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US4294911A
(en)
*
|
1979-06-18 |
1981-10-13 |
Eastman Kodak Company |
Development of light-sensitive quinone diazide compositions using sulfite stabilizer
|
|
JPS56122031A
(en)
*
|
1980-03-01 |
1981-09-25 |
Japan Synthetic Rubber Co Ltd |
Positive type photosensitive resin composition
|
|
US4419437A
(en)
*
|
1981-02-11 |
1983-12-06 |
Eastman Kodak Company |
Image-forming compositions and elements containing ionic polyester dispersing agents
|
|
NL8101200A
(nl)
*
|
1981-03-12 |
1982-10-01 |
Philips Nv |
Werkwijze voor het aanbrengen van een resistmateriaal op een drager en resist-materiaal.
|
|
JPS57151939A
(en)
*
|
1981-03-16 |
1982-09-20 |
Japan Synthetic Rubber Co Ltd |
Positive type photosensitive resin composition
|
|
EP0062733B1
(en)
*
|
1981-04-10 |
1986-01-02 |
Shipley Company Inc. |
Metal ion-free photoresist developer composition
|
|
US4628023A
(en)
*
|
1981-04-10 |
1986-12-09 |
Shipley Company Inc. |
Metal ion free photoresist developer composition with lower alkyl quaternary ammonium hydrozide as alkalai agent and a quaternary ammonium compound as surfactant
|
|
JPS57192952A
(en)
*
|
1981-05-25 |
1982-11-27 |
Konishiroku Photo Ind Co Ltd |
Composition of developing solution
|
|
JPS5843451A
(ja)
*
|
1981-09-09 |
1983-03-14 |
Japan Synthetic Rubber Co Ltd |
ポジ型感光性樹脂組成物
|
|
US4351895A
(en)
*
|
1981-10-19 |
1982-09-28 |
American Hoechst Corporation |
Deletion fluid for positive printing plates
|
|
US4423138A
(en)
*
|
1982-01-21 |
1983-12-27 |
Eastman Kodak Company |
Resist developer with ammonium or phosphonium compound and method of use to develop o-quinone diazide and novolac resist
|
|
JPS58187926A
(ja)
*
|
1982-04-28 |
1983-11-02 |
Toyo Soda Mfg Co Ltd |
放射線ネガ型レジストの現像方法
|
|
DE3230171A1
(de)
*
|
1982-08-13 |
1984-02-16 |
Hoechst Ag, 6230 Frankfurt |
Waessrig-alkalische loesung und verfahren zum entwickeln von positiv-arbeitenden reproduktionsschichten
|
|
JPS59182444A
(ja)
*
|
1983-04-01 |
1984-10-17 |
Sumitomo Chem Co Ltd |
ポジ型フオトレジストの改良現像液
|
|
JPS59219743A
(ja)
*
|
1983-05-28 |
1984-12-11 |
Tokyo Ohka Kogyo Co Ltd |
ポジ型レジスト現像液
|
|
US4464461A
(en)
*
|
1983-07-22 |
1984-08-07 |
Eastman Kodak Company |
Development of light-sensitive quinone diazide compositions
|
|
JPS60254043A
(ja)
*
|
1984-05-30 |
1985-12-14 |
Yotsukaichi Gosei Kk |
ポジ型感光材料用現像剤
|
|
US4711836A
(en)
*
|
1984-09-10 |
1987-12-08 |
Olin Hunt Specialty Products, Inc. |
Development of positive-working photoresist compositions
|
|
JPS62102888A
(ja)
*
|
1985-10-28 |
1987-05-13 |
Toyo Kagaku Kenkyusho:Kk |
浄水器等の殺菌洗浄方法
|
|
JPH0638159B2
(ja)
*
|
1986-07-18 |
1994-05-18 |
東京応化工業株式会社 |
ポジ型ホトレジスト用現像液
|
|
US4871644A
(en)
*
|
1986-10-01 |
1989-10-03 |
Ciba-Geigy Corporation |
Photoresist compositions with a bis-benzotriazole
|
|
US4788127A
(en)
*
|
1986-11-17 |
1988-11-29 |
Eastman Kodak Company |
Photoresist composition comprising an interpolymer of a silicon-containing monomer and an hydroxystyrene
|
|
WO1990001726A1
(en)
*
|
1988-08-10 |
1990-02-22 |
Macdermid, Incorporated |
Light-sensitive novolac resins
|
|
US4997748A
(en)
*
|
1988-08-26 |
1991-03-05 |
Tokyo Ohka Kogyo Co., Ltd. |
Developer solution for positive-working resist composition
|
|
US5753406A
(en)
*
|
1988-10-18 |
1998-05-19 |
Japan Synthetic Rubber Co., Ltd. |
Radiation-sensitive resin composition
|
|
JPH0234858A
(ja)
*
|
1988-11-05 |
1990-02-05 |
Toshiba Corp |
フォトレジスト現像液の製造方法
|
|
JP2639853B2
(ja)
*
|
1990-05-18 |
1997-08-13 |
富士写真フイルム株式会社 |
新規キノンジアジド化合物及びそれを含有する感光性組成物
|
|
DE69203824T2
(de)
*
|
1991-10-29 |
1996-02-22 |
Du Pont |
Entwicklerlösungen für lithographische Druckelemente.
|
|
US6472128B2
(en)
|
1996-04-30 |
2002-10-29 |
Shipley Company, L.L.C. |
Antihalation compositions
|
|
US6528235B2
(en)
|
1991-11-15 |
2003-03-04 |
Shipley Company, L.L.C. |
Antihalation compositions
|
|
US6773864B1
(en)
|
1991-11-15 |
2004-08-10 |
Shipley Company, L.L.C. |
Antihalation compositions
|
|
US6165697A
(en)
*
|
1991-11-15 |
2000-12-26 |
Shipley Company, L.L.C. |
Antihalation compositions
|
|
US6340559B1
(en)
*
|
2001-02-21 |
2002-01-22 |
Huntsman Petrochemical Corporation |
Semiconductor developing agent
|
|
JP4080784B2
(ja)
*
|
2002-04-26 |
2008-04-23 |
東京応化工業株式会社 |
レジスト用現像液及びそれを用いたレジストパターン形成方法、並びにレジスト用現像原液
|
|
US7716813B2
(en)
*
|
2006-12-05 |
2010-05-18 |
Hitachi Global Storage Technologies Netherlands B.V. |
Method for fabricating magnetic write pole for a magnetic head using an E-beam resist mask
|