FR2935838B1 - Procede de preparation d'une couche mince auto-supportee de silicium cristallise - Google Patents

Procede de preparation d'une couche mince auto-supportee de silicium cristallise

Info

Publication number
FR2935838B1
FR2935838B1 FR0855969A FR0855969A FR2935838B1 FR 2935838 B1 FR2935838 B1 FR 2935838B1 FR 0855969 A FR0855969 A FR 0855969A FR 0855969 A FR0855969 A FR 0855969A FR 2935838 B1 FR2935838 B1 FR 2935838B1
Authority
FR
France
Prior art keywords
preparing
self
supported
thin layer
silicon thin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0855969A
Other languages
English (en)
Other versions
FR2935838A1 (fr
Inventor
Jean Paul Garandet
Denis Camel
Beatrice Drevet
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to FR0855969A priority Critical patent/FR2935838B1/fr
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Priority to JP2011525598A priority patent/JP5492209B2/ja
Priority to KR1020117007357A priority patent/KR101287525B1/ko
Priority to EP09741364A priority patent/EP2319072A1/fr
Priority to BRPI0919145A priority patent/BRPI0919145A2/pt
Priority to CN2009801349587A priority patent/CN102144283B/zh
Priority to US13/062,462 priority patent/US20110212630A1/en
Priority to PCT/FR2009/051667 priority patent/WO2010026343A1/fr
Priority to RU2011107879/28A priority patent/RU2460167C1/ru
Publication of FR2935838A1 publication Critical patent/FR2935838A1/fr
Application granted granted Critical
Publication of FR2935838B1 publication Critical patent/FR2935838B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • H01L31/1804—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof comprising only elements of Group IV of the Periodic Table
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/20—Deposition of semiconductor materials on a substrate, e.g. epitaxial growth solid phase epitaxy
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/324—Thermal treatment for modifying the properties of semiconductor bodies, e.g. annealing, sintering
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • H01L31/1892—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof methods involving the use of temporary, removable substrates
    • H01L31/1896—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof methods involving the use of temporary, removable substrates for thin-film semiconductors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104—Forming layers
    • H01L21/02365—Forming inorganic semiconducting materials on a substrate
    • H01L21/02436—Intermediate layers between substrates and deposited layers
    • H01L21/02439—Materials
    • H01L21/02441—Group 14 semiconducting materials
    • H01L21/02444—Carbon, e.g. diamond-like carbon
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104—Forming layers
    • H01L21/02365—Forming inorganic semiconducting materials on a substrate
    • H01L21/02436—Intermediate layers between substrates and deposited layers
    • H01L21/02439—Materials
    • H01L21/02441—Group 14 semiconducting materials
    • H01L21/02447—Silicon carbide
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104—Forming layers
    • H01L21/02365—Forming inorganic semiconducting materials on a substrate
    • H01L21/02518—Deposited layers
    • H01L21/02521—Materials
    • H01L21/02524—Group 14 semiconducting materials
    • H01L21/02532—Silicon, silicon germanium, germanium
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104—Forming layers
    • H01L21/02365—Forming inorganic semiconducting materials on a substrate
    • H01L21/02656—Special treatments
    • H01L21/02664—Aftertreatments
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy
    • Y02E10/547—Monocrystalline silicon PV cells
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50—Manufacturing or production processes characterised by the final manufactured product

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Electromagnetism (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Recrystallisation Techniques (AREA)
  • Photovoltaic Devices (AREA)
  • Silicon Compounds (AREA)
FR0855969A 2008-09-05 2008-09-05 Procede de preparation d'une couche mince auto-supportee de silicium cristallise Expired - Fee Related FR2935838B1 (fr)

Priority Applications (9)

Application Number Priority Date Filing Date Title
FR0855969A FR2935838B1 (fr) 2008-09-05 2008-09-05 Procede de preparation d'une couche mince auto-supportee de silicium cristallise
KR1020117007357A KR101287525B1 (ko) 2008-09-05 2009-09-03 자가-지지형 결정화 실리콘 박막의 제조 방법
EP09741364A EP2319072A1 (fr) 2008-09-05 2009-09-03 Procede de preparation d'une couche mince auto-supportee de silicium cristallise
BRPI0919145A BRPI0919145A2 (pt) 2008-09-05 2009-09-03 processo de preparação de uma camada fina auto-suportada de silício cristalizado, utilização do processo e fita de silício auto-suportada
JP2011525598A JP5492209B2 (ja) 2008-09-05 2009-09-03 自立式結晶化シリコン薄膜の製造方法
CN2009801349587A CN102144283B (zh) 2008-09-05 2009-09-03 制备自支撑式晶化硅薄膜的方法及其所获得的产品
US13/062,462 US20110212630A1 (en) 2008-09-05 2009-09-03 Method for preparing a self-supporting crystallized silicon thin film
PCT/FR2009/051667 WO2010026343A1 (fr) 2008-09-05 2009-09-03 Procede de preparation d'une couche mince auto-supportee de silicium cristallise
RU2011107879/28A RU2460167C1 (ru) 2008-09-05 2009-09-03 Способ получения самоподдерживающейся кристаллизованной кремниевой тонкой пленки

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0855969A FR2935838B1 (fr) 2008-09-05 2008-09-05 Procede de preparation d'une couche mince auto-supportee de silicium cristallise

