FR2763343B1 - Procede de depot d'une couche de matiere sur un substrat a l'aide d'un systeme de placage - Google Patents
Procede de depot d'une couche de matiere sur un substrat a l'aide d'un systeme de placageInfo
- Publication number
- FR2763343B1 FR2763343B1 FR9806021A FR9806021A FR2763343B1 FR 2763343 B1 FR2763343 B1 FR 2763343B1 FR 9806021 A FR9806021 A FR 9806021A FR 9806021 A FR9806021 A FR 9806021A FR 2763343 B1 FR2763343 B1 FR 2763343B1
- Authority
- FR
- France
- Prior art keywords
- depositing
- substrate
- material layer
- plating system
- plating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/288—Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition
- H01L21/2885—Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition using an external electrical current, i.e. electro-deposition
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
- C25D17/001—Apparatus specially adapted for electrolytic coating of wafers, e.g. semiconductors or solar cells
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
- C25D17/008—Current shielding devices
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D21/00—Processes for servicing or operating cells for electrolytic coating
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D3/00—Electroplating: Baths therefor
- C25D3/66—Electroplating: Baths therefor from melts
- C25D3/665—Electroplating: Baths therefor from melts from ionic liquids
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/04—Electroplating with moving electrodes
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/18—Electroplating using modulated, pulsed or reversing current
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D7/00—Electroplating characterised by the article coated
- C25D7/12—Semiconductors
- C25D7/123—Semiconductors first coated with a seed layer or a conductive layer
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S204/00—Chemistry: electrical and wave energy
- Y10S204/07—Current distribution within the bath
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/856,459 US6174425B1 (en) | 1997-05-14 | 1997-05-14 | Process for depositing a layer of material over a substrate |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2763343A1 FR2763343A1 (fr) | 1998-11-20 |
FR2763343B1 true FR2763343B1 (fr) | 2000-11-24 |
Family
ID=25323684
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR9806021A Expired - Fee Related FR2763343B1 (fr) | 1997-05-14 | 1998-05-13 | Procede de depot d'une couche de matiere sur un substrat a l'aide d'un systeme de placage |
Country Status (13)
Country | Link |
---|---|
US (3) | US6174425B1 (fr) |
JP (1) | JP3326112B2 (fr) |
KR (1) | KR100329454B1 (fr) |
CN (1) | CN1143906C (fr) |
BR (1) | BR9801617A (fr) |
DE (1) | DE19820878B4 (fr) |
FR (1) | FR2763343B1 (fr) |
GB (2) | GB2325242A (fr) |
IT (1) | IT1299444B1 (fr) |
MY (1) | MY126502A (fr) |
NL (1) | NL1009157C2 (fr) |
SG (1) | SG71111A1 (fr) |
TW (1) | TW372330B (fr) |
Families Citing this family (96)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6599412B1 (en) * | 1997-09-30 | 2003-07-29 | Semitool, Inc. | In-situ cleaning processes for semiconductor electroplating electrodes |
US6174425B1 (en) | 1997-05-14 | 2001-01-16 | Motorola, Inc. | Process for depositing a layer of material over a substrate |
US6936153B1 (en) * | 1997-09-30 | 2005-08-30 | Semitool, Inc. | Semiconductor plating system workpiece support having workpiece-engaging electrode with pre-conditioned contact face |
KR20010024368A (ko) * | 1997-09-30 | 2001-03-26 | 세미툴 인코포레이티드 | 접촉식 세정 작업을 위한 주 반응 챔버 외측에 보조전극을 구비하는 전기도금 시스템 |
US6921468B2 (en) * | 1997-09-30 | 2005-07-26 | Semitool, Inc. | Electroplating system having auxiliary electrode exterior to main reactor chamber for contact cleaning operations |
