MX9504353A - Metodo para medir el espesor de un material transparente. - Google Patents
Metodo para medir el espesor de un material transparente.Info
- Publication number
- MX9504353A MX9504353A MX9504353A MX9504353A MX9504353A MX 9504353 A MX9504353 A MX 9504353A MX 9504353 A MX9504353 A MX 9504353A MX 9504353 A MX9504353 A MX 9504353A MX 9504353 A MX9504353 A MX 9504353A
- Authority
- MX
- Mexico
- Prior art keywords
- rays
- light
- optical frequency
- modulated
- measuring
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
El método está caracterizado por las etapas de: emitir un rayo (4) de luz de frecuencia optica modulada, recibir dos rayos de luz (i, j) regresados por cada una de las superficies (2, 3) de una pared (l) del material, crear una interferencia entre los rayos (i, j) y determinar la diferencia de marcha ?? de la señal de interferencia. Se usa un diodo láser como fuente de iluminacion y se modulo mediante una modulacion de la frecuencia optica del rayo. Entre los rayos difundidos por las dos caras de la pared, se seleccionan dos rayos paralelos. El dispositivo de la invencion permite mediciones espaciadas por 0.3 mseg para ser llevadas a cabo en cada captacion. Por lo tanto, es posible explorar la periférica de una botella en rotacion cada milímetro. Aplicacion a botellas de vidrio o de material plástico, ya sean claras o de colores y a vidrio plano.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9401846A FR2716531B1 (fr) | 1994-02-18 | 1994-02-18 | Procédé de mesure d'épaisseur d'un matériau transparent. |
PCT/FR1995/000184 WO1995022740A1 (fr) | 1994-02-18 | 1995-02-17 | Procede de mesure d'epaisseur d'un materiau transparent |
Publications (1)
Publication Number | Publication Date |
---|---|
MX9504353A true MX9504353A (es) | 1997-05-31 |
Family
ID=9460207
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
MX9504353A MX9504353A (es) | 1994-02-18 | 1995-02-17 | Metodo para medir el espesor de un material transparente. |
Country Status (14)
Country | Link |
---|---|
US (1) | US5657124A (es) |
EP (1) | EP0695414B1 (es) |
JP (1) | JPH08509298A (es) |
CN (1) | CN1123570A (es) |
AT (1) | ATE173082T1 (es) |
AU (1) | AU690966B2 (es) |
BR (1) | BR9506143A (es) |
CA (1) | CA2160802A1 (es) |
DE (1) | DE69505749T2 (es) |
ES (1) | ES2126255T3 (es) |
FR (1) | FR2716531B1 (es) |
MX (1) | MX9504353A (es) |
NO (1) | NO954112L (es) |
WO (1) | WO1995022740A1 (es) |
Families Citing this family (33)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2762083B1 (fr) * | 1997-04-11 | 1999-07-02 | Verreries Souchon Neuvesel | Procede optique de mesure de l'epaisseur de la paroi et/ou de l'ovalisation d'un recipient et dispositif en faisant application |
FR2780778B3 (fr) * | 1998-07-03 | 2000-08-11 | Saint Gobain Vitrage | Procede et dispositif pour la mesure de l'epaisseur d'un materiau transparent |
US6307212B1 (en) * | 1999-04-01 | 2001-10-23 | The United States Of America As Represented By The Secretary Of The Navy | High resolution imaging using optically transparent phosphors |
DE19928171B4 (de) * | 1999-06-19 | 2011-01-05 | Leybold Optics Gmbh | Verfahren zur kontinuierlichen Bestimmung der optischen Schichtdicke von Beschichtungen |