Publications (2)

Publication Number Publication Date
FR2935838A1 FR2935838A1 (fr) 2010-03-12
FR2935838B1 true FR2935838B1 (fr) 2012-11-23

Family

ID=40473397

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0855969A Expired - Fee Related FR2935838B1 (fr) 2008-09-05 2008-09-05 Procede de preparation d'une couche mince auto-supportee de silicium cristallise

Country Status (9)

Country Link
US (1) US20110212630A1 (fr)
EP (1) EP2319072A1 (fr)
JP (1) JP5492209B2 (fr)
KR (1) KR101287525B1 (fr)
CN (1) CN102144283B (fr)
BR (1) BRPI0919145A2 (fr)
FR (1) FR2935838B1 (fr)
RU (1) RU2460167C1 (fr)
WO (1) WO2010026343A1 (fr)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9190322B2 (en) * 2014-01-24 2015-11-17 Infineon Technologies Ag Method for producing a copper layer on a semiconductor body using a printing process
CN104555902B (zh) * 2015-01-05 2016-07-06 中国科学院物理研究所 自支撑介质薄膜及其制备方法
RU2767034C2 (ru) * 2020-07-29 2022-03-16 Акционерное общество "Омский научно-исследовательский институт приборостроения" (АО "ОНИИП") Способ получения самоподдерживающихся тонких пленок

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2638270C2 (de) * 1976-08-25 1983-01-27 Wacker-Chemitronic Gesellschaft für Elektronik-Grundstoffe mbH, 8263 Burghausen Verfahren zur Herstellung großflächiger, freitragender Platten aus Silicium
DE2638269C2 (de) * 1976-08-25 1983-05-26 Wacker-Chemitronic Gesellschaft für Elektronik-Grundstoffe mbH, 8263 Burghausen Verfahren zur Herstellung von substratgebundenem, großflächigem Silicium
US4137355A (en) * 1976-12-09 1979-01-30 Honeywell Inc. Ceramic coated with molten silicon
US4248645A (en) * 1978-09-05 1981-02-03 Mobil Tyco Solar Energy Corporation Method for reducing residual stresses in crystals
FR2455362A1 (fr) * 1979-04-23 1980-11-21 Labo Electronique Physique Procede de realisation de cellules solaires, a base de silicium polycristallin depose sur du carbone, et cellules solaires ainsi obtenues
US4370288A (en) * 1980-11-18 1983-01-25 Motorola, Inc. Process for forming self-supporting semiconductor film
US4419178A (en) * 1981-06-19 1983-12-06 Rode Daniel L Continuous ribbon epitaxy
US4705659A (en) * 1985-04-01 1987-11-10 Motorola, Inc. Carbon film oxidation for free-standing film formation
DE3902452A1 (de) * 1989-01-27 1990-08-02 Heliotronic Gmbh Mit einer strukturierten oberflaeche versehene substrate fuer das aufwachsen von erstarrenden schichten aus schmelzen, insbesondere von halbleitermaterial
RU2040589C1 (ru) * 1990-03-27 1995-07-25 Институт ядерных исследований АН Украины Способ получения тонких самоподдерживающихся пленок
US5186785A (en) * 1991-04-05 1993-02-16 The United States Of America As Represented By The Secretary Of The Air Force Zone melted recrystallized silicon on diamond
JPH06208961A (ja) * 1992-10-27 1994-07-26 Tonen Corp シリコン積層体の製造方法
JPH07187642A (ja) * 1993-12-27 1995-07-25 Tonen Corp シリコン積層体の製造方法
FR2767605B1 (fr) * 1997-08-25 2001-05-11 Gec Alsthom Transport Sa Circuit integre de puissance, procede de fabrication d'un tel circuit et convertisseur incluant un tel circuit
JP2002263981A (ja) * 2001-03-14 2002-09-17 Murata Mach Ltd 板材吸着持ち上げ装置の吸着制御装置
JP4807914B2 (ja) * 2001-09-26 2011-11-02 シャープ株式会社 シリコンシートとそれを含む太陽電池
JP2004296598A (ja) * 2003-03-26 2004-10-21 Canon Inc 太陽電池
US7064037B2 (en) * 2004-01-12 2006-06-20 Chartered Semiconductor Manufacturing Ltd. Silicon-germanium virtual substrate and method of fabricating the same
FR2868598B1 (fr) * 2004-04-05 2006-06-09 Solarforce Soc Par Actions Sim Procede de fabrication de plaques de silicium polycristallin
FR2879821B1 (fr) * 2004-12-21 2007-06-08 Solaforce Soc Par Actions Simp Procede de fabrication de cellules photovoltaiques

Also Published As

Publication number Publication date
WO2010026343A1 (fr) 2010-03-11
CN102144283A (zh) 2011-08-03
US20110212630A1 (en) 2011-09-01
FR2935838A1 (fr) 2010-03-12
JP5492209B2 (ja) 2014-05-14
BRPI0919145A2 (pt) 2015-12-08
KR101287525B1 (ko) 2013-07-19
RU2460167C1 (ru) 2012-08-27
JP2012502457A (ja) 2012-01-26
EP2319072A1 (fr) 2011-05-11
KR20110053378A (ko) 2011-05-20
CN102144283B (zh) 2013-10-30

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20150529