HK1157017A1 - 測量用探測器 - Google Patents
測量用探測器Info
- Publication number
- HK1157017A1 HK1157017A1 HK11111263.4A HK11111263A HK1157017A1 HK 1157017 A1 HK1157017 A1 HK 1157017A1 HK 11111263 A HK11111263 A HK 11111263A HK 1157017 A1 HK1157017 A1 HK 1157017A1
- Authority
- HK
- Hong Kong
- Prior art keywords
- measurement probe
- probe
- measurement
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
- G01R29/0878—Sensors; antennas; probes; detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/07—Non contact-making probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
- G01R31/002—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing where the device under test is an electronic circuit
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Measuring Leads Or Probes (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE202008009469U DE202008009469U1 (de) | 2008-07-15 | 2008-07-15 | Messsonde |
PCT/EP2009/004527 WO2010006683A1 (de) | 2008-07-15 | 2009-06-23 | Messsonde |
Publications (1)
Publication Number | Publication Date |
---|---|
HK1157017A1 true HK1157017A1 (zh) | 2012-06-22 |
Family
ID=39744708
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HK11111263.4A HK1157017A1 (zh) | 2008-07-15 | 2011-10-20 | 測量用探測器 |
Country Status (8)
Country | Link |
---|---|
US (1) | US8760184B2 (zh) |
EP (1) | EP2300835A1 (zh) |
JP (1) | JP5826628B2 (zh) |
CN (1) | CN102099693B (zh) |
CA (1) | CA2725636C (zh) |
DE (1) | DE202008009469U1 (zh) |
HK (1) | HK1157017A1 (zh) |
WO (1) | WO2010006683A1 (zh) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE202008013687U1 (de) * | 2008-10-15 | 2009-01-02 | Rosenberger Hochfrequenztechnik Gmbh & Co. Kg | Messanordnung mit Kalibriersubstrat und elektronischer Schaltung |
DE202008013982U1 (de) * | 2008-10-20 | 2009-01-08 | Rosenberger Hochfrequenztechnik Gmbh & Co. Kg | Messsystem zum Bestimmen von Streuparametern |
CN102736007A (zh) * | 2011-04-07 | 2012-10-17 | 旺矽科技股份有限公司 | 高频耦合信号调整方法及其测试装置 |
WO2015134040A1 (en) * | 2014-03-07 | 2015-09-11 | Agilent Technologies, Inc. | Dual-directional electro-optic probe |
US10230202B2 (en) | 2014-11-04 | 2019-03-12 | X-Microwave, Llc | Modular building block system for RF and microwave design of components and systems from concept to production |
US10775414B2 (en) * | 2017-09-29 | 2020-09-15 | Intel Corporation | Low-profile gimbal platform for high-resolution in situ co-planarity adjustment |
EP3495808A1 (en) | 2017-12-05 | 2019-06-12 | Airbus Helicopters | A probe for non-intrusively detecting imperfections in a test object |
EP3495809A1 (en) | 2017-12-05 | 2019-06-12 | Airbus Helicopters | A method for non-intrusively detecting imperfections in a test object |
US11061068B2 (en) | 2017-12-05 | 2021-07-13 | Intel Corporation | Multi-member test probe structure |
US11204555B2 (en) | 2017-12-28 | 2021-12-21 | Intel Corporation | Method and apparatus to develop lithographically defined high aspect ratio interconnects |
US11543454B2 (en) | 2018-09-25 | 2023-01-03 | Intel Corporation | Double-beam test probe |
US11125779B2 (en) * | 2018-11-15 | 2021-09-21 | Rohde & Schwarz Gmbh & Co. Kg | Probe with radio frequency power detector, test system and test method |
CN110045269A (zh) * | 2019-05-09 | 2019-07-23 | 肇庆学院 | 一种芯片测试装置及方法 |
JP7443017B2 (ja) * | 2019-10-17 | 2024-03-05 | 株式会社日本マイクロニクス | 検査プローブ、検査プローブの製造方法および検査装置 |
EP4170332A1 (en) | 2021-10-20 | 2023-04-26 | Airbus Helicopters | Apparatus and method for non-intrusively detecting imperfections in a test object |
Family Cites Families (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4853613A (en) * | 1987-10-27 | 1989-08-01 | Martin Marietta Corporation | Calibration method for apparatus evaluating microwave/millimeter wave circuits |
JPH0864643A (ja) * | 1994-08-19 | 1996-03-08 | Sanyo Electric Co Ltd | 高周波集積回路装置および高周波測定システム |
US5508630A (en) * | 1994-09-09 | 1996-04-16 | Board Of Regents, University Of Texas Systems | Probe having a power detector for use with microwave or millimeter wave device |
US6239752B1 (en) * | 1995-02-28 | 2001-05-29 | Stmicroelectronics, Inc. | Semiconductor chip package that is also an antenna |
