002-05-22 | Japan Science & Technology Corp | 酸化スズ薄膜の低温形成方法 |
US7008669B2 (en) | 2001-06-13 | 2006-03-07 | Seiko Epson Corporation | Ceramic and method of manufacturing the same, dielectric capacitor, semiconductor device, and element |
ES2197785B1 (es) | 2001-12-18 | 2005-03-01 | Centro De Investigaciones Energeticas, Medioambientales Y Tecnologicas (C.I.E.M.A.T.) | Procedimiento para depositar recubrimientos de metales y oxidos metalicos. |
KR100528330B1 (ko) | 2003-02-19 | 2005-11-16 | 삼성전자주식회사 | 무기 분말의 코팅방법 및 이에 의하여 제조된 코팅된무기입자 |
JP4025681B2 (ja) * | 2003-05-02 | 2007-12-26 | 富士通株式会社 | 酸化物薄膜の製造方法、酸化物薄膜製造装置及び半導体装置の製造方法 |
JP4402991B2 (ja) * | 2004-03-18 | 2010-01-20 | 日本パーカライジング株式会社 | 金属表面処理用組成物、金属表面処理用処理液、金属表面処理方法および金属材料 |
JP5055747B2 (ja) | 2004-11-10 | 2012-10-24 | 大日本印刷株式会社 | 金属酸化物膜の製造方法 |
US7655566B2 (en) * | 2005-07-27 | 2010-02-02 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
JP2007144297A (ja) | 2005-11-28 | 2007-06-14 | Masaharu Kaneko | 薄膜形成方法 |
JP2007242340A (ja) | 2006-03-07 | 2007-09-20 | Fujikura Ltd | 透明導電性基板及びその製造方法並びにその製造装置 |
CN100427403C (zh) | 2006-04-24 | 2008-10-22 | 陕西科技大学 | 一种氧化锌薄膜的制备方法 |
JP2008078113A (ja) | 2006-08-25 | 2008-04-03 | Fujikura Ltd | 透明導電性基板の製造装置 |
JP5323849B2 (ja) | 2008-09-24 | 2013-10-23 | 東芝三菱電機産業システム株式会社 | 酸化亜鉛膜(ZnO)または酸化マグネシウム亜鉛膜(ZnMgO)の成膜方法 |
KR101333437B1 (ko) | 2008-09-24 | 2013-11-26 | 도시바 미쓰비시덴키 산교시스템 가부시키가이샤 | 금속 산화막의 성막 방법 및 금속 산화막의 성막 장치 |
JP2010084179A (ja) | 2008-09-30 | 2010-04-15 | Dainippon Printing Co Ltd | ニッケル酸化物膜を有する積層体 |
CN102405305B (zh) | 2009-04-20 | 2016-03-16 | 东芝三菱电机产业系统株式会社 | 金属氧化膜的成膜方法、金属氧化膜及金属氧化膜的成膜装置 |
-
2009
- 2009-09-02 CN CN200980161287.3A patent/CN102482777B/zh active Active
- 2009-09-02 WO PCT/JP2009/065314 patent/WO2011027425A1/fr active Application Filing
- 2009-09-02 DE DE112009005204T patent/DE112009005204T5/de not_active Ceased
- 2009-09-02 JP JP2011529718A patent/JP5652768B2/ja active Active
- 2009-09-02 KR KR1020127003704A patent/KR101348532B1/ko active IP Right Grant
- 2009-09-02 US US13/383,766 patent/US9574271B2/en active Active
-
2012
- 2012-10-25 HK HK12110711.3A patent/HK1170011A1/xx unknown
Also Published As
Publication number | Publication date |
---|---|
WO2011027425A1 (fr) | 2011-03-10 |
JP5652768B2 (ja) | 2015-01-14 |
US20120112187A1 (en) | 2012-05-10 |
KR101348532B1 (ko) | 2014-01-07 |
JPWO2011027425A1 (ja) | 2013-01-31 |
US9574271B2 (en) | 2017-02-21 |
CN102482777B (zh) | 2014-08-06 |
CN102482777A (zh) | 2012-05-30 |
DE112009005204T5 (de) | 2012-06-28 |
KR20120032026A (ko) | 2012-04-04 |
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