FI912339A - Foerfarande foer maetning av en glansprofil. - Google Patents

Foerfarande foer maetning av en glansprofil. Download PDF

Info

Publication number
FI912339A
FI912339A FI912339A FI912339A FI912339A FI 912339 A FI912339 A FI 912339A FI 912339 A FI912339 A FI 912339A FI 912339 A FI912339 A FI 912339A FI 912339 A FI912339 A FI 912339A
Authority
FI
Finland
Prior art keywords
spot
glansprofil
foerfarande foer
sample
foer maetning
Prior art date
Application number
FI912339A
Other languages
English (en)
Other versions
FI100826B (fi
FI912339A0 (fi
Inventor
Hideki Fujiwara
Chizuru Kaga
Isao Kano
Original Assignee
Jujo Paper Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jujo Paper Co Ltd filed Critical Jujo Paper Co Ltd
Publication of FI912339A0 publication Critical patent/FI912339A0/fi
Publication of FI912339A publication Critical patent/FI912339A/fi
Application granted granted Critical
Publication of FI100826B publication Critical patent/FI100826B/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/57—Measuring gloss
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/33—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using ultraviolet light

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
FI912339A 1990-05-15 1991-05-14 Menetelmä kiiltoprofiilin mittaamiseksi FI100826B (fi)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2124440A JPH0420845A (ja) 1990-05-15 1990-05-15 光沢むらの測定方法

Publications (3)

Publication Number Publication Date
FI912339A0 FI912339A0 (fi) 1991-05-14
FI912339A true FI912339A (fi) 1991-11-16
FI100826B FI100826B (fi) 1998-02-27

Family

ID=14885558

Family Applications (1)

Application Number Title Priority Date Filing Date
FI912339A FI100826B (fi) 1990-05-15 1991-05-14 Menetelmä kiiltoprofiilin mittaamiseksi

Country Status (4)

Country Link
US (1) US5146097A (fi)
JP (1) JPH0420845A (fi)
DE (1) DE4115704C2 (fi)
FI (1) FI100826B (fi)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5486701A (en) * 1992-06-16 1996-01-23 Prometrix Corporation Method and apparatus for measuring reflectance in two wavelength bands to enable determination of thin film thickness
CN1133633A (zh) * 1993-10-26 1996-10-16 旭化成工业株式会社 光泽不均匀、印刷不均匀的测定方法及装置
US6215552B1 (en) * 1994-07-18 2001-04-10 Xerox Corporation Electrostatic process control based upon both the roughness and the thickness of a substrate
US6195163B1 (en) 1996-02-05 2001-02-27 Micron Technology, Inc. Reflectance method for evaluating the surface characteristics of opaque materials
US5825498A (en) * 1996-02-05 1998-10-20 Micron Technology, Inc. Ultraviolet light reflectance method for evaluating the surface characteristics of opaque materials
US6031620A (en) * 1997-05-01 2000-02-29 Impact Systems, Inc. Gloss sensor resistant to tilting and shifting paper and with improved calibration
DE60027223T2 (de) * 1999-06-22 2006-08-31 FUJI PHOTO FILM CO., LTD., Minamiashigara Verfahren und Apparat zum Wickeln von Film, Verfahren und Apparat zum Zuführen von Wickelkernen, und Verfahren und Apparat zum Kontrollieren des Zustandes von Filmrollen
FR2824138B1 (fr) * 2001-04-27 2003-06-13 Usinor Dispositif de mesure de brillance du type reflectometre
US20020162966A1 (en) * 2001-05-02 2002-11-07 Yoder Lorinda L. Method and apparatus for detecting surface defects in a plastic container
EP1273905B9 (de) * 2001-07-06 2005-12-07 Nordland Papier GmbH Verfahren zum Bestimmen der Papierqualität für autotypischen Rasterdruck
US6507403B1 (en) * 2001-07-16 2003-01-14 Honeywell International Inc. Gloss sensor having dirt buildup compensation apparatus and method
EP2278269B1 (en) * 2005-11-07 2016-07-27 Cardinal CG Company Method for identifying photocatalytic coatings
US7834991B2 (en) * 2006-07-13 2010-11-16 Byk Gardner Gmbh Determining surface properties with angle offset correction
DE102006032404B4 (de) 2006-07-13 2019-05-09 Byk-Gardner Gmbh Vorrichtung und Verfahren zur Bestimmung von Oberflächeneigenschaften
JP5288235B2 (ja) * 2007-09-11 2013-09-11 株式会社リコー 画像形成装置
US20100005911A1 (en) * 2008-07-11 2010-01-14 Atlas Material Testing Technology, Llc Weathering Test Apparatus With Real-Time Color Measurement
US8771784B2 (en) * 2009-07-30 2014-07-08 Axalta Coating Systems Ip Co., Llc Method for producing coating having desired gloss value
US9008984B2 (en) * 2010-10-15 2015-04-14 Axalta Coating Systems Ip Co., Llc Device for predicting gloss of low gloss coating by wet color measurement
US8637112B2 (en) * 2010-10-15 2014-01-28 Axalta Coating Systems Ip Co., Llc Process for predicting gloss of low gloss coating by wet color measurement
RU2456558C1 (ru) * 2011-03-11 2012-07-20 Государственное образовательное учреждение высшего профессионального образования "Вологодский государственный технический университет" (ВоГТУ) Устройство для определения альбедо деятельной поверхности материала
CN102608049B (zh) * 2011-10-14 2014-06-18 安徽皖仪科技股份有限公司 一种2,2′-亚甲基-双(4,6-二叔丁基苯酚)磷酸酯中铝的检测方法
US9525802B2 (en) * 2013-07-24 2016-12-20 Georgetown University Enhancing the legibility of images using monochromatic light sources
JP2015102519A (ja) * 2013-11-28 2015-06-04 株式会社リコー 光学センサ及び画像形成装置
US9952160B2 (en) 2014-04-04 2018-04-24 Packaging Corporation Of America System and method for determining an impact of manufacturing processes on the caliper of a sheet material
US10334276B2 (en) * 2015-12-28 2019-06-25 Ati Technologies Ulc Method and apparatus for determining the severity of corruption in a picture

