JPS56130606A - Optical measuring device for thickness of transparent material - Google Patents

Optical measuring device for thickness of transparent material

Info

Publication number
JPS56130606A
JPS56130606A JP3455580A JP3455580A JPS56130606A JP S56130606 A JPS56130606 A JP S56130606A JP 3455580 A JP3455580 A JP 3455580A JP 3455580 A JP3455580 A JP 3455580A JP S56130606 A JPS56130606 A JP S56130606A
Authority
JP
Japan
Prior art keywords
transparent
thickness
lens
optical measuring
reverse
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3455580A
Other languages
Japanese (ja)
Inventor
Hideo Yamauchi
Original Assignee
Asahi Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asahi Glass Co Ltd filed Critical Asahi Glass Co Ltd
Priority to JP3455580A priority Critical patent/JPS56130606A/en
Publication of JPS56130606A publication Critical patent/JPS56130606A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical means
    • G01B11/02Measuring arrangements characterised by the use of optical means for measuring length, width or thickness
    • G01B11/06Measuring arrangements characterised by the use of optical means for measuring length, width or thickness for measuring thickness ; e.g. of sheet material

Abstract

PURPOSE:To measure the thickness of the transparent material without contacting, by measuring light path distances of reflection lights from the surface and the reverse face when the light beam is irradiated to the transparent material. CONSTITUTION:The laser beam from light source 2 consisting of an He-Ne laser oscillator is condensed to the measure position of transparent material 1 by lens 3. Lights reflected by surface S0 and reverse face S1 of transparent material 1 are condensed onto screen 6 by lens 4 and become bright point. Bright points become sharp by arranging lens 4 and screen 6 properly, and the distance between these bright points is measured to obtain the thickness of transparent material 1.
JP3455580A 1980-03-18 1980-03-18 Optical measuring device for thickness of transparent material Pending JPS56130606A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3455580A JPS56130606A (en) 1980-03-18 1980-03-18 Optical measuring device for thickness of transparent material

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3455580A JPS56130606A (en) 1980-03-18 1980-03-18 Optical measuring device for thickness of transparent material

Publications (1)

Publication Number Publication Date
JPS56130606A true JPS56130606A (en) 1981-10-13

Family

ID=12417551

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3455580A Pending JPS56130606A (en) 1980-03-18 1980-03-18 Optical measuring device for thickness of transparent material

Country Status (1)

Country Link
JP (1) JPS56130606A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58216904A (en) * 1982-06-11 1983-12-16 Toshiba Corp Thickness measuring device
JP2002176240A (en) * 2000-12-07 2002-06-21 Shibuya Kogyo Co Ltd Method and system for boring via hole
JP2012083183A (en) * 2010-10-12 2012-04-26 Pulstec Industrial Co Ltd Thickness measuring device for light-transmissive tubular object

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58216904A (en) * 1982-06-11 1983-12-16 Toshiba Corp Thickness measuring device
JP2002176240A (en) * 2000-12-07 2002-06-21 Shibuya Kogyo Co Ltd Method and system for boring via hole
JP2012083183A (en) * 2010-10-12 2012-04-26 Pulstec Industrial Co Ltd Thickness measuring device for light-transmissive tubular object

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