US6126798A (en) * | 1997-11-13 | 2000-10-03 | Novellus Systems, Inc. | Electroplating anode including membrane partition system and method of preventing passivation of same |
TWI223678B (en) * | 1998-03-20 | 2004-11-11 | Semitool Inc | Process for applying a metal structure to a workpiece, the treated workpiece and a solution for electroplating copper |
US6565729B2 (en) * | 1998-03-20 | 2003-05-20 | Semitool, Inc. | Method for electrochemically depositing metal on a semiconductor workpiece |
KR100616198B1 (ko) | 1998-04-21 | 2006-08-25 | 어플라이드 머티어리얼스, 인코포레이티드 | 기판상에 전기도금하는 전기화학적 증착 시스템 및 방법 |
US6497801B1 (en) * | 1998-07-10 | 2002-12-24 | Semitool Inc | Electroplating apparatus with segmented anode array |
US7427337B2 (en) | 1998-12-01 | 2008-09-23 | Novellus Systems, Inc. | System for electropolishing and electrochemical mechanical polishing |
US6251235B1 (en) | 1999-03-30 | 2001-06-26 | Nutool, Inc. | Apparatus for forming an electrical contact with a semiconductor substrate |
US6551484B2 (en) * | 1999-04-08 | 2003-04-22 | Applied Materials, Inc. | Reverse voltage bias for electro-chemical plating system and method |
US6585876B2 (en) * | 1999-04-08 | 2003-07-01 | Applied Materials Inc. | Flow diffuser to be used in electro-chemical plating system and method |
US7585398B2 (en) * | 1999-04-13 | 2009-09-08 | Semitool, Inc. | Chambers, systems, and methods for electrochemically processing microfeature workpieces |
US7438788B2 (en) * | 1999-04-13 | 2008-10-21 | Semitool, Inc. | Apparatus and methods for electrochemical processing of microelectronic workpieces |
US6916412B2 (en) * | 1999-04-13 | 2005-07-12 | Semitool, Inc. | Adaptable electrochemical processing chamber |
US7020537B2 (en) * | 1999-04-13 | 2006-03-28 | Semitool, Inc. | Tuning electrodes used in a reactor for electrochemically processing a microelectronic workpiece |
US6368475B1 (en) * | 2000-03-21 | 2002-04-09 | Semitool, Inc. | Apparatus for electrochemically processing a microelectronic workpiece |
US7264698B2 (en) * | 1999-04-13 | 2007-09-04 | Semitool, Inc. | Apparatus and methods for electrochemical processing of microelectronic workpieces |
US20030038035A1 (en) * | 2001-05-30 | 2003-02-27 | Wilson Gregory J. | Methods and systems for controlling current in electrochemical processing of microelectronic workpieces |
US7160421B2 (en) * | 1999-04-13 | 2007-01-09 | Semitool, Inc. | Turning electrodes used in a reactor for electrochemically processing a microelectronic workpiece |
US7189318B2 (en) * | 1999-04-13 | 2007-03-13 | Semitool, Inc. | Tuning electrodes used in a reactor for electrochemically processing a microelectronic workpiece |
CN1217034C (zh) * | 1999-04-13 | 2005-08-31 | 塞米用具公司 | 具有改进的处理流体流的处理腔的工件处理装置 |
US6297155B1 (en) * | 1999-05-03 | 2001-10-02 | Motorola Inc. | Method for forming a copper layer over a semiconductor wafer |
US6413858B1 (en) * | 1999-08-27 | 2002-07-02 | Micron Technology, Inc. | Barrier and electroplating seed layer |
US6217727B1 (en) * | 1999-08-30 | 2001-04-17 | Micron Technology, Inc. | Electroplating apparatus and method |
US20020000380A1 (en) * | 1999-10-28 | 2002-01-03 | Lyndon W. Graham | Method, chemistry, and apparatus for noble metal electroplating on a microelectronic workpiece |
US6547937B1 (en) * | 2000-01-03 | 2003-04-15 | Semitool, Inc. | Microelectronic workpiece processing tool including a processing reactor having a paddle assembly for agitation of a processing fluid proximate to the workpiece |
US6231743B1 (en) | 2000-01-03 | 2001-05-15 | Motorola, Inc. | Method for forming a semiconductor device |
US6454916B1 (en) * | 2000-01-05 | 2002-09-24 | Advanced Micro Devices, Inc. | Selective electroplating with direct contact chemical polishing |
