HK113393A - Integrated multistage decoder - Google Patents
Integrated multistage decoderInfo
- Publication number
- HK113393A HK113393A HK1133/93A HK113393A HK113393A HK 113393 A HK113393 A HK 113393A HK 1133/93 A HK1133/93 A HK 1133/93A HK 113393 A HK113393 A HK 113393A HK 113393 A HK113393 A HK 113393A
- Authority
- HK
- Hong Kong
- Prior art keywords
- integrated multistage
- multistage decoder
- decoder
- integrated
- multistage
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
- G11C29/30—Accessing single arrays
- G11C29/34—Accessing multiple bits simultaneously
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1006—Data managing, e.g. manipulating data before writing or reading out, data bus switches or control circuits therefor
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/12—Group selection circuits, e.g. for memory block selection, chip selection, array selection
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Compression, Expansion, Code Conversion, And Decoders (AREA)
- Static Random-Access Memory (AREA)
- Dram (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE3708522 | 1987-03-16 | ||
| DE3708532 | 1987-03-16 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| HK113393A true HK113393A (en) | 1993-10-29 |
Family
ID=25853538
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| HK1133/93A HK113393A (en) | 1987-03-16 | 1993-10-21 | Integrated multistage decoder |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US4855621A (ko) |
| EP (1) | EP0283908B1 (ko) |
| JP (1) | JP2603206B2 (ko) |
| KR (1) | KR960009244B1 (ko) |
| DE (1) | DE3862969D1 (ko) |
| HK (1) | HK113393A (ko) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE58903906D1 (de) * | 1988-02-10 | 1993-05-06 | Siemens Ag | Redundanzdekoder eines integrierten halbleiterspeichers. |
| KR910003594B1 (ko) * | 1988-05-13 | 1991-06-07 | 삼성전자 주식회사 | 스페어컬럼(column)선택방법 및 회로 |
| FR2635600A1 (fr) * | 1988-08-19 | 1990-02-23 | Philips Nv | Unite de memoire adressable a circuit de selection d'unite ameliore |
| KR920009059B1 (ko) * | 1989-12-29 | 1992-10-13 | 삼성전자 주식회사 | 반도체 메모리 장치의 병렬 테스트 방법 |
| US5072137A (en) * | 1990-08-17 | 1991-12-10 | Sgs-Thomson Microelectronics, Inc. | Semiconductor memory with a clocked access code for test mode entry |
| US5072138A (en) * | 1990-08-17 | 1991-12-10 | Sgs-Thomson Microelectronics, Inc. | Semiconductor memory with sequential clocked access codes for test mode entry |
| EP0475588B1 (en) * | 1990-08-17 | 1996-06-26 | STMicroelectronics, Inc. | A semiconductor memory with inhibited test mode entry during power-up |
| DE69129492T2 (de) * | 1990-10-02 | 1998-11-05 | Toshiba Kk | Halbleiterspeicher |
| JP2786020B2 (ja) * | 1991-02-22 | 1998-08-13 | 日本電気アイシーマイコンシステム株式会社 | 半導体メモリ装置 |
| US5631868A (en) * | 1995-11-28 | 1997-05-20 | International Business Machines Corporation | Method and apparatus for testing redundant word and bit lines in a memory array |
| JP4235122B2 (ja) * | 2004-02-06 | 2009-03-11 | シャープ株式会社 | 半導体記憶装置及び半導体記憶装置のテスト方法 |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2538373C3 (de) * | 1975-08-28 | 1978-04-20 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Schaltungsanordnung zum Einsatz von teilfunktionsfahigen Halbleiterbausteinen in einem Speicher |
| US4194130A (en) * | 1977-11-21 | 1980-03-18 | Motorola, Inc. | Digital predecoding system |
| JPS5833633B2 (ja) * | 1978-08-25 | 1983-07-21 | シャープ株式会社 | Ｍｏｓトランジスタ・デコ−ダ |
| JPS5873097A (ja) * | 1981-10-27 | 1983-05-02 | Nec Corp | デコ−ダ−回路 |
| JPS58164099A (ja) * | 1982-03-25 | 1983-09-28 | Toshiba Corp | 半導体メモリ− |
| JPS5990291A (ja) * | 1982-11-16 | 1984-05-24 | Nec Corp | メモリ |
| US4672240A (en) * | 1983-02-07 | 1987-06-09 | Westinghouse Electric Corp. | Programmable redundancy circuit |
| JPS6059588A (ja) * | 1983-09-12 | 1985-04-05 | Hitachi Ltd | 半導体記憶装置 |
| US4720817A (en) * | 1985-02-26 | 1988-01-19 | Texas Instruments Incorporated | Fuse selection of predecoder output |
| EP0198935A1 (de) * | 1985-04-23 | 1986-10-29 | Deutsche ITT Industries GmbH | Elektrisch umprogrammierbarer Halbleiterspeicher mit Redundanz |
| US4691300A (en) * | 1985-12-20 | 1987-09-01 | Motorola, Inc. | Redundant column substitution architecture with improved column access time |
| US4721868A (en) * | 1986-09-23 | 1988-01-26 | Advanced Micro Devices, Inc. | IC input circuitry programmable for realizing multiple functions from a single input |
-
1988
- 1988-03-11 JP JP63059197A patent/JP2603206B2/ja not_active Expired - Fee Related
- 1988-03-15 DE DE8888104117T patent/DE3862969D1/de not_active Expired - Lifetime
- 1988-03-15 EP EP88104117A patent/EP0283908B1/de not_active Expired - Lifetime
- 1988-03-16 US US07/168,672 patent/US4855621A/en not_active Expired - Lifetime
- 1988-03-16 KR KR88002742A patent/KR960009244B1/ko not_active IP Right Cessation
-
1993
- 1993-10-21 HK HK1133/93A patent/HK113393A/xx not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| EP0283908B1 (de) | 1991-05-29 |
| JP2603206B2 (ja) | 1997-04-23 |
| JPS63244491A (ja) | 1988-10-11 |
| KR960009244B1 (en) | 1996-07-16 |
| DE3862969D1 (de) | 1991-07-04 |
| KR880011792A (ko) | 1988-10-31 |
| US4855621A (en) | 1989-08-08 |
| EP0283908A1 (de) | 1988-09-28 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PC | Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee) |