ES2100395T3 - Aparato para medir errores en la desviacion de tiempo. - Google Patents

Aparato para medir errores en la desviacion de tiempo.

Info

Publication number
ES2100395T3
ES2100395T3 ES93109863T ES93109863T ES2100395T3 ES 2100395 T3 ES2100395 T3 ES 2100395T3 ES 93109863 T ES93109863 T ES 93109863T ES 93109863 T ES93109863 T ES 93109863T ES 2100395 T3 ES2100395 T3 ES 2100395T3
Authority
ES
Spain
Prior art keywords
transition
signal
synchronization
synchronization signal
storage elements
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES93109863T
Other languages
English (en)
Inventor
David Lowell Mcneely
Greg Alan Kranawetter
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Technicolor USA Inc
Original Assignee
Thomson Consumer Electronics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thomson Consumer Electronics Inc filed Critical Thomson Consumer Electronics Inc
Application granted granted Critical
Publication of ES2100395T3 publication Critical patent/ES2100395T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00—Details of television systems
    • H04N5/76—Television signal recording
    • H04N5/91—Television signal processing therefor
    • H04N5/93—Regeneration of the television signal or of selected parts thereof
    • H04N5/95—Time-base error compensation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/66007—Multistep manufacturing processes
    • H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
    • H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
    • H01L29/66409—Unipolar field-effect transistors
    • H01L29/66477—Unipolar field-effect transistors with an insulated gate, i.e. MISFET
    • H01L29/66568—Lateral single gate silicon transistors
    • H01L29/66575—Lateral single gate silicon transistors where the source and drain or source and drain extensions are self-aligned to the sides of the gate
    • H01L29/6659—Lateral single gate silicon transistors where the source and drain or source and drain extensions are self-aligned to the sides of the gate with both lightly doped source and drain extensions and source and drain self-aligned to the sides of the gate, e.g. lightly doped drain [LDD] MOSFET, double diffused drain [DDD] MOSFET
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
    • H01L21/0271—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
    • H01L21/0273—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers characterised by the treatment of photoresist layers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
    • H01L21/82—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
    • H01L21/822—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being a semiconductor, using silicon technology
    • H01L21/8232—Field-effect technology
    • H01L21/8234—MIS technology, i.e. integration processes of field effect transistors of the conductor-insulator-semiconductor type
    • H01L21/8238—Complementary field-effect transistors, e.g. CMOS
    • H01L21/823814—Complementary field-effect transistors, e.g. CMOS with a particular manufacturing method of the source or drain structures, e.g. specific source or drain implants or silicided source or drain structures or raised source or drain structures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/66007—Multistep manufacturing processes
    • H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
    • H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
    • H01L29/66409—Unipolar field-effect transistors
    • H01L29/66477—Unipolar field-effect transistors with an insulated gate, i.e. MISFET
    • H01L29/6656—Unipolar field-effect transistors with an insulated gate, i.e. MISFET using multiple spacer layers, e.g. multiple sidewall spacers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76—Unipolar devices, e.g. field effect transistors
    • H01L29/772—Field effect transistors
    • H01L29/78—Field effect transistors with field effect produced by an insulated gate
    • H01L29/7833—Field effect transistors with field effect produced by an insulated gate with lightly doped drain or source extension, e.g. LDD MOSFET's; DDD MOSFET's

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Manufacturing & Machinery (AREA)
  • Ceramic Engineering (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Measurement Of Unknown Time Intervals (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Pulse Circuits (AREA)
  • Manipulation Of Pulses (AREA)
  • Measuring Phase Differences (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

