JPS6424413A - Identification of wafer - Google Patents
Identification of waferInfo
- Publication number
- JPS6424413A JPS6424413A JP62180832A JP18083287A JPS6424413A JP S6424413 A JPS6424413 A JP S6424413A JP 62180832 A JP62180832 A JP 62180832A JP 18083287 A JP18083287 A JP 18083287A JP S6424413 A JPS6424413 A JP S6424413A
- Authority
- JP
- Japan
- Prior art keywords
- quarrer
- identification
- reflection parts
- code
- wafer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
- H01L2223/544—Marks applied to semiconductor devices or parts
- H01L2223/54406—Marks applied to semiconductor devices or parts comprising alphanumeric information
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
- H01L2223/544—Marks applied to semiconductor devices or parts
- H01L2223/54493—Peripheral marks on wafers, e.g. orientation flats, notches, lot number
Landscapes
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
PURPOSE:To avoid creation of dust and facilitate both the identification by mechanical reading and the identification by visual inspection of an operator by a method wherein regular reflection parts which have mirror surfaces and irregular reflection parts which have rough surfaces are formed in a predetermined region on a wafer and a light beam is applied to those parts and the reflected light is measured. CONSTITUTION:An identification pattern 2 is formed in a predetermined region on a wafer 1 such as an edge part where an orientation flat 1a is formed. The pattern 2 is composed of, for instance, quarrer codes or the like. One quarrer code is composed of four square blocks. A number is stamped in the block. By using the respective blocks as regular reflection parts which have mirror surfaces or irregular reflection parts which have rough surfaces, one code can express numbers 0-15 or 0-16. A laser beam from a laser emitting apparatus is applied to the quarrer codes and the reflected light is measured by a photodetector 11 to read the number expressed by the quarrer code.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62180832A JPS6424413A (en) | 1987-07-20 | 1987-07-20 | Identification of wafer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62180832A JPS6424413A (en) | 1987-07-20 | 1987-07-20 | Identification of wafer |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6424413A true JPS6424413A (en) | 1989-01-26 |
Family
ID=16090137
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62180832A Pending JPS6424413A (en) | 1987-07-20 | 1987-07-20 | Identification of wafer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6424413A (en) |
-
1987
- 1987-07-20 JP JP62180832A patent/JPS6424413A/en active Pending
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