JP3344682B2 (ja) * | 1995-04-05 | 2002-11-11 | 日本電信電話株式会社 | 電磁妨害波侵入経路の特定方法及び電磁妨害波探索装置 |
JP2001124809A (ja) * | 1999-10-26 | 2001-05-11 | Advantest Corp | 負荷容量付き水晶振動子の測定方法 |
JP3758439B2 (ja) * | 1999-12-20 | 2006-03-22 | 日本精工株式会社 | 曲面を有する被検査体の欠陥を曲面に沿って非接触で検出する方法 |
JP2001242207A (ja) * | 2000-02-25 | 2001-09-07 | Anritsu Corp | 高周波デバイス測定プログラムを記録した記憶媒体並びに高周波デバイス測定装置及び方法 |
US7006046B2 (en) * | 2001-02-15 | 2006-02-28 | Integral Technologies, Inc. | Low cost electronic probe devices manufactured from conductive loaded resin-based materials |
US20030115008A1 (en) * | 2001-12-18 | 2003-06-19 | Yutaka Doi | Test fixture with adjustable pitch for network measurement |
JP3613269B2 (ja) * | 2002-08-28 | 2005-01-26 | 日本電気株式会社 | ノイズイミュニティ評価装置及びノイズイミュニティ評価方法 |
US6724205B1 (en) * | 2002-11-13 | 2004-04-20 | Cascade Microtech, Inc. | Probe for combined signals |
TW583409B (en) * | 2002-12-25 | 2004-04-11 | Advanced Semiconductor Eng | Impedance standard substrate and correction method for vector network analyzer |
JP2004325123A (ja) * | 2003-04-22 | 2004-11-18 | Matsushita Electric Ind Co Ltd | プローブカードおよび検査方法 |
JP4150296B2 (ja) * | 2003-06-18 | 2008-09-17 | 日本電産リード株式会社 | 基板検査装置 |
JP2005207868A (ja) * | 2004-01-22 | 2005-08-04 | Yamaha Corp | 半導体装置の試験装置 |
ATE377287T1 (de) * | 2004-07-08 | 2007-11-15 | Alcatel Lucent | Kopplungsanordnung für rf differenzsignal- übertragung |
US7088109B2 (en) * | 2004-09-30 | 2006-08-08 | Agilent Technologies, Inc. | Method and apparatus for measuring a digital device |
US7548069B2 (en) * | 2005-06-10 | 2009-06-16 | Maury Microwave, Inc. | Signal measurement systems and methods |
US7362106B2 (en) * | 2005-06-29 | 2008-04-22 | Agilent Technologies, Inc. | Methods and apparatus for non-contact testing and diagnosing of open connections on non-probed nodes |
US7606592B2 (en) * | 2005-09-19 | 2009-10-20 | Becker Charles D | Waveguide-based wireless distribution system and method of operation |
JP2007101330A (ja) * | 2005-10-04 | 2007-04-19 | Nec Corp | 磁界センサ |
US7195404B1 (en) * | 2006-03-03 | 2007-03-27 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Fiber optic transceiver module with electromagnetic interference absorbing material and method for making the module |
US7235982B1 (en) * | 2006-03-31 | 2007-06-26 | Agilent Technologies, Inc. | Re-calculating S-parameter error terms after modification of a calibrated port |
DE102006030630B3 (de) | 2006-07-03 | 2007-10-25 | Rosenberger Hochfrequenztechnik Gmbh & Co. Kg | HF-Messvorrichtung, Verfahren zu deren Kalibrierung sowie Verfahren zum Bestimmen von Streuparametern mit dieser HF-Messvorrichtung |
DE202007010784U1 (de) * | 2007-08-03 | 2007-10-04 | Rosenberger Hochfrequenztechnik Gmbh & Co. Kg | Kontaktloses Messsystem |
US7705681B2 (en) * | 2008-04-17 | 2010-04-27 | Infineon Technologies Ag | Apparatus for coupling at least one of a plurality of amplified input signals to an output terminal using a directional coupler |
-
2008
- 2008-07-15 DE DE202008009469U patent/DE202008009469U1/de not_active Expired - Lifetime
-
2009
- 2009-06-23 US US13/003,704 patent/US8760184B2/en active Active
- 2009-06-23 JP JP2011517770A patent/JP5826628B2/ja active Active
- 2009-06-23 CA CA2725636A patent/CA2725636C/en active Active
- 2009-06-23 WO PCT/EP2009/004527 patent/WO2010006683A1/de active Application Filing
- 2009-06-23 EP EP09776813A patent/EP2300835A1/de not_active Ceased
- 2009-06-23 CN CN200980127983.2A patent/CN102099693B/zh active Active
-
2011
- 2011-10-20 HK HK11111263.4A patent/HK1157017A1/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
WO2010006683A1 (de) | 2010-01-21 |
JP5826628B2 (ja) | 2015-12-02 |
US20110163773A1 (en) | 2011-07-07 |
CN102099693B (zh) | 2014-07-02 |
CA2725636C (en) | 2016-01-19 |
CN102099693A (zh) | 2011-06-15 |
JP2011528107A (ja) | 2011-11-10 |
DE202008009469U1 (de) | 2008-09-11 |
EP2300835A1 (de) | 2011-03-30 |
US8760184B2 (en) | 2014-06-24 |
CA2725636A1 (en) | 2010-01-21 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PC | Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee) |
Effective date: 20200620 |