SE PRESENTA UN APARATO PARA MEDIR LA DESVIACION EN UNA SEÑAL DE SINCRONIZACION PARA PROCESAR UNA SEÑAL DE VIDEO. EL APARATO INCLUYE UNA CONEXION EN CASCADA DE UNA PLURALIDAD DE ELEMENTOS ANALOGICOS DE RETARDO A LOS CUALES SE APLICA LA SEÑAL DE SINCRONIZACION. LAS CONEXIONES DE SALIDA DE CADA ELEMENTO ANALOGICO DE RETARDO SE ACOPLAN A UN TERMINAL DE ENTRADA DE DATOS DE UN ELEMENTO DE ALMACENAMIENTO RESPECTIVO. UNA SEÑAL REPRESENTATIVA DE LA SEÑAL DE SINCRONIZACION HORIZONTAL SE APLICA A LOS ELEMENTOS DE ALMACENAMIENTO PARA ENGANCHAR SIMULTANEAMENTE LA SEÑAL EN LOS RESPECTIVOS ELEMENTOS DE ALMACENAMIENTO, MEDIANTE LO CUAL SE CAPTURA UN CICLO REPRESENTATIVO DE LA SEÑAL DE SINCRONIZACION DE MUESTREO EN LOS ELEMENTOS DE ALMACENAMIENTO. UN CIRCUITO DESCODIFICADOR ESTA ACOPLADO A LOS ELEMENTOS DE ALMACENAMIENTO PARA DETECTAR LA POSICION RELATIVA DE POR EJEMPLO LA TRANSICION DE CARGA DEL IMPULSOR DE SINCRONIZACION DE MUESTREO QUE PRECEDE INMEDIATAMENTE LA TRANSICION TRASERA DE IMPULSO HORIZONTAL. SE CALCULA UNA PROPORCION INDICATIVA DEL ERROR DE DESVIACION, DICHA PROPORCION SE CORRESPONDE CON LA POSICION DE LA PRIMERA TRANSICION, EN UNIDADES DE RETARDO, DIVIDIDA POR LA DURACION DEL PERIODO DE SINCRONIZACION DE MUESTREO, EN UNIDADES DE RETARDO. EN UNA CONFORMACION, LA RELACION ES UNA MEDIDA, COMO UNA FRACCION DE PERIODO DE SINCRONIZACION, DEL INTERVALO DE TIEMPO ENTRE UNA TRANSICION PREDETERMINADA DE UNA SEÑAL DE SINCRONIZACION HORIZONTAL Y LA TRANSICION DELANTERA DEL PRIMER IMPULSO DE SINCRONIZACION DE MUESTREO QUE SIGUE A DICHA TRANSICION PREDETERMINADA.
ES93109863T 1992-06-26 1993-06-21 Aparato para medir errores en la desviacion de tiempo. Expired - Lifetime ES2100395T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/904,632 US5309111A (en) 1992-06-26 1992-06-26 Apparatus for measuring skew timing errors

Publications (1)

Publication Number Publication Date
ES2100395T3 true ES2100395T3 (es) 1997-06-16

Family

ID=25419475

Family Applications (1)

Application Number Title Priority Date Filing Date
ES93109863T Expired - Lifetime ES2100395T3 (es) 1992-06-26 1993-06-21 Aparato para medir errores en la desviacion de tiempo.

Country Status (9)