US8475636B2 (en) | 2008-11-07 | 2013-07-02 | Novellus Systems, Inc. | Method and apparatus for electroplating |
US8308931B2 (en) * | 2006-08-16 | 2012-11-13 | Novellus Systems, Inc. | Method and apparatus for electroplating |
US20050183959A1 (en) * | 2000-04-13 | 2005-08-25 | Wilson Gregory J. | Tuning electrodes used in a reactor for electrochemically processing a microelectric workpiece |
US6913680B1 (en) * | 2000-05-02 | 2005-07-05 | Applied Materials, Inc. | Method of application of electrical biasing to enhance metal deposition |
JP2001316887A (ja) * | 2000-05-08 | 2001-11-16 | Tokyo Electron Ltd | メッキ処理装置 |
EP1337693A2 (fr) | 2000-05-23 | 2003-08-27 | Applied Materials, Inc. | Procede et dispositif permettant de corriger les anomalies dans des couches germes de cuivre et permettant d'ajuster la largeur de trait et le facteur de forme |
AU2001259504A1 (en) * | 2000-05-24 | 2001-12-03 | Semitool, Inc. | Tuning electrodes used in a reactor for electrochemically processing a microelectronic workpiece |
JP3379755B2 (ja) | 2000-05-24 | 2003-02-24 | インターナショナル・ビジネス・マシーンズ・コーポレーション | 金属めっき装置 |
US6436267B1 (en) * | 2000-08-29 | 2002-08-20 | Applied Materials, Inc. | Method for achieving copper fill of high aspect ratio interconnect features |
US7129160B2 (en) | 2002-08-29 | 2006-10-31 | Micron Technology, Inc. | Method for simultaneously removing multiple conductive materials from microelectronic substrates |
US7094131B2 (en) | 2000-08-30 | 2006-08-22 | Micron Technology, Inc. | Microelectronic substrate having conductive material with blunt cornered apertures, and associated methods for removing conductive material |
US7160176B2 (en) * | 2000-08-30 | 2007-01-09 | Micron Technology, Inc. | Methods and apparatus for electrically and/or chemically-mechanically removing conductive material from a microelectronic substrate |
US7112121B2 (en) | 2000-08-30 | 2006-09-26 | Micron Technology, Inc. | Methods and apparatus for electrical, mechanical and/or chemical removal of conductive material from a microelectronic substrate |
US7134934B2 (en) * | 2000-08-30 | 2006-11-14 | Micron Technology, Inc. | Methods and apparatus for electrically detecting characteristics of a microelectronic substrate and/or polishing medium |
US7192335B2 (en) | 2002-08-29 | 2007-03-20 | Micron Technology, Inc. | Method and apparatus for chemically, mechanically, and/or electrolytically removing material from microelectronic substrates |
US7153410B2 (en) * | 2000-08-30 | 2006-12-26 | Micron Technology, Inc. | Methods and apparatus for electrochemical-mechanical processing of microelectronic workpieces |
US7074113B1 (en) * | 2000-08-30 | 2006-07-11 | Micron Technology, Inc. | Methods and apparatus for removing conductive material from a microelectronic substrate |
US7153195B2 (en) * | 2000-08-30 | 2006-12-26 | Micron Technology, Inc. | Methods and apparatus for selectively removing conductive material from a microelectronic substrate |
US7078308B2 (en) * | 2002-08-29 | 2006-07-18 | Micron Technology, Inc. | Method and apparatus for removing adjacent conductive and nonconductive materials of a microelectronic substrate |
US7220166B2 (en) * | 2000-08-30 | 2007-05-22 | Micron Technology, Inc. | Methods and apparatus for electromechanically and/or electrochemically-mechanically removing conductive material from a microelectronic substrate |
JP2004536217A (ja) * | 2000-10-03 | 2004-12-02 | アプライド マテリアルズ インコーポレイテッド | 金属蒸着のためのエントリーにあたって半導体基板を傾けるための方法と関連する装置 |
JP2002173794A (ja) * | 2000-12-05 | 2002-06-21 | Electroplating Eng Of Japan Co | カップ式めっき装置 |
US20040020780A1 (en) * | 2001-01-18 | 2004-02-05 | Hey H. Peter W. | Immersion bias for use in electro-chemical plating system |
