GB2419896B - Chemical vapor deposition reactor - Google Patents
Chemical vapor deposition reactorInfo
- Publication number
- GB2419896B GB2419896B GB0602942A GB0602942A GB2419896B GB 2419896 B GB2419896 B GB 2419896B GB 0602942 A GB0602942 A GB 0602942A GB 0602942 A GB0602942 A GB 0602942A GB 2419896 B GB2419896 B GB 2419896B
- Authority
- GB
- United Kingdom
- Prior art keywords
- vapor deposition
- chemical vapor
- deposition reactor
- reactor
- chemical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000005229 chemical vapour deposition Methods 0.000 title 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45502—Flow conditions in reaction chamber
- C23C16/45504—Laminar flow
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45587—Mechanical means for changing the gas flow
- C23C16/45589—Movable means, e.g. fans
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4582—Rigid and flat substrates, e.g. plates or discs
- C23C16/4583—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
- C23C16/4584—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally the substrate being rotated
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/14—Feed and outlet means for the gases; Modifying the flow of the reactive gases
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/40—AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
- C30B29/403—AIII-nitrides
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/40—AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
- C30B29/403—AIII-nitrides
- C30B29/406—Gallium nitride
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1016—Apparatus with means for treating single-crystal [e.g., heat treating]
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Organic Chemistry (AREA)
- Metallurgy (AREA)
- Materials Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Mechanical Engineering (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Inorganic Chemistry (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Fluid Mechanics (AREA)
- Chemical Vapour Deposition (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Physical Or Chemical Processes And Apparatus (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/621,049 US20050011459A1 (en) | 2003-07-15 | 2003-07-15 | Chemical vapor deposition reactor |
| PCT/US2004/021001 WO2005010227A2 (en) | 2003-07-15 | 2004-06-29 | Chemical vapor deposition reactor |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| GB0602942D0 GB0602942D0 (en) | 2006-03-22 |
| GB2419896A GB2419896A (en) | 2006-05-10 |
| GB2419896B true GB2419896B (en) | 2007-09-05 |
Family
ID=34062909
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB0602942A Expired - Fee Related GB2419896B (en) | 2003-07-15 | 2004-06-29 | Chemical vapor deposition reactor |
Country Status (8)
| Country | Link |
|---|---|
| US (2) | US20050011459A1 (enExample) |
| JP (2) | JP2007531250A (enExample) |
| KR (1) | KR100816969B1 (enExample) |
| CN (1) | CN101036215A (enExample) |
| DE (1) | DE112004001308T5 (enExample) |
| GB (1) | GB2419896B (enExample) |
| TW (1) | TWI276698B (enExample) |
| WO (1) | WO2005010227A2 (enExample) |
Families Citing this family (56)
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| US7524532B2 (en) * | 2002-04-22 | 2009-04-28 | Aixtron Ag | Process for depositing thin layers on a substrate in a process chamber of adjustable height |
| US20050178336A1 (en) * | 2003-07-15 | 2005-08-18 | Heng Liu | Chemical vapor deposition reactor having multiple inlets |
| JP4790607B2 (ja) * | 2004-04-27 | 2011-10-12 | パナソニック株式会社 | Iii族元素窒化物結晶製造装置およびiii族元素窒化物結晶製造方法 |
| CN100358098C (zh) * | 2005-08-05 | 2007-12-26 | 中微半导体设备(上海)有限公司 | 半导体工艺件处理装置 |
