ES2578678T3 - Dispositivo semiconductor de puerta aislada de potencia de conmutación rápida - Google Patents

Dispositivo semiconductor de puerta aislada de potencia de conmutación rápida Download PDF

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Publication number
ES2578678T3
ES2578678T3 ES04737345.1T ES04737345T ES2578678T3 ES 2578678 T3 ES2578678 T3 ES 2578678T3 ES 04737345 T ES04737345 T ES 04737345T ES 2578678 T3 ES2578678 T3 ES 2578678T3
Authority
ES
Spain
Prior art keywords
door
semiconductor device
terminal
switching power
fast switching
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES04737345.1T
Other languages
English (en)
Inventor
Barend Visser
Ocker Cornelis De Jager
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AMBIXTRA Pty Ltd
Original Assignee
AMBIXTRA Pty Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by AMBIXTRA Pty Ltd filed Critical AMBIXTRA Pty Ltd
Application granted granted Critical
Publication of ES2578678T3 publication Critical patent/ES2578678T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76—Unipolar devices, e.g. field effect transistors
    • H01L29/772—Field effect transistors
    • H01L29/78—Field effect transistors with field effect produced by an insulated gate
    • H01L29/7801—DMOS transistors, i.e. MISFETs with a channel accommodating body or base region adjoining a drain drift region
    • H01L29/7802—Vertical DMOS transistors, i.e. VDMOS transistors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/40—Electrodes ; Multistep manufacturing processes therefor
    • H01L29/41—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions
    • H01L29/423—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions not carrying the current to be rectified, amplified or switched
    • H01L29/42312—Gate electrodes for field effect devices
    • H01L29/42316—Gate electrodes for field effect devices for field-effect transistors
    • H01L29/4232—Gate electrodes for field effect devices for field-effect transistors with insulated gate
    • H01L29/42364—Gate electrodes for field effect devices for field-effect transistors with insulated gate characterised by the insulating layer, e.g. thickness or uniformity
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/04—Modifications for accelerating switching
    • H03K17/041—Modifications for accelerating switching without feedback from the output circuit to the control circuit
    • H03K17/0412—Modifications for accelerating switching without feedback from the output circuit to the control circuit by measures taken in the control circuit
    • H03K17/04123—Modifications for accelerating switching without feedback from the output circuit to the control circuit by measures taken in the control circuit in field-effect transistor switches
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
    • H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
    • H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
    • H01L25/07—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L29/00
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Microelectronics & Electronic Packaging (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Electronic Switches (AREA)
  • Insulated Gate Type Field-Effect Transistor (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)

Abstract

Un dispositivo de puerta aislada (30, 90, 110) que comprende una fuente conectada a un terminal de fuente (98, 122) de una puerta (34, 95, 114) conectado a un terminal de puerta (94, 118) y medios de capacitancia de entrada que proporcionan la capacidad de entrada (CG) entre el terminal de puerta y el terminal de fuente, los medios de capacidad de entrada comprendiendo o bien un condensador en serie (116) entre la puerta (95, 114) y el terminal de puerta (94, 118) o una capa de aislamiento (32) que tiene un espesor suficiente (dins) entre la puerta (34) y un canal del dispositivo de tal manera que cuando el dispositivo es conmutado entre un estado apagado y un estado encendido, una relación de (Cfiss/Ciiss) entre un valor final de la capacitancia de entrada (Cfiss) cuando el dispositivo está encendido y un valor inicial de la capacitancia de entrada (Ciiss) cuando el dispositivo está apagado es de 1 < Cfiss/Ciiss <2,0.

Description

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Claims (1)

  1. imagen1
ES04737345.1T 2003-01-21 2004-01-21 Dispositivo semiconductor de puerta aislada de potencia de conmutación rápida Expired - Lifetime ES2578678T3 (es)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
ZA200300552 2003-01-21
ZA200300552 2003-01-21
PCT/ZA2004/000005 WO2004066395A2 (en) 2003-01-21 2004-01-21 Fast switching power insulated gate semiconductor device

Publications (1)

Publication Number Publication Date
ES2578678T3 true ES2578678T3 (es) 2016-07-29

Family

ID=32772476

Family Applications (1)

Application Number Title Priority Date Filing Date
ES04737345.1T Expired - Lifetime ES2578678T3 (es) 2003-01-21 2004-01-21 Dispositivo semiconductor de puerta aislada de potencia de conmutación rápida

Country Status (8)

Country Link
US (2) US20060118832A1 (es)
EP (1) EP1586120B1 (es)
JP (2) JP5362955B2 (es)
CN (1) CN100508211C (es)
ES (1) ES2578678T3 (es)
HK (1) HK1091321A1 (es)
WO (1) WO2004066395A2 (es)
ZA (1) ZA200505759B (es)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8039897B2 (en) * 2008-12-19 2011-10-18 Fairchild Semiconductor Corporation Lateral MOSFET with substrate drain connection
US20120019284A1 (en) * 2010-07-26 2012-01-26 Infineon Technologies Austria Ag Normally-Off Field Effect Transistor, a Manufacturing Method Therefor and a Method for Programming a Power Field Effect Transistor
JPWO2014034346A1 (ja) * 2012-08-28 2016-08-08 シャープ株式会社 複合型半導体装置

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Also Published As

Publication number Publication date
US20060118832A1 (en) 2006-06-08
JP2006516365A (ja) 2006-06-29
US8063426B2 (en) 2011-11-22
JP5362955B2 (ja) 2013-12-11
EP1586120B1 (en) 2016-04-27
EP1586120A2 (en) 2005-10-19
WO2004066395A2 (en) 2004-08-05
JP2013179344A (ja) 2013-09-09
CN1836337A (zh) 2006-09-20
ZA200505759B (en) 2007-02-28
HK1091321A1 (en) 2007-01-12
CN100508211C (zh) 2009-07-01
WO2004066395A3 (en) 2004-09-02
US20080203457A1 (en) 2008-08-28

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