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3395278A (en) * 1965-07-14 1968-07-30 Armstrong Cork Co Method of measuring the coating thickness on articles
US4124808A (en) * 1977-01-28 1978-11-07 National Semiconductor Corporation MOS on-chip voltage sense amplifier circuit
DE3565893D1 (en) * 1984-12-14 1988-12-01 Flachglas Ag Method and device for inspecting transparent strip material, in particular flat glass ribbons
JPH087145B2 (ja) * 1986-08-04 1996-01-29 日本製紙株式会社 コ−ト層表面の接着剤濃度の測定方法
JPS6345118A (ja) * 1986-08-12 1988-02-26 Showa Denko Kk アルミナ質焼結砥粒の製造方法
JPS63295945A (ja) * 1987-05-28 1988-12-02 Nippon Paint Co Ltd 光沢度測定装置
US4830504A (en) * 1987-06-24 1989-05-16 Measurex Corporation Gloss gauge
JPS6413438A (en) * 1987-07-08 1989-01-18 Hitachi Ltd Measuring instrument for absolute reflection factor in ultraviolet range
DE3728705A1 (de) * 1987-08-28 1989-03-09 Agfa Gevaert Ag Vorrichtung zur ueberpruefung von beschichteten und unbeschichteten folien
US5066865A (en) * 1989-09-01 1991-11-19 Measurex Corporation Single sided reflectance sensor for measuring select physical properties of a material using one or more wavelengths of radiation
US5078496A (en) * 1990-08-14 1992-01-07 Autospect, Inc. Machine vision surface characterization system

Also Published As

Publication number Publication date
JPH0420845A (ja) 1992-01-24
DE4115704C2 (de) 1997-05-22
US5146097A (en) 1992-09-08
FI100826B (fi) 1998-02-27
FI912339A0 (fi) 1991-05-14
DE4115704A1 (de) 1991-11-21

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Owner name: NIPPON PAPER INDUSTRIES CO., LTD