| KR100703214B1 (ko) * | 2006-01-02 | 2007-04-09 | 삼성전기주식회사 | 유성형 화학 기상 증착 장치 |
| CN101361164B (zh) * | 2006-01-18 | 2011-04-20 | Oc欧瑞康巴尔斯公司 | 用于盘状衬底除气的装置 |
| CN101611472B (zh) * | 2007-01-12 | 2015-03-25 | 威科仪器有限公司 | 气体处理系统 |
| US20090096349A1 (en) * | 2007-04-26 | 2009-04-16 | Moshtagh Vahid S | Cross flow cvd reactor |
| US8216419B2 (en) * | 2008-03-28 | 2012-07-10 | Bridgelux, Inc. | Drilled CVD shower head |
| DE102007024798A1 (de) * | 2007-05-25 | 2008-11-27 | Aixtron Ag | Vorrichtung zum Abscheiden von GaN mittels GaCI mit einem molybdänmaskierten Quarzteil, insbesondere Gaseinlassorgan |
| US20080308036A1 (en) * | 2007-06-15 | 2008-12-18 | Hideki Ito | Vapor-phase growth apparatus and vapor-phase growth method |
| JP5038073B2 (ja) * | 2007-09-11 | 2012-10-03 | 株式会社ニューフレアテクノロジー | 半導体製造装置および半導体製造方法 |
| US8668775B2 (en) * | 2007-10-31 | 2014-03-11 | Toshiba Techno Center Inc. | Machine CVD shower head |
| KR20100114037A (ko) * | 2007-12-20 | 2010-10-22 | 어플라이드 머티어리얼스, 인코포레이티드 | 향상된 가스 유동 분포를 가진 열 반응기 |
| EP2281300A4 (en) * | 2008-05-30 | 2013-07-17 | Alta Devices Inc | METHOD AND DEVICE FOR A CHEMICAL STEAM SEPARATION REACTOR |
| CN102203910B (zh) * | 2008-11-07 | 2014-12-10 | Asm美国公司 | 反应室 |
| EP3471130A1 (en) * | 2008-12-04 | 2019-04-17 | Veeco Instruments Inc. | Chemical vapor deposition flow inlet elements and methods |
| TWI398545B (zh) * | 2010-04-29 | 2013-06-11 | Chi Mei Lighting Tech Corp | 有機金屬化學氣相沉積機台 |
| US8562746B2 (en) * | 2010-12-15 | 2013-10-22 | Veeco Instruments Inc. | Sectional wafer carrier |
| CN105755450B (zh) * | 2010-12-30 | 2019-03-15 | 维易科仪器公司 | 使用承载器扩展的晶圆加工 |
| US20130171350A1 (en) * | 2011-12-29 | 2013-07-04 | Intermolecular Inc. | High Throughput Processing Using Metal Organic Chemical Vapor Deposition |
| KR20130111029A (ko) * | 2012-03-30 | 2013-10-10 | 삼성전자주식회사 | 화학 기상 증착 장치용 서셉터 및 이를 구비하는 화학 기상 증착 장치 |
| TWI506163B (zh) * | 2012-07-13 | 2015-11-01 | Epistar Corp | 應用於氣相沉積的反應器及其承載裝置 |
| JP5904101B2 (ja) * | 2012-11-22 | 2016-04-13 | 豊田合成株式会社 | 化合物半導体の製造装置およびウェハ保持体 |
| CN203890438U (zh) * | 2013-06-08 | 2014-10-22 | 唐治 | 一种用于碳化硅外延生长的化学气相沉积装置 |
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| JP5971870B2 (ja) * | 2013-11-29 | 2016-08-17 | 株式会社日立国際電気 | 基板処理装置、半導体装置の製造方法及び記録媒体 |
| TWI650832B (zh) | 2013-12-26 | 2019-02-11 | 維克儀器公司 | 用於化學氣相沉積系統之具有隔熱蓋的晶圓載具 |
| US20150280051A1 (en) * | 2014-04-01 | 2015-10-01 | Tsmc Solar Ltd. | Diffuser head apparatus and method of gas distribution |
| SG10201506020UA (en) * | 2014-08-19 | 2016-03-30 | Silcotek Corp | Chemical vapor deposition system, arrangement of chemical vapor deposition systems, and chemical vapor deposition method |
| JP6578158B2 (ja) * | 2015-08-28 | 2019-09-18 | 株式会社ニューフレアテクノロジー | 気相成長装置及び気相成長方法 |
| KR102381344B1 (ko) * | 2015-09-18 | 2022-03-31 | 삼성전자주식회사 | 캠형 가스 혼합부 및 이것을 포함하는 반도체 소자 제조 장치들 |
| US11832521B2 (en) | 2017-10-16 | 2023-11-28 | Akoustis, Inc. | Methods of forming group III-nitride single crystal piezoelectric thin films using ordered deposition and stress neutral template layers |
| JP6786307B2 (ja) * | 2016-08-29 | 2020-11-18 | 株式会社ニューフレアテクノロジー | 気相成長方法 |
| JP2018107156A (ja) * | 2016-12-22 | 2018-07-05 | 株式会社ニューフレアテクノロジー | 気相成長装置及び気相成長方法 |
| US10559451B2 (en) * | 2017-02-15 | 2020-02-11 | Applied Materials, Inc. | Apparatus with concentric pumping for multiple pressure regimes |
| USD860146S1 (en) | 2017-11-30 | 2019-09-17 | Veeco Instruments Inc. | Wafer carrier with a 33-pocket configuration |
| USD866491S1 (en) | 2018-03-26 | 2019-11-12 | Veeco Instruments Inc. | Chemical vapor deposition wafer carrier with thermal cover |