US6932896B2 (en) * | 2001-03-30 | 2005-08-23 | Nutool, Inc. | Method and apparatus for avoiding particle accumulation in electrodeposition |
DE10134680A1 (de) * | 2001-07-20 | 2003-02-06 | Endress & Hauser Gmbh & Co Kg | Schaltungsanrdnung für einen kapazitiven Sensor |
US6751391B2 (en) * | 2001-07-24 | 2004-06-15 | Agilent Technologies, Inc. | Optical systems incorporating waveguides and methods of manufacture |
US6630360B2 (en) | 2002-01-10 | 2003-10-07 | Advanced Micro Devices, Inc. | Advanced process control (APC) of copper thickness for chemical mechanical planarization (CMP) optimization |
US7854828B2 (en) * | 2006-08-16 | 2010-12-21 | Novellus Systems, Inc. | Method and apparatus for electroplating including remotely positioned second cathode |
US6911136B2 (en) * | 2002-04-29 | 2005-06-28 | Applied Materials, Inc. | Method for regulating the electrical power applied to a substrate during an immersion process |
US7247223B2 (en) * | 2002-05-29 | 2007-07-24 | Semitool, Inc. | Method and apparatus for controlling vessel characteristics, including shape and thieving current for processing microfeature workpieces |
US20040108212A1 (en) * | 2002-12-06 | 2004-06-10 | Lyndon Graham | Apparatus and methods for transferring heat during chemical processing of microelectronic workpieces |
TW200422443A (en) * | 2003-02-18 | 2004-11-01 | Applied Materials Inc | Method for immersing a substrate |
US20040222101A1 (en) * | 2003-04-18 | 2004-11-11 | Applied Materials, Inc. | Contact ring spin during idle time and deplate for defect reduction |
US20040206628A1 (en) * | 2003-04-18 | 2004-10-21 | Applied Materials, Inc. | Electrical bias during wafer exit from electrolyte bath |
US20050026416A1 (en) * | 2003-07-31 | 2005-02-03 | International Business Machines Corporation | Encapsulated pin structure for improved reliability of wafer |
US7112122B2 (en) * | 2003-09-17 | 2006-09-26 | Micron Technology, Inc. | Methods and apparatus for removing conductive material from a microelectronic substrate |
US7150820B2 (en) * | 2003-09-22 | 2006-12-19 | Semitool, Inc. | Thiourea- and cyanide-free bath and process for electrolytic etching of gold |
US20050067274A1 (en) * | 2003-09-30 | 2005-03-31 | Shao-Yu Ting | [electroplating apparatus] |
US7135357B2 (en) * | 2003-10-06 | 2006-11-14 | E. I. Du Pont De Nemours And Company | Process for making an organic electronic device having a roughened surface heat sink |
US7153777B2 (en) | 2004-02-20 | 2006-12-26 | Micron Technology, Inc. | Methods and apparatuses for electrochemical-mechanical polishing |
US20060043534A1 (en) * | 2004-08-26 | 2006-03-02 | Kirby Kyle K | Microfeature dies with porous regions, and associated methods and systems |
US7566391B2 (en) | 2004-09-01 | 2009-07-28 | Micron Technology, Inc. | Methods and systems for removing materials from microfeature workpieces with organic and/or non-aqueous electrolytic media |
US20060175201A1 (en) * | 2005-02-07 | 2006-08-10 | Hooman Hafezi | Immersion process for electroplating applications |
TW200641189A (en) * | 2005-02-25 | 2006-12-01 | Applied Materials Inc | Counter electrode encased in cation exchange membrane tube for electroplating cell |
FR2883889B1 (fr) * | 2005-04-04 | 2007-06-08 | Commissariat Energie Atomique | Electrode de reduction pour depot de metal par oxydoreduction. |
US20060273309A1 (en) * | 2005-06-03 | 2006-12-07 | Jian Wang | Workpiece including electronic components and conductive members |
US9822461B2 (en) * | 2006-08-16 | 2017-11-21 | Novellus Systems, Inc. | Dynamic current distribution control apparatus and method for wafer electroplating |
US20090114542A1 (en) * | 2007-11-06 | 2009-05-07 | Spansion Llc | Process of forming an electronic device including depositing a conductive layer over a seed layer |