Country Link
US (1) US5309111A (es)
EP (1) EP0575933B1 (es)
JP (1) JPH0698354A (es)
KR (1) KR100272626B1 (es)
CN (1) CN1045146C (es)
DE (1) DE69310030T2 (es)
ES (1) ES2100395T3 (es)
FI (1) FI107975B (es)
SG (1) SG92592A1 (es)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5404437A (en) * 1992-11-10 1995-04-04 Sigma Designs, Inc. Mixing of computer graphics and animation sequences
FR2711286B1 (fr) * 1993-10-11 1996-01-05 Sgs Thomson Microelectronics Dispositif de surveillance du déphasage entre deux signaux d'horloge.
US5598576A (en) * 1994-03-30 1997-01-28 Sigma Designs, Incorporated Audio output device having digital signal processor for responding to commands issued by processor by emulating designated functions according to common command interface
US5515107A (en) * 1994-03-30 1996-05-07 Sigma Designs, Incorporated Method of encoding a stream of motion picture data
US6124897A (en) 1996-09-30 2000-09-26 Sigma Designs, Inc. Method and apparatus for automatic calibration of analog video chromakey mixer
US5528309A (en) 1994-06-28 1996-06-18 Sigma Designs, Incorporated Analog video chromakey mixer
US5663767A (en) * 1995-10-25 1997-09-02 Thomson Consumer Electronics, Inc. Clock re-timing apparatus with cascaded delay stages
US5719511A (en) * 1996-01-31 1998-02-17 Sigma Designs, Inc. Circuit for generating an output signal synchronized to an input signal
US6128726A (en) 1996-06-04 2000-10-03 Sigma Designs, Inc. Accurate high speed digital signal processor
US5818468A (en) * 1996-06-04 1998-10-06 Sigma Designs, Inc. Decoding video signals at high speed using a memory buffer
US5963267A (en) * 1996-09-20 1999-10-05 Thomson Consumer Electronics, Inc. Delay correction circuit
US5982408A (en) * 1997-04-10 1999-11-09 Lexmark International, Inc. Method and apparatus for HSYNC synchronization
US6687770B1 (en) 1999-03-08 2004-02-03 Sigma Designs, Inc. Controlling consumption of time-stamped information by a buffered system
US6654956B1 (en) 2000-04-10 2003-11-25 Sigma Designs, Inc. Method, apparatus and computer program product for synchronizing presentation of digital video data with serving of digital video data
US20070103141A1 (en) * 2003-11-13 2007-05-10 International Business Machines Corporation Duty cycle measurment circuit for measuring and maintaining balanced clock duty cycle
US7400555B2 (en) * 2003-11-13 2008-07-15 International Business Machines Corporation Built in self test circuit for measuring total timing uncertainty in a digital data path
US7961559B2 (en) * 2003-11-13 2011-06-14 International Business Machines Corporation Duty cycle measurement circuit for measuring and maintaining balanced clock duty cycle
KR100582391B1 (ko) * 2004-04-08 2006-05-22 주식회사 하이닉스반도체 반도체 소자에서의 지연 요소의 지연 검출 장치 및 방법
US7587640B2 (en) * 2005-09-27 2009-09-08 Agere Systems Inc. Method and apparatus for monitoring and compensating for skew on a high speed parallel bus
JP4973498B2 (ja) * 2005-09-28 2012-07-11 日本電気株式会社 位相差測定装置及び位相比較回路の調整方法
EP1950577A3 (fr) * 2007-01-29 2012-01-11 Stmicroelectronics Sa Procede de verification de l'integrite d'un arbre d'horloge
US8198904B2 (en) * 2007-03-30 2012-06-12 Mitsubishi Electric Corporation Synchrophasor measuring device and inter-bus-line phase angle difference measurement unit using the same
JP2009130442A (ja) * 2007-11-20 2009-06-11 Fujitsu Component Ltd 信号伝送システム及びその制御方法
US20150104673A1 (en) * 2013-10-10 2015-04-16 Datang Nxp Semiconductors Co., Ltd. Daisy-chain communication bus and protocol
US20160080138A1 (en) * 2014-09-17 2016-03-17 Telefonaktiebolaget L M Ericsson (Publ) Method and apparatus for timing synchronization in a distributed timing system
US11256286B1 (en) 2020-12-28 2022-02-22 Samsung Electronics Co., Ltd. Electronic circuit and method for clock skew-calibration

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3681693A (en) * 1970-11-27 1972-08-01 Rca Corp Measurement of maximum dynamic skew in parallel channels
US4595953A (en) * 1984-10-31 1986-06-17 Rca Corporation Television receiver having character generator with burst locked pixel clock and correction for non-standard video signals
DE3579925D1 (de) * 1985-12-12 1990-10-31 Itt Ind Gmbh Deutsche Digitale phasenmesschaltung.
US4772937A (en) * 1987-03-31 1988-09-20 Rca Licensing Corporation Skew signal generating apparatus for digital TV
US4814879A (en) * 1987-08-07 1989-03-21 Rca Licensing Corporation Signal phase alignment circuitry
US4926115A (en) * 1988-12-19 1990-05-15 Ag Communication Systems Corporation Unique phase difference measuring circuit
US5138320A (en) * 1990-11-14 1992-08-11 Zenith Electronics Corporation Skew code generator for measuring pulses width using a delay line

Also Published As

Publication number Publication date
JPH0698354A (ja) 1994-04-08
DE69310030T2 (de) 1997-08-14
DE69310030D1 (de) 1997-05-28
CN1082296A (zh) 1994-02-16
EP0575933A1 (en) 1993-12-29
SG92592A1 (en) 2002-11-19
US5309111A (en) 1994-05-03
KR940001693A (ko) 1994-01-11
EP0575933B1 (en) 1997-04-23
FI932954A (fi) 1993-12-27
CN1045146C (zh) 1999-09-15
FI107975B (fi) 2001-10-31
FI932954A0 (fi) 1993-06-24
KR100272626B1 (ko) 2000-11-15

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