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| USD858469S1 (en) | 2018-03-26 | 2019-09-03 | Veeco Instruments Inc. | Chemical vapor deposition wafer carrier with thermal cover |
| USD854506S1 (en) | 2018-03-26 | 2019-07-23 | Veeco Instruments Inc. | Chemical vapor deposition wafer carrier with thermal cover |
| USD863239S1 (en) | 2018-03-26 | 2019-10-15 | Veeco Instruments Inc. | Chemical vapor deposition wafer carrier with thermal cover |
| CN109941963A (zh) * | 2019-03-27 | 2019-06-28 | 常州大学 | 基于浮动催化法化学气相反应的微纳米结构直写装置 |
| EP3760765B1 (en) | 2019-07-03 | 2022-03-16 | SiCrystal GmbH | System for horizontal growth of high-quality semiconductor single crystals, and method of manufacturing same |
| CN112522684A (zh) * | 2019-09-17 | 2021-03-19 | 夏泰鑫半导体(青岛)有限公司 | 前置样品室及晶片处理装置 |
| DE102020101066A1 (de) * | 2020-01-17 | 2021-07-22 | Aixtron Se | CVD-Reaktor mit doppelter Vorlaufzonenplatte |
| US11618968B2 (en) * | 2020-02-07 | 2023-04-04 | Akoustis, Inc. | Apparatus including horizontal flow reactor with a central injector column having separate conduits for low-vapor pressure metalorganic precursors and other precursors for formation of piezoelectric layers on wafers |
| US12102010B2 (en) | 2020-03-05 | 2024-09-24 | Akoustis, Inc. | Methods of forming films including scandium at low temperatures using chemical vapor deposition to provide piezoelectric resonator devices and/or high electron mobility transistor devices |
| CN111501020A (zh) * | 2020-06-10 | 2020-08-07 | 北京北方华创微电子装备有限公司 | 半导体设备 |
| TWI757781B (zh) * | 2020-07-06 | 2022-03-11 | 大陸商蘇州雨竹機電有限公司 | 化學氣相沉積反應腔及其基板承載裝置 |
| WO2022222000A1 (en) * | 2021-04-19 | 2022-10-27 | Innoscience (Suzhou) Technology Co., Ltd. | Laminar flow mocvd apparatus for iii-nitride films |
| US12221695B2 (en) * | 2021-05-18 | 2025-02-11 | Mellanox Technologies, Ltd. | CVD system with flange assembly for facilitating uniform and laminar flow |
| CN114768578B (zh) * | 2022-05-20 | 2023-08-18 | 北京北方华创微电子装备有限公司 | 混气装置及半导体工艺设备 |
| CN115537769B (zh) * | 2022-12-01 | 2023-07-07 | 浙江晶越半导体有限公司 | 一种碳化硅化学气相沉积方法及反应器 |
| CN116770264B (zh) * | 2023-08-21 | 2023-11-14 | 合肥晶合集成电路股份有限公司 | 半导体器件的加工方法、装置、处理器和半导体加工设备 |
| CN117438277B (zh) * | 2023-12-19 | 2024-04-12 | 北京北方华创微电子装备有限公司 | 匀流组件、进气装置及半导体设备 |
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-
2004
- 2004-06-29 KR KR1020067001007A patent/KR100816969B1/ko not_active Expired - Fee Related
- 2004-06-29 GB GB0602942A patent/GB2419896B/en not_active Expired - Fee Related
- 2004-06-29 WO PCT/US2004/021001 patent/WO2005010227A2/en not_active Ceased
- 2004-06-29 CN CNA2004800261595A patent/CN101036215A/zh active Pending
- 2004-06-29 JP JP2006520200A patent/JP2007531250A/ja active Pending
- 2004-06-29 DE DE112004001308T patent/DE112004001308T5/de not_active Withdrawn
- 2004-07-14 TW TW093120989A patent/TWI276698B/zh not_active IP Right Cessation
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2009
- 2009-06-17 JP JP2009144159A patent/JP2009212531A/ja active Pending
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Also Published As
| Publication number | Publication date |
|---|---|
| DE112004001308T5 (de) | 2006-10-19 |
| GB0602942D0 (en) | 2006-03-22 |
| CN101036215A (zh) | 2007-09-12 |
| US20050011436A1 (en) | 2005-01-20 |
| JP2007531250A (ja) | 2007-11-01 |
| US20050011459A1 (en) | 2005-01-20 |
| WO2005010227A2 (en) | 2005-02-03 |
| JP2009212531A (ja) | 2009-09-17 |
| WO2005010227A3 (en) | 2005-06-09 |
| TW200516168A (en) | 2005-05-16 |
| KR100816969B1 (ko) | 2008-03-25 |
| TWI276698B (en) | 2007-03-21 |
| GB2419896A (en) | 2006-05-10 |
| KR20060036095A (ko) | 2006-04-27 |
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