US6683695B1 (en) | 1999-07-21 | 2004-01-27 | Electronic Design To Market, Inc. | Method and apparatus for detecting properties of reflective transparent surface coatings on a sheet of transparent material |
US6693275B1 (en) | 2000-03-23 | 2004-02-17 | Plastipak Packaging, Inc. | Method and apparatus for inspecting blow molded containers |
US20040061873A1 (en) * | 2002-09-26 | 2004-04-01 | Davis Brett L. | Method and apparatus for detecting media thickness |
US7057735B2 (en) * | 2002-11-14 | 2006-06-06 | Fitel U.S.A. Corp. | Method for measuring the optical and physical thickness of optically transparent objects |
CN1307402C (zh) * | 2004-06-03 | 2007-03-28 | 中南大学 | 高精度在线铝板凸度检测装置 |
US7417749B1 (en) | 2004-09-01 | 2008-08-26 | Electric Design To Market, Inc. | Method and apparatus for protecting an optical transmission measurement when sensing transparent materials |
US20060054843A1 (en) * | 2004-09-13 | 2006-03-16 | Electronic Design To Market, Inc. | Method and apparatus of improving optical reflection images of a laser on a changing surface location |
US7339682B2 (en) * | 2005-02-25 | 2008-03-04 | Verity Instruments, Inc. | Heterodyne reflectometer for film thickness monitoring and method for implementing |
US20060285120A1 (en) * | 2005-02-25 | 2006-12-21 | Verity Instruments, Inc. | Method for monitoring film thickness using heterodyne reflectometry and grating interferometry |
US20060266743A1 (en) * | 2005-05-30 | 2006-11-30 | National Chiao Tung University | Laser-ablated fiber devices and method of manufacturing the same |
CN100422776C (zh) * | 2005-06-17 | 2008-10-01 | 陈南光 | 激光微加工处理全光纤型元件的制作方法 |
US7545503B2 (en) * | 2005-09-27 | 2009-06-09 | Verity Instruments, Inc. | Self referencing heterodyne reflectometer and method for implementing |
EP2278269B1 (en) * | 2005-11-07 | 2016-07-27 | Cardinal CG Company | Method for identifying photocatalytic coatings |
US7652760B1 (en) | 2006-04-05 | 2010-01-26 | Electronic Design To Market, Inc. | System for detecting coatings on transparent or semi-transparent materials |
US7583368B1 (en) | 2006-04-05 | 2009-09-01 | Electronic Design To Market, Inc. | Method of enhancing measurement of stress in glass |
US7505496B2 (en) * | 2006-04-05 | 2009-03-17 | Ciena Corporation | Systems and methods for real-time compensation for non-linearity in optical sources for analog signal transmission |
US20080065351A1 (en) * | 2006-09-11 | 2008-03-13 | George Panotopoulos | Thickness measurement based navigation apparatus and methods |
US20110206830A1 (en) * | 2010-02-19 | 2011-08-25 | United Solar Ovonic Llc | Reverse interferometric method and apparatus for measuring layer thickness |
FR2971847B1 (fr) * | 2011-02-18 | 2013-07-19 | Tiama | Procede et dispositif pour detecter des defauts de repartition de matiere dans des recipients transparents |
FR2977312B1 (fr) * | 2011-06-29 | 2014-06-13 | Sidel Participations | Procede de mesure de l'epaisseur d'une paroi transparente d'un recipient par interferometrie et dispositif pour la mise en oeuvre du procede |
CN103438802B (zh) * | 2013-09-17 | 2016-04-20 | 上海理工大学 | 光纤涂覆层几何参数测量方法 |
US9593939B1 (en) * | 2013-12-30 | 2017-03-14 | Flextronics Ap, Llc | Glue thickness inspection (GTI) |
EP2946197A4 (en) * | 2014-02-14 | 2016-12-21 | Halliburton Energy Services Inc | IN SITU SPECTROSCOPY FOR MONITORING THE MANUFACTURE OF INTEGRATED DATA ELEMENTS |