CN101457379B (zh) * | 2007-12-14 | 2012-05-30 | 盛美半导体设备(上海)有限公司 | 在半导体工件上电镀金属的电镀装置 |
US7749884B2 (en) * | 2008-05-06 | 2010-07-06 | Astrowatt, Inc. | Method of forming an electronic device using a separation-enhancing species |
US8076215B2 (en) * | 2008-05-17 | 2011-12-13 | Astrowatt, Inc. | Method of forming an electronic device using a separation technique |
US8858774B2 (en) | 2008-11-07 | 2014-10-14 | Novellus Systems, Inc. | Electroplating apparatus for tailored uniformity profile |
DE102009023768A1 (de) * | 2009-05-22 | 2010-11-25 | Hübel, Egon, Dipl.-Ing. (FH) | Verfahren und Vorrichtung zum Steuern von elektrochemischen Oberflächenprozessen |
CN101724869B (zh) * | 2009-12-18 | 2011-06-22 | 北京有色金属研究总院 | 一种离子液体添加剂在瓦特电镀镍溶液中的应用 |
EP2434590A1 (fr) * | 2010-09-28 | 2012-03-28 | Tyco Electronics France SAS | Prévention de corrosion de prise AV |
TWI404833B (zh) * | 2011-01-26 | 2013-08-11 | Zhen Ding Technology Co Ltd | 電鍍系統及電鍍方法 |
US8575025B2 (en) | 2011-07-28 | 2013-11-05 | Hewlett-Packard Development Company, L.P. | Templated circuitry fabrication |
US9909228B2 (en) | 2012-11-27 | 2018-03-06 | Lam Research Corporation | Method and apparatus for dynamic current distribution control during electroplating |
US9752248B2 (en) | 2014-12-19 | 2017-09-05 | Lam Research Corporation | Methods and apparatuses for dynamically tunable wafer-edge electroplating |
US9567685B2 (en) | 2015-01-22 | 2017-02-14 | Lam Research Corporation | Apparatus and method for dynamic control of plated uniformity with the use of remote electric current |
US9689082B2 (en) * | 2015-04-14 | 2017-06-27 | Applied Materials, Inc. | Electroplating wafers having a notch |
US9988733B2 (en) | 2015-06-09 | 2018-06-05 | Lam Research Corporation | Apparatus and method for modulating azimuthal uniformity in electroplating |
WO2017037480A1 (fr) * | 2015-09-03 | 2017-03-09 | Mccormack Brian James | Dispositif de collecte de selles et dispositif d'échantillonnage des selles |
WO2018013874A1 (fr) | 2016-07-13 | 2018-01-18 | Alligant Scientific, LLC | Procédés, dispositifs et compositions électrochimiques |
CN106531626A (zh) * | 2016-11-08 | 2017-03-22 | 湖南文理学院 | 一种改善多孔硅径向物理微结构均匀性的新方法 |
Family Cites Families (29)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2751340A (en) | 1952-10-17 | 1956-06-19 | Clevite Corp | Method of plating |
US2859166A (en) | 1955-09-15 | 1958-11-04 | Pennsalt Chemicals Corp | Shielding means for effecting uniform plating of lead dioxide in the formation of lead dioxide electrodes |
US3880725A (en) * | 1974-04-10 | 1975-04-29 | Rca Corp | Predetermined thickness profiles through electroplating |
JPS5412845A (en) | 1977-06-30 | 1979-01-30 | Ricoh Co Ltd | Multicolor copier |
US4148707A (en) | 1977-07-08 | 1979-04-10 | Heritage Silversmiths Limited | Electrochemical finishing of stainless steel |
JPS54128945A (en) | 1978-03-30 | 1979-10-05 | Sumitomo Metal Ind Ltd | Electroplating method |
US4420382A (en) | 1980-01-18 | 1983-12-13 | Alcan International Limited | Method for controlling end effect on anodes used for cathodic protection and other applications |
US4304641A (en) | 1980-11-24 | 1981-12-08 | International Business Machines Corporation | Rotary electroplating cell with controlled current distribution |
GB2089838A (en) | 1980-12-22 | 1982-06-30 | Alcan Int Ltd | Jigs for electrochemical treatment of elongated workpieces |
US4421627A (en) | 1982-05-24 | 1983-12-20 | Lincoln Plating Company | Article holder for electroplating process |
US4466864A (en) * | 1983-12-16 | 1984-08-21 | At&T Technologies, Inc. | Methods of and apparatus for electroplating preselected surface regions of electrical articles |
