FI119259B - Pinnan ja paksuuden määrittäminen - Google Patents

Pinnan ja paksuuden määrittäminen Download PDF

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Publication number
FI119259B
FI119259B FI20065669A FI20065669A FI119259B FI 119259 B FI119259 B FI 119259B FI 20065669 A FI20065669 A FI 20065669A FI 20065669 A FI20065669 A FI 20065669A FI 119259 B FI119259 B FI 119259B
Authority
FI
Finland
Prior art keywords
optical radiation
measured
optical
detector
normal
Prior art date
Application number
FI20065669A
Other languages
English (en)
Finnish (fi)
Swedish (sv)
Other versions
FI20065669A0 (fi
FI20065669L (fi
Inventor
Heimo Keraenen
Original Assignee
Valtion Teknillinen
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=37232275&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=FI119259(B) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Publication of FI20065669A0 publication Critical patent/FI20065669A0/fi
Priority to FI20065669A priority Critical patent/FI119259B/fi
Application filed by Valtion Teknillinen filed Critical Valtion Teknillinen
Priority to US12/446,298 priority patent/US7936464B2/en
Priority to CN2007800386293A priority patent/CN101529200B/zh
Priority to EP07823198A priority patent/EP2076733B1/en
Priority to PCT/FI2007/050561 priority patent/WO2008046966A1/en
Priority to JP2009532834A priority patent/JP5155325B2/ja
Priority to ES07823198T priority patent/ES2400380T3/es
Publication of FI20065669L publication Critical patent/FI20065669L/fi
Publication of FI119259B publication Critical patent/FI119259B/fi
Application granted granted Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0691—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of objects while moving
    • D—TEXTILES; PAPER
    • D21—PAPER-MAKING; PRODUCTION OF CELLULOSE
    • D21F—PAPER-MAKING MACHINES; METHODS OF PRODUCING PAPER THEREON
    • D21F7/00—Other details of machines for making continuous webs of paper
    • D21F7/06—Indicating or regulating the thickness of the layer; Signal devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/06—Systems determining position data of a target
    • G01S17/46—Indirect determination of position data
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/499—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00 using polarisation effects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2210/00—Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
    • G01B2210/40—Caliper-like sensors
    • G01B2210/44—Caliper-like sensors with detectors on both sides of the object to be measured
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2210/00—Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
    • G01B2210/50—Using chromatic effects to achieve wavelength-dependent depth resolution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/57—Measuring gloss

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Electromagnetism (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
FI20065669A 2006-10-18 2006-10-18 Pinnan ja paksuuden määrittäminen FI119259B (fi)

Priority Applications (7)

Application Number Priority Date Filing Date Title
FI20065669A FI119259B (fi) 2006-10-18 2006-10-18 Pinnan ja paksuuden määrittäminen
US12/446,298 US7936464B2 (en) 2006-10-18 2007-10-17 Determining surface and thickness
ES07823198T ES2400380T3 (es) 2006-10-18 2007-10-17 Determinación de superficie y de grosor
CN2007800386293A CN101529200B (zh) 2006-10-18 2007-10-17 确定表面和厚度
EP07823198A EP2076733B1 (en) 2006-10-18 2007-10-17 Determining surface and thickness
PCT/FI2007/050561 WO2008046966A1 (en) 2006-10-18 2007-10-17 Determining surface and thickness
JP2009532834A JP5155325B2 (ja) 2006-10-18 2007-10-17 表面および厚みの決定

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20065669 2006-10-18
FI20065669A FI119259B (fi) 2006-10-18 2006-10-18 Pinnan ja paksuuden määrittäminen

Publications (3)

Publication Number Publication Date
FI20065669A0 FI20065669A0 (fi) 2006-10-18
FI20065669L FI20065669L (fi) 2008-04-19
FI119259B true FI119259B (fi) 2008-09-15

Family

ID=37232275

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20065669A FI119259B (fi) 2006-10-18 2006-10-18 Pinnan ja paksuuden määrittäminen

Country Status (7)

Country Link
US (1) US7936464B2 (enExample)
EP (1) EP2076733B1 (enExample)
JP (1) JP5155325B2 (enExample)
CN (1) CN101529200B (enExample)
ES (1) ES2400380T3 (enExample)
FI (1) FI119259B (enExample)
WO (1) WO2008046966A1 (enExample)

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WO2011042606A1 (en) 2009-10-08 2011-04-14 Valtion Teknillinen Tutkimuskeskus Measuring instrument and method for determination of the properties of an item and its surface

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US10684362B2 (en) 2011-06-30 2020-06-16 The Regents Of The University Of Colorado Remote measurement of shallow depths in semi-transparent media
US11313678B2 (en) 2011-06-30 2022-04-26 The Regents Of The University Of Colorado Remote measurement of shallow depths in semi-transparent media
US11231502B2 (en) * 2011-06-30 2022-01-25 The Regents Of The University Of Colorado Remote measurement of shallow depths in semi-transparent media
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CN110836642A (zh) * 2019-12-23 2020-02-25 海伯森技术（深圳）有限公司 一种基于三角测量法的彩色三角位移传感器及其测量方法
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CN112162296B (zh) * 2020-09-29 2024-05-31 香港中文大学（深圳） 一种激光测距系统
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CN116325068A (zh) 2020-10-01 2023-06-23 Asml荷兰有限公司 检查装置和方法
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011042606A1 (en) 2009-10-08 2011-04-14 Valtion Teknillinen Tutkimuskeskus Measuring instrument and method for determination of the properties of an item and its surface

Also Published As

Publication number Publication date
EP2076733B1 (en) 2012-12-05
FI20065669A0 (fi) 2006-10-18
JP5155325B2 (ja) 2013-03-06
CN101529200B (zh) 2012-07-04
US20100296107A1 (en) 2010-11-25
US7936464B2 (en) 2011-05-03
JP2010507089A (ja) 2010-03-04
EP2076733A1 (en) 2009-07-08
EP2076733A4 (en) 2010-01-06
WO2008046966A1 (en) 2008-04-24
ES2400380T3 (es) 2013-04-09
CN101529200A (zh) 2009-09-09
FI20065669L (fi) 2008-04-19

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