TWI700473B (zh) * | 2014-06-04 | 2020-08-01 | 美商康寧公司 | 用於量測玻璃物品厚度的方法及系統 |
EP3714231A1 (en) * | 2017-11-24 | 2020-09-30 | ABB Schweiz AG | System and method for characterizing a coating such as a paint film by radiation, and painting facility with such a system |
EP3489619A1 (en) | 2017-11-28 | 2019-05-29 | Koh Young Technology Inc. | Apparatus for inspecting substrate and method thereof |
EP3489620B1 (en) | 2017-11-28 | 2023-06-07 | Koh Young Technology Inc. | Apparatus for inspecting substrate and method thereof |
KR102138622B1 (ko) * | 2017-11-28 | 2020-07-28 | 주식회사 고영테크놀러지 | 기판 검사 장치 및 기판 검사 방법 |
CN113405478A (zh) * | 2021-06-01 | 2021-09-17 | 西安工业大学 | 一种透明材料厚度测量方法 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1329240A (en) * | 1969-11-11 | 1973-09-05 | British Aircraft Corp Ltd | Optical measurement of the thickness of translucent objects |
AU8181375A (en) * | 1974-06-07 | 1976-12-09 | Decca Ltd | Determination of thickness of uniform films |
JPS5535214A (en) * | 1978-09-04 | 1980-03-12 | Asahi Chem Ind Co Ltd | Method and device for film-thickness measurement making use of infrared-ray interference |
FR2589578B1 (fr) * | 1985-11-05 | 1988-02-05 | Univ Reims Champagne Ardenne | Procede et dispositif de controle optique par reflexion d'un materiau ou composant semi-transparent |
US5402230A (en) * | 1991-12-16 | 1995-03-28 | Tsinghua University | Heterodyne interferometric optical fiber displacement sensor for measuring displacement of an object |
-
1994
- 1994-02-18 FR FR9401846A patent/FR2716531B1/fr not_active Expired - Fee Related
-
1995
- 1995-02-17 WO PCT/FR1995/000184 patent/WO1995022740A1/fr active IP Right Grant
- 1995-02-17 EP EP95909836A patent/EP0695414B1/fr not_active Expired - Lifetime
- 1995-02-17 AU AU18155/95A patent/AU690966B2/en not_active Ceased
- 1995-02-17 CA CA002160802A patent/CA2160802A1/fr not_active Abandoned
- 1995-02-17 BR BR9506143A patent/BR9506143A/pt not_active Application Discontinuation
- 1995-02-17 JP JP7521631A patent/JPH08509298A/ja active Pending
- 1995-02-17 ES ES95909836T patent/ES2126255T3/es not_active Expired - Lifetime
- 1995-02-17 CN CN95190096A patent/CN1123570A/zh active Pending
- 1995-02-17 AT AT95909836T patent/ATE173082T1/de active
- 1995-02-17 US US08/530,378 patent/US5657124A/en not_active Expired - Fee Related
- 1995-02-17 DE DE69505749T patent/DE69505749T2/de not_active Expired - Fee Related
- 1995-02-17 MX MX9504353A patent/MX9504353A/es not_active IP Right Cessation
- 1995-10-16 NO NO954112A patent/NO954112L/no not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
ES2126255T3 (es) | 1999-03-16 |
US5657124A (en) | 1997-08-12 |
EP0695414A1 (fr) | 1996-02-07 |
FR2716531A1 (fr) | 1995-08-25 |
DE69505749T2 (de) | 1999-07-01 |
CA2160802A1 (fr) | 1995-08-24 |
ATE173082T1 (de) | 1998-11-15 |
AU1815595A (en) | 1995-09-04 |
DE69505749D1 (de) | 1998-12-10 |
EP0695414B1 (fr) | 1998-11-04 |
NO954112D0 (no) | 1995-10-16 |
AU690966B2 (en) | 1998-05-07 |
CN1123570A (zh) | 1996-05-29 |
BR9506143A (pt) | 1996-04-16 |
WO1995022740A1 (fr) | 1995-08-24 |
FR2716531B1 (fr) | 1996-05-03 |
JPH08509298A (ja) | 1996-10-01 |
NO954112L (no) | 1995-10-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
FG | Grant or registration | ||
MM | Annulment or lapse due to non-payment of fees |