US4720329A (en) | 1984-09-17 | 1988-01-19 | Microsurface Technology Corp. | Apparatus and method for the electrolytic plating of layers onto computer memory hard discs |
US4678545A (en) | 1986-06-12 | 1987-07-07 | Galik George M | Printed circuit board fine line plating |
GB8809750D0 (en) | 1988-04-25 | 1988-06-02 | Beckswift Ltd | Electrical apparatus |
US5230743A (en) | 1988-05-25 | 1993-07-27 | Semitool, Inc. | Method for single wafer processing in which a semiconductor wafer is contacted with a fluid |
US4879007B1 (en) | 1988-12-12 | 1999-05-25 | Process Automation Int L Ltd | Shield for plating bath |
US5368711A (en) * | 1990-08-01 | 1994-11-29 | Poris; Jaime | Selective metal electrodeposition process and apparatus |
US5135636A (en) * | 1990-10-12 | 1992-08-04 | Microelectronics And Computer Technology Corporation | Electroplating method |
SE467976B (sv) | 1991-02-20 | 1992-10-12 | Dcm Innovation Ab | Anordning foer elektroplaetering, vid framstaellning av matriser foer tillverkning av t ex cd-skivor samt foerfarande foer tillverkning av matriser medelst anordningen |
US5149419A (en) | 1991-07-18 | 1992-09-22 | Eastman Kodak Company | Method for fabricating long array orifice plates |
US5312532A (en) | 1993-01-15 | 1994-05-17 | International Business Machines Corporation | Multi-compartment eletroplating system |
US5332487A (en) | 1993-04-22 | 1994-07-26 | Digital Equipment Corporation | Method and plating apparatus |
GB9325297D0 (en) | 1993-12-10 | 1994-02-16 | Process Automation Internation | Improvements in or relating to clamps and the use thereof |
FR2725215B1 (fr) | 1994-09-29 | 1996-11-22 | Lorraine Laminage | Cellule d'electrodeposition en continu d'alliages metalliques |
US5620581A (en) * | 1995-11-29 | 1997-04-15 | Aiwa Research And Development, Inc. | Apparatus for electroplating metal films including a cathode ring, insulator ring and thief ring |
DE19547948C1 (de) | 1995-12-21 | 1996-11-21 | Atotech Deutschland Gmbh | Verfahren und Schaltungsanordnung zur Erzeugung von Strompulsen zur elektrolytischen Metallabscheidung |
US5662788A (en) * | 1996-06-03 | 1997-09-02 | Micron Technology, Inc. | Method for forming a metallization layer |
US5980706A (en) * | 1996-07-15 | 1999-11-09 | Semitool, Inc. | Electrode semiconductor workpiece holder |
US6174425B1 (en) | 1997-05-14 | 2001-01-16 | Motorola, Inc. | Process for depositing a layer of material over a substrate |
-
1997
- 1997-05-14 US US08/856,459 patent/US6174425B1/en not_active Expired - Lifetime
-
1998
- 1998-04-08 TW TW087105272A patent/TW372330B/zh not_active IP Right Cessation
- 1998-04-29 IT IT98RM000277A patent/IT1299444B1/it active IP Right Grant
- 1998-04-30 SG SG1998000893A patent/SG71111A1/en unknown
- 1998-05-09 DE DE19820878A patent/DE19820878B4/de not_active Expired - Lifetime
- 1998-05-11 GB GB9809856A patent/GB2325242A/en not_active Withdrawn
- 1998-05-12 BR BR9801617A patent/BR9801617A/pt not_active Application Discontinuation
- 1998-05-12 MY MYPI98002117A patent/MY126502A/en unknown
- 1998-05-13 FR FR9806021A patent/FR2763343B1/fr not_active Expired - Fee Related
- 1998-05-13 NL NL1009157A patent/NL1009157C2/nl not_active IP Right Cessation
- 1998-05-13 CN CNB981083692A patent/CN1143906C/zh not_active Expired - Lifetime
- 1998-05-14 KR KR1019980017296A patent/KR100329454B1/ko not_active IP Right Cessation
- 1998-05-14 JP JP15054898A patent/JP3326112B2/ja not_active Expired - Lifetime
-
2000
- 2000-05-01 US US09/561,776 patent/US6500324B1/en not_active Expired - Lifetime
-
2001
- 2001-05-09 GB GBGB0111315.8A patent/GB0111315D0/en not_active Ceased
-
2002
- 2002-08-14 US US10/218,810 patent/US7323094B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US6500324B1 (en) | 2002-12-31 |
KR19980087024A (ko) | 1998-12-05 |
TW372330B (en) | 1999-10-21 |
IT1299444B1 (it) | 2000-03-16 |
US6174425B1 (en) | 2001-01-16 |
ITRM980277A1 (it) | 1999-10-29 |
GB2325242A (en) | 1998-11-18 |
ITRM980277A0 (it) | 1998-04-29 |
MY126502A (en) | 2006-10-31 |
DE19820878B4 (de) | 2011-03-03 |
FR2763343A1 (fr) | 1998-11-20 |
GB9809856D0 (en) | 1998-07-08 |
SG71111A1 (en) | 2000-03-21 |
CN1143906C (zh) | 2004-03-31 |
JPH10330991A (ja) | 1998-12-15 |
US7323094B2 (en) | 2008-01-29 |
KR100329454B1 (ko) | 2002-08-28 |
MX9803339A (es) | 1998-12-31 |
DE19820878A1 (de) | 1998-11-19 |
NL1009157C2 (nl) | 2000-01-10 |
BR9801617A (pt) | 1999-06-08 |
NL1009157A1 (nl) | 1998-11-17 |
US20020195347A1 (en) | 2002-12-26 |
GB0111315D0 (en) | 2001-07-04 |
JP3326112B2 (ja) | 2002-09-17 |
CN1204702A (zh) | 1999-01-13 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
FR2763343B1 (fr) | Procede de depot d'une couche de matiere sur un substrat a l'aide d'un systeme de placage | |
FR2744285B1 (fr) | Procede de transfert d'une couche mince d'un substrat initial sur un substrat final | |
FR2708924B1 (fr) | Procédé de dépôt d'une couche de nitrure métallique sur un substrat transparent. | |
MA23544A1 (fr) | Formation d'une couche d'argent sur un substrat vitreux | |
FR2725074B1 (fr) | Procede de fabrication d'une structure comportant une couche mince semi-conductrice sur un substrat | |
FR2809661B1 (fr) | Procede de formation d'un materiau insonorisant comprenant une couche viscoelastique ultramince | |
FR2518429B1 (fr) | Installation pour deposer en continu, sur la surface d'un substrat porte a haute temperature, une couche d'une matiere solide | |
FR2736934B1 (fr) | Procede de fabrication d'une structure avec une couche utile maintenue a distance d'un substrat par des butees, et de desolidarisation d'une telle couche | |
FR2787061B1 (fr) | Procede et installation de marquage superficiel d'un substrat | |
FR2774511B1 (fr) | Substrat compliant en particulier pour un depot par hetero-epitaxie | |
FR2782843B1 (fr) | Procede d'isolation physique de regions d'une plaque de substrat | |
FR2698882B1 (fr) | Procédé pour former un revêtement protecteur sur un substrat. | |
HK1042627A1 (zh) | 沈積傳導層於基板之程序 | |
FR2665024B1 (fr) | Procede de determination de l'elimination complete d'une couche mince sur un substrat non plan. | |
FR2830856B1 (fr) | Precurseur de revetement et procede pour revetir un substrat d'une couche refractaire | |
FR2780054B1 (fr) | Procede de depot d'une couche a base d'oxyde metallique sur un substrat verrier, substrat verrier ainsi revetu | |
FR2842651B1 (fr) | Procede de lissage du contour d'une couche utile de materiau reportee sur un substrat support | |
FR2728103B1 (fr) | Substrat de base en si recouvert d'une couche de cdte ou de cdznte riche en cd et procede pour sa production | |
FR2766211B1 (fr) | PROCEDE DE DEPOT D'UNE COUCHE DIELECTRIQUE DE Ta2O5 | |
FR2523480B1 (fr) | Procede de depot d'une couche de protection metallique et/ou ceramique sur un substrat | |
FR2703076B1 (fr) | Procédé pour former une couche électriquement isolante, tenace, sur la surface d'un matériau en cuivre. | |
FR2755297B1 (fr) | Procede de formation d'un cablage multicouche dans un composant a semiconducteur | |
FR2769867B1 (fr) | Film thermoplastique multicouche pour scellage sur lui-meme ou sur un substrat | |
FR2764732B1 (fr) | Procede de depot d'une couche d'un materiau polycristallin sur un substrat a base de silicium | |
FR2789698B1 (fr) | Procede et installation pour former un depot d'une couche sur un substrat |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
TP | Transmission of property | ||
ST | Notification of lapse |
Effective date: 20160129 |